Wafer inspection is the process of examining silicon wafers for defects that could impact integrated circuit performance. It is crucial in California's large semiconductor industry. Wafer inspection utilizes advanced technologies like machine learning, optical systems, electron microscopy, and x-ray inspection to detect even nanoscale imperfections. As the industry drives further miniaturization and new fields like quantum computing emerge, wafer inspection techniques will need to continue advancing to ensure reliable next-generation devices.