XPSPPT useful for the students and materials reasearchers
illustration of XRF and TEY STXM for image single particle
1. e
SDD detector “split” light
to get element mapping
XRF
400 600 800 1000 1200
0
10000
20000
30000
40000
Intensity
Photon energy (eV)
Ni
O
Mn
Fe
hv=1100 eV, 50 ms
Nanoscale imaging the correlation of morphology, chemistry and conductivity of single electrode
particle by STXM at XRF and TEY
Spatial resolution: 20, 25, 35, 40, 60 nm ZP
Energy: 130 - 2500 eV (E/∆E: 3000 - 10000)
Sample: thin films or nano-scale particles under
helium or 10-6 Torr vacuum.
Techniques: NEXAFS (Transmission, TEY, XRF),
2D/3D chemical imaging, XLD, XMCD, SAXS, In situ
devices (humidity, wet cells, heating, magnets etc.).
Phys. Chem. Chem. Phys., 2016, 18, 22789--22793
Phys. Chem. Chem. Phys., 2016, 18, 22789--22793
SDD
Fe doped LiNi0.5Mn1.5O4 was taken as a model in the PCCP paper. Efforts in
enhancing the sensitivity for detecting light elements will enable new insights on
electrode interface manipulation and engineering toward better energy storage
system. This technique will find applications in other areas such as mining and health.