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Karakterisasi:
Chemical State
Chemical Composition
X-ray Photoelectron Spectroscopy
XPS, ESCA
MEF 3100 Spring 2007
XPS and AES are surface sensitive
techniques
Photo emission process is often envisaged as
three steps
•Absorption and ionisation - (initial state effect)
•Response from atom and creation of
photoelectron -(final state effect)
•Transport of electron to surface and
escape - (extrinsic loss)
MEF 3100 Spring 2007
XPS – ESCA
MEF 3100 Spring 2007
X-ray Photoelectron Spectroscopy (XPS)
• works by irradiating a sample material with mono
energetic soft X-rays causing electrons to be ejected.
• Identification of the elements in the sample can be made
directly from the kinetic energies of these ejected
photoelectrons.
• The relative concentrations of elements can be determined
from the photoelectron intensities.
MEF 3100 Spring 2007
XPS - ESCA
• Surface sensitive analysis technique based on
photoelectric effect. Depth of analysis ~4-40 nm.
• All elements except Hydrogen.
• Wide range of materials: Polymers, Ceramics,
metals …. (vacuum compatible)
• Applications: corrosion, catalysis, thin films,
surface coatings, segregation …
• Gives information on chemical composition and
chemical state
MEF 3100 Spring 2007
History
• 1887 Heinrich Hertz /1888 Wilhelm Hallwaches
illuminating metal surfaces resulted in electronic emission
• 1900 Max Planck -black body radiation
• 1905 Einstein - light is quantized
E=h
• 1950 Kai Siegbahn 1981 : Nobel Prize
studied photoejection of electrons with x-rays
• 1950: Instrumentation 1960: Chemical Applications
MEF 3100 Spring 2007
Photoelectric effect
Photoelectric effect
Planck's law of black body radiation
electron spectroscopy
Absorbing X-rays – emitting Photoelectrons
MEF 3100 Spring 2007
XPS Peaks
MEF 3100 Spring 2007
Basic equations:
The relationship governing the interaction
of a photon with a core level is:
KE= h - BE – 
• KE = kinetic energy of ejected photoelectron
• h = characteristic energy of X-ray photon
• BE = binding energy of the atomic orbital from which
the electron originates.
•  = spectrometer work function
MEF 3100 Spring 2007
XPS example: Gold
MEF 3100 Spring 2007
Electronic structure and spectroscopy
MEF 3100 Spring 2007
Binding energies?
MEF 3100 Spring 2007
MEF 3100 Spring 2007
MEF 3100 Spring 2007
Spin-Orbit Coupling
965 955 945 935 925
19.8
BindingEnergy(eV)
Cu2p
2p1/2
2p3/2
PeakArea 1 : 2
Orbital=p
ls=1/2,3/2
l=1
s=+/-1/2
MEF 3100 Spring 2007
XPS spectra of Palladium
BE= h - KE – 
MEF 3100 Spring 2007
WHAT IS THIS?
Survey scan : Most elements have major photoelectron peaks below
1100 eV, so a range from 1100 - 0 eV is usually sufficient.
?
Al anode Mg anode
MEF 3100 Spring 2007
MEF 3100 Spring 2007
MEF 3100 Spring 2007
Energy resolution ~1 eV
MEF 3100 Spring 2007
Chemical shift – binding energies in
C 1s peak
MEF 3100 Spring 2007
Chemical shift
Functional
Group
Binding Energy
(eV)
hydrocarbon C-H, C-C 285.0
amine C-N 286.0
alcohol, ether C-O-H, C-O-C 286.5
Cl bound to C C-Cl 286.5
F bound to C C-F 287.8
carbonyl C=O 288.0
MEF 3100 Spring 2007
Chemical shift
MEF 3100 Spring 2007
Inelastic Background
MEF 3100 Spring 2007
Plasmon loss
MEF 3100 Spring 2007
Instrumentation
Surface analysis by XPS requires irradiating
Surface analysis by XPS requires irradiating
a
a solid in an Ultra
solid in an Ultra-
-high Vacuum (UHV)
high Vacuum (UHV)
chamber with monoenergetic soft X
chamber with monoenergetic soft X-
-rays
rays
and analysing the energies of the emitted
and analysing the energies of the emitted
electrons.
electrons.
