1. Sam Broyles
sam.broyles@gmail.com
214 697 6562
Profile Experienced electrical engineer specializing in manufacturing test of integrated
circuits, printed circuit board assemblies, and finished product assemblies.
Broad test platform experience, including traditional laboratory instrumentation,
Automated Test Equipment (ATE), and custom Functional Test Systems.
Developed hardware and test programs for testing ICs with Automated Test
Equipment. Designed bed-of-nails test fixtures, integrated test instrumentation,
and developed test programs using National Instruments LabVIEW and
TestStand for Functional Test Systems.
Business experience includes project proposals, project management,
employee management, and sales support. Project leadership includes
managing schedule, budget, contractors, vendors, scope creep, and changing
deadlines of multiple parallel projects.
Education Master of Engineering, Electrical Engineering Program for Semiconductor
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Product Engineering, Texas Tech University, Aug. 2000.
Bachelor of Science, majors in Mathematics and Manufacturing Engineering
Technology, minor in Chemistry, Midwestern State University, May 1998,
Magna Cum Laude.
Experience Staff Test Engineer: O&S Services. Contracting for local product development
companies to characterize product performance or develop custom
manufacturing test systems. Performing design reviews to improve Design for
Test (DFT) and Design for Manufacturability (DFM). [Oct. 2014 -- present]
Staff Test Engineer: INOVA Geophysical. Responsible for the design,
development, and maintenance of 32 manufacturing test systems deployed
globally. Manage 5 employees and contractors. Work with design teams to
define test requirements, support new product releases, improve reliability,
improve Design for Testability (DFT) and improve Design for Manufacturability
(DFM). Support manufacturing to reduce cost, improve yield, and improve
operational efficiency. Test fixture design, PCB design, Mixed Signal Test, RF
Test (including GPS, Wi-Fi, and Bluetooth), LabVIEW, TestStand, OrCAD,
Altium Viewer, PADS Viewer, Cadence Allegro Viewer, and AutoCAD. [Jan.
2011 – Sept. 2014]
Staff Systems Engineer: Aeroflex (formerly VI Technology). Design and
develop custom manufacturing test systems based on customer requirements.
Develop cost estimates and manage projects. Recognized as a top performer
for the ability to drive a project to completion. Leader of the RF semiconductor
test initiative that successfully deployed a custom ATE system to test all
required power amplifier data sheet specifications while meeting manufacturing
goals for accuracy, repeatability, test time, yield, and handler interface.
LabVIEW, TestStand, and CVI. [Jan. 2008 – Dec. 2010]

2. Sam Broyles
sam.broyles@gmail.com
214 697 6562
Product Engineer: Texas Instruments. Automated test equipment (ATE)
software and hardware development, bench characterization, statistical
analysis, production support, new product team support, customer return
analysis, application research, and project management. Products included
interface bus transceivers, audio power amplifiers, and low power ISM Band
wireless transceivers. Recognized as a top performer for analytical ability,
attention to detail, and teamwork. C, Pascal, BASIC, Assembly, and Mentor
Graphics. [internship May 1999 – Dec. 1999, fulltime Aug. 2000 – Dec. 2007]
Undergraduate Internships: Pratt & Whitney, General Motors, PPG, etc.
Designed tooling fixtures and gauges, performed quality control tests, taught
AutoCAD, performed ergonomic evaluations. [5 years, part-time]
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Awards “Outstanding Young Engineer,” IEEE Dallas section, 2005.
“Man of the Year,” Midwestern State University, 1996.
Membership Institute of Electrical and Electronics Engineers (IEEE), Senior Member
Dallas IEEE Instrumentation and Measurement Society, Chairman
Surface Mount Technology Association (SMTA), Member
Dallas IEEE Consumer Electronics Society, former Chairman
2007 International Symposium on Consumer Electronics, Vice-Chairman
Publications “TestStand XML Report Data Compilation and Analysis,” Sam Broyles.
Presented at the 2013 NI Week Conference.
“A Case Study in Parallel Test System Design,” Sam Broyles. Presented at the
Dallas IEEE Instrumentation and Measurement Society meeting, May 2010.
“A Case Study in Parallel Test System Design with NI TestStand,” Sam Broyles.
Presented at the NI Technical Symposium, Oct. 2009.
"Using CAN Arbitration for Electrical-Layer Testing," Sam Broyles and Steve
Corrigan. Presented at the 8th International CAN Conference. Available on the
CAN in Automation (CiA) and Texas Instruments websites.
"A System Evaluation of CAN transceivers," Sam Broyles. Application note
available on the Texas Instruments website.