ECE 663
MOSFET I-Vs
Substrate
Channel Drain
Insulator
Gate
Operation of a transistor
VSG > 0
n type operation
Positive gate bias attracts electrons into channel
Channel now becomes more conductive
More
electrons
Source
VSD
VSG
Some important equations in the
inversion regime (Depth direction)
VT = ms + 2B + ox
Wdm = [2S(2B)/qNA]
Qinv = -Cox(VG - VT)
ox = Qs/Cox
Qs = qNAWdm
VT = ms + 2B + [4SBqNA]/Cox
Substrate
Channel Drain
Insulator
Gate
Source
x
ECE 663
MOSFET Geometry
x
y
z
L
Z
S D
VG
VD
ECE 663
How to include y-dependent potential
without doing the whole problem over?
ECE 663
Assume potential V(y) varies slowly along
channel, so the x-dependent and y-dependent
electrostats are independent
(GRADUAL CHANNEL APPROXIMATION)
i.e.,
Ignore ∂Ex/∂y
Potential is separable in
x and y
ECE 663
How to include y-dependent potentials?
S = 2B + V(y)
VG = S + [2SSqNA]/Cox
Need VG – V(y) > VT to invert
channel at y (V increases
threshold)
Since V(y) largest at drain end, that
end reverts from inversion to
depletion first (Pinch off) 
SATURATION [VDSAT = VG – VT]
j = qninvv = (Qinv/tinv)v
I = jA = jZtinv = ZQinvv
ECE 663
So current:
Qinv = -Cox[VG – VT - V(y)]
v = -effdV(y)/dy
ECE 663
So current:
I = eff ZCox[VG – VT - V(y)]dV(y)/dy
I = eff ZCox[(VG – VT )VD- VD
2
/2]/L
Continuity implies ∫Idy = IL
ECE 663
But this current behaves like a parabola !!
ID
VD
IDsat
VDsat
I = eff ZCox[(VG – VT )VD- VD
2
/2]/L
We have assumed inversion in our model (ie, always above pinch-off)
So we just extend the maximum current into saturation…
Easy to check that above current is maximum for VDsat = VG - VT
Substituting, IDsat = (CoxeffZ/2L)(VG-VT)2
What’s Pinch off?
0
0 0
0
VG VG
Now add in the drain voltage to drive a current. Initially you get
an increasing current with increasing drain bias
0 VD
VG VG
When you reach VDsat = VG – VT, inversion is disabled at the drain
end (pinch-off), but the source end is still inverted
The charges still flow, just that you can’t draw more current
with higher drain bias, and the current saturates
Square law theory of MOSFETs
I = eff ZCox[(VG – VT )VD- VD
2
/2]/L, VD < VG - VT
I = eff ZCox(VG – VT )2
/2L, VD > VG - VT
J = qnv
n ~ Cox(VG – VT )
v ~ effVD /L
NEW
ECE 663
Ideal Characteristics of n-channel
enhancement mode MOSFET
ECE 663
Drain current for REALLY small VD
 
 
 
 
T
G
D
D
T
G
i
n
D
D
D
T
G
i
n
D
V
V
V
V
V
V
C
L
Z
I
V
V
V
V
C
L
Z
I















2
2
1
Linear operation
Channel Conductance:
)
( T
G
i
n
V
D
D
D V
V
C
L
Z
V
I
g
G






Transconductance:
D
i
n
V
G
D
m V
C
L
Z
V
I
g
D





ECE 663
In Saturation
• Channel Conductance:
• Transconductance:
 2
2
T
G
i
n
D V
V
C
L
Z
sat
I 


0




G
V
D
D
D
V
I
g
 
T
G
i
n
V
G
D
m V
V
C
L
Z
V
I
g
D






ECE 663
Equivalent Circuit – Low Frequency AC
• Gate looks like open circuit
• S-D output stage looks like current source with channel
conductance
g
m
d
D
G
V
G
D
D
V
D
D
D
v
g
v
g
i
V
V
I
V
V
I
I
D
G