MEF 3100 Spring 2007
XPS instrument
Kratos Axis Ultra – new in 2007
MEF 3100 Spring 2007
MEF 3100 Spring 2007
Instrument
1. Chambers
2. Vacuum and Pumps
3. Sources
4. Monochromator
5. Analysers
Specimen handling
Planning experiments
MEF 3100 Spring 2007
Dual anode X-ray source
MEF 3100 Spring 2007
Alternative X-ray sources
Monochromator
N =2dsin
For Al K  8.3 Å
_
1010 planes in quartz:
d= 4.25 Å
MEF 3100 Spring 2007
Monochromated X-rays
MEF 3100 Spring 2007
Flooded or focused X-ray beam
MEF 3100 Spring 2007
CHA with standard input lens
MEF 3100 Spring 2007
Pass Energy and Resolution
MEF 3100 Spring 2007
Pass Energy
MEF 3100 Spring 2007
Ion Etching
MEF 3100 Spring 2007
MEF 3100 Spring 2007
MEF 3100 Spring 2007
Survey scan : Most elements have major photoelectron peaks below
1100 eV, so a range from 1100 - 0 eV is usually sufficient.
Al anode Mg anode
?
MEF 3100 Spring 2007
Detail Scans
For purposes of chemical state identification, for quantitative
analysis of minor components and peak deconvolution or other
mathematical manipulation of data.
•Scan should be wide enough to encompass the background on
both sides of the region of interest - yet with small enough step
size - within a reasonable time.
•Radiation-sensitive peaks should be run first.
•Sufficient Signal / noise .
•Pass Energy ?  E same for all scans !
MEF 3100 Spring 2007
MEF 3100 Spring 2007
MEF 3100 Spring 2007
MEF 3100 Spring 2007
MEF 3100 Spring 2007
Oxidation of Titanium
Oxidation of Ti:
Titanium has a big shift. Ti-metal
(Tio) to TiO2
(Ti4+).
Ti 2p-scan of Ti-metal and TiO2
Binding energies:
metal:Ti 2p3/2
=451.4 Ti 2p1/2
=457.57
oxide:Ti 2p3/2
=458.8 Ti 2p1/2
=464.34
1.Not the same shift for the two spin doublets.
2. Metals have more asymmetric peaks than insulators/oxides.
3. Weak peak at 450.7eV - “ghost” -
(X-ray with higher energy = K)
MEF 3100 Spring 2007
Density of state DOS
DOS Ti-metal
Degree of asymmetry proportional to DOS at EF
MEF 3100 Spring 2007
MEF 3100 Spring 2007
Depth information from XPS
MEF 3100 Spring 2007
Depth information from Ag-anode
• Greater analysis depth
The Al 2p spectra shown (Figure 3)
were acquired with
• (a) Al and
• (b) Ag sources. Spectrum
• (b) is a clear illustration of the greater
analysis depth of the Ag source as the
element : oxide ratio is greater than
that acquired with the Al source. An
oxide thickness of 1.8nm indicated
here was confirmed by independent
angle resolved measurements.
MEF 3100 Spring 2007
Binding Energy Referencing
MEF 3100 Spring 2007
BE
BE =
= hv
hv -
- KE
KE -
- 
spec
spec
--E
E
ch
ch
Where:
Where: BE
BE=
= Electron Binding Energy
Electron Binding Energy
KE
KE=
= Electron Kinetic Energy
Electron Kinetic Energy

spec
spec
=
= Spectrometer Work Function
Spectrometer Work Function
E
Ech
ch
=
= Surface Charge Energy
Surface Charge Energy
E
Ech
ch can be determined by calibrating the instrument
can be determined by calibrating the instrument
to a spectral feature.
to a spectral feature.
C1s at 285.0 eV
C1s at 285.0 eV
Au4f
Au4f7/2
7/2 at 84.0 eV
at 84.0 eV
Binding Energy Referencing
When analysing insulating samples more care is required
because of sample charging and the uncertainty in the
location of the Fermi Level within the band gap.
The term Binding energy is often used without specifying
the reference level.
Take care when evaluating spectra !
MEF 3100 Spring 2007
Charge neutralization for insulating samples
• Low-energy electrons from a cold cathode flood gun alleviates positive charging
• Low-energy source of positive ions alleviates the surrounding negative charge
MEF 3100 Spring 2007
Auger parameter
The Auger parameter is defined as:
A.P. = K.E(Auger) - K.E.(photoelectron) + Photon Excitation Energy
= K.E.(Auger) + B.E.(photoemission)
Where K.E.(Auger) and B.E.(photoemission) are normally
measured for the most intense photoemission and
sharpest Auger lines available.
