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ARPES microscopy study on
free standing bilayer graphene
Po-Chun Yeh , Kevin Knox , Wencan Jin , Jerry
Dadap , Philip Kim , Richard M. Osgood
Columbia University
Alexei Barinov, Dudin Pavel
Elettra-Sincrotrone Trieste,Italy
Outline
ā€¢ Goal: To study electronic structure
of free standing graphene
ā€¢ Brief review of our prior monolayer
graphene studies
ā€¢ Bilayer
ā€“ Theory and related studies
ā€“ Sample preparation and apparatus
ā€“ Data analysis
ā€“ Comments
Two Varieties of Graphene
Stormer HL, Kim P
PRL 99, 106802
(2007)
Novoselov KS, Geim AK
22 OCT 2004 VOL 306
SCIENCE
Epitaxial Graphene Exfoliated Graphene
ā€¢ Large-Area coverage
ā€¢ Conducting substrate
ā€¢ Ideal for UHV measurements
ā€¢ Good PE works
ā€¢ High-quality crystals
ā€¢ Insulating substrate
ā€¢ Ideal for transport
measurements
ā€¢ Small sample sizeDe Heer, First, Butler, IBM Geim, Novoselov; Kim
PE work: see LBL Group, Georgia Tech Group, IBM, etc.
For Monolayer Measurements SPELEEM Needed:
For Roughness Data to Improve ARPES
SPELEEM microscope at ELETTRA
ā€¢ Combines microscopy, spectroscopy
ā€¢ High spatial resolution for imaging:
XPEEM (40 nm), LEEM (15 nm)
ā€¢ 2 Ī¼m spot, Ī¼LEED, Ī¼ARPES
ā€¢ 300 meV energy resolution
ā€¢ Noninvasive probe
LEEM autocorrelation
2D Roughness Parameters: Ī¾, w, Ī±
Ī±=0.5
Ī±=0.3
Ī±=0.7
Ī±=0.5
Ī±=0.3
Ī±=0.7
Ī±=0.5
Ī±=0.3
Ī±=0.7
Columbia, ACSNano, 2010Columbia, ACSNano, 2010
Suspended vs Supported ARPES
Š“
M
K
K'
Supported
Graphene
Suspended
Graphene
Columbia, PRB, 2008Columbia, PRB, 2008
Columbia, PRB, 2011Columbia, PRB, 2011
Our measurements show
Ī² = 0.3 fs-1
eV-1
Lifetime = 1/(Ī²*2*(E-
EF)*vF)
=> marginal Fermi liquid
ā€œRemoving Corrugationā€
Yields Lifetime:
Marginal Fermi Liquid
High symmetry points
ā€¢ No SiO2 photoelectrons
ā€¢ Significantly narrower peaks
ā€¢ Possible to measure S(k)
Removing SiO2 Interaction
10Ī¼m
Slope = Ī²
Bilayer Graphene Theory
Bilayer graphene in Bernal stacking
McCannā€™s Tight-binding calculation:
ā€¢ Weak A1B2 coupling, Ī³3 <<VF, negligible
ā€¢ No doping or external fields
ā€¢Small band asymmetry
ā€¢ Near K point
- L. M. Malard et al., PRB 76, 201401 (2007)
-T. Ohta et al., Science 313, 951 (2006)
-S. Y. Zhou et al., Nature Materials 6, (2007)
-A.B. Kuzmenko et al., PRB 79, 115441 (2009)
-C. Z. Q. Li et al., PRL 102, 037403 (2009)
-E. McCann et al., PRL 96, 086805 (2006).
