This document summarizes the results of device modeling simulations for a TC7SZ125F CMOS digital integrated circuit manufactured by Toshiba. The document includes truth tables, circuit schematics, simulation waveforms, and comparison tables that evaluate the circuit's performance against specifications for input/output voltage levels, propagation delay times, and enable/disable times under varying operating conditions.
SPICE MODEL of TC7SZ00AFE in SPICE PARK. English Version is http://www.spicepark.net. Japanese Version is http://www.spicepark.com by Bee Technologies.
SPICE MODEL of TC7SZ00AFE in SPICE PARK. English Version is http://www.spicepark.net. Japanese Version is http://www.spicepark.com by Bee Technologies.
SPICE MODEL of TC7SET02FU in SPICE PARK. English Version is http://www.spicepark.net. Japanese Version is http://www.spicepark.com by Bee Technologies.
SPICE MODEL of TC7SET08FU in SPICE PARK. English Version is http://www.spicepark.net. Japanese Version is http://www.spicepark.com by Bee Technologies.
SPICE MODEL of TC7SET00FU in SPICE PARK. English Version is http://www.spicepark.net. Japanese Version is http://www.spicepark.com by Bee Technologies.
SPICE MODEL of TC7SET02FU in SPICE PARK. English Version is http://www.spicepark.net. Japanese Version is http://www.spicepark.com by Bee Technologies.
SPICE MODEL of TC7SET08FU in SPICE PARK. English Version is http://www.spicepark.net. Japanese Version is http://www.spicepark.com by Bee Technologies.
SPICE MODEL of TC7SET00FU in SPICE PARK. English Version is http://www.spicepark.net. Japanese Version is http://www.spicepark.com by Bee Technologies.
The Art of the Pitch: WordPress Relationships and SalesLaura Byrne
Clients don’t know what they don’t know. What web solutions are right for them? How does WordPress come into the picture? How do you make sure you understand scope and timeline? What do you do if sometime changes?
All these questions and more will be explored as we talk about matching clients’ needs with what your agency offers without pulling teeth or pulling your hair out. Practical tips, and strategies for successful relationship building that leads to closing the deal.
Pushing the limits of ePRTC: 100ns holdover for 100 daysAdtran
At WSTS 2024, Alon Stern explored the topic of parametric holdover and explained how recent research findings can be implemented in real-world PNT networks to achieve 100 nanoseconds of accuracy for up to 100 days.
Generative AI Deep Dive: Advancing from Proof of Concept to ProductionAggregage
Join Maher Hanafi, VP of Engineering at Betterworks, in this new session where he'll share a practical framework to transform Gen AI prototypes into impactful products! He'll delve into the complexities of data collection and management, model selection and optimization, and ensuring security, scalability, and responsible use.
Elevating Tactical DDD Patterns Through Object CalisthenicsDorra BARTAGUIZ
After immersing yourself in the blue book and its red counterpart, attending DDD-focused conferences, and applying tactical patterns, you're left with a crucial question: How do I ensure my design is effective? Tactical patterns within Domain-Driven Design (DDD) serve as guiding principles for creating clear and manageable domain models. However, achieving success with these patterns requires additional guidance. Interestingly, we've observed that a set of constraints initially designed for training purposes remarkably aligns with effective pattern implementation, offering a more ‘mechanical’ approach. Let's explore together how Object Calisthenics can elevate the design of your tactical DDD patterns, offering concrete help for those venturing into DDD for the first time!
UiPath Test Automation using UiPath Test Suite series, part 4DianaGray10
Welcome to UiPath Test Automation using UiPath Test Suite series part 4. In this session, we will cover Test Manager overview along with SAP heatmap.
The UiPath Test Manager overview with SAP heatmap webinar offers a concise yet comprehensive exploration of the role of a Test Manager within SAP environments, coupled with the utilization of heatmaps for effective testing strategies.
Participants will gain insights into the responsibilities, challenges, and best practices associated with test management in SAP projects. Additionally, the webinar delves into the significance of heatmaps as a visual aid for identifying testing priorities, areas of risk, and resource allocation within SAP landscapes. Through this session, attendees can expect to enhance their understanding of test management principles while learning practical approaches to optimize testing processes in SAP environments using heatmap visualization techniques
What will you get from this session?
1. Insights into SAP testing best practices
2. Heatmap utilization for testing
3. Optimization of testing processes
4. Demo
Topics covered:
Execution from the test manager
Orchestrator execution result
Defect reporting
SAP heatmap example with demo
Speaker:
Deepak Rai, Automation Practice Lead, Boundaryless Group and UiPath MVP
GraphRAG is All You need? LLM & Knowledge GraphGuy Korland
Guy Korland, CEO and Co-founder of FalkorDB, will review two articles on the integration of language models with knowledge graphs.
