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Enli Technology Co. Ltd.
November 9, 2021
1
Introduction of SG-A:CMOS Image Sensor
Tester
Quick Installation and Rapid Deployment Can Help You Speed Up
Time to Market.
2
Basic Introduction
• The SG-A system is the world’s first commercial CMOS Image sensor tester.
• SG-A can provide the most comprehensive CMOS image sensor parameter
characterizations, such as full-spectrum quantum efficiency QE, overall system gain
K, temporal dark noise, signal-to-noise ratio, absolute sensitivity threshold, saturation
capacity, dynamic range, DSNU, PRNU, Linearity error, and chief-ray angle CRA. The
device under test can be several type of CMOS image sensor modules. The
inspection procedures are complied with the EMVA 1288 standard. Therefore, SG-A
CMOS image sensor tester can be used to do wafer-level optics inspection,
processing parameters controlling, micro-lens design, micro-lens verification.
• The highly collimated beam (< 1°) of the SG-A CMOS image sensor tester can
overcome the inspection difficulties of new manufacturing processes that traditional
optical systems (such as integrating sphere systems) cannot solve. The processes
include small pixel (< 1 um), BSI and 3D stacking, micro lens, new Bayer array
design, and so on.
3
Contents
 Features
 System Design
 Specification
 Application
4
Features
Non-destructive optical inspection.
High collimated beam angle; <0.05°, <0.1°, <0.5°, <1°, <3°(different models).
High Uniform Beam spot: ≥ 99%.
Light instability ≤ 1%.
High dynamic range testing capability: 80dB~140dB (different models).
Can test CMOS image sensor parameters: Quantum efficiency, Spectral Response, System Gain, Sensitivity,
Dynamic Range, Dark Current/Noise, SNR, Saturation Capacity, Linearity Error (LE), DCNU (Dark Current
Non-Uniformity), PRNU (Photo Response Non-Uniformity), CRA (Chief Ray Angle).
Full Spectrum wavelength range: 300nm-1100nm or 350nm~1000nm (PTC).
5
Features
Wavelength can be extended to 1700nm or more.
DUT package: CIS module, PCB Board level, CIS Camera, with/without micro-lens.
“Direct” or “Handshake” communication protocol between SG-A and DUT.
Customized test fixture and stages (manual or automatic, max 6-axises).
Powerful analyzing software ARGUS®.
Application: fingerprint recognition (CIS+Lens, CIS+collimator, TFT-array sensor) micro-lens design of CIS, wafer level
optics inspection, CIS DSP chip algorithm development, Si TFT sensor panel, Time-of-Flight camera sensor, Proximity
Sensor (Quantum efficiency, sensitivity, linearity, SNR et al.,),d-ToF sensor, i-ToF sensor, Multi-spectral sensor, Ambient
light sensor (ALS), Fingerprint-Under-Display (FoD) sensor.
6
System Design
7
Specification
• The capability of SG-A CMOS image sensor tester is very powerful; therefore, the
relevant specifications and accessories are very complete. Please contact us for
more details and the selection consulting.
The followings are main capability specifications:
– Full-spectrum wavelength range: 300-1100nm or 350-1000nm (PTC)
– Wavelength range can be extended to 1700nm or more.
– Single wavelength source: 470nm, 530nm, 630nm, 940nm (±5nm), or customized
– Dynamic Range: 80dB, 100dB, or 140dB
– Test fixtures: DUT≤ 100mm x 100mm x 30mm(Hight)[Basic type] or customized
– Stage: Non, manual 3-axis, or 6-axis (manual + automatic) stages (can be
customized)
8
Application
• Fingerprint recognition (CIS+Lens, CIS+collimator, TFT-array sensor)
• Micro-lens design of CIS, wafer level optics inspection
• CIS DSP chip algorithm development
• Si TFT sensor panel
• Time-of-Flight camera sensor
• Proximity Sensor (Quantum efficiency, sensitivity, linearity, SNR et al.,)
• d-ToF sensor, i-ToF sensor
• Multi-spectral sensor
• Ambient light sensor (ALS)
• Fingerprint-Under-Display (FoD) sensor
9
For more Installation Gallery of SG-A, please click on the following
link:
https://enlitechnology.com/home/products/image-sensor/sg-a/
Thank you for your
time and
attention.
ENLITECH CONFIDENTIAL
10
11
ENLITECHCONFIDENTIAL
• R&D and Production of Quantum Efficiency/
Spectral Response/IPCE Measuring Equipment
• Image Sensor/Photodiode/Semiconductor Testing System
• ISO/IEC 17025 (TAF) Certificated Lab QE/SR/Jsc Certification
• Innovative R&D/Technology Integration/Total Solutions
for Customers
Visit our website: https://enlitechnology.com/
ENLIGHTENYOUR IDEA
Headquarter:
ADD/ 1F., No.96, Luke 5th Rd., Luzhu Dist.,
Kaohsiung City, Taiwan (Kaohsiung Science Park)
TEL/ +886-7-6955669
Email: qeservice@enli.com.tw
Shanghai Branch:
Room 5I, Block 3, No.100, Lane 1505, Zu Chong Zhi Road,
Pudong New District, Shanghai, China
TEL/+86-21-31338780 / 18512186724

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Introduction of SG-A CMOS Image Sensor Tester

  • 1. Enli Technology Co. Ltd. November 9, 2021 1 Introduction of SG-A:CMOS Image Sensor Tester Quick Installation and Rapid Deployment Can Help You Speed Up Time to Market.
