STEP Conference 2016: Amir Esmaeil Bozorgzadeh: Saudi vs Iran: a mobile gam...STEP Conference
Amir Esmaeil-Bozorgzadeh of Gameguise takes on the topic of mobile games in Saudi and Iran, two huge markets in the region on the Entertainment stage at STEP Conference 2016, the largest tech event in the Middle East.
Yield improvement of an eeprom for automotive applicationsPete Sarson, PH.D
In order to manufacture high quality and cost effective EEPROMs suitable for automotive under-hood applications several topics must be taken into account. As well as a high reliability EEPROM technology the choice of an advanced memory architecture including ECC and a highly sophisticated screening methodology in production test is necessary to achieve high quality in the field. The EEPROM production test flow must not only be able to screen out weaknesses of the process but must also be cost efficient. A majority of the tests executed in the EEPROM test flow are needed to check the quality of the processed oxides which are the basic elements to realize the EEPROM function of the memory. Most of these tests are complex and time consuming. This work will present an optimization of an existing EEPROM production test flow by means of thorough analysis of the faulty dice and the test flow leading to an increase of the yield without reducing quality.
STEP Conference 2016: Amir Esmaeil Bozorgzadeh: Saudi vs Iran: a mobile gam...STEP Conference
Amir Esmaeil-Bozorgzadeh of Gameguise takes on the topic of mobile games in Saudi and Iran, two huge markets in the region on the Entertainment stage at STEP Conference 2016, the largest tech event in the Middle East.
Yield improvement of an eeprom for automotive applicationsPete Sarson, PH.D
In order to manufacture high quality and cost effective EEPROMs suitable for automotive under-hood applications several topics must be taken into account. As well as a high reliability EEPROM technology the choice of an advanced memory architecture including ECC and a highly sophisticated screening methodology in production test is necessary to achieve high quality in the field. The EEPROM production test flow must not only be able to screen out weaknesses of the process but must also be cost efficient. A majority of the tests executed in the EEPROM test flow are needed to check the quality of the processed oxides which are the basic elements to realize the EEPROM function of the memory. Most of these tests are complex and time consuming. This work will present an optimization of an existing EEPROM production test flow by means of thorough analysis of the faulty dice and the test flow leading to an increase of the yield without reducing quality.