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Recent advances of
MEIS (medium-energy ion scattering)
     (medium-
      for near surface analysis
           Pedro. L. Grande
            (UFRGS-Brazil)
Outline
1.       Introduction (MEIS)

2.       Recent Advances
     •        Nanoparticles (NPs) Analysis
          •      Simple NPs : Au NPs on Polyeletroyides

          •      Core-shell NPs: CdSe

          •      Buried NPs: Pb Nanoisland and Fe NPs

     •        Simple approach for the 2D MEIS spectra for crystal

3.       Conclusions
Techniques
           (Surfaces/Interfaces/Nano)
•XPS
•AES
•LEED
•STM
•Electron microscopic
•EXAFS,
•Raman,
•...   Ion Beam Techniques
Ion Beam Techniques




  http://lnmsf.irb.hr/techniques.htm
Ion Scattering - MEIS
                      Improved

H+                    depth and mass
                      resolution

       (amorphous)




                      Surface
                      sensitivity


          (crystal)
MEIS - Advantages
 Penetrating (can access buried interfaces!)
 Mass specific
 Known interaction law (cross sections are
  known) – quantitative technique – can
  determine absolute number of atoms in the
  sample
 Excellent depth resolution
 Non-destructive
MEIS data collection                                    Schulte H. (Private communication)




    Energy Spectrum                     Angular Spectrum

   Yield




                                                               gl g
                                                            An ter i n
                                                                 e
                                                              at
                                                           Sc
                     Energy




                                        d
                                         el
                                      Yi

                                        MC ion scattering simulation of
   Deconvolution of ES gives depth
                                        angular yield provides surface
   profile (primarily for amorphous
                                        structure.
   thin films).
MEIS Spectrum
                                       3.0


                                                                               o
                                       2.5                              = 60


                 Counts (arb. units)
                                       2.0
Energy




                                       1.5



                                       1.0



                                       0.5



                                       0.0

         Angle                            93.0       93.5        94.0              94.5           95.0

                                                            proton energy

                                             Summed over 2 degrees around                 = 60o
MEIS user Community
  • Depth profiling (amourphous)

      •High-k materials
      •Thin films
  …

  • Structural determination

      •Heterogeneous catalysis
      •Surface reconstruction
  …
Recent Developments (MEIS)
 New detectors (MEIS 3D, TOF-MEIS)

Strain measurements

Organic and biological materials analysis

 Better understanding of the energy-loss processes
            (ab-inito, simple-models)

 Nanoparticle/Nanoislands/Quantum dots analysis

Full description of the 2D MEIS spectrum for crystals
MEIS for Nanoparticles
MEIS Potentiality



            Depth profiling elements
            inside a NP
Energy-
     Energy-loss asymmetry

                            1.5

        Backscattred Ions

                            1.0




                            0.5




                            0.0
                                  60   80       100   120

                                            Energy




Depth profile or energy-loss asymmetry ???
              or energy-
0.020                                                                                                          distributions




                                                                   Investigations on
                                                                                        Exponentially Modified Gaussian (EMG)
                                                                                                                                                                       Moyal

                                                 +
                            M-shell         H (100keV) + Al                                                                                                        f(x) = exp(-(a x + exp(-ax))/2)
                0.015
                                                                                    Gaussian                                                    not Gaussian


                                                                                                                 Exp. decay                                             Exp. decay
  dP/d E(eV )




                        the asymmetry of energy-loss distribution
                                         energy-
  -1




                0.010
                                                                                d                                                                                                                    d
                                                                                                                                                                       Asymmetric Gaussian
                                                                                                                Lognormal




                                                                         (Grande and Schiwietz)
                                                                                     Schiwietz)
                                       L-shell                                                                                  2
                                                                                                           f(x) = exp(-(ln(x)- ) /2
                                                                                                                                      2
                                                                                                                                          )/x

                0.005
                                                                                                                                                               1   2




                0.000
                        0    50   100 150 200 250 300 350 400 450 500 550 600
                                                                                                                                      distributions
                                       Energy Transfer ( E) (eV)




                                  Ab-initio (coupled-channel calculations)

                                  Analytical formula                                                                                                                                                NIMB 256 (2007) 92
                                                                                                                                                                                                     Surface Science 601 (2007)5559
                                                                                                                                                                                                     PRL 102 (2009) 096103


                                  Simple models (CasP program)

P.L. Grande, G. Schiwietz, Ionization and energy loss beyond perturbation theory,
Advances in Quantum Chemistry, Vol 45 (2004) 7-46.
Where does the asymmetry come from ?



