This document summarizes the use of multivariate analysis (MVA) methods like principal component analysis (PCA) and non-negative matrix factorization (NMF) for analyzing time-of-flight secondary ion mass spectrometry (ToF-SIMS) datasets. It provides examples of how PCA and NMF have been applied to analyze organic coatings, wood samples, polymers, and aided in X-ray photoelectron spectroscopy (XPS) peak fitting. PCA and NMF can help identify unknown samples, separate behaviors of different compounds, and allow relative quantification, though NMF results are generally easier to interpret. The document recommends using the simsMVA software package for MVA of ToF-SIMS data.