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ASPEX CORPORATION:
ANALYTICAL SERVICES GROUP
February 10, 2012




                            CONFIDENTIAL
Introduction to ASPEX Corporation

• An FEI Company
• An American company located  in Pittsburgh, PA.
• Analytical Testing Services provider
   > cGMP compliant, FDA Registered
   > Electron microscopy services
   > X‐Ray microanalysis
• Co‐located with
   > ASPEX SEM‐EDX manufacturing  facility 
   > Global Sales and Services
   > ASPEX Learning Center
Quality Assurance Program

• Quality Management System
• cGMP‐compliant standard operating  procedures
• ISO9002:2008 certification (Expected April 2012)
MARKETS SERVED


 Introducing

Pharmaceuticals-       Oil Analysis-   Hard Drives
Particulate Matter     Wear Debris



 February 10, 2012


      Metals            Inhalers         Mining




                     Medical Devices
PRODUCTS & SERVICES

February 10, 2012




                      CONFIDENTIAL
Laboratory Equipment: SEM-EDX

 ASPEX EXpress™                  ASPEX EXplorer™




ASPEX EXpress™ desktop SEM   The ASPEX EXplorer™ system
                             provides a fully integrated SEM and
                             EDX platform that blends state of the
                             art hardware with software
                             sophistication.




Experience The Power of ASPEX
                                                                     CONFIDENTIAL
Analytical Testing Services

•   Microscopic Imaging Services                        •   Metals Quality Analysis
    • Failure Analysis (fractures, delamination &            • ASTM E45, ASTM E2142, ISO 4967
    corrosion) 
    • Materials Testing (ceramics, composites &         •   Advanced Quality Control
    metals)                                                  • ISO 4406, ISO 11171
    • Surface Characterization (porosity & grain             • Oil Analysis
    structure) 
                                                        •   Foreign Particle  Identification
•   Elemental Composition by X‐Ray 
    Microanalysis                                       •   Automated Particle Analysis
    • Contamination Identification                           • Characterization (size, shape and 
    • Surface Composition & Coatings                             composition)
    • Elemental Analysis                                     •   Size Distribution
    • X‐ray mapping, Line Scan, Spot & Area 
    Microanalysis 
ASTM, ISO and USP Standard Services


061   ISO 4406 ‐ Hydraulic and Oil Particle Count Analysis
062   ISO 4406 ‐ with Elemental Composition
063   ISO 11171 ‐ Fluid Cleanliness Analysis
064   ISO 11171 ‐ with Elemental Composition
066   ASTM‐E45 ‐ Inclusion Cleanliness Analysis of Rolled Steel
067   ASTM‐E2142 ‐ Inclusion Cleanliness Analysis of Rolled Steel
068   JIS G 0555 ‐ Inclusion Cleanliness Analysis of Rolled Steel

069   ISO 4967 ‐ Inclusion Cleanliness Analysis of Rolled Steel

070   USP <788> Particulate Matter

071   ASTM Test Method F1877 Life Cycle Testing




                                                                    CONFIDENTIAL
General Electron Microscopy Services




•   Secondary Electron Imaging
•   Backscatter Electron Imaging
•   Low‐vacuum Backscatter Electron Imaging
•   X‐Ray Microanalysis (elemental composition)
•   Features  (particles or inclusions) characterization
•   X‐Ray Mapping




                                                           CONFIDENTIAL
Sample Preparation




• Filtration
• Sputter Coating
• Metal polishing




                                 CONFIDENTIAL
INTRODUCTION TO ASPEX TECHNOLOGY
  Scanning Electron Microscopy and Energy Dispersive Spectrometry

  February 10, 2012




                                                              CONFIDENTIAL
SEM‐EDX Information



           • Secondary Electron Imaging
               Topographical/Morphological imaging
           • Backscatter Electron Imaging
               Atomic number based contrast
               Low‐vacuum imaging capabilities
           • SDD for X‐Ray detection
               Chemical composition using Energy 
                Dispersive Spectrometry




  ASPEX
EXPLORER
SEM‐EDX Information

SECONDARY ELECTRONS

                                     • Secondary electrons are inelastically
                           SE            scattered.
                                     •   Incident electron loses much of its energy 
                                         to the sample
                                     •   Weakly bound electrons of the sample are 
                                         “boiled‐off”.
       Nucleus
                                     •   <50 eV
                                     •   Topographic information.
                                     •   SE are drawn to detector with positive 
                                         bias.