       • Statistical : # of collisions
                      correlated or uncorrelated


       • Single hard collision (b ~ 0)
Asymmetry very important
           for ultra-thin films !
               ultra-




Pezzi at al. Surface Science 601 (2007) 5559
Nanoparticle analysis
Nanoparticles
           Full Monte-Carlo Simulation

• any geometrical shape (sphere, cylinder,..)
• density distribution
• size distribution
• asymmetrical lineshape
Full 3D Monte-Carlo Integration
        Monte-
(PowerMeis program)




                              E0    Eout
E1      E0    E in
E out    K i ( ) E1   E out


                               E1
Sample description
PowerMeis GUI
Giant 3D matrix (of matrices)




  Pair correlation function g(r)
Shape sensitivity
Influence of the asymmetry:
       backscattering collision

Au
Nanoparticles
   (asymmetrical lineshape)
                 lineshape)

 Diameter   t > 5nm



 Diameter   t < 5nm


         false geometrical shape
         false size distribution
For the full 2D MEIS spectrum !


                                    Asymmetric                                                                             Gaussian
                                                                                                                     80% 1 nm + 20% 4 nm Au spheres - Gaussian lineshape
                                  1nm Au spheres - EMG lineshape                         1.485E6                                                                                           1.585E6
               99.5                                                                                               99.5
                                                                                         1.392E6                                                                                           1.486E6


                                                                                         1.276E6                                                                                           1.362E6

               99.0                                                                                               99.0
                                                                                         1.160E6                                                                                           1.238E6


                                                                                         1.044E6                                                                                           1.114E6

               98.5                                                                                               98.5                                                                     9.906E5
                                                                                         9.281E5
Energy (keV)




                                                                                                   Energy (keV)
                                                                                                                                                                                           8.668E5
                                                                                         8.121E5

               98.0                                                                                               98.0                                                                     7.430E5
                                                                                         6.961E5

                                                                                                                                                                                           6.191E5
                                                                                         5.801E5
               97.5                                                                                               97.5                                                                     4.953E5
                                                                                         4.641E5

                                                                                                                                                                                           3.715E5
                                                                                         3.480E5
               97.0                                                                                               97.0                                                                     2.477E5
                                                                                         2.320E5

                                                                                                                                                                                           1.238E5
                                                                                         1.160E5
               96.5                                                                                               96.5                                                                     0
                      120   140    160   180   200   220   240   260   280   300   320   0                               120   140   160   180   200   220   240   260   280   300   320
                                               Angle (deg)                                                                                       Angle (deg)
Nanoparticle analysis - applications
    I – Au NPs in polyelectrolytes
          multilayered films
Polyelectrolyte (PE)
   charged polymers
   films can be tuned with
    desired composition and
    thickness
   can be deposited onto
    different substrates
   can be easily removed
    after nanomaterials
    synthesis
Au NPs adsorbed in polyelectrolyte
TEM
NPs on the surface
MEIS results (100 keV         H+)




M.A. Sortica et al. JAP (2009)
Energy spectrum (1D)



      Geometrical shape


      Size distribution



   Good agreement with TEM !


M.A. Sortica et al. JAP (2009)
NP interaction with PE film
 Depends   on both Au colloid and PE assembling
    procedure




   MEIS  characterization of nanoparticles on the PE
    surface
Further MEIS results (100 keV H+)




G. Machado et al. Nanoscale 3, (2011)1717
Nanoparticle analysis – applications
     II – Core-shell characterization of
          CdSe/ZnS quantum dots
Quantum dots CdSe/ZnS
                 CdSe/
 Nanocrystals
   Absorption and  emission depends on
    composition and size
   Higher efficiency in fluorescence process
   Thin band gap
Core-
         Core-shell analysis of CdSe/ZnS
                                CdSe/
         quantum dots

   Liquid sample – EviDots
    (maple red-orange) in
    toluene solution – 2.2
    mg/L



     Dilutedin toluene at 3.82 g/L
     Deposited on SiO2/Si(100) substrate
MEIS analysis (150 keV He+)
MEIS analysis – 3 angles
           400
                                        Cd         Experimental     Cd                      Cd
           350                                     Simulated



           300
                       = 112 degrees             = 120 degrees             = 128 degrees

