Preview of webcast. Register at http://event.on24.com/r.htm?e=151461&s=1&k=45AAAF345F3B6FC01400112AD06ED046&partnerref=slideshare for full webcast (one hour)

1. Signal Integrity Design Agilent EEsof EDA
Using
Fast Channel Simulation Colin Warwick
Signal Integrity Product Manager
and
Statistical Eye Diagrams July 22th, 2009
© 2009 Agilent Technologies, Inc.
1 July 22th, 2009

2. How To Optimize Tx, Channel, and Rx in a Large
Multi-dimensional Design Space?
XTalk1 Jitter
PRBS ∑ EQ
TX Jitter Channel Jitter RX
PRBS ∑ EQ ∑ EQ
Received
XTalkN Jitter Signal
PRBS ∑ EQ
• Optimization goal
– Lowest cost way of achieving 10−10 or 10−12 BER contour versus eye mask
• Need BER @ thousands of sets of settings in the design space
• Multi-million-bit SPICE-like simulations are prohibitively long
• Bit-by-bit fast channel simulation is better – million bits per minute
• Statistical channel simulation is even better – ultralow BER in a few seconds
© 2009 Agilent Technologies, Inc.
2 July 22th, 2009

3. Comparison of Techniques
Transient Channel Channel
(SPICE-like) Simulator, Simulator,
Simulator Bit-by-bit mode Statistical mode
Method Modified nodal Bit-by-bit Statistical
analysis of superposition of calculations
Kirchoff’s current step responses based on step
laws for every response
time step
Applicability Linear and non- LTI, any specific LTI, fixed, general
linear circuits bit pattern, bit pattern, fixed
adaptive eq. taps eq. taps
BER floor in one ~10-3 ~10-6 Arbitrarily low
minute simulation
© 2009 Agilent Technologies, Inc.
3 July 22th, 2009

4. Channel Simulator: Bit-by-bit mode
1) SPICE-like transient response of single bit: runs on existing schematic
2) Response of millions of bits per minute using signal processing techniques
Superposition
ISI
© 2009 Agilent Technologies, Inc.
4 July 22th, 2009

5. Channel Simulator: Statistical mode
1) SPICE-like transient response of single bit: runs on existing schematic
2) Statistical calculations including ISI, crosstalk, jitter specification, equalizers,
and encoding
© 2009 Agilent Technologies, Inc.
5 July 22th, 2009

6. Channel Simulator: Bit-by-bit and Statistical Modes
Integrate layout EyeDiff_Probe
EyeDiff
artwork into V+
ML2CTL_V
schematic V-
CLin1
4
1
Via1
2
TL1
3 Re f
S4P
SNP1 Metal-1 Via2
TL2
Dielectric-1 blah
Metal-2
Metal-i : T[i], COND[i], TYPE[i]
blah_1
Dielectric-i : ER[i], H[i], T AND[ i]
ModelType=MW
Subst1
© 2009 Agilent Technologies, Inc.
6 July 22th, 2009

7. Demo
youtube.com/watch?v=AZ8Kv8l4Fjc
© 2009 Agilent Technologies, Inc.
7 July 22th, 2009

8. Summary and Next Steps
• Explore a large design space quickly using statistical
channel simulation and optimization of BER contours
versus eye mask goals
• In-depth webcast: live July 29th, 2009 11AM PDT
http://event.on24.com/r.htm?e=151461&s=1&k=45AAAF345F3B6FC01400112AD06ED046
Google “Agilent channel simulator webcast”
• Application page:
http://www.agilent.com/find/signal-integrity
• Blog:
http://signal-integrity-tips.com
• Evaluate ADS 2009 Update 1:
http://www.agilent.com/find/eesof-ads2009-update1
– Early Access (beta) available now
– Product Shipment in September
© 2009 Agilent Technologies, Inc.
8 July 22th, 2009