Its advantage as a probe of charges in screening energy is that (unlike photoemission or Auger line measurements
taken separately) it is independent of energy referencing problems whilst still being measurable to a high
precision. Hence small shifts in its value can be measured and interpreted.
MEF 3100 Spring 2007
• http://www.uksaf.org/data/table.html
MEF 3100 Spring 2007
MEF 3100 Spring 2007
Specimen preparation and
handling
MEF 3100 Spring 2007
Analysis of Multi-Layer Paint Cross
Section
MEF 3100 Spring 2007
Analysis of Materials for Solar Energy
Collection by XPS Depth Profiling-
The amorphous-SiC/SnO2
Interface
The profile indicates a reduction of the SnO
The profile indicates a reduction of the SnO2
2
occurred at the interface during deposition.
occurred at the interface during deposition.
Such a reduction would effect the collector’s
Such a reduction would effect the collector’s
efficiency.
efficiency.
Photo
Photo-
-voltaic Collector
voltaic Collector
Conductive Oxide
Conductive Oxide-
- SnO
SnO2
2
p
p--type a
type a-
-SiC
SiC
a
a--Si
Si
Solar Energy
Solar Energy
SnO
SnO2
2
Sn
Sn
Depth
500 496 492 488 484 480
Binding Energy, eV
Data courtesy A. Nurrudin and J. Abelson, University of Illinois
MEF 3100 Spring 2007
Probing Glass Coatings
Windows are coated with complex
Multi-layer thin films to meet demands:
1) Energy conservation
2) Appearance
3) Durability
MEF 3100 Spring 2007
MEF 3100 Spring 2007
XPS Analysis of Pigment from Mummy
Artwork
150 145 140 135 130
Binding Energy (
Binding Energy (eV
eV)
)
PbO2
Pb3
O4
500 400 300 200 100 0
Binding Energy (
Binding Energy (eV
eV)
)
O
Pb Pb
Pb
N
Ca
C
Na
Cl
XPS analysis showed
XPS analysis showed
that the pigment used
that the pigment used
on the mummy
on the mummy
w
wrapping was Pb
rapping was Pb3
3
O
O4
4
rather than Fe
rather than Fe2
2
O
O3
3
Egyptian Mummy
Egyptian Mummy
2nd Century AD
2nd Century AD
World Heritage Museum
World Heritage Museum
University of Illinois
University of Illinois
Databases
MEF 3100 Spring 2007

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4. XPS.pptx

  • 1. Karakterisasi: Chemical State Chemical Composition X-ray Photoelectron Spectroscopy XPS, ESCA
  • 2. MEF 3100 Spring 2007 XPS and AES are surface sensitive techniques
  • 3. Photo emission process is often envisaged as three steps •Absorption and ionisation - (initial state effect) •Response from atom and creation of photoelectron -(final state effect) •Transport of electron to surface and escape - (extrinsic loss) MEF 3100 Spring 2007
  • 4. XPS – ESCA MEF 3100 Spring 2007
  • 5. X-ray Photoelectron Spectroscopy (XPS) • works by irradiating a sample material with mono energetic soft X-rays causing electrons to be ejected. • Identification of the elements in the sample can be made directly from the kinetic energies of these ejected photoelectrons. • The relative concentrations of elements can be determined from the photoelectron intensities. MEF 3100 Spring 2007
  • 6. XPS - ESCA • Surface sensitive analysis technique based on photoelectric effect. Depth of analysis ~4-40 nm. • All elements except Hydrogen. • Wide range of materials: Polymers, Ceramics, metals …. (vacuum compatible) • Applications: corrosion, catalysis, thin films, surface coatings, segregation … • Gives information on chemical composition and chemical state MEF 3100 Spring 2007
  • 7. History • 1887 Heinrich Hertz /1888 Wilhelm Hallwaches illuminating metal surfaces resulted in electronic emission • 1900 Max Planck -black body radiation • 1905 Einstein - light is quantized E=h • 1950 Kai Siegbahn 1981 : Nobel Prize studied photoejection of electrons with x-rays • 1950: Instrumentation 1960: Chemical Applications MEF 3100 Spring 2007 Photoelectric effect Photoelectric effect Planck's law of black body radiation electron spectroscopy
  • 8. Absorbing X-rays – emitting Photoelectrons MEF 3100 Spring 2007
  • 9.