           250
  Counts




           200


           150                                               Se
                                       Se
                                                                                       Se
           100
                               Zn                       Zn                       Zn
                   S                         S
           50


            0
             100       110   120    130 100      110   120    130    100
                                                                     140   110   120    130      140
                                              Energy (keV)
MEIS analysis




 Core  stoichiometry  Cd0.65Se0.35
 Core diameter  5.0 nm
 Shell stoichiometry  Zn0.41S0.59
 Shell thickness  0.6 nm
40




                                  TEM Results
        30
# NPs




        20




        10




        0
             3   4   5    6   7
                     nm




                 TEM  spatial and size distribution


                 MEIS  core and shell characterization
Dr. DaeWon Moon
Buried Nanoparticles ?
Nanoparticle analysis – applications
          III – Burried Pb NPs
             ion implantation
Pb nanoislands at SiO2 / Si

                                                   2 D array



             SiO2             Si

• Produced by ion implantation (300 keV Pb)
• Thermal annealing : 200oC (100 hours) + 1100oC (1 hour)

• Two SiO2 thicknesses (different etching times)
        45 and 65 nm
Pb nanoislands : TEM images
Cross-section     Plan view




                3.7x1011 NPs/cm2
MEIS results (100 keV         He+)




  thinner (45nm)   thicker (65nm) SiO2
Experiment       Pb Film           Simulations
                                   (PowerMeis program)
                                        Same amount of Pb
                                         3.3 x1022 Pb/cm2

                                  • Film (thickness = 0.7nm)

2x1011 NPs/cm2   6x1011 NPs/cm2   • NPs
                                  1.   V = 350 nm3 (2x1011 NPs/cm2)
                                  2.   V = 100 nm3 (6x1011 NPs/cm2)
Usual data analysis
            60


                   Experiment
                       11      -2
                   2.10 NPs cm
                       11      -2
                   6.10 NPs cm
            40



                  = 130 deg




        S
            20




            0
             60             70              80
                             Energy (keV)
Advanced data analysis
Experimental vs. Simulations

                                                  Experimental
                 1000                             Film
                                                        11      2
                                                  2.0x10 NPs/cm
 Counts (a.u.)


                                                        11      2
                                                  3.5x10 NPs/cm
                                                        11      2
                                                  6.0x10 NPs/cm




                 500




                   0
                    66   68   70     72   74      76      78        80
                                   Energy (keV)
TEM plan view


                  3.7 x 1011 NPs/cm2




MEIS (best fit)        (4.5 ± 1.5) x1011 NPs/cm2
Where do they deviations come from ?
Multiple Scattering Effects ?
some NPs in Si (bulk)
                                                                                         atomic Pb ?

                                                                                         NP Size Distribution ?
                                                                     Experimental
                                   1000                              Simulation
                                                                                         some NPs in SiO2
                   Counts (a.u.)




                                   500




                                     0
                                      66   68   70     72   74      76     78       80
                                                     Energy (keV)
Energy Spectra


MS important for   < 115 deg !
Shape Sensitivity
                                                          11         2
                                                    2x10 NPs/cm

                                                          Experimental
                                                          Film
                                                          TEM
                                                          Sphere




                                                          11         2
                                                   3.5x10 NPs/cm
                                                          Experimental
                                                          Film
              Counts (a. u.)




                                                          TEM
                                                          Sphere




                                                          11         2
                                                    6 x10 NPs/cm

                                                          Experimental
                                                          Film
                                                          TEM
                                                          Sphere




                               68   70   72   74     76        78   80
                                         Counts (a. u.)


D.F. Sanchez et al. Surface Science 605 (2011) 654
Nanoparticle analysis – applications
                                Au (sputtering)

          IV – Burried Au NPs
                                    SiO2
               sputtering


                                 Si (bulk)
Porto Alegre,
                                  Brazil




                                                     ~40 nm
                                SiO2 (sputtering)

                                Au (sputtering)
7.4 ×   1015   Au   atoms/cm2




                                      SiO2


3.1 × 1015 Au atoms/cm2




                                    Si (bulk)

1.8 × 1015 Au atoms/cm2


                                                56
57
44 %


                 9.0 × 1011 NP/cm2
          25s



Au dissolved
into the SiO2



                                     58
Nanoparticle analysis – applications
           V – Burried Fe NPs
               Ion implantation
As implanted                   1 minute
                                                   MEIS →                                                        109º                       109º