ECE 663
• Input stage looks like capacitances gate-to-source(gate) and
gate-to-drain(overlap)
• Output capacitances ignored -drain-to-source capacitance
small
Equivalent Circuit – Higher Frequency AC
ECE 663
• Input circuit:
• Input capacitance is mainly gate capacitance
• Output circuit:
  g
gate
g
gd
gs
in v
fC
j
v
C
C
j
i 



 2
g
m
out v
g
i 
gate
m
in
out
fC
g
i
i


2
D
i
n
V
G
D
m V
C
L
Z
V
I
g
D





Equivalent Circuit – Higher Frequency AC
ECE 663
Maximum Frequency (not in saturation)
• Ci is capacitance per unit area and Cgate is total capacitance
of the gate
• F=fmax when gain=1 (iout/iin=1)
2
max
max
2
2
2
L
V
ZL
C
C
V
L
Z
f
C
g
f
D
n
i
i
D
n
gate
m








ZL
C
C i
gate 
ECE 663
Maximum Frequency (not in saturation)
2
max 2 L
V
f D
n



L
V
v
v
L
D /
/
1
max




(Inverse transit time)
NEW
ECE 663
Switching Speed, Power Dissipation
ton = CoxZLVD/ION
Trade-off: If Cox too small, Cs and Cd take over and you lose
control of the channel potential (e.g. saturation)
(DRAIN-INDUCED BARRIER LOWERING/DIBL)
If Cox increases, you want to make sure you don’t control
immobile charges (parasitics) which do not contribute to
current.
ECE 663
Switching Speed, Power Dissipation
Pdyn = ½ CoxZLVD
2
f
Pst = IoffVD
ECE 663
CMOS
NOT gate
(inverter)
ECE 663
CMOS
NOT gate
(inverter)
Positive gate turns nMOS on
Vin = 1 Vout = 0
ECE 663
CMOS
NOT gate
(inverter)
Negative gate turns pMOS on
Vin = 0 Vout = 1
ECE 663
So what?
• If we can create a NOT gate
we can create other gates
(e.g. NAND, EXOR)
ECE 663
So what?
Ring Oscillator
ECE 663
So what?
• More importantly, since one is open and one is shut at steady
state, no current except during turn-on/turn-off
 Low power dissipation
ECE 663
Getting the inverter output
Gain
ON
OFF
ECE 663
0




G
V
D
D
D
V
I
g
 
T
G
i
n
V
G
D
m V
V
C
L
Z
V
I
g
D






What’s the gain here?
ECE 663
Signal Restoration
ECE 663
BJT vs MOSFET
• RTL logic vs CMOS logic
• DC Input impedance of MOSFET (at gate end) is infinite
Thus, current output can drive many inputs  FANOUT
• CMOS static dissipation is low!! ~ IOFFVDD
• Normally BJTs have higher transconductance/current (faster!)
IC = (qni
2
Dn/WBND)exp(qVBE/kT) ID = CoxW(VG-VT) 2
/L
gm = IC/VBE = IC/(kT/q) gm = ID/VG = ID/[(VG-VT)/2]
• Today’s MOSFET ID >> IC due to near ballistic operation
NEW
ECE 663
What if it isn’t ideal?
• If work function differences and oxide charges are present,
threshold voltage is shifted just like for MOS capacitor:
• If the substrate is biased wrt the Source (VBS) the
threshold voltage is also shifted
i
B
A
s
B
i
f
ms
i
B
A
s
B
FB
T
C
qN
C
Q
C
qN
V
V
)
2
(
2
2
)
2
(
2
2




















i
BS
B
A
s
B
FB
T
C
V
qN
V
V
)
2
(
2
2







ECE 663
Threshold Voltage Control
• Substrate Bias:
i
BS
B
A
s
B
FB
T
C
V
qN
V
V
)
2
(
2
2