  • 10.
  • 11. XPS Peaks MEF 3100 Spring 2007
  • 12. Basic equations: The relationship governing the interaction of a photon with a core level is: KE= h - BE –  • KE = kinetic energy of ejected photoelectron • h = characteristic energy of X-ray photon • BE = binding energy of the atomic orbital from which the electron originates. •  = spectrometer work function MEF 3100 Spring 2007
  • 13. XPS example: Gold MEF 3100 Spring 2007
  • 14. Electronic structure and spectroscopy MEF 3100 Spring 2007
  • 18. Spin-Orbit Coupling 965 955 945 935 925 19.8 BindingEnergy(eV) Cu2p 2p1/2 2p3/2 PeakArea 1 : 2 Orbital=p ls=1/2,3/2 l=1 s=+/-1/2 MEF 3100 Spring 2007
  • 19. XPS spectra of Palladium BE= h - KE –  MEF 3100 Spring 2007
  • 20. WHAT IS THIS? Survey scan : Most elements have major photoelectron peaks below 1100 eV, so a range from 1100 - 0 eV is usually sufficient. ? Al anode Mg anode MEF 3100 Spring 2007
  • 23. Energy resolution ~1 eV MEF 3100 Spring 2007
  • 24. Chemical shift – binding energies in C 1s peak MEF 3100 Spring 2007
  • 25. Chemical shift Functional Group Binding Energy (eV) hydrocarbon C-H, C-C 285.0 amine C-N 286.0 alcohol, ether C-O-H, C-O-C 286.5 Cl bound to C C-Cl 286.5 F bound to C C-F 287.8 carbonyl C=O 288.0 MEF 3100 Spring 2007
  • 26. Chemical shift MEF 3100 Spring 2007
  • 28. Plasmon loss MEF 3100 Spring 2007
  • 29. Instrumentation Surface analysis by XPS requires irradiating Surface analysis by XPS requires irradiating a a solid in an Ultra solid in an Ultra- -high Vacuum (UHV) high Vacuum (UHV) chamber with monoenergetic soft X chamber with monoenergetic soft X- -rays rays and analysing the energies of the emitted and analysing the energies of the emitted electrons. electrons. MEF 3100 Spring 2007
  • 30. XPS instrument Kratos Axis Ultra – new in 2007 MEF 3100 Spring 2007
  • 31. MEF 3100 Spring 2007 Instrument 1. Chambers 2. Vacuum and Pumps 3. Sources 4. Monochromator 5. Analysers Specimen handling Planning experiments
  • 32. MEF 3100 Spring 2007 Dual anode X-ray source
  • 33. MEF 3100 Spring 2007 Alternative X-ray sources
  • 34. Monochromator N =2dsin For Al K  8.3 Å _ 1010 planes in quartz: d= 4.25 Å MEF 3100 Spring 2007
  • 36. Flooded or focused X-ray beam MEF 3100 Spring 2007
  • 37. CHA with standard input lens MEF 3100 Spring 2007
  • 38. Pass Energy and Resolution MEF 3100 Spring 2007
  • 39. Pass Energy MEF 3100 Spring 2007
  • 40. Ion Etching MEF 3100 Spring 2007
  • 43. Survey scan : Most elements have major photoelectron peaks below 1100 eV, so a range from 1100 - 0 eV is usually sufficient. Al anode Mg anode ? MEF 3100 Spring 2007
  • 44. Detail Scans For purposes of chemical state identification, for quantitative analysis of minor components and peak deconvolution or other mathematical manipulation of data. •Scan should be wide enough to encompass the background on both sides of the region of interest - yet with small enough step size - within a reasonable time. •Radiation-sensitive peaks should be run first. •Sufficient Signal / noise . •Pass Energy ?  E same for all scans ! MEF 3100 Spring 2007
  • 49. Oxidation of Titanium Oxidation of Ti: Titanium has a big shift. Ti-metal (Tio) to TiO2 (Ti4+). Ti 2p-scan of Ti-metal and TiO2 Binding energies: metal:Ti 2p3/2 =451.4 Ti 2p1/2 =457.57 oxide:Ti 2p3/2 =458.8 Ti 2p1/2 =464.34 1.Not the same shift for the two spin doublets. 2. Metals have more asymmetric peaks than insulators/oxides. 3. Weak peak at 450.7eV - “ghost” - (X-ray with higher energy = K) MEF 3100 Spring 2007
  • 50. Density of state DOS DOS Ti-metal Degree of asymmetry proportional to DOS at EF MEF 3100 Spring 2007
  • 52. Depth information from XPS MEF 3100 Spring 2007