                                                   H+ 150 keV




                                                                Scattered Intensity (a. u.)
                                                                                                                 120º                       120º


Lower Hutt, New Zealand

                                                                                              131º
                                                                                                     Si                 131º
                                                                                                                                Si                  Fe
                                                                                                           Fe                         Fe            surface
1.0 x 1016 atoms/cm2


                                                                                              132    136   140    144 132       136   140    144

                                                                                                           Energy (keV)


                                                                                                                  Fe
                                                                                                                  surface




   J. Kennedy et. al., Nanotechnology, 22, 115602 (2011)                                                                                           60
Statistics and shape from
TEM as input to obtain
shell stoichiometry from
MEIS analysis



                            2 Rshell




                                       2 Rcore




                                                 61
XPS + MEIS/TEM


  Fe@FexSi33-xO67
          33-
  SiO2 density (atoms/cm3)




 Fe@Fe14Si19O67


  Fe                Fe


  Si                Si



                             62
Simple approach for the
full description of the 2D –MEIS
        spectrum-
        spectrum- Crystals
Cu(111):[100] In
Blocking curves – Cu(111) surface
VEGAS Monte Carlo Simulation
  well   established in MEIS
          just the area of the surface peak
          Phit and Pdet


 (only the blocking curves !)




                                              66
Extending the VEGAS code
 to include ion scattered energies

Improve surface determination

    •Bimetallic surfaces
    •Thermal vibration correlations
    •Dechanneling background
Energy Loss




                                            single collision
                    0.020

                    0.018

                    0.016

                    0.014
      dP/d E(eV )




                    0.012
      -1




                    0.010

                    0.008

                    0.006

                    0.004

                    0.002

                    0.000
                            0   50   100 150 200 250 300 350 400 450 500 550 600   68
                                          Energy Transfer ( E) (eV)
Cu (111) single crystal


     •single atomic type

     •very small relaxation

     •previously analyzed by MEIS




A,.Hentz et al. PRL 102, 096103 (2009)
Comparison with ab-initio
                  ab-
 energy-
 energy-loss calculations
Skimming Effect
Nice but…
Coupled-channel calculations are
very time consuming !




 A simple model is needed !
Simple Model for the impact
    parameter dependent
   energy loss distribution

            Gaussian( E - Q(b), (b))        b>0
F( E,b) =

               exp(-       E)   ( E) b =0



                  1/   0
Simple model




               Skimming Effect
Experimental Data




                    Simple model
Summary
       MEIS for NP characterization

1) On the surface : Excellent (using asymmetrical lineshape)




2) Buried NPs : sensitivity for the areal density
                 no sensitivity for the geometrical shape
                 MS effects are important
Summary II


   This opens new perspectives for nanostructure analysis in situ that
can of great interest.



   Pitfall : Dissolved atomic species affect MEIS analysis
Summary III

Simple approach for the full 2D MEIS spectrum (Crystal)
                      (VEGAS extended)
 • Visibility of each layer
 • Electronic energy-loss at hard-collision (asymmetric)
 • Impact parameter dependent energy-loss


Input parameters : , dE/dx, dW2/dx

Useful to improve surface determination
Gregor Schiwietz
                                   Helmholtz-
                                   Helmholtz-Zentrum Berlin




                          Phil Woodruff                                      Daewon Moon
                          Warwick                                            KRISS




Mauricio, Dario,Agenor, Paulo, Adriano
Giovanna, Claudio
UFRGS – Porto Alegre
                                                              Jêróme Leveneur, John Kennedy,
                                                              National Isotope Centre, GNS Science
                                                              New Zealand




                                                                                         80
Thank you for your attention !

        Obrigado !

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Recent advances of MEIS for near surface analysis