Interlayer Hopping Energy
Tight-binding approach by McCann
Important works & people
Interlayer
asymmetry, Ī”
ā€¢ 300nm thick SiO2 on intrinsic Si substrate
ā€¢ No substrate doping
ā€¢ Mechanical exfoliation
ā€¢ Free standing on 5Ī¼m wells
ā€¢ Shadow mask Au/Cr deposition, no photoresist
ā€¢ Overnight thermal radiation cleaning
ā€¢ Well defined layers, single domain
Sample Preparation
(Left) Optical
microscopy image
(Right)Spatially-resolved
photoemission image:
angle integrated mode at
15eV electron kinetic
energy, by
Spectromicroscopy.
1
2
3
4
Monolayer
Bilayer
1
2
3
4
10Ī¼m
ā€¢ Study the band structure and the Fermi surface
topography
ā€¢ Temperature: 110K to 300K
ā€¢ Beam size: 0.6 - 1Ī¼m
ā€¢ Photon energy: 27eV
ā€¢ Momentum resolution: 2.7mƅ-1
ā€¢ Energy resolution: 33meV
SpectroMicroscopy at Elettra :
Microscope + Monochromator
-P. Dudin et al., J. Synchrotron Rad. (2010) 17
Cryostat
Electron
Analyzer
Sample
Counter
Source
Frequency
selection
Schwarzschild
objective
Elettra Sincrotrone,
Trieste, Italy
K// (ƅ-1
)E-EF(eV)
Ī”,
Ī³1
Data Handling
Processing and Fitting
ā€¢ Coordinate transforms
angles to k//
ā€¢ Resize the data into a
nonzero matrix
ā€¢ EDC* Peak fitting to find K
point, Fermi Energy, and Ļ€
bands
ā€¢ Use 2nd
derivative to find
initial values for fitting
ā€¢ Least square method and
bilayer graphene theory
ā€¢ Band gap, Fermi velocity,
binding energy Ī³1, and
lifetime can be established
ā€¢ 3 samples
ā€¢ 110 ā€“ 300K
ā€¢ UHV
EDCs
*EDC: Energy Distribution Curve
Mā€™KĪ“
Fermi Cutoff and Spatial Resolution
EDC*s fit at K point with
Lorentzian function
convoluted with Fermi
function:
T=110K
T=300K
Room temperature, 300K
2nd
Derivative2nd
Derivative Peak Fitting
ā€¢ 2nd
derivative help locates the two bands
ā€¢ Parabolic ā€“ linear feature of bilayer is clear
ā€¢ Dirac point is close to Fermi level within min energy resolution
ā€¢ Parabolic region ~ Ā±0.5 ƅ-1
Mā€™KĪ“
Low Temperature, 110K
Peak Fitting2nd
Derivative
ā€¢ Lowering temperature removes background noise
ā€¢ Sharper bands
ā€¢ Interlayer hopping and band gaps are not temperature
dependent, as theory predicted
Mā€™KĪ“
Results of Fitting for Exfoliated Gr
Fit the Ļ€ bands with the tight binding model:
A
300K
A
110K
B C D E
VF
(106
m/s)
1.042
Ā±0.018
1.003
Ā±0.013
* 1.1 1 1 ~ 1.1
Ī”/2
(meV)
48.0
Ā±13.4
56.2
Ā±9.4
0 40 -0.05 ~
0.1
Variable
Ī³1
(eV)
0.6
Ā±0.017
0.611
Ā±0.007
0.378
Ā±0.005
0.404
Ā±0.01
0.41 ~
0.46
0.36 ~
0.45
A. Our ARPES measurement
B. Infrared measurement on SiO2/Si, doped, 10K
C. Infrared measurement on SiO2/Si, doped, 45K
D. ARPES measurement on SiC, doped
E. McCannā€™s tight binding calculation
References:
B. A.B. Kuzmenko et al., PRB 79, 115441 (2009)
C. Z. Q. Li et al., PRL 102, 037403 (2009)
D. T. Ohta et al., Science 313, 951 (2006)
E. McCann et al., PRL 96, 086805 (2006).
* Not provided.