 
B
BS
B
i
A
s
T
BS
T
BS
T
T
V
C
qN
V
V
V
V
V
V











2
2
2
)
0
(
)
(
ECE 663
Threshold Voltage Control-substrate bias
ECE 663
It also affects the I-V
VG
The threshold voltage is increased due to the depletion region
that grows at the drain end because the inversion layer shrinks
there and can’t screen it any more. (Wd > Wdm)
Qinv = -Cox[VG-VT(y)], I = -effZQinvdV(y)/dy
VT(y) =  + √2sqNA/Cox
 = 2B + V(y)
ECE 663
It also affects the I-V
IL = ∫effZCox[VG – (2B+V) - √2sqNA(2B+V)/Cox]dV
I = (ZeffCox/L)[(VG–2B)VD –VD
2
/2
-2√2sqNA{(2B+VD)3/2
-(2B)3/2
}/3Cox]
ECE 663
We can approximately include this…
Include an additional charge term from the
depletion layer capacitance controlling V(y)
Q = -Cox[VG-VT]+(Cox + Cd)V(y)
where Cd = s/Wdm
Q = -Cox[VG –VT - MV(y)], M = 1 + Cd/Cox
ID = (ZeffCox/L)[(VG-VT - MVD/2)VD]
ECE 663
Comparison between different models
Square Law Theory
Body Coefficient
Bulk Charge Theory
Still not good below threshold or above saturation
ECE 663
Mobility
• Drain current model assumed constant mobility in channel
• Mobility of channel less than bulk – surface scattering
• Mobility depends on gate voltage – carriers in inversion
channel are attracted to gate – increased surface scattering
– reduced mobility
ECE 663
Mobility dependence on gate voltage
)
(
1
0
T
G V
V 





ECE 663
Sub-Threshold Behavior
• For gate voltage less than the threshold – weak inversion
• Diffusion is dominant current mechanism (not drift)
L
L
n
o
n
qAD
y
n
qAD
A
J
I n
n
D
D
)
(
)
( 







kT
V
q
i
kT
q
i
D
B
s
B
s
e
n
L
n
e
n
n
/
)
(
/
)
(
)
(
)
0
(









ECE 663
Sub-threshold
  kT
q
kT
qV
kT
i
n
D
s
D
B
e
e
L
e
n
qAD
I /
/
/
1 





We can approximate s with VG-VT below threshold since all
voltage drops across depletion region
    kT
V
V
q
kT
qV
kT
i
n
D
T
G
D
B
e
e
L
e
n
qAD
I /
/
/
1 





•Sub-threshold current is exponential function of applied gate voltage
•Sub-threshold current gets larger for smaller gates (L)
ECE 663
Subthreshold Characteristic
 
 
G
D V
I
S



log
1
Subthreshold Swing
Tunneling transistor
– Band filter like operation
J Appenzeller et al, PRL ‘04
Ghosh, Rakshit, Datta
(Nanoletters, 2004)
(Sconf)min=2.3(kBT/e).(etox/m)
Hodgkin and Huxley, J. Physiol. 116, 449 (1952a)
Subthreshold slope = (60/Z) mV/decade
Much of new research depends on reducing S !
Much of new research depends on reducing S !
• Increase ‘q’ by collective motion (e.g. relay)
Ghosh, Rakshit, Datta, NL ‘03
• Effectively reduce N through interactions
Salahuddin, Datta
• Negative capacitance
Salahuddin, Datta
• Non-thermionic switching (T-independent)
Appenzeller et al, PRL
• Nonequilibrium switching
Li, Ghosh, Stan
• Impact Ionization
Plummer
ECE 663
More complete model – sub-threshold to
saturation
• Must include diffusion and drift currents
• Still use gradual channel approximation
• Yields sub-threshold and saturation behavior for long
channel MOSFETS
• Exact Charge Model – numerical integration


















