The document provides a summary of Alex de Guzman Ferrer's professional experience and qualifications. It details his current role as a Senior Failure Analysis Engineer at Fairchild Semiconductor Philippines, Inc., where he leads failure analysis projects and ensures enhanced failure analysis procedures. It also outlines his previous roles in failure analysis, reliability engineering, and as a reliability technician at Vishay Philippines and PSI Technologies. His educational background and training in failure analysis and semiconductor reliability are also summarized.

1. ALEX de GUZMAN FERRER
Lot 8, Block 8 Rajah Townhomes, Soong, Lapu-lapu City
Cebu, Philippines
Mobile # (+63) 998-9666621
Email: portialex031002@yahoo.com
PROFESSION:
 REGISTERED ELECTRONICS AND COMMUNICATIONS ENGINEER (0019098)
WORK EXPERIENCE:
FAIRCHILD SEMICONDUCTOR PHILIPPINES, INC.
Senior Failure Analysis Engineer
February 2012 to Present
 Lead FA Laboratory Operation for comprehensive analysis of customer returned parts (PQA), NPI,
Assembly & Test fallouts, Qualification and Reliability Monitoring failures
 Spearhead the team on FA projects, new capabilities, and enhancement of FA processes
 Liaise closely the failure analysis results with internal and external customers
 Ensure enhanced FA procedures by failure modes are applied to determine the failure mechanism of
WLCSP, Analog/Logic, MOSFET, Module, and Automotive devices.
 Review and publish FA reports including Destructive Physical Analysis and Construction Analysis in FA
database
 Knowledge on the analysis of WLCSP, Wire bonded (Gold, Copper, and Aluminum), Ribbon, and Clip
bonded parts
 Formulate decision analysis for the procurement of new or additional equipment
VISHAY (PHILIPPINES), INC.
Failure Analysis and Reliability Engineer
February 2001 - February 2011
 Supervise and conduct failure analysis on Analog IC (AIC) and Discrete (MOSFET and JFET) customer
returned parts, reliability monitoring and qualification tests fallouts, and low yield production lots
 Perform reliability monitoring on all Siliconix products
 Conduct qualification testing for new products and packages
 Provide disposition on assembly/process related issues on Analog IC (AIC), Power IC (PIC), and Military
devices
PSI TECHNOLOGIES, INC
Reliability Technician
July 1999 - January 2001
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2.  Perform loading and unloading of units from life and environmental tests for qualification and reliability
monitoring of Siliconix products
 Prepare monthly report and encode data in Reliability monitoring and Quality database.
 Design program cards for burn-in stress test of integrated circuits.
 Troubleshoot and maintains reliability burn-in boards.
SCHOLASTIC RECORD:
1993-1998 LYCEUM-NORTHWESTERN UNIVERSITY
Graduated with the Degree of Bachelor of Science in Electronics and
Communications Engineering
1989.1993 BINMALEY CATHOLIC HIGH SCHOOL
1983.1989 BINMALEY NORTH ELEMENTARY SCHOOL
PERSONAL DATA:
 Born in Binmaley, Pangasinan on July 20, 1977. Fluent in English and Filipino. Familiar with Microsoft Office
tools.
TRAININGS ATTENDED:
 Energy Dispersive X-ray Fluorescence for material analysis in electronic and semiconductor at Days Hotel
Cebu (Phils) – 2015
 Microelectronic Defects, Fault Isolation, & Failure Analysis in IC Packaging at Acacia Hotel Manila (Phils) -
2014
 Noran System Six (NSS) Energy Dispersive X-ray (EDX) training at Madison, Wisconsin (USA) – 2002
KNOWLEDGEABLE IN THE OPERATION AND APPLICATION OF
FAILURE ANALYSIS & RELIABILITY EQUIPMENT:
 Microprober
• Micromanipulator Model 6000 and Model 8860 Probestation
• Cascade Probestation
 Low and High Power Microscopes
• Olympus SZ61 LPM
• Olympus BX51M, STM6, MX61L HPM
• Nikon LV50 HPM
• Olympus LEXTOLS3100 Laser Microscope
 Decapsulation System
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3. • D Cap d2i Auto Decapsulator
• Decaptech LD-10 Laser Decapper
 Mechanical Decapper for Metal Cans
 Liquid Crystal Analysis / Hotspot Detection
 Dry Etching Using Reactive Ion Etcher
• March Jupiter III RIE
• NSC ES301 RIE
 Polisher / Grinder for Metallography or Cross-sectioning Analysis
• Leco Spectrum System 2000
• Allied Multiprep system
 Scanning Electron Microscope / Energy dispersive X-ray Spectroscopy
• Hitachi S-570/S-3000N SEM with EDX (Kevex/Noran System Six)
• JEOL 5410LV / 6510LV SEM with EDX (Oxford Inca)
 Tektronix 576/370A/371A/371B Curve Tracers
 Precision Semiconductor Parameter Analyzer
• Agilent 4156B
• Keithley 4200
 Misonix Aura-250E Ductless Fume Hood
 Scanning Acoustic Microscopy (SAM)
• Sonoscan D9000
• Sonix Fusion
 X-ray System
• Glenbrook / Softex / Cougar Finefocus
 Perkin Elmer Spectrum 100 and Spotlight 200 Fourier Transform Infrared System
 Finetech Pico Rework/Reball Station
 Jarvis burn-in oven with system monitoring panel / APOEM Oven
 ESPEC HAST system TPC-422M
 Tabai Pressure Cooker TPC-211
 Emitech K550 Gold Ion Sputter / Coater
 Dima SMT Systems Reflow
 Cincinnati Sub-Zero (CSZ) Temperature Cycle
CHARACTER REFERENCES: (Available Upon Request)
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