Device Modeling Report




COMPONENTS:THYRISTOR
PART NUMBER:BT145-800R
MANUFACTURER: PHILIPS SEMICONDUCTOR




                 Bee Technologies Inc.


  All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
DIODE MODEL
 Pspice model
                                        Model description
  Parameter
       IS         Saturation Current
       N          Emission Coefficient
      RS          Series Resistance
      IKF         High-injection Knee Current
     CJO          Zero-bias Junction Capacitance
       M          Junction Grading Coefficient
       VJ         Junction Potential
     ISR          Recombination Current Saturation Value
      BV          Reverse Breakdown Voltage(a positive value)
     IBV          Reverse Breakdown Current(a positive value)
       TT         Transit Time




          All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
IG-VT Characteristic

Evaluation Circuit




Simulation result




                                                            Simulation




Comparison Table
                           Measurement             Simulation           % Error
        IGT (mA)                5                    4.9762            -0.47600
         VGT (V)               0.6                  0.590949           -1.50850

               All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
ITM-VTM Characteristic

Evaluation Circuit




Simulation result




                                                    Simulation




Comparison Table
        At ITM=30A            Measurement            Simulation          % Error
          VTM(V)                  1.1                  1.1375            3.40909

               All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
Holding Characteristic (IH)

Evaluation Circuit




Simulation result




                                                     Simulation




Comparison Table
          VD=12V              Measurement            Simulation           % Error
          IH(mA)                  20                   19.692            -1.54000


               All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
Switching Time Characteristic

Evaluation Circuit




Simulation result




                                         Simulation




Comparison Table
                           Measurement             Simulation           %Error
         Ton(us)                2                    1.9913            -0.43500
         Toff(us)              70                    70.745             1.06429


               All Rights Reserved Copyright (c) Bee Technologies Inc. 2004

SPICE MODEL of BT145-800R in SPICE PARK

  • 1.
    Device Modeling Report COMPONENTS:THYRISTOR PARTNUMBER:BT145-800R MANUFACTURER: PHILIPS SEMICONDUCTOR Bee Technologies Inc. All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
  • 2.
    DIODE MODEL Pspicemodel Model description Parameter IS Saturation Current N Emission Coefficient RS Series Resistance IKF High-injection Knee Current CJO Zero-bias Junction Capacitance M Junction Grading Coefficient VJ Junction Potential ISR Recombination Current Saturation Value BV Reverse Breakdown Voltage(a positive value) IBV Reverse Breakdown Current(a positive value) TT Transit Time All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
  • 3.
    IG-VT Characteristic Evaluation Circuit Simulationresult Simulation Comparison Table Measurement Simulation % Error IGT (mA) 5 4.9762 -0.47600 VGT (V) 0.6 0.590949 -1.50850 All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
  • 4.
    ITM-VTM Characteristic Evaluation Circuit Simulationresult Simulation Comparison Table At ITM=30A Measurement Simulation % Error VTM(V) 1.1 1.1375 3.40909 All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
  • 5.
    Holding Characteristic (IH) EvaluationCircuit Simulation result Simulation Comparison Table VD=12V Measurement Simulation % Error IH(mA) 20 19.692 -1.54000 All Rights Reserved Copyright (c) Bee Technologies Inc. 2004
  • 6.
    Switching Time Characteristic EvaluationCircuit Simulation result Simulation Comparison Table Measurement Simulation %Error Ton(us) 2 1.9913 -0.43500 Toff(us) 70 70.745 1.06429 All Rights Reserved Copyright (c) Bee Technologies Inc. 2004