1. Unifying Large Language Models and Knowledge Graphs: A Roadmap.
https://arxiv.org/abs/2306.08302
2. Microsoft Research's GraphRAG paper and a review paper on various uses of knowledge graphs:
https://www.microsoft.com/en-us/research/blog/graphrag-unlocking-llm-discovery-on-narrative-private-data/
SAP Sapphire 2024 - ASUG301 building better apps with SAP Fiori.pdfPeter Spielvogel
Building better applications for business users with SAP Fiori.
• What is SAP Fiori and why it matters to you
• How a better user experience drives measurable business benefits
• How to get started with SAP Fiori today
• How SAP Fiori elements accelerates application development
• How SAP Build Code includes SAP Fiori tools and other generative artificial intelligence capabilities
• How SAP Fiori paves the way for using AI in SAP apps
Smart TV Buyer Insights Survey 2024 by 91mobiles.pdf91mobiles
91mobiles recently conducted a Smart TV Buyer Insights Survey in which we asked over 3,000 respondents about the TV they own, aspects they look at on a new TV, and their TV buying preferences.
Encryption in Microsoft 365 - ExpertsLive Netherlands 2024Albert Hoitingh
In this session I delve into the encryption technology used in Microsoft 365 and Microsoft Purview. Including the concepts of Customer Key and Double Key Encryption.
Removing Uninteresting Bytes in Software FuzzingAftab Hussain
Imagine a world where software fuzzing, the process of mutating bytes in test seeds to uncover hidden and erroneous program behaviors, becomes faster and more effective. A lot depends on the initial seeds, which can significantly dictate the trajectory of a fuzzing campaign, particularly in terms of how long it takes to uncover interesting behaviour in your code. We introduce DIAR, a technique designed to speedup fuzzing campaigns by pinpointing and eliminating those uninteresting bytes in the seeds. Picture this: instead of wasting valuable resources on meaningless mutations in large, bloated seeds, DIAR removes the unnecessary bytes, streamlining the entire process.
In this work, we equipped AFL, a popular fuzzer, with DIAR and examined two critical Linux libraries -- Libxml's xmllint, a tool for parsing xml documents, and Binutil's readelf, an essential debugging and security analysis command-line tool used to display detailed information about ELF (Executable and Linkable Format). Our preliminary results show that AFL+DIAR does not only discover new paths more quickly but also achieves higher coverage overall. This work thus showcases how starting with lean and optimized seeds can lead to faster, more comprehensive fuzzing campaigns -- and DIAR helps you find such seeds.
- These are slides of the talk given at IEEE International Conference on Software Testing Verification and Validation Workshop, ICSTW 2022.
Welcome to the first live UiPath Community Day Dubai! Join us for this unique occasion to meet our local and global UiPath Community and leaders. You will get a full view of the MEA region's automation landscape and the AI Powered automation technology capabilities of UiPath. Also, hosted by our local partners Marc Ellis, you will enjoy a half-day packed with industry insights and automation peers networking.
📕 Curious on our agenda? Wait no more!
10:00 Welcome note - UiPath Community in Dubai
Lovely Sinha, UiPath Community Chapter Leader, UiPath MVPx3, Hyper-automation Consultant, First Abu Dhabi Bank
10:20 A UiPath cross-region MEA overview
Ashraf El Zarka, VP and Managing Director MEA, UiPath
10:35: Customer Success Journey
Deepthi Deepak, Head of Intelligent Automation CoE, First Abu Dhabi Bank
11:15 The UiPath approach to GenAI with our three principles: improve accuracy, supercharge productivity, and automate more
Boris Krumrey, Global VP, Automation Innovation, UiPath
12:15 To discover how Marc Ellis leverages tech-driven solutions in recruitment and managed services.
Brendan Lingam, Director of Sales and Business Development, Marc Ellis
1. Device Modeling Report
COMPONENTS : CMOS DIGITAL INTEGRATED CIRCUIT
PART NUMBER : TC7SZ125F
MANUFACTURER : TOSHIBA
Bee Technologies Inc.