  • 1. Recent advances of MEIS (medium-energy ion scattering) (medium- for near surface analysis Pedro. L. Grande (UFRGS-Brazil)
  • 2. Outline 1. Introduction (MEIS) 2. Recent Advances • Nanoparticles (NPs) Analysis • Simple NPs : Au NPs on Polyeletroyides • Core-shell NPs: CdSe • Buried NPs: Pb Nanoisland and Fe NPs • Simple approach for the 2D MEIS spectra for crystal 3. Conclusions
  • 3. Techniques (Surfaces/Interfaces/Nano) •XPS •AES •LEED •STM •Electron microscopic •EXAFS, •Raman, •... Ion Beam Techniques
  • 4. Ion Beam Techniques http://lnmsf.irb.hr/techniques.htm
  • 5. Ion Scattering - MEIS Improved H+ depth and mass resolution (amorphous) Surface sensitivity (crystal)
  • 6. MEIS - Advantages  Penetrating (can access buried interfaces!)  Mass specific  Known interaction law (cross sections are known) – quantitative technique – can determine absolute number of atoms in the sample  Excellent depth resolution  Non-destructive
  • 7. MEIS data collection Schulte H. (Private communication) Energy Spectrum Angular Spectrum Yield gl g An ter i n e at Sc Energy d el Yi MC ion scattering simulation of Deconvolution of ES gives depth angular yield provides surface profile (primarily for amorphous structure. thin films).
  • 8. MEIS Spectrum 3.0 o 2.5 = 60 Counts (arb. units) 2.0 Energy 1.5 1.0 0.5 0.0 Angle 93.0 93.5 94.0 94.5 95.0 proton energy Summed over 2 degrees around = 60o
  • 9. MEIS user Community • Depth profiling (amourphous) •High-k materials •Thin films … • Structural determination •Heterogeneous catalysis •Surface reconstruction …
  • 10. Recent Developments (MEIS)  New detectors (MEIS 3D, TOF-MEIS) Strain measurements Organic and biological materials analysis  Better understanding of the energy-loss processes (ab-inito, simple-models)  Nanoparticle/Nanoislands/Quantum dots analysis Full description of the 2D MEIS spectrum for crystals
  • 12. MEIS Potentiality Depth profiling elements inside a NP
  • 13. Energy- Energy-loss asymmetry 1.5 Backscattred Ions 1.0 0.5 0.0 60 80 100 120 Energy Depth profile or energy-loss asymmetry ??? or energy-
  • 14. 0.020 distributions Investigations on Exponentially Modified Gaussian (EMG) Moyal + M-shell H (100keV) + Al f(x) = exp(-(a x + exp(-ax))/2) 0.015 Gaussian not Gaussian Exp. decay Exp. decay dP/d E(eV ) the asymmetry of energy-loss distribution energy- -1 0.010 d d Asymmetric Gaussian Lognormal (Grande and Schiwietz) Schiwietz) L-shell 2 f(x) = exp(-(ln(x)- ) /2 2 )/x 0.005 1 2 0.000 0 50 100 150 200 250 300 350 400 450 500 550 600 distributions Energy Transfer ( E) (eV)  Ab-initio (coupled-channel calculations)  Analytical formula NIMB 256 (2007) 92 Surface Science 601 (2007)5559 PRL 102 (2009) 096103  Simple models (CasP program) P.L. Grande, G. Schiwietz, Ionization and energy loss beyond perturbation theory, Advances in Quantum Chemistry, Vol 45 (2004) 7-46.
  • 15. Where does the asymmetry come from ? • Statistical : # of collisions correlated or uncorrelated • Single hard collision (b ~ 0)
  • 16. Asymmetry very important for ultra-thin films ! ultra- Pezzi at al. Surface Science 601 (2007) 5559
  • 18. Nanoparticles Full Monte-Carlo Simulation • any geometrical shape (sphere, cylinder,..) • density distribution • size distribution • asymmetrical lineshape
  • 19. Full 3D Monte-Carlo Integration Monte- (PowerMeis program) E0 Eout E1 E0 E in E out K i ( ) E1 E out E1
  • 21. Giant 3D matrix (of matrices) Pair correlation function g(r)
  • 23. Influence of the asymmetry: backscattering collision Au