Summary and Direction
ļƒ¼Characteristics
ļƒ¼ Fermi velocity, VF
ļƒ¼ Interlayer asymmetry, Ī”
ļƒ¼ Interlayer coupling, Ī³1
ā€“ Strain ?
ā€“ > 2ML ā€“ data looks too clean for this.
ā€“ Additional measurements
ļƒ¼Zero-to-minimally-doped graphene measured
ā€¢ Chemical doping experiments needed
ā€¢ Surface corrugation and width broadening
ā€¢ Band asymmetry and renormalization
Thank you
L. M. Malard et al., PRB 76, 201401 (2007)
Raman
From graphite theory paper:
Will optical measurement changes the Ī³1 ?
Ī³1 ~0.7eV, VF = 8x105
Cited by A.B. Kuzmenko et al., PRB 79, 115441 (2009), IR study
0.377eV in graphite -D.D. L. Chung, J. Mater. Sci. 37, 1475 (2002)
ARPES Lanzaraā€™s paper: 0.35eV
We shouldnā€™t be looking
at thin graphite, since the
Ī³1 decreases when
number of layers
increases.
Results of Fitting for Exfoliated Gr
Normal Temperature
ā€¢ Ī”/2 = 48.0Ā±13.4meV
ā€¢ Ī³1 = 0.6Ā±0.017eV
ā€¢ VF = (1.042Ā±0.018)x106
m/s
Low Temperature
ā€¢ Ī”/2 = 56.2Ā±9.4meV
ā€¢ Ī³1 = 0.611Ā±0.007eV
ā€¢ VF = (1.003Ā±0.013)x106
m/s
ARPES results, fit the Ļ€ bands with McCannā€™s model:
ā€¢ Ī” = 0
ā€¢ Ī”ā€™ = 15Ā±5meV
ā€¢ Ī³1 = 0.378Ā±0.005eV
ā€¢ Ī³4 = 0.12eV
ā€¢ VF = Not provided
IR, exfoliated, n-doped, 10K
SiC, K doped
ā€¢ Ī” = -0.1 ā€“ 0.2 meV
ā€¢ Ī³1 = 0.41 ā€“ 0.46 eV
ā€¢ VF = 1x106
m/s
ā€¢ Ī” = variable
ā€¢ Ī³1 = 0.36 ā€“ 0.45eV
ā€¢ VF = (1 ā€“ 1.1)x106
m/s
McCannā€™s theory
IR, 45K, band asymmetry
ā€¢ Ī”/2 < 40meV
ā€¢ Ī”ā€™ = 18Ā±2meV
ā€¢ Ī³1 = 0.404Ā±0.01, 0.450eV
ā€¢ Ī³4 = 0.04eV
ā€¢ VF = 1.1x106
m/s
A.B. Kuzmenko et al., PRB 79, 115441 (2009) Z. Q. Li et al., PRL 102, 037403 (2009)
E. McCann et al., PRL 96, 086805 (2006).T. Ohta et al., Science 313, 951 (2006)
Bilayer graphene ARPES studies
T. Ohta et al., Science 313, 951 (2006) S. Y. Zhou et al., Nature Materials 6, (2007)
Graphene on SiC: a very specific case
Rotenbergā€™s Group Lanzaraā€™s Group
Linewidth broadening
ā€¢ Quasiparticle's lifetime is inversely
proportional to the linewidth(FWHM) in Breit-
Wigner line shape.
ā€¢ Linewidth are affected by two major effects:
Corrugation broadening and intrinsic
broadening.
ā€¢ In bilayer graphene, we should expect a mild
corrugation broadening.
Corrugation Broadening
ā€¢ Surface roughness of the graphene sample
provides ripples with phase shift as a wave in
a continuum.
ā€¢ Electron scattering
ā€¢ Corrugation parameters: Ī¾, Ļ‰, and Ī±; acquire
from LEEM and LEED measurement.
ā€¢ Calculation:
A~ Lorentzian, obtainable by fitting MDCs.