                 Incident Electron



                                                                           CONFIDENTIAL
SEM‐EDX Information

APPLICATIONS: HIGH MAGNIFICATION IMAGING




    •   Surface morphology
    •   Shape
    •   Texture
    •   Porosity
    •   Defects




                                           CONFIDENTIAL
SEM‐EDX Information

BACKSCATTERED ELECTRONS

         Electron Beam
   BSE
                         •   Backscattered electrons are elastically 
                             scattered.
                         •   Minimal energy loss.
                         •   Large directional change.
                         •   >50 eV
                         •   Strong correlation with atomic number.
           Nucleus




                                                                  CONFIDENTIAL
SEM‐EDX Information

BACKSCATTERED ELECTRONS




• Imaging based on atomic number contrast useful to investigate:
   > Sample homogeneity
   > Contamination

                                                               CONFIDENTIAL
SEM‐EDX Information

X-RAYS MICROANALYSIS
   Characteristic X‐Rays are generated in a multi‐step process:
   • An inner shell electron is knocked out by incoming electron.  
   • An outer shell electron drops down to fill vacancy.
   • Energy difference is emitted as a photon.

                                       SE                         Emitted 
                                                                   X‐Ray


                       Nucleus                    Nucleus




                                 Incident 
                                 Electron


                                                                             CONFIDENTIAL
SEM‐EDX Information

ENERGY DISPERSIVE SPECTRUM
     •   Energy of emitted X‐Ray is characteristic of chemical element.
     •   The X‐ray detector collects the X‐rays and results are displayed in a 
         histogram.
     •   Used to identify  and quantify the elements present in a sample.




                                                                             CONFIDENTIAL
SEM‐EDX Information


      SED             BSED                                            EDX
                                                             Si
                                            1,000




                                   Counts
                                             500                                    Mn
                                                                                         Fe
                                                                                              Fe
                                               0
                                                    0    1        2   3    4    5    6        7    8
                                                                          keV




• Electron images – How the sample looks? What is the size and shape?
• EDX ‐ What the sample is made of?
• Complete physical and chemical characterization of materials



                                                                                              CONFIDENTIAL
Applications

SELECTED EXAMPLES OF TESTING SERVICES
    • Contamination studies in Pharmaceuticals
        • Particulate Matter Characterization
    • X‐Ray Mapping
        • Elemental Distribution in samples
    • Surface Characterization of Materials
        • Morphology, porosity, size and shape
    • Oil Analysis
        • Characterize wear debris  to understand  wear and tear patterns
    • Inspection of Medical Devices and Implants
        • Wear Debris, fractures and failures




                                                                            CONFIDENTIAL
Contaminant Particle Found 
                                                                  in a Pharmaceutical Product

                                                  200 µm                                                  200 µm




                               SED                                                              BSED
         800                   Br                                                              Br

                   C
         600                        P
Counts




                                        Cl
         400
                                                 Ca
                       F
         200           O                                                                             Br


          0
               0           1        2        3        4   5   6    7         8   9   10   11   12   13     14      15
                                                                       keV
                                                      EDX (Chemical Composition)
                                                                                                                        CONFIDENTIAL
Contaminant Particle Found 
                                                                             in a Pharmaceutical Product
                         500 µm
                                                                             100 µm



                                                                                                               Stainless 
                                                                                                              Steel in raw 
                                                                                                                material 
                                                                                                                sample




         2,500


         2,000
Counts




         1,500
                     Fe                                            Fe
                              Al                        Cr
         1,000       O

          500            Ni        Si                                        Ni
                                                             Cr         Fe
                                                                                      Ni
            0
                 0        1             2   3   4   5         6         7         8        9   10   11   12
                                                             keV




                                                                                                                              CONFIDENTIAL
X‐Ray Mapping used to evaluate 
                             elemental distribution in samples
MAGNESIUM STEARATE

                   50 µm




   Sample: Aleve 220 mg
   Scanning conditions: 10
   frames at 1ms/pixel

                                                        CONFIDENTIAL
Surface Characterization:
                                             Morphology
100 µm                 1000 µm
                                                      100 µm




    20 µm                               20 µm




         •   How clean is your product?
         •   Is your product free of defects?
         •   Are your coatings uniform?
         •   Does your product meet specifications?
                                                               CONFIDENTIAL
Foreign Particles Identified in 
                           Pharmaceutical Products
                                                                Al

              20 µm
                                  20,000




                        C u ts
                         on
Aluminum                          10,000


                                        0
                                         0                 1              2   3   4    5         6         7    8   9   10
             Teflon                                                                   keV

            100 µm
                                  6,000




                        C u ts
                         on
                                  4,000              Fe                                               Fe




  Iron                            2,000

                                       0
                                                                                                           Fe



                                        0                 1          2        3   4    5         6         7    8   9   10
                                                                                      keV


            200 µm                3,000
                                             C




Synthetic

                        C u ts
                                  2,000




                         on
                                  1,000          O




 Fibers                                0
                                        0                  1          2       3   4    5         6         7    8   9   10
                                                                                      keV

                                                                     Si

                20 µm
                                    15,000           O         Mg
                         C u ts
                          on




  Talc
                                    10,000

                                     5,000

                                        0
                                         0                 1              2   3   4    5         6         7    8   9   10
                                                                                      keV

