1. Recent Successes
128 Channel ATE High Speed ASIC Tester (PCIe x8 Card) 1
Figure 1

2. Flash Memory High Temperature Testing 1
Flash Memory High Temperature Operational Life Testing In Progress

3. General Purpose Long Term ASIC Tester 1

4.  Dual 533MHz ARMCore
o Full SMP EmbeddedLinux Operating System(OpenSource)
o Secure TCP/IPStack (SSH)
o Secure Cloud FileserverCapable
o Programmingwith anyLanguage (Shell,Perl,python,C, etc...)
 GigabitEthernetSecure NetworkInterfacetoFileserver
o Unlimitedtestpattern size
o Unlimiteddatastorage
o UnlimitedTestRuntime
 128G microSD card on BoardStorage (fornon-NetworkOperation)
 16 Channel 1Mhz ADC + 16 Channel 250Khz ADC
 16 Channel DAC
 4 Adjustable DUT PowerSupplies(0.9V-5V/5A)
 160 GPIOTesterchannels (1.2V-3.3V) 100Mhz
 Customizable Xilinx FPGA Core
 Supports:I2C, SPI,JTAG,CAN,USB, UART, etc.
 Dual 48V/30A PWMChannels(Heater,Cooler,etc.)