Intrinsic Broadening
ā€¢ Changes with different photon energies.
ā€¢ Since graphene is a 2D crystal, the valence
band initial states are highly localized along z
direction ā€“ band structure is kz independent,
thus it will not change with different photon
energy.
ā€¢ We have only one photon energy 27eV.
Sample Preparation
ā€¢ Mechanical Exfoliation
ā€¢ 300nm thick SiO2 on intrinsic Si
ā€¢ Shadow mask Au deposition, no photoresist
Optical microscopy image
1
2
3
4
Monolayer
Bilayer
1
2
3
4
10Ī¼m
Energy(eV)
degree
GK
K// (ƅ-1
)
E-EF(eV)
ā€¢ 3 samples
ā€¢ Range of temperature: 110 ā€“300K
ā€¢ UHV
Data Handling
Ī”, Ī³1
1
2
3
4
olayer
er
1
2
10Ī¼m
300K 110Kb) c) d)
Mā€™KĪ“ MKĪ“
Photoemission
microscopy
Bilayer
Dispersion of trilayer measured
with photon energy 74eV
Trilayer @ room temperature
with photon energy 74 eV
ļƒ˜ According to the band
structure, the sample is doped
in the fabrication process. We
can see part of the conduction
band and the gap value is
about 350 meV.
ļƒ˜ This is the band structure
along Ī“-K direction. The
dispersion is strong on one
side with a small tail on the
other side. This is consistent
with our previous theoretical
calculation.

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APS march meeting 2012

  • 1. ARPES microscopy study on free standing bilayer graphene Po-Chun Yeh , Kevin Knox , Wencan Jin , Jerry Dadap , Philip Kim , Richard M. Osgood Columbia University Alexei Barinov, Dudin Pavel Elettra-Sincrotrone Trieste,Italy
  • 2. Outline ā€¢ Goal: To study electronic structure of free standing graphene ā€¢ Brief review of our prior monolayer graphene studies ā€¢ Bilayer ā€“ Theory and related studies ā€“ Sample preparation and apparatus ā€“ Data analysis ā€“ Comments
  • 3. Two Varieties of Graphene Stormer HL, Kim P PRL 99, 106802 (2007) Novoselov KS, Geim AK 22 OCT 2004 VOL 306 SCIENCE Epitaxial Graphene Exfoliated Graphene ā€¢ Large-Area coverage ā€¢ Conducting substrate ā€¢ Ideal for UHV measurements ā€¢ Good PE works ā€¢ High-quality crystals ā€¢ Insulating substrate ā€¢ Ideal for transport measurements ā€¢ Small sample sizeDe Heer, First, Butler, IBM Geim, Novoselov; Kim PE work: see LBL Group, Georgia Tech Group, IBM, etc.
