The document outlines the device modeling report for the TC74VHCT540A CMOS digital integrated circuit from Toshiba. It includes various circuit simulation results, comparisons between measurements and simulations, such as truth tables, propagation delay times, and output enable/disable times. The report highlights performance metrics such as voltage levels and errors in simulation predictions.

1. Device Modeling Report
COMPONENTS : CMOS DIGITAL INTEGRATED CIRCUIT
PART NUMBER : TC74VHCT540AFT
MANUFACTURER : TOSHIBA
Bee Technologies Inc.
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005

2. Truth Table
Circuit simulation result
U1:G1BAR
U1:G2BAR
U1:A1
U1:A2
U1:A3
U1:A4
U1:A5
U1:A6
U1:A7
U1:A8
U1:Y1
U1:Y2
U1:Y3
U1:Y4
U1:Y5
U1:Y6
U1:Y7
U1:Y8
0s 0.5us 1.0us
Time
Evaluation circuit
_ U1
HI G1 VCC
_
CLK A1 G2 CLK
_
DSTM1 A2 Y1 DSTM2
ONTIME = .2uS _ ONTIME = .2uS
OFFTIME = .2uS A3 Y2 OFFTIME = .2uS
_
A4 Y3
_
A5 Y4
_ R4 V1
A6 Y5 5
1MEG
_
A7 Y6
_
A8 Y7
_
GND Y8
VHCT540A
0
Comparison table
Input Output
%Error
G1 G2 An Yn (Measurement) Yn (Simulation)
H X X Z Z 0
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005

3. Truth Table
Circuit simulation result
U1:G1BAR
U1:G2BAR
U1:A1
U1:A2
U1:A3
U1:A4
U1:A5
U1:A6
U1:A7
U1:A8
U1:Y1
U1:Y2
U1:Y3
U1:Y4
U1:Y5
U1:Y6
U1:Y7
U1:Y8
0s 0.5us 1.0us
Time
Evaluation circuit
_ U1
CLK G1 VCC
_
DSTM1 A1 G2 HI
ONTIME = .2uS _
OFFTIME = .2uS A2 Y1
_
A3 Y2
_
A4 Y3
_
A5 Y4
_ R4 V1
A6 Y5 5
1MEG
_
A7 Y6
_
A8 Y7
_
GND Y8
VHCT540A
0
Comparison table
Input Output
%Error
G1 G2 An Yn (Measurement) Yn (Simulation)
X H X Z Z 0
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005

4. Truth Table
Circuit simulation result
U1:G1BAR 0
U1:G2BAR 0
U1:A1 1
U1:A2 1
U1:A3 1
U1:A4 1
U1:A5 1
U1:A6 1
U1:A7 1
U1:A8 1
U1:Y1 0
U1:Y2 0
U1:Y3 0
U1:Y4 0
U1:Y5 0
U1:Y6 0
U1:Y7 0
U1:Y8 0
0s 0.5us 1.0us
Time
Evaluation circuit
_ U1
LO
G1 VCC
_
HI
A1 G2 LO
_
HI A2 Y1
_
HI A3 Y2
_
HI A4 Y3
_
HI A5 Y4
_ V1
HI A6 Y5 R4 5
_
A7 Y6 1MEG
HI
_
HI A8 Y7
_
GND Y8
VHCT540A
0
Comparison table
Input Output
%Error
G1 G2 An Yn (Measurement) Yn (Simulation)
L L H L L 0
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005

5. Truth Table
Circuit simulation result
U1:G1BAR 0
U1:G2BAR 0
U1:A1 0
U1:A2 0
U1:A3 0
U1:A4 0
U1:A5 0
U1:A6 0
U1:A7 0
U1:A8 0
U1:Y1 1
U1:Y2 1
U1:Y3 1
U1:Y4 1
U1:Y5 1
U1:Y6 1
U1:Y7 1
U1:Y8 1
0s 0.5us 1.0us
Time
Evaluation circuit
_ U1
LO
G1 VCC
_
A1 G2
LO LO
_
LO
A2 Y1
_
LO
A3 Y2
_
LO
A4 Y3
_
LO
A5 Y4
_ V2
LO
A6 Y5 R4 5
_
A7 Y6 1MEG
LO
_
LO
A8 Y7
_
GND Y8
VHCT540A
0
Comparison table
Input Output
%Error
G1 G2 An Yn (Measurement) Yn (Simulation)
L L L H H 0
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005