D s
B
V
p
p
V
D
n
s
D
p
n
V
F
e
L
L
Z
I
0
0
0
,
,
ECE 663
Exact Charge Model (Pao-Sah)
– Long Channel MOSFET
http://www.nsti.org/Nanotech2006/WCM2006/WCM2006-BJie.pdf
ECE 663

METAL OXIDE FIELD EFFECT SEMICONDUCTOR-MOSFET

  • 1.
  • 2.
    Substrate Channel Drain Insulator Gate Operation ofa transistor VSG > 0 n type operation Positive gate bias attracts electrons into channel Channel now becomes more conductive More electrons Source VSD VSG
  • 3.
    Some important equationsin the inversion regime (Depth direction) VT = ms + 2B + ox Wdm = [2S(2B)/qNA] Qinv = -Cox(VG - VT) ox = Qs/Cox Qs = qNAWdm VT = ms + 2B + [4SBqNA]/Cox Substrate Channel Drain Insulator Gate Source x
  • 4.
  • 5.
    ECE 663 How toinclude y-dependent potential without doing the whole problem over?
  • 6.
    ECE 663 Assume potentialV(y) varies slowly along channel, so the x-dependent and y-dependent electrostats are independent (GRADUAL CHANNEL APPROXIMATION) i.e., Ignore ∂Ex/∂y Potential is separable in x and y
  • 7.
    ECE 663 How toinclude y-dependent potentials? S = 2B + V(y) VG = S + [2SSqNA]/Cox Need VG – V(y) > VT to invert channel at y (V increases threshold) Since V(y) largest at drain end, that end reverts from inversion to depletion first (Pinch off)  SATURATION [VDSAT = VG – VT]
  • 8.
    j = qninvv= (Qinv/tinv)v I = jA = jZtinv = ZQinvv ECE 663 So current: Qinv = -Cox[VG – VT - V(y)] v = -effdV(y)/dy
  • 9.
    ECE 663 So current: I= eff ZCox[VG – VT - V(y)]dV(y)/dy I = eff ZCox[(VG – VT )VD- VD 2 /2]/L Continuity implies ∫Idy = IL
  • 10.
    ECE 663 But thiscurrent behaves like a parabola !! ID VD IDsat VDsat I = eff ZCox[(VG – VT )VD- VD 2 /2]/L We have assumed inversion in our model (ie, always above pinch-off) So we just extend the maximum current into saturation… Easy to check that above current is maximum for VDsat = VG - VT Substituting, IDsat = (CoxeffZ/2L)(VG-VT)2
  • 11.
    What’s Pinch off? 0 00 0 VG VG Now add in the drain voltage to drive a current. Initially you get an increasing current with increasing drain bias 0 VD VG VG When you reach VDsat = VG – VT, inversion is disabled at the drain end (pinch-off), but the source end is still inverted The charges still flow, just that you can’t draw more current with higher drain bias, and the current saturates
  • 12.
    Square law theoryof MOSFETs I = eff ZCox[(VG – VT )VD- VD 2 /2]/L, VD < VG - VT I = eff ZCox(VG – VT )2 /2L, VD > VG - VT J = qnv n ~ Cox(VG – VT ) v ~ effVD /L NEW
  • 13.
    ECE 663 Ideal Characteristicsof n-channel enhancement mode MOSFET
  • 14.
    ECE 663 Drain currentfor REALLY small VD         T G D D T G i n D D D T G i n D V V V V V V C L Z I V V V V C L Z I                2 2 1 Linear operation Channel Conductance: ) ( T G i n V D D D V V C L Z V I g G       Transconductance: D i n V G D m V C L Z V I g D     
  • 15.
    ECE 663 In Saturation •Channel Conductance: • Transconductance:  2 2 T G i n D V V C L Z sat I    0     G V D D D V I g   T G i n V G D m V V C L Z V I g D      
  • 16.