                                                      Fe                                              Fe

              100 µm
                                    4,000

Stainless
                           C u ts
                            on




                                    2,000        Cr                                         Cr




  Steel                                 0
                                         0                 1              2   3   4    5
                                                                                                 C



                                                                                                 6
                                                                                                  r
                                                                                                           Fe




                                                                                                           7    8   9   10
                                                                                      keV




                                                                                                                             CONFIDENTIAL
Manual Inspection of 
                                 Medical Devices




                                       Denuded area




                                           Coated area



Metallic stent with polymer coating




                                                CONFIDENTIAL
Applications of Automated 
                                       SEM‐EDX Technology 
WHY USE AUTOMATED SEM-EDX TECHNOLOGY?




    •   To obtain statistically meaningful metrics.
    •   To recognize groupings within a population.
    •   To locate low‐probability features (“needle in haystack”).
    •   To verify absence of contaminants.




                                                                CONFIDENTIAL
Applications of Automated 
                                          SEM‐EDX Technology 
• For each feature (a particle or material inclusion):
   •   Total number of features per area analyzed
   •   Exact location on specimen to relocate for advanced analysis
   •   Size (average diameter, area)
   •   Shape information (aspect ratio)
   •   BSE contrast level (~average atomic number)
   •   Elemental composition 
   •   Electron Images




                                                                  CONFIDENTIAL
How does an automated 
      SEM‐EDX works?


 Spectrum Analyzed




  Composition Determined


     Particle Identified
   Iron Rich Class
                           CONFIDENTIAL
How does an automated 
                                  SEM‐EDX works?

   WHAT IS USED FOR CHARACTERIZATION?

Size and Shape Parameters     Elemental Chemistry
  • Elemental Composition
  • Average diameter
  • Maximum Diameter
  • Minimum Diameter
  • Aspect Ratio
  • Area




                                                    CONFIDENTIAL
Applications of automated 
                      SEM‐EDX Technology

                              Understanding
                               Distributions
                             Particle-by-Particle
                           Elemental Composition




Rare Feature
  Location
Contamination
   Studies
Specialized QC
Investigations


                                            CONFIDENTIAL
Case 1

PARTICLE COUNT IN PARENTERAL SOLUTIONS

 • USP Test Chapter <788>
    – Enumeration standard for foreign particles 
    – Recommended for particles ≥10 µm and ≥25 µm
    – Two step inspection: 
         • light obscuration for inspection with a given set of limits
                                         Small Volume    Large Volume
                                          Parenterals     Parenterals
                                         <6000 @ 10um   <25/ml @ 10um
                   U.S. Pharmacopoeia
                                         <600 @ 25um    <3/ml @ 25um


         • microscopy if sample does not pass the limits
                                         Small Volume    Large Volume
                                          Parenterals     Parenterals
                                        <300 @25 mm
                                         <6000 @ 10um   <2/mL @ 25 mm
                                                        <25/ml @ 10um
                   U.S. Pharmacopoeia
                                        <3000 @10 mm
                                          <600 @ 25um   <12/mL @10 m 
                                                         <3/ml @ 25um



    – SEM‐EDX analysis provides elemental composition in addition to enumeration

                                                                                    CONFIDENTIAL
Case 1

PARTICLE COUNT IN PARENTERAL SOLUTIONS
              E-Beam Analysis is used to understand distributions
                                                                                 195 Particles >10 um
                                                                                 85 Particles >25 um


                Filter particulate  onto 
                                                                  40
                      a membrane                                  35
                                            Scan filter           30

                                                                  25
Parenteral 




                                                          Count
                                                                  20

 Solution                                                         15

                                                                  10

                                                                  5

                                                                  0
                                                                       0-5 10-15 25-30 40-45 55-60 70-75 85-90 100-105 120-125   140-145
                                                                                                    DMAX




                                                                                                                    CONFIDENTIAL
Case 2

OIL ANALYSIS: UNDERSTANDING KNOWN CONTAMINANTS




                                               Filtered solution
                                                   with know
                                             contaminants ready
                        High pressure wash      for automated
                                               E-beam analysis



   Manufactured parts

                                                         CONFIDENTIAL
Case 2

OIL ANALYSIS: UNDERSTANDING KNOWN CONTAMINANTS




   Contour plot of the average elemental composition for each particle type

                                                                               CONFIDENTIAL
Case 2

OIL ANALYSIS: UNDERSTANDING KNOWN CONTAMINANTS
                                                                                Particle Size Distributions                                                                      What do they look like?