  • 4. For Monolayer Measurements SPELEEM Needed: For Roughness Data to Improve ARPES SPELEEM microscope at ELETTRA ā€¢ Combines microscopy, spectroscopy ā€¢ High spatial resolution for imaging: XPEEM (40 nm), LEEM (15 nm) ā€¢ 2 Ī¼m spot, Ī¼LEED, Ī¼ARPES ā€¢ 300 meV energy resolution ā€¢ Noninvasive probe LEEM autocorrelation 2D Roughness Parameters: Ī¾, w, Ī± Ī±=0.5 Ī±=0.3 Ī±=0.7 Ī±=0.5 Ī±=0.3 Ī±=0.7 Ī±=0.5 Ī±=0.3 Ī±=0.7 Columbia, ACSNano, 2010Columbia, ACSNano, 2010
  • 5. Suspended vs Supported ARPES Š“ M K K' Supported Graphene Suspended Graphene Columbia, PRB, 2008Columbia, PRB, 2008 Columbia, PRB, 2011Columbia, PRB, 2011 Our measurements show Ī² = 0.3 fs-1 eV-1 Lifetime = 1/(Ī²*2*(E- EF)*vF) => marginal Fermi liquid ā€œRemoving Corrugationā€ Yields Lifetime: Marginal Fermi Liquid High symmetry points ā€¢ No SiO2 photoelectrons ā€¢ Significantly narrower peaks ā€¢ Possible to measure S(k) Removing SiO2 Interaction 10Ī¼m Slope = Ī²
  • 6. Bilayer Graphene Theory Bilayer graphene in Bernal stacking McCannā€™s Tight-binding calculation: ā€¢ Weak A1B2 coupling, Ī³3 <<VF, negligible ā€¢ No doping or external fields ā€¢Small band asymmetry ā€¢ Near K point - L. M. Malard et al., PRB 76, 201401 (2007) -T. Ohta et al., Science 313, 951 (2006) -S. Y. Zhou et al., Nature Materials 6, (2007) -A.B. Kuzmenko et al., PRB 79, 115441 (2009) -C. Z. Q. Li et al., PRL 102, 037403 (2009) -E. McCann et al., PRL 96, 086805 (2006). Interlayer Hopping Energy Tight-binding approach by McCann Important works & people Interlayer asymmetry, Ī”
  • 7. ā€¢ 300nm thick SiO2 on intrinsic Si substrate ā€¢ No substrate doping ā€¢ Mechanical exfoliation ā€¢ Free standing on 5Ī¼m wells ā€¢ Shadow mask Au/Cr deposition, no photoresist ā€¢ Overnight thermal radiation cleaning ā€¢ Well defined layers, single domain Sample Preparation (Left) Optical microscopy image (Right)Spatially-resolved photoemission image: angle integrated mode at 15eV electron kinetic energy, by Spectromicroscopy. 1 2 3 4 Monolayer Bilayer 1 2 3 4 10Ī¼m
  • 8. ā€¢ Study the band structure and the Fermi surface topography ā€¢ Temperature: 110K to 300K ā€¢ Beam size: 0.6 - 1Ī¼m ā€¢ Photon energy: 27eV ā€¢ Momentum resolution: 2.7mƅ-1 ā€¢ Energy resolution: 33meV SpectroMicroscopy at Elettra : Microscope + Monochromator -P. Dudin et al., J. Synchrotron Rad. (2010) 17 Cryostat Electron Analyzer Sample Counter Source Frequency selection Schwarzschild objective Elettra Sincrotrone, Trieste, Italy
  • 9. K// (ƅ-1 )E-EF(eV) Ī”, Ī³1 Data Handling Processing and Fitting ā€¢ Coordinate transforms angles to k// ā€¢ Resize the data into a nonzero matrix ā€¢ EDC* Peak fitting to find K point, Fermi Energy, and Ļ€ bands ā€¢ Use 2nd derivative to find initial values for fitting ā€¢ Least square method and bilayer graphene theory ā€¢ Band gap, Fermi velocity, binding energy Ī³1, and lifetime can be established ā€¢ 3 samples ā€¢ 110 ā€“ 300K ā€¢ UHV EDCs *EDC: Energy Distribution Curve Mā€™KĪ“
  • 10. Fermi Cutoff and Spatial Resolution EDC*s fit at K point with Lorentzian function convoluted with Fermi function: T=110K T=300K
  • 11. Room temperature, 300K 2nd Derivative2nd Derivative Peak Fitting ā€¢ 2nd derivative help locates the two bands ā€¢ Parabolic ā€“ linear feature of bilayer is clear ā€¢ Dirac point is close to Fermi level within min energy resolution ā€¢ Parabolic region ~ Ā±0.5 ƅ-1 Mā€™KĪ“
  • 12. Low Temperature, 110K Peak Fitting2nd Derivative ā€¢ Lowering temperature removes background noise ā€¢ Sharper bands ā€¢ Interlayer hopping and band gaps are not temperature dependent, as theory predicted Mā€™KĪ“
  • 13. Results of Fitting for Exfoliated Gr Fit the Ļ€ bands with the tight binding model: A 300K A 110K B C D E VF (106 m/s) 1.042 Ā±0.018 1.003 Ā±0.013 * 1.1 1 1 ~ 1.1 Ī”/2 (meV) 48.0 Ā±13.4 56.2 Ā±9.4 0 40 -0.05 ~ 0.1 Variable Ī³1 (eV) 0.6 Ā±0.017 0.611 Ā±0.007 0.378 Ā±0.005 0.404 Ā±0.01 0.41 ~ 0.46 0.36 ~ 0.45 A. Our ARPES measurement B. Infrared measurement on SiO2/Si, doped, 10K C. Infrared measurement on SiO2/Si, doped, 45K D. ARPES measurement on SiC, doped E. McCannā€™s tight binding calculation References: B. A.B. Kuzmenko et al., PRB 79, 115441 (2009) C. Z. Q. Li et al., PRL 102, 037403 (2009) D. T. Ohta et al., Science 313, 951 (2006) E. McCann et al., PRL 96, 086805 (2006). * Not provided.
