1. Tip-enhanced near-field Raman spectroscopy (TERS) was used to study deformations induced in single-walled carbon nanotubes (SWCNTs) by an atomic force microscopy (AFM) tip. 2. A ~430nm horizontal defect was introduced using an AFM tip, and far-field and near-field Raman spectroscopy and AFM imaging were used to characterize the manipulated SWCNT. 3. The near-field TERS image revealed the manipulation region was about 5nm wide, indicating a bundled structure of 4-5 SWCNTs. Raman peak shifts and intensity changes provided information about the deformation's effect on the SWCNT's structure and properties.