  • 24. Nanoparticles (asymmetrical lineshape) lineshape)  Diameter t > 5nm  Diameter t < 5nm false geometrical shape false size distribution
  • 25. For the full 2D MEIS spectrum ! Asymmetric Gaussian 80% 1 nm + 20% 4 nm Au spheres - Gaussian lineshape 1nm Au spheres - EMG lineshape 1.485E6 1.585E6 99.5 99.5 1.392E6 1.486E6 1.276E6 1.362E6 99.0 99.0 1.160E6 1.238E6 1.044E6 1.114E6 98.5 98.5 9.906E5 9.281E5 Energy (keV) Energy (keV) 8.668E5 8.121E5 98.0 98.0 7.430E5 6.961E5 6.191E5 5.801E5 97.5 97.5 4.953E5 4.641E5 3.715E5 3.480E5 97.0 97.0 2.477E5 2.320E5 1.238E5 1.160E5 96.5 96.5 0 120 140 160 180 200 220 240 260 280 300 320 0 120 140 160 180 200 220 240 260 280 300 320 Angle (deg) Angle (deg)
  • 26. Nanoparticle analysis - applications I – Au NPs in polyelectrolytes multilayered films
  • 27. Polyelectrolyte (PE)  charged polymers  films can be tuned with desired composition and thickness  can be deposited onto different substrates  can be easily removed after nanomaterials synthesis
  • 28. Au NPs adsorbed in polyelectrolyte
  • 29. TEM NPs on the surface
  • 30. MEIS results (100 keV H+) M.A. Sortica et al. JAP (2009)
  • 31. Energy spectrum (1D) Geometrical shape Size distribution Good agreement with TEM ! M.A. Sortica et al. JAP (2009)
  • 32. NP interaction with PE film  Depends on both Au colloid and PE assembling procedure  MEIS  characterization of nanoparticles on the PE surface
  • 33. Further MEIS results (100 keV H+) G. Machado et al. Nanoscale 3, (2011)1717
  • 34. Nanoparticle analysis – applications II – Core-shell characterization of CdSe/ZnS quantum dots
  • 35. Quantum dots CdSe/ZnS CdSe/  Nanocrystals  Absorption and emission depends on composition and size  Higher efficiency in fluorescence process  Thin band gap
  • 36. Core- Core-shell analysis of CdSe/ZnS CdSe/ quantum dots  Liquid sample – EviDots (maple red-orange) in toluene solution – 2.2 mg/L  Dilutedin toluene at 3.82 g/L  Deposited on SiO2/Si(100) substrate
  • 37. MEIS analysis (150 keV He+)
  • 38. MEIS analysis – 3 angles 400 Cd Experimental Cd Cd 350 Simulated 300 = 112 degrees = 120 degrees = 128 degrees 250 Counts 200 150 Se Se Se 100 Zn Zn Zn S S 50 0 100 110 120 130 100 110 120 130 100 140 110 120 130 140 Energy (keV)
  • 39. MEIS analysis  Core stoichiometry  Cd0.65Se0.35  Core diameter  5.0 nm  Shell stoichiometry  Zn0.41S0.59  Shell thickness  0.6 nm
  • 40. 40 TEM Results 30 # NPs 20 10 0 3 4 5 6 7 nm TEM  spatial and size distribution MEIS  core and shell characterization
  • 43. Nanoparticle analysis – applications III – Burried Pb NPs ion implantation
  • 44. Pb nanoislands at SiO2 / Si 2 D array SiO2 Si • Produced by ion implantation (300 keV Pb) • Thermal annealing : 200oC (100 hours) + 1100oC (1 hour) • Two SiO2 thicknesses (different etching times) 45 and 65 nm
  • 45. Pb nanoislands : TEM images Cross-section Plan view 3.7x1011 NPs/cm2
  • 46. MEIS results (100 keV He+) thinner (45nm) thicker (65nm) SiO2
  • 47. Experiment Pb Film Simulations (PowerMeis program) Same amount of Pb 3.3 x1022 Pb/cm2 • Film (thickness = 0.7nm) 2x1011 NPs/cm2 6x1011 NPs/cm2 • NPs 1. V = 350 nm3 (2x1011 NPs/cm2) 2. V = 100 nm3 (6x1011 NPs/cm2)
  • 48. Usual data analysis 60 Experiment 11 -2 2.10 NPs cm 11 -2 6.10 NPs cm 40 = 130 deg S 20 0 60 70 80 Energy (keV)
  • 50. Experimental vs. Simulations Experimental 1000 Film 11 2 2.0x10 NPs/cm Counts (a.u.) 11 2 3.5x10 NPs/cm 11 2 6.0x10 NPs/cm 500 0 66 68 70 72 74 76 78 80 Energy (keV)
  • 51. TEM plan view 3.7 x 1011 NPs/cm2 MEIS (best fit) (4.5 ± 1.5) x1011 NPs/cm2
