SPICE MODEL of NJM311M in SPICE PARK. English Version is http://www.spicepark.net. Japanese Version is http://www.spicepark.com by Bee Technologies.

1. Device Modeling Report
COMPONENTS : VOLTAGE COMPARATOR
PART NUMBER : NJM311M
MANUFACTURER : NEW JAPAN RADIO
Bee Technologies Inc.
All Rights Reserved Copyright (c) Bee Technologies Inc. 2004

2. BJT MODEL
Pspice model
Model description
parameter
IS Saturation Current
BF Ideal Maximum Forward Beta
CJC Zero-bias Collector-Base Junction Capacitance
TF Forward Transit Time
TR Reverse Transit Time
DIODE MODEL
Pspice model
Model description
parameter
IS Saturation Current
RS Series Resistance
All Rights Reserved Copyright (c) Bee Technologies Inc. 2004

3. Output Low Voltage
Simulation result
Simulation
Evaluation Circuit
U1
O/GND V+
IN+ O/P
+
II- - BAL/STR
V- BAL
I1 V2
V1
V4 NJM311M
50m
1.55 V3
-15 15
1.56
0
Compasion Table
IO = 50mA Measurement Simulation %Error
Vol (V) 0.75 0.749735 -0.035
All Rights Reserved Copyright (c) Bee Technologies Inc. 2004

4. Response time
Simulation result
OUTPUT
Evaluation Circuit
U3
O/GND V+
IN+ O/P Tr
+
II- - BAL/STR
V- BAL RL1
V7
500
NJM311M
V1 = -5m V5
V2 = 100m V6 V8 15
TD = 0
TR = 0
TF = 0 -15 5
PW = 5u
PER = 10u
0
Compasion Table
Measurement Simulation % Error
Response time (ns) 200 193.370 -3.315
All Rights Reserved Copyright (c) Bee Technologies Inc. 2004

5. Input Offset Voltage Characteristics
Simulation result
Simulation
Evaluation Circuit
U1
output1 O/GND V+
IN+ O/P
+
R1
II- - BAL/STR
1k
V- BAL
NJM311M
V1 V2
V3
-15
15
0
0
Compasion Table
Measurement Simulation %Error
Vio(mV) 2 1.9965 -0.175
All Rights Reserved Copyright (c) Bee Technologies Inc. 2004

6. Av Characteristics
Simulation result
Simulation
Evaluation Circuit
U1
output
O/GND V+
in IN+ O/P
+
II- - BAL/STR
R3
V2
1k V- BAL
1.9965m
NJM311M
V3
V4
V1 15
0Vdc -15
0
Av = 20*LOG(24.880/124.733u) dB
Compasion Table
RL = 1k Measurement Simulation %Error
Av (dB) 106 106 0
All Rights Reserved Copyright (c) Bee Technologies Inc. 2004

7. Input Bias Current Characteristics
Simulation result
Ib
IIO
Evaluation Circuit
U1
O/GND V+ R1
IN+ O/P
+
1k
II- - BAL/STR
V- BAL
NJM311M
V1 V2
V4 V3
-15
0Vdc 0Vdc 15
0
Compasion Table
Measurement Simulation % Error
Ib (nA) 100 100.059 0.059
IIO (nA) 6 6.0075 0.125
All Rights Reserved Copyright (c) Bee Technologies Inc. 2004