                        90

                        80

                        70
  Number of Particles




                        60                                                                                                                                            Aluminum
                                                                                                                                                                    Al/Cu/Zn
                                                                                                                                                                  Al/Fe
                        50                                                                                                                                     Al/Cu/Zn/Fe
                                                                                                                                                            Aluminum Aggs
                                                                                                                                                          Misc
                        40                                                                                                                             Misc Metals
                                                                                                                                                    Titanium and Lead
                        30                                                                                                                       Titanium (Paint)
                                                                                                                                                                         e
                                                                                                                                                                      yp




                                                                                                                                              Misc Salts
                                                                                                                                                                  eT




                        20                                                                                                                 Brass
                                                                                                                                                                icl




                                                                                                                                        Bushing
                                                                                                                                                                 rt




                         10                                                                                                          Fe/Zn/Cu
                                                                                                                                                              Pa




                                                                                                                                Iron
                             0                                                                                               Stainless
                                 20-60




                                                                                                                         Silicates
                                         60-100

                                                  100-150

                                                            150-300

                                                                      300-450

                                                                                450-600

                                                                                          600-1000

                                                                                                     1000-1600

                                                                                                                 >1600




                                  Particle Size Ranges
                                     (micrometers)



                                                                                                                                                                                                           CONFIDENTIAL
Case 2

UNDERSTANDING KNOWN CONTAMINANTS

   • Assess if your cleaning process is performing as it should. 
   • You may be producing products that may fail later on 
       down the line. 
   •   Are you expending too much effort – and money — on 
       cleaning?
   •   Cleanliness analyzers are resulting in over 30% 
       reductions in warranty cost 




                                                                CONFIDENTIAL
Case 3


FOREIGN PARTICLE DETECTION

       • Foreign particle: contaminated particle derived from 
         active, recipients, containers, formulation, 
         environment, process of manufacture/actuating drug 
         device

       • A number of different regulatory authorities demand 
         the evaluation of foreign particles in all types of 
         respiratory drugs.
          • Number, size,  elemental composition



                                                           CONFIDENTIAL
Case 3

FOREIGN PARTICLE DETECTION

        Investigation into manufacturing contamination of an 
                        inhalable drug powder




      Dissolve drug powder and pass through a polycarbonate filter membrane



                                                                               CONFIDENTIAL
Case 3

FOREIGN PARTICLE DETECTION




   Distribution of inhalable drug product
           on a filter membrane


                                             CONFIDENTIAL
Case 3

FOREIGN PARTICLE DETECTION


   Elemental composition table for inhalable drug powder.




                                                             CONFIDENTIAL
Case 3

FOREIGN PARTICLE DETECTION


• Relocated Particles
    Mica
    Quartz
    Calcium Rich (precipitates)

• Relocated Organic/Carbonaceous
    no sample preparation
    use Variable Pressure mode
    Invert contrast mechanism


                                    CONFIDENTIAL
Case 4

COATING DURABILITY OF METALS

    • Characterization of coating durability of implantable 
      metals

    • Need to know: How many particles are generated by the 
      device under typical use?

    • Problem: Coating is organic, all other particles are 
      inorganic, or organics with inorganic components.




                                                                CONFIDENTIAL
Case 4

COATING DURABILITY OF METALS
                                               Organic      Mica

   Light-on-Dark               Dark-on-Light
                   Gold coat
                   Reverse
                   Contrast




                                               Aluminum   Silica Bead




                                                                        CONFIDENTIAL
Case 5

PARTICLE ENUMERATION IN INHALABLE ASTHMA KIT
    •   Active drug processed into a respirable dry powder. The product is 
        administered with a hand‐held device

    •   Determine origin, profile and number of foreign particle material 
        in drug powder, packaging and device.

    •   Data was tabulated in the following detection size ranges
         > 20‐10 mm, 25‐50 mm, 50‐150 mm, 150‐500 mm 
         > 0‐1 mm, 1‐2 mm, 2‐3 mm, 4‐5 mm, 5‐6 mm, 6‐7 mm, 7‐8 mm, 8‐
           9 mm, 9‐10 mm
         > >10 mm
         > >25 mm
    •   Elemental composition data and total particle count
                                                                              CONFIDENTIAL
Case 5

PARTICLE ENUMERATION IN INHALABLE ASTHMA KIT

                                                       DMAX ( m)   [0.00 ‐       [1.00 ‐ [2.00 ‐ [5.00 ‐ [10.00 ‐ [25.00 ‐ [50.00 ‐
                          Classification      Total
                                                                     1.00)         2.00) 5.00) 10.00) 25.00) 50.00) 100.00)
                                Talc           32
                                                            Talc       0             5      13      11       3        0        0
                          Calcium Rich         16
                                                       Calcium Rich    0             0       5       7       3        1        0
                         Aluminum Rich          1
                                                      Aluminum Rich    0             0       0       0       1        0        0
                              Si Rich          106
                                                           Si Rich     6            30      38      19       7        0        5
                         Chromium Rich          0
                                                      Chromium Rich    0             0       0       0       0        0        0
                            Stainless          17
                                                         Stainless     2            10       5       0       0        0        0
                            Iron Rich          49
                                                         Iron Rich    10            22      13       4       0        0        0
                               Misc            23
                                                            Misc       1             9       4       4       3        2        0
                           All particles       244


