Apresentação do professor Pedro Grande, da seção UFRGS do Instituto Nacional de Engenharia de Superfície. Palestra convidada do Simpósio Engenharia de Superfície do X Encontro da SBPMAT. Realizada no dia 26 de setembro de 2011 em Gramado (RS).
5. Ion Scattering - MEIS
Improved
H+ depth and mass
resolution
(amorphous)
Surface
sensitivity
(crystal)
6. MEIS - Advantages
Penetrating (can access buried interfaces!)
Mass specific
Known interaction law (cross sections are
known) – quantitative technique – can
determine absolute number of atoms in the
sample
Excellent depth resolution
Non-destructive
7. MEIS data collection Schulte H. (Private communication)
Energy Spectrum Angular Spectrum
Yield
gl g
An ter i n
e
at
Sc
Energy
d
el
Yi
MC ion scattering simulation of
Deconvolution of ES gives depth
angular yield provides surface
profile (primarily for amorphous
structure.
thin films).
8. MEIS Spectrum
3.0
o
2.5 = 60
Counts (arb. units)
2.0
Energy
1.5
1.0
0.5
0.0
Angle 93.0 93.5 94.0 94.5 95.0
proton energy
Summed over 2 degrees around = 60o
9. MEIS user Community
• Depth profiling (amourphous)
•High-k materials
•Thin films
…
• Structural determination
•Heterogeneous catalysis
•Surface reconstruction
…
10. Recent Developments (MEIS)
New detectors (MEIS 3D, TOF-MEIS)
Strain measurements
Organic and biological materials analysis
Better understanding of the energy-loss processes
(ab-inito, simple-models)
Nanoparticle/Nanoislands/Quantum dots analysis
Full description of the 2D MEIS spectrum for crystals
18. Nanoparticles
Full Monte-Carlo Simulation
• any geometrical shape (sphere, cylinder,..)
• density distribution
• size distribution
• asymmetrical lineshape
19. Full 3D Monte-Carlo Integration
Monte-
(PowerMeis program)
E0 Eout
E1 E0 E in
E out K i ( ) E1 E out
E1
27. Polyelectrolyte (PE)
charged polymers
films can be tuned with
desired composition and
thickness
can be deposited onto
different substrates
can be easily removed
after nanomaterials
synthesis
34. Nanoparticle analysis – applications
II – Core-shell characterization of
CdSe/ZnS quantum dots
35. Quantum dots CdSe/ZnS
CdSe/
Nanocrystals
Absorption and emission depends on
composition and size
Higher efficiency in fluorescence process
Thin band gap
36. Core-
Core-shell analysis of CdSe/ZnS
CdSe/
quantum dots
Liquid sample – EviDots
(maple red-orange) in
toluene solution – 2.2
mg/L
Dilutedin toluene at 3.82 g/L
Deposited on SiO2/Si(100) substrate
44. Pb nanoislands at SiO2 / Si
2 D array
SiO2 Si
• Produced by ion implantation (300 keV Pb)
• Thermal annealing : 200oC (100 hours) + 1100oC (1 hour)
• Two SiO2 thicknesses (different etching times)
45 and 65 nm
45. Pb nanoislands : TEM images
Cross-section Plan view
3.7x1011 NPs/cm2
51. TEM plan view
3.7 x 1011 NPs/cm2
MEIS (best fit) (4.5 ± 1.5) x1011 NPs/cm2
52. Where do they deviations come from ?
Multiple Scattering Effects ?
some NPs in Si (bulk)
atomic Pb ?
NP Size Distribution ?
Experimental
1000 Simulation
some NPs in SiO2
Counts (a.u.)
500
0
66 68 70 72 74 76 78 80
Energy (keV)
54. Shape Sensitivity
11 2
2x10 NPs/cm
Experimental
Film
TEM
Sphere
11 2
3.5x10 NPs/cm
Experimental
Film
Counts (a. u.)
TEM
Sphere
11 2
6 x10 NPs/cm
Experimental
Film
TEM
Sphere
68 70 72 74 76 78 80
Counts (a. u.)
D.F. Sanchez et al. Surface Science 605 (2011) 654
55. Nanoparticle analysis – applications
Au (sputtering)
IV – Burried Au NPs
SiO2
sputtering
Si (bulk)
56. Porto Alegre,
Brazil
~40 nm
SiO2 (sputtering)
Au (sputtering)
7.4 × 1015 Au atoms/cm2
SiO2
3.1 × 1015 Au atoms/cm2
Si (bulk)
1.8 × 1015 Au atoms/cm2
56
60. As implanted 1 minute
MEIS → 109º 109º
H+ 150 keV
Scattered Intensity (a. u.)
120º 120º
Lower Hutt, New Zealand
131º
Si 131º
Si Fe
Fe Fe surface
1.0 x 1016 atoms/cm2
132 136 140 144 132 136 140 144
Energy (keV)
Fe
surface
J. Kennedy et. al., Nanotechnology, 22, 115602 (2011) 60
61. Statistics and shape from
TEM as input to obtain
shell stoichiometry from
MEIS analysis
2 Rshell
2 Rcore
61
62. XPS + MEIS/TEM
Fe@FexSi33-xO67
33-
SiO2 density (atoms/cm3)
Fe@Fe14Si19O67
Fe Fe
Si Si
62
63. Simple approach for the
full description of the 2D –MEIS
spectrum-
spectrum- Crystals
66. VEGAS Monte Carlo Simulation
well established in MEIS
just the area of the surface peak
Phit and Pdet
(only the blocking curves !)
66
67. Extending the VEGAS code
to include ion scattered energies
Improve surface determination
•Bimetallic surfaces
•Thermal vibration correlations
•Dechanneling background
68. Energy Loss
single collision
0.020
0.018
0.016
0.014
dP/d E(eV )
0.012
-1
0.010
0.008
0.006
0.004
0.002
0.000
0 50 100 150 200 250 300 350 400 450 500 550 600 68
Energy Transfer ( E) (eV)
69. Cu (111) single crystal
•single atomic type
•very small relaxation
•previously analyzed by MEIS
A,.Hentz et al. PRL 102, 096103 (2009)
77. Summary
MEIS for NP characterization
1) On the surface : Excellent (using asymmetrical lineshape)
2) Buried NPs : sensitivity for the areal density
no sensitivity for the geometrical shape
MS effects are important
78. Summary II
This opens new perspectives for nanostructure analysis in situ that
can of great interest.
Pitfall : Dissolved atomic species affect MEIS analysis
79. Summary III
Simple approach for the full 2D MEIS spectrum (Crystal)
(VEGAS extended)
• Visibility of each layer
• Electronic energy-loss at hard-collision (asymmetric)
• Impact parameter dependent energy-loss
Input parameters : , dE/dx, dW2/dx
Useful to improve surface determination
80. Gregor Schiwietz
Helmholtz-
Helmholtz-Zentrum Berlin
Phil Woodruff Daewon Moon
Warwick KRISS
Mauricio, Dario,Agenor, Paulo, Adriano
Giovanna, Claudio
UFRGS – Porto Alegre
Jêróme Leveneur, John Kennedy,
National Isotope Centre, GNS Science
New Zealand
80