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
2. Truth Table
Circuit simulation result
U1:INA 1
U1:GBAR 1
5.0V
2.5V
0V
0s 0.5us 1.0us
V(R1:1)
Time
Evaluation circuit
U1
_
HI G VCC
DSTM1
CLK IN A
OFFTIME = .2uS
ONTIME = .2uS GND OUT Y
V1
5
TC7SZ125
R1
1G
0
Comparison table
Input Output
%Error
A G Y (Measurement) Y (Simulation)
X H Z Z 0
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
3. Truth Table
Circuit simulation result
U1:INA 0
U1:GBAR 0
5.0V
2.5V
0V
0s 0.5us 1.0us
V(R1:1)
Time
Evaluation circuit
U1
_
LO
G VCC
LO
IN A
GND OUT Y
V1
5
TC7SZ125
R1
1G
0
Comparison table
Input Output
%Error
A G Y (Measurement) Y (Simulation)
L L L L 0
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
4. Truth Table
Circuit simulation result
U1:INA 1
U1:GBAR 0
5.0V
2.5V
0V
0s 0.5us 1.0us
V(R1:1)
Time
Evaluation circuit
U1
_
LO
G VCC
HI IN A
GND OUT Y
V1
5
TC7SZ125
R1
1G
0
Comparison table
Input Output
%Error
A G Y (Measurement) Y (Simulation)
H L H H 0
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
5. High Level and Low Level Input Voltage (VCC = 1.8 V)
Circuit simulation result
2.0V
(588.005u,1.5841)
Output
1.0V Input
(511.904u,214.263m)
0V
0s 0.5ms 1.0ms 1.5ms 2.0ms
V(OUTY) V(V1:+)
Time
Evaluation circuit
U1
_
LO
G VCC
IN A
GND OUT Y
OUTY V2
1.8
TC7SZ125
V1 = 0
V2 = 1.8 V1
TD = 0.5m R1
TR = 0.1m
TF = 0.1m 1G
PW = 1m
PER = 2m
0
Comparison table
VCC = 1.8V Measurement Simulation %Error
Min VIH = (0.88*VCC) V 1.584 1.5841 0.006
Max VIL = (0.12*VCC) V 0.216 0.214263 -0.804
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
6. High Level and Low Level Input Voltage (VCC = 5 V)
Circuit simulation result
5.0V
(575.002u,3.7501)
Output
2.5V Input
(524.901u,1.2450)
0V
0s 0.5ms 1.0ms 1.5ms 2.0ms
V(OUTY) V(V1:+)
Time
Evaluation circuit
U1
_
LO
G VCC
IN A
GND OUT Y
OUTY
TC7SZ125 V2
V1 = 0
V2 = 5 V1 5
TD = 0.5m R1
TR = 0.1m
TF = 0.1m 1G
PW = 1m
PER = 2m
0
Comparison table
VCC = 5V Measurement Simulation %Error
Min VIH = (0.75*VCC) V 3.75 3.7501 0.003
Max VIL = (0.25*VCC) V 1.25 1.2450 -0.400
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
7. High Level Output Voltage (VCC = 1.8 V)
Circuit simulation result
2.0V
Output
Input
1.0V
0V
0s 5ms 10ms
V(U1:OUTY)
Time
Evaluation circuit
U1
_
LO
G VCC
IN A
GND OUT Y
V1 TC7SZ125 V2
1.6 1.8
I1
-100u
0
Comparison table
VIN = VIH, VCC = 1.8 V Measurement Simulation %Error
VOH (V) 1.8 1.7999 -0.006
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
8. Low Level Output Voltage (VCC = 1.8 V)
Circuit simulation result
5.0V
Output
Input
2.5V
0V
0s 5ms 10ms
V(U1:OUTY)
Time
Evaluation circuit
U1
_
LO
G VCC
IN A
GND OUT Y
V1 TC7SZ125 V2
0.2 1.8
I1
100u
0
Comparison table
VIN = VIL, VCC = 4.5 V Measurement Simulation %Error
VOL (V) 0 0 0
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
9. High Level Output Voltage (VCC = 4.5 V)
Circuit simulation result
5.0V
Output
Input
2.5V
0V
0s 5ms 10ms
V(U1:OUTY)
Time
Evaluation circuit
U1
_
LO
G VCC
IN A
GND OUT Y
V1 TC7SZ125 V2
3.4 4.5
I1
-100u
0
Comparison table
VIN = VIH, VCC = 4.5 V Measurement Simulation %Error
VOH (V) 4.5 4.4991 -0.02
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
10. Low Level Output Voltage (VCC = 4.5 V)
Circuit simulation result
5.0V
Output
Input
2.5V
0V
0s 5ms 10ms
V(U1:OUTY)
Time
Evaluation circuit
U1
_
LO
G VCC
IN A
