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SPICE MODEL of TC74LCX245FW in SPICE PARK
1. Device Modeling Report
COMPONENTS : CMOS DIGITAL INTEGRATED CIRCUIT
PART NUMBER : TC74LCX245FW
MANUFACTURER : TOSHIBA
Bee Technologies Inc.
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
2. Truth Table
Circuit simulation result
U1:DIR 0
U1:OEBAR 0
U1:B1 1
U1:B2 1
U1:B3 1
U1:B4 1
U1:B5 1
U1:B6 1
U1:B7 1
U1:B8 1
U1:A1 1
U1:A2 1
U1:A3 1
U1:A4 1
U1:A5 1
U1:A6 1
U1:A7 1
U1:A8 1
0s 0.5us 1.0us
Time
Evaluation circuit
U1
DIR VCC
LO
___
A1 OE LO
A2 B1
IN_B
A3 B2
A4 B3
A5 B4
R1 V1
A6 B5
1MEG
A7 B6
DSTM1 3.6
A8 B7 CLK
GND B8 ONTIME = .2uS
OFFTIME = .2uS
74LCX245
0
Comparison table Function : A BUS = OUTPUT, B BUS = INPUT
Input Output
%Error
OE DIR Measurement Simulation
L L A=B A=B 0
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
3. Truth Table
Circuit simulation result
U1:DIR 1
U1:OEBAR 0
U1:A1 1
U1:A2 1
U1:A3 1
U1:A4 1
U1:A5 1
U1:A6 1
U1:A7 1
U1:A8 1
U1:B1 1
U1:B2 1
U1:B3 1
U1:B4 1
U1:B5 1
U1:B6 1
U1:B7 1
U1:B8 1
0s 0.5us 1.0us
Time
Evaluation circuit
U1
HI
DIR VCC
___
A1 OE
IN_A LO
A2 B1
A3 B2
A4 B3
A5 B4
R1 V1
A6 B5
1MEG
CLK A7 B6
3.6
DSTM1 A8 B7
ONTIME = .2uS
OFFTIME = .2uS GND B8
74LCX245
0
Comparison table Function : A BUS = INPUT, B BUS = OUTPUT
Input Output
%Error
OE DIR Measurement Simulation
L H B=A B=A 0
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
4. Truth Table
Circuit simulation result
U1:DIR 1
U1:OEBAR 1
U1:A1 Z
U1:A2 Z
U1:A3 Z
U1:A4 Z
U1:A5 Z
U1:A6 Z
U1:A7 Z
U1:A8 Z
U1:B1 Z
U1:B2 Z
U1:B3 Z
U1:B4 Z
U1:B5 Z
U1:B6 Z
U1:B7 Z
U1:B8 Z
0s 0.5us 1.0us
Time
Evaluation circuit
U1
DSTM1
CLK DIR VCC
___
ONTIME = .2uS A1 OE HI
OFFTIME = .2uS
A2 B1
A3 B2
A4 B3
A5 B4
R1 V1
A6 B5
1MEG
A7 B6 3.6
A8 B7
GND B8
74LCX245
0
Comparison table Function : A BUS and B BUS = HIGH IMPEDANCE
Input Output
%Error
OE DIR Measurement Simulation
H X Z Z 0
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
5. High Level and Low Level Input Voltage
Circuit simulation result
3.0V
(566.677u,2.0003)
2.0V
Output
Input
1.0V (526.639u,799.182m)
0V
0s 0.5ms 1.0ms 1.5ms 2.0ms
V(OUT) V(V1:+)
Time
Evaluation circuit
U4
DIR VCC
LO
___
A1 OE
OUT LO
A2 B1
A3 B2
A4 B3 V2
A5 B4
V1 = 0
R2 A6 B5 V2 = 3 V1 3
TD = 0.5m
1G A7 B6 TR = 0.1m
TF = 0.1m
A8 B7 PW = 1m
PER = 2m
GND B8
74LCX245
0
Comparison table
VCC =3.3 V Measurement Simulation %Error
VIH (V) 2 2 0
VIL (V) 0.8 0.799182 -0.102
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
6. High Level Output Voltage
Circuit simulation result
3.0V
2.0V
Output
1.0V
0V
0s 5ms 10ms
V(OUT)
Time
Evaluation circuit
U1
DIR VCC
LO
___
A1 OE
OUT LO
A2 B1
A3 B2
A4 B3 V2
A5 B4
I1 A6 B5 V1 3
2.1
-100u A7 B6
A8 B7
GND B8
74LCX245
0
Comparison table
VIN = VIH, VCC = 3 V Measurement Simulation %Error
Min VOH = (VCC - 0.2) V 2.8 2.8331 1.182
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005
7. Low Level Output Voltage
Circuit simulation result
3.0V
2.0V
Output
1.0V
0V
0s 5ms 10ms
V(OUT)
Time
Evaluation circuit
U1
DIR VCC
LO
___
A1 OE
OUT LO
A2 B1
A3 B2
A4 B3 V2
A5 B4
I1 A6 B5 V1 3
0.7
100u A7 B6
A8 B7
GND B8
74LCX245
0
Comparison table
VIN = VIL, VCC = 3 V Measurement Simulation %Error
VOL (V) 0.2 0.191208 -4.396
All Rights Reserved Copyright (c) Bee Technologies Inc. 2005