  • 52. Where do they deviations come from ? Multiple Scattering Effects ? some NPs in Si (bulk) atomic Pb ? NP Size Distribution ? Experimental 1000 Simulation some NPs in SiO2 Counts (a.u.) 500 0 66 68 70 72 74 76 78 80 Energy (keV)
  • 53. Energy Spectra MS important for < 115 deg !
  • 54. Shape Sensitivity 11 2 2x10 NPs/cm Experimental Film TEM Sphere 11 2 3.5x10 NPs/cm Experimental Film Counts (a. u.) TEM Sphere 11 2 6 x10 NPs/cm Experimental Film TEM Sphere 68 70 72 74 76 78 80 Counts (a. u.) D.F. Sanchez et al. Surface Science 605 (2011) 654
  • 55. Nanoparticle analysis – applications Au (sputtering) IV – Burried Au NPs SiO2 sputtering Si (bulk)
  • 56. Porto Alegre, Brazil ~40 nm SiO2 (sputtering) Au (sputtering) 7.4 × 1015 Au atoms/cm2 SiO2 3.1 × 1015 Au atoms/cm2 Si (bulk) 1.8 × 1015 Au atoms/cm2 56
  • 57. 57
  • 58. 44 % 9.0 × 1011 NP/cm2 25s Au dissolved into the SiO2 58
  • 59. Nanoparticle analysis – applications V – Burried Fe NPs Ion implantation
  • 60. As implanted 1 minute MEIS → 109º 109º H+ 150 keV Scattered Intensity (a. u.) 120º 120º Lower Hutt, New Zealand 131º Si 131º Si Fe Fe Fe surface 1.0 x 1016 atoms/cm2 132 136 140 144 132 136 140 144 Energy (keV) Fe surface J. Kennedy et. al., Nanotechnology, 22, 115602 (2011) 60
  • 61. Statistics and shape from TEM as input to obtain shell stoichiometry from MEIS analysis 2 Rshell 2 Rcore 61
  • 62. XPS + MEIS/TEM Fe@FexSi33-xO67 33- SiO2 density (atoms/cm3) Fe@Fe14Si19O67 Fe Fe Si Si 62
  • 63. Simple approach for the full description of the 2D –MEIS spectrum- spectrum- Crystals
  • 65. Blocking curves – Cu(111) surface
  • 66. VEGAS Monte Carlo Simulation  well established in MEIS just the area of the surface peak Phit and Pdet (only the blocking curves !) 66
  • 67. Extending the VEGAS code to include ion scattered energies Improve surface determination •Bimetallic surfaces •Thermal vibration correlations •Dechanneling background
  • 68. Energy Loss single collision 0.020 0.018 0.016 0.014 dP/d E(eV ) 0.012 -1 0.010 0.008 0.006 0.004 0.002 0.000 0 50 100 150 200 250 300 350 400 450 500 550 600 68 Energy Transfer ( E) (eV)
  • 69. Cu (111) single crystal •single atomic type •very small relaxation •previously analyzed by MEIS A,.Hentz et al. PRL 102, 096103 (2009)
  • 70. Comparison with ab-initio ab- energy- energy-loss calculations
  • 72. Nice but… Coupled-channel calculations are very time consuming ! A simple model is needed !
  • 73. Simple Model for the impact parameter dependent energy loss distribution Gaussian( E - Q(b), (b)) b>0 F( E,b) = exp(- E) ( E) b =0 1/ 0
  • 74.
  • 75. Simple model Skimming Effect
  • 76. Experimental Data Simple model
  • 77. Summary MEIS for NP characterization 1) On the surface : Excellent (using asymmetrical lineshape) 2) Buried NPs : sensitivity for the areal density no sensitivity for the geometrical shape MS effects are important
  • 78. Summary II This opens new perspectives for nanostructure analysis in situ that can of great interest. Pitfall : Dissolved atomic species affect MEIS analysis
  • 79. Summary III Simple approach for the full 2D MEIS spectrum (Crystal) (VEGAS extended) • Visibility of each layer • Electronic energy-loss at hard-collision (asymmetric) • Impact parameter dependent energy-loss Input parameters : , dE/dx, dW2/dx Useful to improve surface determination
  • 80. Gregor Schiwietz Helmholtz- Helmholtz-Zentrum Berlin Phil Woodruff Daewon Moon Warwick KRISS Mauricio, Dario,Agenor, Paulo, Adriano Giovanna, Claudio UFRGS – Porto Alegre Jêróme Leveneur, John Kennedy, National Isotope Centre, GNS Science New Zealand 80
  • 81. Thank you for your attention ! Obrigado !