GND OUT Y
V1 TC7SZ125 V2
1 4.5
I1
100u
0
Comparison table
VIN = VIL, VCC = 4.5 V Measurement Simulation %Error
VOL (V) 0 0 0
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
11. Propagation Delay Time (VCC = 1.8 V)
Circuit simulation result
2.0V
Output
Input
1.0V
0V
0s 0.5us 1.0us
V(TPLH) V(V1:+)
Time
Evaluation circuit
U1
_
LO
G VCC
IN A
tplh
GND OUT Y
V1 = 0 V2
TC7SZ125
V2 = 1.8
TD = 0.2u V1
TR = 3.8n
TF = 3.8n R1 C1 1.8
PW = 0.5u
PER = 1u 1MEG 15p
0
Comparison table CL = 15 pF, RL = 1 M
VCC = 1.8V, tr = tf = 3 ns Measurement Simulation %Error
tPLH (ns) 5.3 5.3208 0.392
tPHL (ns) 5.3 5.3079 0.149
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
12. Propagation Delay Time (VCC = 5 V)
Circuit simulation result
5.0V
Output
Input
2.5V
0V
0s 0.5us 1.0us
V(TPLH) V(V1:+)
Time
Evaluation circuit
U1
_
LO
G VCC
IN A
tplh
GND OUT Y
V1 = 0 V2
TC7SZ125
V2 = 5
TD = 0.2u V1
TR = 3.8n
TF = 3.8n R1 C1 5
PW = 0.5u
PER = 1u 500 50p
0
Comparison table CL = 50 pF, RL = 500
VCC = 5 V, tr = tf = 3 ns Measurement Simulation %Error
tPLH (ns) 2.6 2.6444 1.708
tPHL (ns) 2.6 2.6279 1.073
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
13. Output enable time(tPZH) and Output disable time(tPHZ) (VCC = 1.8 V)
Circuit simulation result
2.0V
Output
Input
1.0V
0V
0s 0.5us 1.0us
V(TPHZ_TPZH) V(U1:GBAR)
Time
Evaluation circuit
U1
_
G VCC
HI IN A
tphz_tpzh
GND OUT Y
V1 = 0
TC7SZ125 V2
V2 = 1.8
TD = 0.2u V1
TR = 3.8n
TF = 3.8n C1 R1 R2
PW = 0.5u 1.8
PER = 1u 50p 500 500
0
Comparison table CL = 50 pF, RL = 500
VCC = 1.8V, tr = tf = 3 ns Measurement Simulation %Error
tPZH (ns) 7 7.0535 0.764
tPHZ (ns) 5.4 5.4334 0.619
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
14. Output enable time(tPZH) and Output disable time(tPHZ) (VCC = 5 V)
Circuit simulation result
5.0V
Output
Input
2.5V
0V
0s 0.5us 1.0us
V(TPHZ_TPZH) V(U1:GBAR)
Time
Evaluation circuit
U1
_
G VCC
HI IN A
tphz_tpzh
GND OUT Y
V1 = 0
TC7SZ125 V2
V2 = 5
TD = 0.2u V1
TR = 3.8n
TF = 3.8n C1 R1 R2
PW = 0.5u 5
PER = 1u 50p 500 500
0
Comparison table CL = 50 pF, RL = 500
VCC = 5 V, tr = tf = 3 ns Measurement Simulation %Error
tPZH (ns) 2.8 2.7773 -0.811
tPHZ (ns) 2.1 2.1849 4.043
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
15. Output enable time(tPZL) and Output disable time(tPLZ) (VCC = 1.8 V)
Circuit simulation result
2.0V
Output
Input
1.0V
0V
0s 0.5us 1.0us
V(TPZL_TPLZ) V(V1:+)
Time
Evaluation circuit
U1
_
G VCC
LO
IN A
tpzl_tplz R2
GND OUT Y
500
TC7SZ125 V3
V1 = 0
V2 = 1.8
TD = 0.2u V1 C1 R1 V2
TR = 3.8n 1.8
TF = 3.8n 50p 500
PW = 0.5u 3.6
PER = 1u
0
Comparison table CL = 50 pF, RL = 500
VCC = 1.8 V, tr = tf = 3 ns Measurement Simulation %Error
tPZL (ns) 7 7.0213 0.304
tPLZ (ns) 5.4 5.4336 0.622
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
16. Output enable time(tPZL) and Output disable time(tPLZ) (VCC = 5 V)
Circuit simulation result
5.0V
Output
Input
2.5V
0V
0s 0.5us 1.0us
V(TPZL_TPLZ) V(V1:+)
Time
Evaluation circuit
U1
_
G VCC
LO
IN A
tpzl_tplz R2
GND OUT Y
500
V1 = 0
TC7SZ125 V3
V2 = 10
TD = 0.2u V1
TR = 3.8n
TF = 3.8n C1 R1 V2
PW = 0.5u 5
PER = 1u 50p 500
10
0
Comparison table CL = 50 pF, RL = 500
VCC = 5 V, tr = tf = 3 ns Measurement Simulation %Error
tPZL (ns) 2.8 2.7927 -0.261
tPLZ (ns) 2.1 2.1048 0.229
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005