                            DAve      DMin    DMax        ASPECT        [1.00 ‐         [1.10 ‐     [3.25 ‐     [5.50 ‐      [7.75 ‐
  Classification Total       m        m      m          RATIO         1.10)           3.25)       5.50)       7.75)       10.00)
 Aluminum Rich 1            15.2       13.4    17.3         ( m)
                                                             Talc             0            30           1          1            0
  Calcium Rich 16            6.0        4.3    8.0
                                                       Calcium Rich           0            13           2          0            1
 Chromium Rich 0
                                                      Aluminum  Rich          0             1           0          0            0
    Iron Rich     49         1.4       0.8     2.2
                                                           Si Rich            6            75          13          3            2
       Misc       23         5.6       3.9     7.8    Chromium  Rich          0             0           0          0            0
      Si Rich     106        3.4       1.7     8.8       Stainless            0            15           1          0            1
    Stainless     17         1.1       0.6     1.7       Iron Rich            1            38           8          1            0
       Talc       32         3.4       2.2     5.3          Misc              2            18           3          0            0

                                                                                                                          CONFIDENTIAL
Case 5

PARTICLE ENUMERATION IN INHALABLE ASTHMA KIT




                                                CONFIDENTIAL
Case 6

ACTIVE PHARMACEUTICAL INGREDIENT
   • API  has significant exposure to FP during dissolution, 
       filtering, spray drying , milling and blending with 
       excipients.
   •   If the API is obtained from outside sources, the supplier 
       should be  included in the control process.




                                             API containing Br


                                                                    CONFIDENTIAL
Case 6

ACTIVE PHARMACEUTICAL INGREDIENT
   Particle map showing distribution of
          API on filter membrane




                                          Particle image (thumbnail), percentage composition and
                                                          EDS spectra of API using
                                                       ASPEX AFA Data ViewerTM

                                                                                        CONFIDENTIAL
Contact Information



Marie C. Vicéns, PhD
Manager, Analytical Services
E‐mail: mvicens@aspexcorp.com;  Marie.Vicens@fei.com
Phone: (724) 468‐1618
Web: http://www.aspexcorp.com/Solutions/ContractServices/Analytical.aspx




                                                                           CONFIDENTIAL

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Electron Microscopy Services

