This document summarizes a method for retrieving the electrical and physical properties of dielectric samples using time domain multiple reflection analysis. It presents the theoretical models for computing reflection coefficients and extracting relative permittivity, thickness, conductivity, and loss tangent of samples. Experimental results applying the technique to measure a 2.3 cm thick red granite sample and 2.8 cm thick unknown material at normal and 30 degree oblique incidence are also presented, with low errors between reconstructed and actual properties.