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Towards an airborne high temperature SiC inverter
Ampère CNRS UMR 5005
-
Dominique Bergogne, Hervé Morel,
Dominique Planson, Dominique Tournier,
Pascal Bevilacqua, Bruno Allard
-
Hispano-Suiza SAFRAN group
Régis Meuret, Sébastien Vieillard
Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 1 / 28
Overview
1 More Electrical Aircraft
2 Characterizations
3 JFET gate driver
4 Experimental verification
5 Conclusion
Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 2 / 28
More Electrical Aircraft
1 More Electrical Aircraft
2 Characterizations
3 JFET gate driver
4 Experimental verification
5 Conclusion
Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 3 / 28
More Electrical Aircraft
Final target
+ 2 years
Controler + gate driver + inverter up to 200°C
Now : step One
control + driver : 25°C
inverter : 200°C
Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 4 / 28
More Electrical Aircraft
A severe environment
Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 5 / 28
More Electrical Aircraft
Specifications
Stand-by 50 000 hours*
Operation < 1000 hours
Thermal cycles 15000
Thermal cycle -55°C to 200°C
Power range 1-50 kW*
DC input +/- 270V
AC output 230V
Cooling temperature up to 200°C
At now
540VDC
6ARMS per phase
cooling temperature : 200°C
Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 6 / 28
More Electrical Aircraft
Why SiC JFETs ?
Thermal runaway physical limits. SiC limits do not fit within this plot
Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 7 / 28
Characterizations
1 More Electrical Aircraft
2 Characterizations
3 JFET gate driver
4 Experimental verification
5 Conclusion
Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 8 / 28
Characterizations
SiCED JFET
The JFET can be usedwith external free-wheel diode
Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 9 / 28
Characterizations
Effect of temperature : JFET static
Measured at 225°C on one sample JFET*
Saturation current is reduced at high temperature
from 40A at 25°C to 25A at 225°C for this sample device
RDSON varies from 0.2Ω to 0.6Ω
Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 10 / 28
Characterizations
Effect of temperature : JFET dynamic
Power side
Turn-Off losses are almost constant versus temperature
Turn-On losses are reduced from 900uJ to 500uJ
Control side
Gate charge is not affected by temperature
Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 11 / 28
Characterizations
Effect of temperature : inductance
Inductance is not affected, but losses ...
Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 12 / 28
Characterizations
Effect of temperature : capacitor
Capacitance is reduced , series resistance increases (ceramic)
by a factor of 3
Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 13 / 28
Characterizations
Effect of temperature
Conclusion
High Temperature requires specific components/materials
Some characteristics remain constant while ...
Losses, in general, are increased at high temperature (times 10)
Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 14 / 28
JFET gate driver
1 More Electrical Aircraft
2 Characterizations
3 JFET gate driver
4 Experimental verification
5 Conclusion
Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 15 / 28
JFET gate driver
What do we want ?
Fast gate transients for reduced dynamic losses on the power side
Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 16 / 28
JFET gate driver
Driver requirements
Set by JFET (4mm², 1200V)
Maximum gate voltage : -30V
Peak current : 0.5 to 1A
Set by environment
Insulation up to 1000V, high dv/dt
Logic signal input
Several protections
High temperature
Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 17 / 28
JFET gate driver
Gate driver
Gate circuit principle SOI circuit bloc diagram
Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 18 / 28
JFET gate driver
Normal temperature driver
The driver’s fonctions are implemented in a ’cold’ prototype
Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 19 / 28
JFET gate driver
High temperature driver bloc diagram
This driver is compatible with high temperature.
Currently ’under construction’
Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 20 / 28
Experimental verification
1 More Electrical Aircraft
2 Characterizations
3 JFET gate driver
4 Experimental verification
5 Conclusion
Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 21 / 28
Experimental verification
JFET modelling
Simulation output Experimental measurement
This is the primary result on a novel JFET model
Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 22 / 28
Experimental verification
3 phase inverter under test
Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 23 / 28
Experimental verification
Electrical measurements
Gate behaviour
Effect of gate wiring
Power capability : 540VDC bus,
15A peak current at 250°C
Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 24 / 28
Experimental verification
Verification
Verified
Driver and inverter functions
Electrical behaviour of inverter at high temperature
To be Verified
Power losses (calorimetric/thermal measurement)
Electrical behaviour of the system over full temperature range
Thermal cycling mechanical stress effects
Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 25 / 28
Conclusion
1 More Electrical Aircraft
2 Characterizations
3 JFET gate driver
4 Experimental verification
5 Conclusion
Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 26 / 28
Conclusion
Conclusion
What is functionnal ?
Inverter power core functionnal
’Cold’ Driver
To be continued
High temperature driver
Thermal range testing of the system
Mechanical aspects, integration
Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 27 / 28
Conclusion
Thank you for your attention.
Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 28 / 28

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toward high temperature power converters

  • 1. Towards an airborne high temperature SiC inverter Ampère CNRS UMR 5005 - Dominique Bergogne, Hervé Morel, Dominique Planson, Dominique Tournier, Pascal Bevilacqua, Bruno Allard - Hispano-Suiza SAFRAN group Régis Meuret, Sébastien Vieillard Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 1 / 28
  • 2. Overview 1 More Electrical Aircraft 2 Characterizations 3 JFET gate driver 4 Experimental verification 5 Conclusion Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 2 / 28
  • 3. More Electrical Aircraft 1 More Electrical Aircraft 2 Characterizations 3 JFET gate driver 4 Experimental verification 5 Conclusion Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 3 / 28
  • 4. More Electrical Aircraft Final target + 2 years Controler + gate driver + inverter up to 200°C Now : step One control + driver : 25°C inverter : 200°C Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 4 / 28
  • 5. More Electrical Aircraft A severe environment Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 5 / 28
  • 6. More Electrical Aircraft Specifications Stand-by 50 000 hours* Operation < 1000 hours Thermal cycles 15000 Thermal cycle -55°C to 200°C Power range 1-50 kW* DC input +/- 270V AC output 230V Cooling temperature up to 200°C At now 540VDC 6ARMS per phase cooling temperature : 200°C Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 6 / 28
  • 7. More Electrical Aircraft Why SiC JFETs ? Thermal runaway physical limits. SiC limits do not fit within this plot Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 7 / 28
  • 8. Characterizations 1 More Electrical Aircraft 2 Characterizations 3 JFET gate driver 4 Experimental verification 5 Conclusion Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 8 / 28
  • 9. Characterizations SiCED JFET The JFET can be usedwith external free-wheel diode Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 9 / 28
  • 10. Characterizations Effect of temperature : JFET static Measured at 225°C on one sample JFET* Saturation current is reduced at high temperature from 40A at 25°C to 25A at 225°C for this sample device RDSON varies from 0.2Ω to 0.6Ω Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 10 / 28
  • 11. Characterizations Effect of temperature : JFET dynamic Power side Turn-Off losses are almost constant versus temperature Turn-On losses are reduced from 900uJ to 500uJ Control side Gate charge is not affected by temperature Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 11 / 28
  • 12. Characterizations Effect of temperature : inductance Inductance is not affected, but losses ... Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 12 / 28
  • 13. Characterizations Effect of temperature : capacitor Capacitance is reduced , series resistance increases (ceramic) by a factor of 3 Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 13 / 28
  • 14. Characterizations Effect of temperature Conclusion High Temperature requires specific components/materials Some characteristics remain constant while ... Losses, in general, are increased at high temperature (times 10) Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 14 / 28
  • 15. JFET gate driver 1 More Electrical Aircraft 2 Characterizations 3 JFET gate driver 4 Experimental verification 5 Conclusion Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 15 / 28
  • 16. JFET gate driver What do we want ? Fast gate transients for reduced dynamic losses on the power side Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 16 / 28
  • 17. JFET gate driver Driver requirements Set by JFET (4mm², 1200V) Maximum gate voltage : -30V Peak current : 0.5 to 1A Set by environment Insulation up to 1000V, high dv/dt Logic signal input Several protections High temperature Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 17 / 28
  • 18. JFET gate driver Gate driver Gate circuit principle SOI circuit bloc diagram Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 18 / 28
  • 19. JFET gate driver Normal temperature driver The driver’s fonctions are implemented in a ’cold’ prototype Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 19 / 28
  • 20. JFET gate driver High temperature driver bloc diagram This driver is compatible with high temperature. Currently ’under construction’ Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 20 / 28
  • 21. Experimental verification 1 More Electrical Aircraft 2 Characterizations 3 JFET gate driver 4 Experimental verification 5 Conclusion Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 21 / 28
  • 22. Experimental verification JFET modelling Simulation output Experimental measurement This is the primary result on a novel JFET model Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 22 / 28
  • 23. Experimental verification 3 phase inverter under test Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 23 / 28
  • 24. Experimental verification Electrical measurements Gate behaviour Effect of gate wiring Power capability : 540VDC bus, 15A peak current at 250°C Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 24 / 28
  • 25. Experimental verification Verification Verified Driver and inverter functions Electrical behaviour of inverter at high temperature To be Verified Power losses (calorimetric/thermal measurement) Electrical behaviour of the system over full temperature range Thermal cycling mechanical stress effects Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 25 / 28
  • 26. Conclusion 1 More Electrical Aircraft 2 Characterizations 3 JFET gate driver 4 Experimental verification 5 Conclusion Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 26 / 28
  • 27. Conclusion Conclusion What is functionnal ? Inverter power core functionnal ’Cold’ Driver To be continued High temperature driver Thermal range testing of the system Mechanical aspects, integration Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 27 / 28
  • 28. Conclusion Thank you for your attention. Dominique Bergogne (Ampere-lab) PESC’08-Rhodes, June 2008 28 / 28