    ECE 663 Equivalent Circuit– Low Frequency AC • Gate looks like open circuit • S-D output stage looks like current source with channel conductance g m d D G V G D D V D D D v g v g i V V I V V I I D G           
  • 17.
    ECE 663 • Inputstage looks like capacitances gate-to-source(gate) and gate-to-drain(overlap) • Output capacitances ignored -drain-to-source capacitance small Equivalent Circuit – Higher Frequency AC
  • 18.
    ECE 663 • Inputcircuit: • Input capacitance is mainly gate capacitance • Output circuit:   g gate g gd gs in v fC j v C C j i      2 g m out v g i  gate m in out fC g i i   2 D i n V G D m V C L Z V I g D      Equivalent Circuit – Higher Frequency AC
  • 19.
    ECE 663 Maximum Frequency(not in saturation) • Ci is capacitance per unit area and Cgate is total capacitance of the gate • F=fmax when gain=1 (iout/iin=1) 2 max max 2 2 2 L V ZL C C V L Z f C g f D n i i D n gate m         ZL C C i gate 
  • 20.
    ECE 663 Maximum Frequency(not in saturation) 2 max 2 L V f D n    L V v v L D / / 1 max     (Inverse transit time) NEW
  • 21.
    ECE 663 Switching Speed,Power Dissipation ton = CoxZLVD/ION Trade-off: If Cox too small, Cs and Cd take over and you lose control of the channel potential (e.g. saturation) (DRAIN-INDUCED BARRIER LOWERING/DIBL) If Cox increases, you want to make sure you don’t control immobile charges (parasitics) which do not contribute to current.
  • 22.
    ECE 663 Switching Speed,Power Dissipation Pdyn = ½ CoxZLVD 2 f Pst = IoffVD
  • 23.
  • 24.
    ECE 663 CMOS NOT gate (inverter) Positivegate turns nMOS on Vin = 1 Vout = 0
  • 25.
    ECE 663 CMOS NOT gate (inverter) Negativegate turns pMOS on Vin = 0 Vout = 1
  • 26.
    ECE 663 So what? •If we can create a NOT gate we can create other gates (e.g. NAND, EXOR)
  • 27.
  • 28.
    ECE 663 So what? •More importantly, since one is open and one is shut at steady state, no current except during turn-on/turn-off  Low power dissipation
  • 29.
    ECE 663 Getting theinverter output Gain ON OFF
  • 30.
    ECE 663 0     G V D D D V I g   T G i n V G D mV V C L Z V I g D       What’s the gain here?
  • 31.
  • 32.
    ECE 663 BJT vsMOSFET • RTL logic vs CMOS logic • DC Input impedance of MOSFET (at gate end) is infinite Thus, current output can drive many inputs  FANOUT • CMOS static dissipation is low!! ~ IOFFVDD • Normally BJTs have higher transconductance/current (faster!) IC = (qni 2 Dn/WBND)exp(qVBE/kT) ID = CoxW(VG-VT) 2 /L gm = IC/VBE = IC/(kT/q) gm = ID/VG = ID/[(VG-VT)/2] • Today’s MOSFET ID >> IC due to near ballistic operation NEW
  • 33.
    ECE 663 What ifit isn’t ideal? • If work function differences and oxide charges are present, threshold voltage is shifted just like for MOS capacitor: • If the substrate is biased wrt the Source (VBS) the threshold voltage is also shifted i B A s B i f ms i B A s B FB T C qN C Q C qN V V ) 2 ( 2 2 ) 2 ( 2 2                     i BS B A s B FB T C V qN V V ) 2 ( 2 2       
  • 34.
    ECE 663 Threshold VoltageControl • Substrate Bias: i BS B A s B FB T C V qN V V ) 2 ( 2 2          B BS B i A s T BS T BS T T V C qN V V V V V V            2 2 2 ) 0 ( ) (
  • 35.
    ECE 663 Threshold VoltageControl-substrate bias
  • 36.
