Desktop Converter Test system

1. Desktop ATE for Data Converter
Characterization and Production Testing
Purpose
•Simplicity and efficiency for converter evaluation and low volume production test
•Combining advantage of ATE and bench-top instrument
•Fully coverage of performance, DC and timing parameters
•IEEE 1241, 1658 converter test standard compliance
•Industry open standard hardware interface and software programming environment
•Low initial capital investment with scalability to a 1152-pin SoC tester
Converter testing signal processor
•Support both ADC and DAC testing
•Enable test automation for converter testing using
bench-top instruments
•Customized signal filtering at up-to 4 frequencies for
superior dynamic test performance
•Signal combiner for IMD measurement
•Support ADC aperture jitter measurement
•Single-ended to differential transform
•Dual channel for I/Q converter testing
•Support accurate signal level calibration
Digital and Device Power Supply Unit
System Features
•5-slot AXIe expandable to 28 slots
•Cable or hard docking interface
•DUT power supplies
•32 General purpose Control Bit •8 general purpose Bi-Directional PFI front
•General purpose I2C interface to DUT site panel triggers with programmable thresholds
•Internal 10MHz VCXO or external frequency •4 star distributed internal differential triggers
reference per slot
48-channel Dynamic Digital Subsystem
Pattern Generator Features Timing & Formatting Features
•32M Unrestricted (128M in High Speed •100/200/400 Mvps data rates
Mode) vector memory •32 per pin flexible edge sets
•3 unique 1G SCAN chains per board •32 period sets (10ns to 671mS periods)
•128M digital sample source/capture •127 global timing sets on the fly
memory parallel per channel •Window and strobe compare formats
•Match mode, parallel and serial. •Flexible mixed-signal drive formats
•Flexible micro-instructions supporting •250ps standard timing accuracy
nested loops and subroutines •50ps focused calibration timing accuracy
•Flexible mixed signal triggering
•8-channel granularity of most functions
Per Pin PMU Features
for test & cost efficiency
Driver, Comparator & Load Features •Force Voltage, Measure Current
•Force Current, Measure Voltage
•3 level driver ( Vih, Vil, Vtt) •5 current ranges (2uA to 32mA)
•-2v to +6.0v Range •-2v to +6.0v Range
•Active load up to 12mA source and sink •Hardware measurement averaging &
•Voltage clamps histogram support

2. Polytope Solutions
Your out-of-box solution partner
12-channel Device Power Supply Source & Measurement Unit
Analog Functionality & Features
•16 bit Force Voltage resolution •Window Comparator per Channel
•Measure Voltage 16 Bit •250KHz w/ 1M AWG Source per channel
•Measure Current 16 Bit •250KHz w/ 1M PMU Memory per channel
•-12.0V to +12.0V Range •Multiple Triggering Capability
•0V to +22V Range •Programmable Slew Rates
•6 Current Ranges (25uA to 1.2A) •Programmable load compensation
•Current Clamps and Alarms •User Analog Bus for channel connect flexibility
•Active guard per channel •Gate ON / OFF
•Full Kelvin Sense / Alarm per channel •Built-in Ramp Function
•Channel Ganging •Broadcast mode channel setup
Analog subsystem
Extensive choice of analog/clock source
•PXI or LXI/GPIB bench top instruments
•Vast availability of vendor and large installation base
•Fully integrated with NI virtual instrument driver
•Wide range of performance selection
•Flexibility of system configuration
Tester operating system
Fully Integrated Test Development
•Test programming development
•Test result visualization
•Debug link of test result and test program
•Native multi-site support
•Native multi-threading for shorter test time
•Data converter test signal processing library
Software compatibility
•Microsoft Visual studio .NET
•NI LabWindows/CVI
Polytope Solutions www.ConvertRule.com 17 Orris St, Newton, MA 02466, U.S.A.
phone +1 617 462 6810 +86 150 1048 7717 email: fang.xu@ieee.org