  • 1. ASPEX CORPORATION: ANALYTICAL SERVICES GROUP February 10, 2012 CONFIDENTIAL
  • 2. Introduction to ASPEX Corporation • An FEI Company • An American company located  in Pittsburgh, PA. • Analytical Testing Services provider > cGMP compliant, FDA Registered > Electron microscopy services > X‐Ray microanalysis • Co‐located with > ASPEX SEM‐EDX manufacturing  facility  > Global Sales and Services > ASPEX Learning Center
  • 4. MARKETS SERVED Introducing Pharmaceuticals- Oil Analysis- Hard Drives Particulate Matter Wear Debris February 10, 2012 Metals Inhalers Mining Medical Devices
  • 5. PRODUCTS & SERVICES February 10, 2012 CONFIDENTIAL
  • 6. Laboratory Equipment: SEM-EDX ASPEX EXpress™ ASPEX EXplorer™ ASPEX EXpress™ desktop SEM The ASPEX EXplorer™ system provides a fully integrated SEM and EDX platform that blends state of the art hardware with software sophistication. Experience The Power of ASPEX CONFIDENTIAL
  • 7. Analytical Testing Services • Microscopic Imaging Services  • Metals Quality Analysis • Failure Analysis (fractures, delamination &  • ASTM E45, ASTM E2142, ISO 4967 corrosion)  • Materials Testing (ceramics, composites &  • Advanced Quality Control metals)  • ISO 4406, ISO 11171 • Surface Characterization (porosity & grain  • Oil Analysis structure)  • Foreign Particle  Identification • Elemental Composition by X‐Ray  Microanalysis  • Automated Particle Analysis • Contamination Identification  • Characterization (size, shape and  • Surface Composition & Coatings  composition) • Elemental Analysis • Size Distribution • X‐ray mapping, Line Scan, Spot & Area  Microanalysis 
  • 8. ASTM, ISO and USP Standard Services 061 ISO 4406 ‐ Hydraulic and Oil Particle Count Analysis 062 ISO 4406 ‐ with Elemental Composition 063 ISO 11171 ‐ Fluid Cleanliness Analysis 064 ISO 11171 ‐ with Elemental Composition 066 ASTM‐E45 ‐ Inclusion Cleanliness Analysis of Rolled Steel 067 ASTM‐E2142 ‐ Inclusion Cleanliness Analysis of Rolled Steel 068 JIS G 0555 ‐ Inclusion Cleanliness Analysis of Rolled Steel 069 ISO 4967 ‐ Inclusion Cleanliness Analysis of Rolled Steel 070 USP <788> Particulate Matter 071 ASTM Test Method F1877 Life Cycle Testing CONFIDENTIAL
  • 9. General Electron Microscopy Services • Secondary Electron Imaging • Backscatter Electron Imaging • Low‐vacuum Backscatter Electron Imaging • X‐Ray Microanalysis (elemental composition) • Features  (particles or inclusions) characterization • X‐Ray Mapping CONFIDENTIAL
  • 11. INTRODUCTION TO ASPEX TECHNOLOGY Scanning Electron Microscopy and Energy Dispersive Spectrometry February 10, 2012 CONFIDENTIAL
  • 12. SEM‐EDX Information • Secondary Electron Imaging  Topographical/Morphological imaging • Backscatter Electron Imaging  Atomic number based contrast  Low‐vacuum imaging capabilities • SDD for X‐Ray detection  Chemical composition using Energy  Dispersive Spectrometry ASPEX EXPLORER
  • 13. SEM‐EDX Information SECONDARY ELECTRONS • Secondary electrons are inelastically SE scattered. • Incident electron loses much of its energy  to the sample • Weakly bound electrons of the sample are  “boiled‐off”. Nucleus • <50 eV • Topographic information. • SE are drawn to detector with positive  bias. Incident Electron CONFIDENTIAL
  • 14. SEM‐EDX Information APPLICATIONS: HIGH MAGNIFICATION IMAGING • Surface morphology • Shape • Texture • Porosity • Defects CONFIDENTIAL
  • 15. SEM‐EDX Information BACKSCATTERED ELECTRONS Electron Beam BSE • Backscattered electrons are elastically  scattered. • Minimal energy loss. • Large directional change. • >50 eV • Strong correlation with atomic number. Nucleus CONFIDENTIAL
  • 17. SEM‐EDX Information X-RAYS MICROANALYSIS Characteristic X‐Rays are generated in a multi‐step process: • An inner shell electron is knocked out by incoming electron.   • An outer shell electron drops down to fill vacancy. • Energy difference is emitted as a photon. SE Emitted  X‐Ray Nucleus Nucleus Incident  Electron CONFIDENTIAL
  • 18. SEM‐EDX Information ENERGY DISPERSIVE SPECTRUM • Energy of emitted X‐Ray is characteristic of chemical element. • The X‐ray detector collects the X‐rays and results are displayed in a  histogram. • Used to identify  and quantify the elements present in a sample. CONFIDENTIAL
  • 19. SEM‐EDX Information SED BSED EDX Si 1,000 Counts 500 Mn Fe Fe 0 0 1 2 3 4 5 6 7 8 keV • Electron images – How the sample looks? What is the size and shape? • EDX ‐ What the sample is made of? • Complete physical and chemical characterization of materials CONFIDENTIAL