6. High Level and Low Level Input Voltage
Circuit simulation result
5.0V
Output
(540.005u,2.0003)
2.5V Input
515.984u,799.200m)
0V
0s 0.5ms 1.0ms 1.5ms 2.0ms
V(Y1) V(V1:+)
Time
Evaluation circuit
_ U1
LO
G1 VCC
_
A1 G2 LO
_
A2 Y1
Y1
_
A3 Y2
_
A4 Y3 V2
V1 = 0 _
V2 = 5 V1 A5 Y4
TD = 0.5m _ R2
TR = 0.1m A6 Y5 5
TF = 0.1m 1G
_
PW = 1m A7 Y6
PER = 2m _
A8 Y7
_
GND Y8
VHCT540A
0
Comparison table
VCC = 5V Measurement Simulation %Error
VIH (V) 2 2.0003 0.015
VIL (V) 0.8 0.7992 -0.100
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005

7. High Level and Low Level Output Voltage
Circuit simulation result
5.0V
2.5V
SEL>> Output
0V
V(Y1) Input
5.0V
2.5V
0V
0s 5ms 10ms
V(V1:+)
Time
Evaluation circuit
_ U1
LO
G1 VCC
_
A1 G2 LO
_
A2 Y1
Y1
_
A3 Y2
_
A4 Y3 V2
V1 = 0 _
V2 = 4.5 V1 A5 Y4
TD = 0.5m _ R1
TR = 3n A6 Y5 4.5
TF = 3n 0.09MEG
_
PW = 1m A7 Y6
PER = 2m _
A8 Y7
_
GND Y8
VHCT540A
0
Comparison table
VCC = 4.5V Measurement Simulation %Error
VOH (V) 4.5 4.4986 -0.031
VOL (V) 0 0 0
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005

8. Propagation Delay Time
Circuit simulation result
5.0V 3.0V
1 2
2.0V
Output
2.5V Input
1.0V
>>
0V 0V
0s 0.5us 1.0us
1 V(TPLH_TPHL) 2 V(U1:A1)
Time
Evaluation circuit
_ U1
LO
G1 VCC
_
A1 G2 LO
_ TPLH_TPHL
A2 Y1
_
A3 Y2
_
A4 Y3
_
A5 Y4
V1 = 0 _ V2
V2 = 3 A6 Y5
TD = 0.2u V1 _ C1
TR = 3.8n A7 Y6 50p 5
TF = 3.8n _
PW = 0.5u A8 Y7
PER = 1u _
GND Y8
VHCT540A
0
Comparison table CL = 50 pF
VCC = 5 V, tr = tf = 3 ns Measurement Simulation %Error
tpLH (ns) 5.9 5.9777 1.317
tpHL (ns) 5.9 5.9779 1.320
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005

9. Output enable time, high impedance (off) to high output (tPZH)
Output disable time, high to high impedance (off) output (tPHZ)
Circuit simulation result
5.0V 3.0V
1 2
Output
Input
2.0V
2.5V
1.0V
>>
0V 0V
0s 0.5us 1.0us
1 V(TPHZ_TPZH) 2 V(V1:+)
Time
Evaluation circuit
_ U1
G1 VCC
_
A1 G2
LO
_ tphz_tpzh
A2 Y1
_
A3 Y2
_
A4 Y3
_
A5 Y4
_ V2
V1 = 0 V1 A6 Y5 C1 R1 R2
V2 = 3 _ 50p
TD = 0.2u A7 Y6 1k 1k
TR = 3.8n _ 5
TF = 3.8n A8 Y7
PW = 0.5u _
PER = 1u GND Y8
VHCT540A
0
Comparison table CL = 50 pF, RL = 1 K
VCC = 5 V, tr = tf = 3 ns Measurement Simulation %Error
tPHZ (ns) 9.4 9.4881 0.937
tpZH (ns) 8.8 8.8358 0.407
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005

10. Output enable time, high impedance (off) to low output (tPZL)
Output disable time, low to high impedance (off) output (tPLZ)
Circuit simulation result
5.0V 3.0V
1 2
Output
Input
2.0V
2.5V
1.0V
>>
0V 0V
0s 0.5us 1.0us
1 V(TPLZ_TPZL) 2 V(V1:+)
Time
Evaluation circuit
_ U1
G1 VCC
_
HI
A1 G2
_ tplz_tpzl R2
A2 Y1
_ 1k
A3 Y2
_
A4 Y3
_
A5 Y4 V3
V1 = 0 V1 _ V2
V2 = 3 A6 Y5 C1 R1
TD = 0.2u _
TR = 3.8n A7 Y6 50p 1k
TF = 3.8n _ 10 5
PW = 0.5u A8 Y7
PER = 1u _
GND Y8
VHCT540A
0
Comparison table CL = 50 pF, RL = 1 K
VCC = 5 V, tr = tf = 3 ns Measurement Simulation %Error
tPLZ (ns) 9.4 9.4062 0.066
tpZL (ns) 8.8 8.8674 0.766
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005