  • 14. Summary and Direction ļƒ¼Characteristics ļƒ¼ Fermi velocity, VF ļƒ¼ Interlayer asymmetry, Ī” ļƒ¼ Interlayer coupling, Ī³1 ā€“ Strain ? ā€“ > 2ML ā€“ data looks too clean for this. ā€“ Additional measurements ļƒ¼Zero-to-minimally-doped graphene measured ā€¢ Chemical doping experiments needed ā€¢ Surface corrugation and width broadening ā€¢ Band asymmetry and renormalization
  • 16. L. M. Malard et al., PRB 76, 201401 (2007) Raman From graphite theory paper: Will optical measurement changes the Ī³1 ? Ī³1 ~0.7eV, VF = 8x105 Cited by A.B. Kuzmenko et al., PRB 79, 115441 (2009), IR study 0.377eV in graphite -D.D. L. Chung, J. Mater. Sci. 37, 1475 (2002) ARPES Lanzaraā€™s paper: 0.35eV We shouldnā€™t be looking at thin graphite, since the Ī³1 decreases when number of layers increases.
  • 17. Results of Fitting for Exfoliated Gr Normal Temperature ā€¢ Ī”/2 = 48.0Ā±13.4meV ā€¢ Ī³1 = 0.6Ā±0.017eV ā€¢ VF = (1.042Ā±0.018)x106 m/s Low Temperature ā€¢ Ī”/2 = 56.2Ā±9.4meV ā€¢ Ī³1 = 0.611Ā±0.007eV ā€¢ VF = (1.003Ā±0.013)x106 m/s ARPES results, fit the Ļ€ bands with McCannā€™s model: ā€¢ Ī” = 0 ā€¢ Ī”ā€™ = 15Ā±5meV ā€¢ Ī³1 = 0.378Ā±0.005eV ā€¢ Ī³4 = 0.12eV ā€¢ VF = Not provided IR, exfoliated, n-doped, 10K SiC, K doped ā€¢ Ī” = -0.1 ā€“ 0.2 meV ā€¢ Ī³1 = 0.41 ā€“ 0.46 eV ā€¢ VF = 1x106 m/s ā€¢ Ī” = variable ā€¢ Ī³1 = 0.36 ā€“ 0.45eV ā€¢ VF = (1 ā€“ 1.1)x106 m/s McCannā€™s theory IR, 45K, band asymmetry ā€¢ Ī”/2 < 40meV ā€¢ Ī”ā€™ = 18Ā±2meV ā€¢ Ī³1 = 0.404Ā±0.01, 0.450eV ā€¢ Ī³4 = 0.04eV ā€¢ VF = 1.1x106 m/s A.B. Kuzmenko et al., PRB 79, 115441 (2009) Z. Q. Li et al., PRL 102, 037403 (2009) E. McCann et al., PRL 96, 086805 (2006).T. Ohta et al., Science 313, 951 (2006)
  • 18. Bilayer graphene ARPES studies T. Ohta et al., Science 313, 951 (2006) S. Y. Zhou et al., Nature Materials 6, (2007) Graphene on SiC: a very specific case Rotenbergā€™s Group Lanzaraā€™s Group
  • 19. Linewidth broadening ā€¢ Quasiparticle's lifetime is inversely proportional to the linewidth(FWHM) in Breit- Wigner line shape. ā€¢ Linewidth are affected by two major effects: Corrugation broadening and intrinsic broadening. ā€¢ In bilayer graphene, we should expect a mild corrugation broadening.