  • 20. Applications SELECTED EXAMPLES OF TESTING SERVICES • Contamination studies in Pharmaceuticals • Particulate Matter Characterization • X‐Ray Mapping • Elemental Distribution in samples • Surface Characterization of Materials • Morphology, porosity, size and shape • Oil Analysis • Characterize wear debris  to understand  wear and tear patterns • Inspection of Medical Devices and Implants • Wear Debris, fractures and failures CONFIDENTIAL
  • 21. Contaminant Particle Found  in a Pharmaceutical Product 200 µm 200 µm SED BSED 800 Br Br C 600 P Counts Cl 400 Ca F 200 O Br 0 0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 keV EDX (Chemical Composition) CONFIDENTIAL
  • 22. Contaminant Particle Found  in a Pharmaceutical Product 500 µm 100 µm Stainless  Steel in raw  material  sample 2,500 2,000 Counts 1,500 Fe Fe Al Cr 1,000 O 500 Ni Si Ni Cr Fe Ni 0 0 1 2 3 4 5 6 7 8 9 10 11 12 keV CONFIDENTIAL
  • 23. X‐Ray Mapping used to evaluate  elemental distribution in samples MAGNESIUM STEARATE 50 µm Sample: Aleve 220 mg Scanning conditions: 10 frames at 1ms/pixel CONFIDENTIAL
  • 24. Surface Characterization: Morphology 100 µm 1000 µm 100 µm 20 µm 20 µm • How clean is your product? • Is your product free of defects? • Are your coatings uniform? • Does your product meet specifications? CONFIDENTIAL
  • 25. Foreign Particles Identified in  Pharmaceutical Products Al 20 µm 20,000 C u ts on Aluminum 10,000 0 0 1 2 3 4 5 6 7 8 9 10 Teflon keV 100 µm 6,000 C u ts on 4,000 Fe Fe Iron 2,000 0 Fe 0 1 2 3 4 5 6 7 8 9 10 keV 200 µm 3,000 C Synthetic C u ts 2,000 on 1,000 O Fibers 0 0 1 2 3 4 5 6 7 8 9 10 keV Si 20 µm 15,000 O Mg C u ts on Talc 10,000 5,000 0 0 1 2 3 4 5 6 7 8 9 10 keV Fe Fe 100 µm 4,000 Stainless C u ts on 2,000 Cr Cr Steel 0 0 1 2 3 4 5 C 6 r Fe 7 8 9 10 keV CONFIDENTIAL
  • 26. Manual Inspection of  Medical Devices Denuded area Coated area Metallic stent with polymer coating CONFIDENTIAL
  • 27. Applications of Automated  SEM‐EDX Technology  WHY USE AUTOMATED SEM-EDX TECHNOLOGY? • To obtain statistically meaningful metrics. • To recognize groupings within a population. • To locate low‐probability features (“needle in haystack”). • To verify absence of contaminants. CONFIDENTIAL
  • 28. Applications of Automated  SEM‐EDX Technology  • For each feature (a particle or material inclusion): • Total number of features per area analyzed • Exact location on specimen to relocate for advanced analysis • Size (average diameter, area) • Shape information (aspect ratio) • BSE contrast level (~average atomic number) • Elemental composition  • Electron Images CONFIDENTIAL
  • 29. How does an automated  SEM‐EDX works? Spectrum Analyzed Composition Determined Particle Identified Iron Rich Class CONFIDENTIAL
  • 30. How does an automated  SEM‐EDX works? WHAT IS USED FOR CHARACTERIZATION? Size and Shape Parameters Elemental Chemistry • Elemental Composition • Average diameter • Maximum Diameter • Minimum Diameter • Aspect Ratio • Area CONFIDENTIAL
  • 31. Applications of automated  SEM‐EDX Technology Understanding Distributions Particle-by-Particle Elemental Composition Rare Feature Location Contamination Studies Specialized QC Investigations CONFIDENTIAL
  • 32. Case 1 PARTICLE COUNT IN PARENTERAL SOLUTIONS • USP Test Chapter <788> – Enumeration standard for foreign particles  – Recommended for particles ≥10 µm and ≥25 µm – Two step inspection:  • light obscuration for inspection with a given set of limits Small Volume Large Volume Parenterals Parenterals <6000 @ 10um <25/ml @ 10um U.S. Pharmacopoeia <600 @ 25um <3/ml @ 25um • microscopy if sample does not pass the limits Small Volume Large Volume Parenterals Parenterals <300 @25 mm <6000 @ 10um <2/mL @ 25 mm <25/ml @ 10um U.S. Pharmacopoeia <3000 @10 mm <600 @ 25um <12/mL @10 m  <3/ml @ 25um – SEM‐EDX analysis provides elemental composition in addition to enumeration CONFIDENTIAL
  • 33. Case 1 PARTICLE COUNT IN PARENTERAL SOLUTIONS E-Beam Analysis is used to understand distributions 195 Particles >10 um 85 Particles >25 um Filter particulate  onto  40 a membrane 35 Scan filter 30 25 Parenteral  Count 20 Solution 15 10 5 0 0-5 10-15 25-30 40-45 55-60 70-75 85-90 100-105 120-125 140-145 DMAX CONFIDENTIAL
  • 34. Case 2 OIL ANALYSIS: UNDERSTANDING KNOWN CONTAMINANTS Filtered solution with know contaminants ready High pressure wash for automated E-beam analysis Manufactured parts CONFIDENTIAL
  • 35. Case 2 OIL ANALYSIS: UNDERSTANDING KNOWN CONTAMINANTS Contour plot of the average elemental composition for each particle type CONFIDENTIAL