    ECE 663 It alsoaffects the I-V VG The threshold voltage is increased due to the depletion region that grows at the drain end because the inversion layer shrinks there and can’t screen it any more. (Wd > Wdm) Qinv = -Cox[VG-VT(y)], I = -effZQinvdV(y)/dy VT(y) =  + √2sqNA/Cox  = 2B + V(y)
  • 37.
    ECE 663 It alsoaffects the I-V IL = ∫effZCox[VG – (2B+V) - √2sqNA(2B+V)/Cox]dV I = (ZeffCox/L)[(VG–2B)VD –VD 2 /2 -2√2sqNA{(2B+VD)3/2 -(2B)3/2 }/3Cox]
  • 38.
    ECE 663 We canapproximately include this… Include an additional charge term from the depletion layer capacitance controlling V(y) Q = -Cox[VG-VT]+(Cox + Cd)V(y) where Cd = s/Wdm Q = -Cox[VG –VT - MV(y)], M = 1 + Cd/Cox ID = (ZeffCox/L)[(VG-VT - MVD/2)VD]
  • 39.
    ECE 663 Comparison betweendifferent models Square Law Theory Body Coefficient Bulk Charge Theory Still not good below threshold or above saturation
  • 40.
    ECE 663 Mobility • Draincurrent model assumed constant mobility in channel • Mobility of channel less than bulk – surface scattering • Mobility depends on gate voltage – carriers in inversion channel are attracted to gate – increased surface scattering – reduced mobility
  • 41.
    ECE 663 Mobility dependenceon gate voltage ) ( 1 0 T G V V      
  • 42.
    ECE 663 Sub-Threshold Behavior •For gate voltage less than the threshold – weak inversion • Diffusion is dominant current mechanism (not drift) L L n o n qAD y n qAD A J I n n D D ) ( ) (         kT V q i kT q i D B s B s e n L n e n n / ) ( / ) ( ) ( ) 0 (         
  • 43.
    ECE 663 Sub-threshold  kT q kT qV kT i n D s D B e e L e n qAD I / / / 1       We can approximate s with VG-VT below threshold since all voltage drops across depletion region     kT V V q kT qV kT i n D T G D B e e L e n qAD I / / / 1       •Sub-threshold current is exponential function of applied gate voltage •Sub-threshold current gets larger for smaller gates (L)
  • 44.
    ECE 663 Subthreshold Characteristic    G D V I S    log 1 Subthreshold Swing
  • 45.
    Tunneling transistor – Bandfilter like operation J Appenzeller et al, PRL ‘04 Ghosh, Rakshit, Datta (Nanoletters, 2004) (Sconf)min=2.3(kBT/e).(etox/m) Hodgkin and Huxley, J. Physiol. 116, 449 (1952a) Subthreshold slope = (60/Z) mV/decade Much of new research depends on reducing S !
  • 46.
    Much of newresearch depends on reducing S ! • Increase ‘q’ by collective motion (e.g. relay) Ghosh, Rakshit, Datta, NL ‘03 • Effectively reduce N through interactions Salahuddin, Datta • Negative capacitance Salahuddin, Datta • Non-thermionic switching (T-independent) Appenzeller et al, PRL • Nonequilibrium switching Li, Ghosh, Stan • Impact Ionization Plummer
  • 47.
    ECE 663 More completemodel – sub-threshold to saturation • Must include diffusion and drift currents • Still use gradual channel approximation • Yields sub-threshold and saturation behavior for long channel MOSFETS • Exact Charge Model – numerical integration                   D s B V p p V D n s D p n V F e L L Z I 0 0 0 , ,
  • 48.
    ECE 663 Exact ChargeModel (Pao-Sah) – Long Channel MOSFET http://www.nsti.org/Nanotech2006/WCM2006/WCM2006-BJie.pdf
  • 49.