  • 20. Corrugation Broadening ā€¢ Surface roughness of the graphene sample provides ripples with phase shift as a wave in a continuum. ā€¢ Electron scattering ā€¢ Corrugation parameters: Ī¾, Ļ‰, and Ī±; acquire from LEEM and LEED measurement. ā€¢ Calculation: A~ Lorentzian, obtainable by fitting MDCs.
  • 21. Intrinsic Broadening ā€¢ Changes with different photon energies. ā€¢ Since graphene is a 2D crystal, the valence band initial states are highly localized along z direction ā€“ band structure is kz independent, thus it will not change with different photon energy. ā€¢ We have only one photon energy 27eV.
  • 22. Sample Preparation ā€¢ Mechanical Exfoliation ā€¢ 300nm thick SiO2 on intrinsic Si ā€¢ Shadow mask Au deposition, no photoresist Optical microscopy image 1 2 3 4 Monolayer Bilayer 1 2 3 4 10Ī¼m
  • 23. Energy(eV) degree GK K// (ƅ-1 ) E-EF(eV) ā€¢ 3 samples ā€¢ Range of temperature: 110 ā€“300K ā€¢ UHV Data Handling Ī”, Ī³1
  • 26. Trilayer @ room temperature with photon energy 74 eV ļƒ˜ According to the band structure, the sample is doped in the fabrication process. We can see part of the conduction band and the gap value is about 350 meV. ļƒ˜ This is the band structure along Ī“-K direction. The dispersion is strong on one side with a small tail on the other side. This is consistent with our previous theoretical calculation.

Editor's Notes

  1. Emphasize free standing/ suspended.
  2. To provide context, I am going to give a brief review of ā€¦
  3. Donā€™t say ā€œrecentā€ work.
  4. Ref: low energy electron microscope (LEEM) and energy filtered x-ray photoemission electron microscope (XPEEM.)
  5. Imaginary part of internal energy v.s. binding energy - &amp;gt; slope = Ī²
  6. Backup knowledge: Bernal stacking, tight-binding theory, assumptionsā€¦ Remake the band structure to emphasize the zero gap case
  7. Donā€™t over emphasize on the energy resolution. Say it has ten times higher resolution than SPELEEM, and it can let us look at the band structure around the K point.
  8. Stress on data handling requires a series of processing Points: 2nd derivativeā€¦ and Least square value
  9. Chirp by Fermi Function.
  10. 1. Symmetry mismatch in sample and the incoming light; the optical matrix and the sample matrix are different.
  11. There is a small band gap in our data, but it is within our error bar Ī³1 is sample dependent. (From Kuzmenkoā€™s paper.)
  12. Explanations: 1. 2.
  13. The bang gap falls into our minimum energy resolution, so we are not sure if thereā€™s actually a very small gap or no gap. (Intrinsic band gap?) How all these compare to SiC data? IR data? Ī³1 is sample dependent. (From Kuzmenkoā€™s paper.)
  14. Breaks A-B symmetry, creating a band gap Effect of layer inequivalence Suspension eliminate most of the unwanted scattering mechanisms enhancing the effect of electron-electron interaction, which makes bands anisotropic, or directionally dependent.