  • 36. Case 2 OIL ANALYSIS: UNDERSTANDING KNOWN CONTAMINANTS Particle Size Distributions What do they look like? 90 80 70 Number of Particles 60 Aluminum Al/Cu/Zn Al/Fe 50 Al/Cu/Zn/Fe Aluminum Aggs Misc 40 Misc Metals Titanium and Lead 30 Titanium (Paint) e yp Misc Salts eT 20 Brass icl Bushing rt 10 Fe/Zn/Cu Pa Iron 0 Stainless 20-60 Silicates 60-100 100-150 150-300 300-450 450-600 600-1000 1000-1600 >1600 Particle Size Ranges (micrometers) CONFIDENTIAL
  • 37. Case 2 UNDERSTANDING KNOWN CONTAMINANTS • Assess if your cleaning process is performing as it should.  • You may be producing products that may fail later on  down the line.  • Are you expending too much effort – and money — on  cleaning? • Cleanliness analyzers are resulting in over 30%  reductions in warranty cost  CONFIDENTIAL
  • 38. Case 3 FOREIGN PARTICLE DETECTION • Foreign particle: contaminated particle derived from  active, recipients, containers, formulation,  environment, process of manufacture/actuating drug  device • A number of different regulatory authorities demand  the evaluation of foreign particles in all types of  respiratory drugs. • Number, size,  elemental composition CONFIDENTIAL
  • 39. Case 3 FOREIGN PARTICLE DETECTION Investigation into manufacturing contamination of an  inhalable drug powder Dissolve drug powder and pass through a polycarbonate filter membrane CONFIDENTIAL
  • 40. Case 3 FOREIGN PARTICLE DETECTION Distribution of inhalable drug product on a filter membrane CONFIDENTIAL
  • 41. Case 3 FOREIGN PARTICLE DETECTION Elemental composition table for inhalable drug powder. CONFIDENTIAL
  • 42. Case 3 FOREIGN PARTICLE DETECTION • Relocated Particles  Mica  Quartz  Calcium Rich (precipitates) • Relocated Organic/Carbonaceous  no sample preparation  use Variable Pressure mode  Invert contrast mechanism CONFIDENTIAL
  • 43. Case 4 COATING DURABILITY OF METALS • Characterization of coating durability of implantable  metals • Need to know: How many particles are generated by the  device under typical use? • Problem: Coating is organic, all other particles are  inorganic, or organics with inorganic components. CONFIDENTIAL
  • 44. Case 4 COATING DURABILITY OF METALS Organic Mica Light-on-Dark Dark-on-Light Gold coat Reverse Contrast Aluminum Silica Bead CONFIDENTIAL
  • 45. Case 5 PARTICLE ENUMERATION IN INHALABLE ASTHMA KIT • Active drug processed into a respirable dry powder. The product is  administered with a hand‐held device • Determine origin, profile and number of foreign particle material  in drug powder, packaging and device. • Data was tabulated in the following detection size ranges > 20‐10 mm, 25‐50 mm, 50‐150 mm, 150‐500 mm  > 0‐1 mm, 1‐2 mm, 2‐3 mm, 4‐5 mm, 5‐6 mm, 6‐7 mm, 7‐8 mm, 8‐ 9 mm, 9‐10 mm > >10 mm > >25 mm • Elemental composition data and total particle count CONFIDENTIAL
  • 46. Case 5 PARTICLE ENUMERATION IN INHALABLE ASTHMA KIT DMAX ( m) [0.00 ‐ [1.00 ‐ [2.00 ‐ [5.00 ‐ [10.00 ‐ [25.00 ‐ [50.00 ‐ Classification Total 1.00) 2.00) 5.00) 10.00) 25.00) 50.00) 100.00) Talc 32 Talc 0 5 13 11 3 0 0 Calcium Rich 16 Calcium Rich 0 0 5 7 3 1 0 Aluminum Rich 1 Aluminum Rich 0 0 0 0 1 0 0 Si Rich 106 Si Rich 6 30 38 19 7 0 5 Chromium Rich 0 Chromium Rich 0 0 0 0 0 0 0 Stainless 17 Stainless 2 10 5 0 0 0 0 Iron Rich 49 Iron Rich 10 22 13 4 0 0 0 Misc 23 Misc 1 9 4 4 3 2 0 All particles  244 DAve DMin DMax ASPECT [1.00 ‐ [1.10 ‐ [3.25 ‐ [5.50 ‐ [7.75 ‐ Classification Total m m m RATIO 1.10) 3.25) 5.50) 7.75) 10.00) Aluminum Rich 1 15.2 13.4 17.3 ( m) Talc 0 30 1 1 0 Calcium Rich 16 6.0 4.3 8.0 Calcium Rich 0 13 2 0 1 Chromium Rich 0 Aluminum  Rich 0 1 0 0 0 Iron Rich 49 1.4 0.8 2.2 Si Rich 6 75 13 3 2 Misc 23 5.6 3.9 7.8 Chromium  Rich 0 0 0 0 0 Si Rich 106 3.4 1.7 8.8 Stainless 0 15 1 0 1 Stainless 17 1.1 0.6 1.7 Iron Rich 1 38 8 1 0 Talc 32 3.4 2.2 5.3 Misc 2 18 3 0 0 CONFIDENTIAL
  • 47. Case 5 PARTICLE ENUMERATION IN INHALABLE ASTHMA KIT CONFIDENTIAL
  • 48. Case 6 ACTIVE PHARMACEUTICAL INGREDIENT • API  has significant exposure to FP during dissolution,  filtering, spray drying , milling and blending with  excipients. • If the API is obtained from outside sources, the supplier  should be  included in the control process. API containing Br CONFIDENTIAL
  • 49. Case 6 ACTIVE PHARMACEUTICAL INGREDIENT Particle map showing distribution of API on filter membrane Particle image (thumbnail), percentage composition and EDS spectra of API using ASPEX AFA Data ViewerTM CONFIDENTIAL