X-ray photoelectron spectroscopy (XPS) is a surface-sensitive technique that uses X-rays to excite photoelectrons from a material. The kinetic energy of the emitted photoelectrons is measured, allowing the elemental composition and chemical or electronic state of the surface to be determined. When X-rays irradiate a sample surface, they eject core-level electrons from the top 1-10 nm. By measuring the kinetic energy of these photoelectrons, their binding energy can be determined based on the conservation of energy. This provides information about the elemental composition and chemical environment of the surface being analyzed with high sensitivity.