Retired chairman of Belfort Instrument Co., Bruce R. Robinson also oversaw corporate growth for SCIENTECH, Inc., and Utilipoint International, Inc. Bruce R. Robinson also continues as co-owner and Chairman of GAMMA Scientific Inc.

1. BENEFITS OF THIN
FILM MEASUREMENT
SYSTEMS
By Bruce R. Robinson

2. Introduction
 Retired chairman of Belfort Instrument Co., Bruce R.
Robinson also oversaw corporate growth for
SCIENTECH, Inc., and Utilipoint International, Inc.
Bruce R. Robinson also continues as co-owner and
Chairman of GAMMA Scientific Inc.
Manufacturing spectroradiometers, integrated sphere,
and UDT instruments, GAMMA Scientific recently
introduced its new Thin Film Measurement Systems at
the Society of Vacuum Coaters TechCon in April 2015.
At the Santa Clara Convention Center, attendees
stopped by GAMMA Scientific’s booth to observe
demonstrations of the technology, which expedites
inspections and maximizes production line uptime.

3.  GAMMA Scientific educated the public on the
flexibility of the user interface, its ability to
accommodate multilayer film stacks up to 10
micrometers, and the system’s wavelength
range of 380 to 830 nanometers. Likewise, the
technology leverages surface reflection to
speed up the process of taking spectral
gonioreflectance measurements. This
eliminates the need to blacken or coarse grind
the back side and cut samples to test. To learn
more about the Thin Film Measurement
Systems, visit www.gamma-sci.com.