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Device Modeling Report




COMPONENTS:THYRISTOR
PART NUMBER:2S4M
MANUFACTURER: NEC




                 Bee Technologies Inc.


  All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
DIODE MODEL
 Pspice model
                                        Model description
  Parameter
       IS         Saturation Current
       N          Emission Coefficient
      RS          Series Resistance
      IKF         High-injection Knee Current
     CJO          Zero-bias Junction Capacitance
       M          Junction Grading Coefficient
       VJ         Junction Potential
     ISR          Recombination Current Saturation Value
      BV          Reverse Breakdown Voltage(a positive value)
     IBV          Reverse Breakdown Current(a positive value)
       TT         Transit Time




          All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
IG-VT Characteristic

Evaluation Circuit




Simulation result




                                                         Simulation




Comparison Table
                        Measurement                Simulation            % Error
        IGT (uA)         300(max)                    296.000             -1.3333
         VGT (V)          0.8(max)                  0.780101            -2.48738
              All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
ITM-VTM Characteristic

Evaluation Circuit




Simulation result




                                                        Simulation




Comparison Table
        At ITM=4A           Measurement             Simulation           % Error
         VTM(V)               2.2(max)                2.1953            -0.21364

               All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
Holding Characteristic (IH)

Evaluation Circuit




Simulation result




                                                       Simulation




Comparison Table
          VD=6V             Measurement            Simulation            % Error
          IH(mA)              10(max)                9.864               -1.3600

               All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
Switching Time Characteristic

Evaluation Circuit




Simulation result




                                                        Simulation




Comparison Table
                         Measurement             Simulation             %Error
        Ton(us)            2(max)                  2.0456                2.2800
        Toff(us)           15(max)                 15.013               0.08667


               All Rights Reserved Copyright (c) Bee Technologies Inc. 2004

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SPICE MODEL of 2S4M in SPICE PARK

  • 1. Device Modeling Report COMPONENTS:THYRISTOR PART NUMBER:2S4M MANUFACTURER: NEC Bee Technologies Inc. All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
  • 2. DIODE MODEL Pspice model Model description Parameter IS Saturation Current N Emission Coefficient RS Series Resistance IKF High-injection Knee Current CJO Zero-bias Junction Capacitance M Junction Grading Coefficient VJ Junction Potential ISR Recombination Current Saturation Value BV Reverse Breakdown Voltage(a positive value) IBV Reverse Breakdown Current(a positive value) TT Transit Time All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
  • 3. IG-VT Characteristic Evaluation Circuit Simulation result Simulation Comparison Table Measurement Simulation % Error IGT (uA) 300(max) 296.000 -1.3333 VGT (V) 0.8(max) 0.780101 -2.48738 All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
  • 4. ITM-VTM Characteristic Evaluation Circuit Simulation result Simulation Comparison Table At ITM=4A Measurement Simulation % Error VTM(V) 2.2(max) 2.1953 -0.21364 All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
  • 5. Holding Characteristic (IH) Evaluation Circuit Simulation result Simulation Comparison Table VD=6V Measurement Simulation % Error IH(mA) 10(max) 9.864 -1.3600 All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
  • 6. Switching Time Characteristic Evaluation Circuit Simulation result Simulation Comparison Table Measurement Simulation %Error Ton(us) 2(max) 2.0456 2.2800 Toff(us) 15(max) 15.013 0.08667 All Rights Reserved Copyright (c) Bee Technologies Inc. 2004