I am C.S.Tu

1. Fusion FT Utilization Chart
100.0
90.0
80.0
70.0
60.0
50.0
40.0
30.0
20.0
10.0
0.0
WK303
WK305
WK311
WK313
WK317
WK319
WK321
WK323
WK325
WK327
WK329
WK331
WK333
WK335
WK337
WK339
WK341
WK343
WK345
WK347
WK349
WK403
WK405
WK411
WK301
WK307
WK309
WK315
WK351
WK401
WK407
WK409
WK413
WK415
Planning Utilization (a) Overall Tester Utilization (a)x(b)
Operation Utilization (b) Overall Tester Utilization from Output
Semiconductors, ATO-PSK, Promotion Candidate Overview

2. Fusion WT Utilization Chart
100
90
80
70
60
50
40
30
20
10
0
WK301
WK325
WK328
WK334
WK346
WK406
WK409
WK412
WK304
WK307
WK310
WK313
WK316
WK319
WK322
WK331
WK337
WK340
WK343
WK349
WK352
WK403
WK415
Planning Utilization (a) Overall Tester Utilization (a)x(b)
Operation Utilization (b) Overall Tester Utilization from Output
Semiconductors, ATO-PSK, Promotion Candidate Overview

3. 2004 Actions Planning for System
1. Add one item in check list of PM, Use gauge to check & re-align docking.
(Done at WK412 WTFs.)
2. PECHF will have a trial on Fusion for PECHF high failures improvements.
(Ongoing)
3. OM6357 “Stuck-at ” problem caused by register during production.
(Ongoing)
4. SMS, Open “data_login” function for analysis SMS failure during SMS
calibration (Done WK412.)
5. SMS rev 02 & 03 ex-change because of higher failure rates
(Ongoing “exchange by fail)
Semiconductors, ATO-PSK, Promotion Candidate Overview

4. 5.
Semiconductors, ATO-PSK, Promotion Candidate Overview