  • 53. Depth information from Ag-anode • Greater analysis depth The Al 2p spectra shown (Figure 3) were acquired with • (a) Al and • (b) Ag sources. Spectrum • (b) is a clear illustration of the greater analysis depth of the Ag source as the element : oxide ratio is greater than that acquired with the Al source. An oxide thickness of 1.8nm indicated here was confirmed by independent angle resolved measurements. MEF 3100 Spring 2007
  • 54. Binding Energy Referencing MEF 3100 Spring 2007 BE BE = = hv hv - - KE KE - -  spec spec --E E ch ch Where: Where: BE BE= = Electron Binding Energy Electron Binding Energy KE KE= = Electron Kinetic Energy Electron Kinetic Energy  spec spec = = Spectrometer Work Function Spectrometer Work Function E Ech ch = = Surface Charge Energy Surface Charge Energy E Ech ch can be determined by calibrating the instrument can be determined by calibrating the instrument to a spectral feature. to a spectral feature. C1s at 285.0 eV C1s at 285.0 eV Au4f Au4f7/2 7/2 at 84.0 eV at 84.0 eV
  • 55. Binding Energy Referencing When analysing insulating samples more care is required because of sample charging and the uncertainty in the location of the Fermi Level within the band gap. The term Binding energy is often used without specifying the reference level. Take care when evaluating spectra ! MEF 3100 Spring 2007
  • 56. Charge neutralization for insulating samples • Low-energy electrons from a cold cathode flood gun alleviates positive charging • Low-energy source of positive ions alleviates the surrounding negative charge MEF 3100 Spring 2007
  • 57. Auger parameter The Auger parameter is defined as: A.P. = K.E(Auger) - K.E.(photoelectron) + Photon Excitation Energy = K.E.(Auger) + B.E.(photoemission) Where K.E.(Auger) and B.E.(photoemission) are normally measured for the most intense photoemission and sharpest Auger lines available. Its advantage as a probe of charges in screening energy is that (unlike photoemission or Auger line measurements taken separately) it is independent of energy referencing problems whilst still being measurable to a high precision. Hence small shifts in its value can be measured and interpreted. MEF 3100 Spring 2007
  • 59. MEF 3100 Spring 2007 Specimen preparation and handling
  • 61. Analysis of Multi-Layer Paint Cross Section MEF 3100 Spring 2007
  • 62. Analysis of Materials for Solar Energy Collection by XPS Depth Profiling- The amorphous-SiC/SnO2 Interface The profile indicates a reduction of the SnO The profile indicates a reduction of the SnO2 2 occurred at the interface during deposition. occurred at the interface during deposition. Such a reduction would effect the collector’s Such a reduction would effect the collector’s efficiency. efficiency. Photo Photo- -voltaic Collector voltaic Collector Conductive Oxide Conductive Oxide- - SnO SnO2 2 p p--type a type a- -SiC SiC a a--Si Si Solar Energy Solar Energy SnO SnO2 2 Sn Sn Depth 500 496 492 488 484 480 Binding Energy, eV Data courtesy A. Nurrudin and J. Abelson, University of Illinois MEF 3100 Spring 2007
  • 63. Probing Glass Coatings Windows are coated with complex Multi-layer thin films to meet demands: 1) Energy conservation 2) Appearance 3) Durability MEF 3100 Spring 2007
  • 64. MEF 3100 Spring 2007 XPS Analysis of Pigment from Mummy Artwork 150 145 140 135 130 Binding Energy ( Binding Energy (eV eV) ) PbO2 Pb3 O4 500 400 300 200 100 0 Binding Energy ( Binding Energy (eV eV) ) O Pb Pb Pb N Ca C Na Cl XPS analysis showed XPS analysis showed that the pigment used that the pigment used on the mummy on the mummy w wrapping was Pb rapping was Pb3 3 O O4 4 rather than Fe rather than Fe2 2 O O3 3 Egyptian Mummy Egyptian Mummy 2nd Century AD 2nd Century AD World Heritage Museum World Heritage Museum University of Illinois University of Illinois