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All Rights Reserved Copyright (C) Bee Technologies Inc. 2014
1
Device Modeling Report
Bee Technologies Inc.
COMPONENTS: SiC Schottky Barrier Diode
PART NUMBER: IDK02G65C5
MANUFACTURER: Infineon
REMARK: Professional Model
All Rights Reserved Copyright (C) Bee Technologies Inc. 2014
2
Circuit Configuration
DIODE MODEL PARAMETERS
PSpice
model
parameter
Model description
IS Saturation Current
N Emission Coefficient
RS Series Resistance
IKF High-injection Knee Current
CJO Zero-bias Junction Capacitance
M Junction Grading Coefficient
VJ Junction Potential
ISR Recombination Current Saturation Value
BV Reverse Breakdown Voltage(a positive value)
IBV Reverse Breakdown Current(a positive value)
TT Transit Time
EG Energy-band Gap
All Rights Reserved Copyright (C) Bee Technologies Inc. 2014
3
U1
IDK02G65C5
R1
0.01m
V1
0Vdc
0
R2
100MEG
V_V1
0V 0.5V 1.0V 1.5V 2.0V 2.5V
I(R1)
0A
1.0A
2.0A
3.0A
4.0A
Forward Current Characteristics
Circuit Simulation result
Evaluation circuit
All Rights Reserved Copyright (C) Bee Technologies Inc. 2014
4
Comparison Graph
Circuit Simulation result
Comparison table
IF (A)
VF (V)
%Error
Measurement Simulation
0.1 0.924 0.923 -0.11
0.2 0.980 0.981 0.10
0.5 1.100 1.097 -0.27
1 1.250 1.247 -0.24
2 1.510 1.510 0.00
4 2.000 2.000 0.00
All Rights Reserved Copyright (C) Bee Technologies Inc. 2014
5
V(R)
100mV 1.0V 10V 100V 1.0KV
I(V2)/(650V/100u)
0
10p
20p
30p
40p
50p
60p
70p
80p
90p
0
R
V1
TD = 0
TF = 100ns
PW = 100us
PER = 10m
V1 = 0
TR = 100us
V2 = 650
V2
0Vdc
R2
100MEG
U1
IDK02G65C5
Junction Capacitance Characteristic
Circuit Simulation result
Evaluation circuit
All Rights Reserved Copyright (C) Bee Technologies Inc. 2014
6
Comparison Graph
Circuit Simulation result
Comparison table
VR(V)
C (pF)
%Error
Measurement Simulation
0.1 84.000 83.680 -0.38
0.2 82.000 81.650 -0.43
0.5 77.000 76.440 -0.73
1 70.000 69.500 -0.71
2 59.000 59.460 0.78
5 45.000 43.710 -2.87
10 34.000 32.650 -3.97
20 25.000 23.940 -4.24
50 17.000 16.330 -3.94
100 12.300 12.900 4.88
200 10.400 10.840 4.23
500 9.200 9.620 4.57
All Rights Reserved Copyright (C) Bee Technologies Inc. 2014
7
V_V1
100V 200V 300V 400V 500V 600V
I(R1)
1.0nA
10nA
100nA
1.0uA
10uA
R4
10G
U1
IDK02G65C5
V1
0Vdc
R1
100m
0
Reverse Characteristic
Circuit Simulation result
Evaluation circuit
All Rights Reserved Copyright (C) Bee Technologies Inc. 2014
8
Comparison Graph
Circuit Simulation result
Comparison table
IR (A)
VR (V)
%Error
Measurement Simulation
1.00E-09 480.000 461.620 -3.83
1.00E-08 563.000 567.300 0.76
1.00E-07 650.000 654.260 0.66

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SPICE MODEL of IDK02G65C5 (Professional Model) in SPICE PARK

  • 1. All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 1 Device Modeling Report Bee Technologies Inc. COMPONENTS: SiC Schottky Barrier Diode PART NUMBER: IDK02G65C5 MANUFACTURER: Infineon REMARK: Professional Model
  • 2. All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 2 Circuit Configuration DIODE MODEL PARAMETERS PSpice model parameter Model description IS Saturation Current N Emission Coefficient RS Series Resistance IKF High-injection Knee Current CJO Zero-bias Junction Capacitance M Junction Grading Coefficient VJ Junction Potential ISR Recombination Current Saturation Value BV Reverse Breakdown Voltage(a positive value) IBV Reverse Breakdown Current(a positive value) TT Transit Time EG Energy-band Gap
  • 3. All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 3 U1 IDK02G65C5 R1 0.01m V1 0Vdc 0 R2 100MEG V_V1 0V 0.5V 1.0V 1.5V 2.0V 2.5V I(R1) 0A 1.0A 2.0A 3.0A 4.0A Forward Current Characteristics Circuit Simulation result Evaluation circuit
  • 4. All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 4 Comparison Graph Circuit Simulation result Comparison table IF (A) VF (V) %Error Measurement Simulation 0.1 0.924 0.923 -0.11 0.2 0.980 0.981 0.10 0.5 1.100 1.097 -0.27 1 1.250 1.247 -0.24 2 1.510 1.510 0.00 4 2.000 2.000 0.00
  • 5. All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 5 V(R) 100mV 1.0V 10V 100V 1.0KV I(V2)/(650V/100u) 0 10p 20p 30p 40p 50p 60p 70p 80p 90p 0 R V1 TD = 0 TF = 100ns PW = 100us PER = 10m V1 = 0 TR = 100us V2 = 650 V2 0Vdc R2 100MEG U1 IDK02G65C5 Junction Capacitance Characteristic Circuit Simulation result Evaluation circuit
  • 6. All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 6 Comparison Graph Circuit Simulation result Comparison table VR(V) C (pF) %Error Measurement Simulation 0.1 84.000 83.680 -0.38 0.2 82.000 81.650 -0.43 0.5 77.000 76.440 -0.73 1 70.000 69.500 -0.71 2 59.000 59.460 0.78 5 45.000 43.710 -2.87 10 34.000 32.650 -3.97 20 25.000 23.940 -4.24 50 17.000 16.330 -3.94 100 12.300 12.900 4.88 200 10.400 10.840 4.23 500 9.200 9.620 4.57
  • 7. All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 7 V_V1 100V 200V 300V 400V 500V 600V I(R1) 1.0nA 10nA 100nA 1.0uA 10uA R4 10G U1 IDK02G65C5 V1 0Vdc R1 100m 0 Reverse Characteristic Circuit Simulation result Evaluation circuit
  • 8. All Rights Reserved Copyright (C) Bee Technologies Inc. 2014 8 Comparison Graph Circuit Simulation result Comparison table IR (A) VR (V) %Error Measurement Simulation 1.00E-09 480.000 461.620 -3.83 1.00E-08 563.000 567.300 0.76 1.00E-07 650.000 654.260 0.66