  • 2. 2 Basic Introduction • The SG-A system is the world’s first commercial CMOS Image sensor tester. • SG-A can provide the most comprehensive CMOS image sensor parameter characterizations, such as full-spectrum quantum efficiency QE, overall system gain K, temporal dark noise, signal-to-noise ratio, absolute sensitivity threshold, saturation capacity, dynamic range, DSNU, PRNU, Linearity error, and chief-ray angle CRA. The device under test can be several type of CMOS image sensor modules. The inspection procedures are complied with the EMVA 1288 standard. Therefore, SG-A CMOS image sensor tester can be used to do wafer-level optics inspection, processing parameters controlling, micro-lens design, micro-lens verification. • The highly collimated beam (< 1°) of the SG-A CMOS image sensor tester can overcome the inspection difficulties of new manufacturing processes that traditional optical systems (such as integrating sphere systems) cannot solve. The processes include small pixel (< 1 um), BSI and 3D stacking, micro lens, new Bayer array design, and so on.
  • 3. 3 Contents  Features  System Design  Specification  Application
  • 4. 4 Features Non-destructive optical inspection. High collimated beam angle; <0.05°, <0.1°, <0.5°, <1°, <3°(different models). High Uniform Beam spot: ≥ 99%. Light instability ≤ 1%. High dynamic range testing capability: 80dB~140dB (different models). Can test CMOS image sensor parameters: Quantum efficiency, Spectral Response, System Gain, Sensitivity, Dynamic Range, Dark Current/Noise, SNR, Saturation Capacity, Linearity Error (LE), DCNU (Dark Current Non-Uniformity), PRNU (Photo Response Non-Uniformity), CRA (Chief Ray Angle). Full Spectrum wavelength range: 300nm-1100nm or 350nm~1000nm (PTC).
  • 5. 5 Features Wavelength can be extended to 1700nm or more. DUT package: CIS module, PCB Board level, CIS Camera, with/without micro-lens. “Direct” or “Handshake” communication protocol between SG-A and DUT. Customized test fixture and stages (manual or automatic, max 6-axises). Powerful analyzing software ARGUS®. Application: fingerprint recognition (CIS+Lens, CIS+collimator, TFT-array sensor) micro-lens design of CIS, wafer level optics inspection, CIS DSP chip algorithm development, Si TFT sensor panel, Time-of-Flight camera sensor, Proximity Sensor (Quantum efficiency, sensitivity, linearity, SNR et al.,),d-ToF sensor, i-ToF sensor, Multi-spectral sensor, Ambient light sensor (ALS), Fingerprint-Under-Display (FoD) sensor.
  • 7. 7 Specification • The capability of SG-A CMOS image sensor tester is very powerful; therefore, the relevant specifications and accessories are very complete. Please contact us for more details and the selection consulting. The followings are main capability specifications: – Full-spectrum wavelength range: 300-1100nm or 350-1000nm (PTC) – Wavelength range can be extended to 1700nm or more. – Single wavelength source: 470nm, 530nm, 630nm, 940nm (±5nm), or customized – Dynamic Range: 80dB, 100dB, or 140dB – Test fixtures: DUT≤ 100mm x 100mm x 30mm(Hight)[Basic type] or customized – Stage: Non, manual 3-axis, or 6-axis (manual + automatic) stages (can be customized)
  • 8. 8 Application • Fingerprint recognition (CIS+Lens, CIS+collimator, TFT-array sensor) • Micro-lens design of CIS, wafer level optics inspection • CIS DSP chip algorithm development • Si TFT sensor panel • Time-of-Flight camera sensor • Proximity Sensor (Quantum efficiency, sensitivity, linearity, SNR et al.,) • d-ToF sensor, i-ToF sensor • Multi-spectral sensor • Ambient light sensor (ALS) • Fingerprint-Under-Display (FoD) sensor
  • 9. 9 For more Installation Gallery of SG-A, please click on the following link: https://enlitechnology.com/home/products/image-sensor/sg-a/
  • 10. Thank you for your time and attention. ENLITECH CONFIDENTIAL 10
  • 11. 11 ENLITECHCONFIDENTIAL • R&D and Production of Quantum Efficiency/ Spectral Response/IPCE Measuring Equipment • Image Sensor/Photodiode/Semiconductor Testing System • ISO/IEC 17025 (TAF) Certificated Lab QE/SR/Jsc Certification • Innovative R&D/Technology Integration/Total Solutions for Customers Visit our website: https://enlitechnology.com/ ENLIGHTENYOUR IDEA Headquarter: ADD/ 1F., No.96, Luke 5th Rd., Luzhu Dist., Kaohsiung City, Taiwan (Kaohsiung Science Park) TEL/ +886-7-6955669 Email: qeservice@enli.com.tw Shanghai Branch: Room 5I, Block 3, No.100, Lane 1505, Zu Chong Zhi Road, Pudong New District, Shanghai, China TEL/+86-21-31338780 / 18512186724