This short document promotes Haiku Deck, a presentation creation tool, and encourages the reader to create their own Haiku Deck presentation. It provides a link to get started making a Haiku Deck presentation on SlideShare.
This document outlines 8 trends that will impact ad tech in 2015 according to Sloan Gaon, CEO. The trends are: 1) Programmatic TV will become a buzzword, 2) Private marketplaces will remain difficult to implement, 3) High impact ad formats will replace display ads, 4) The ad tech industry will experience a wave of consolidation, 5) The Lumascape model will be challenged, 6) The death of DMPs, 7) Ad quality will drive industry growth, 8) Contextual targeting will become more important. The document predicts another year of exciting changes and opportunities in the ad tech industry.
This document summarizes the results of a boundary scan test (BST) performed on a Microchip PIC32 microprocessor unit (MPU) using a Lorenzo Electronics LE1201 BST controller. The BST tested individual MPU pins for shorts by driving each pin high while pulling the others low. On a successful test, the driven pin value was correctly captured on the input cell. When a pin was shorted to ground, the test failed to detect the driven value. The document provides snippets from the BST output files detailing the passed and failed test results.
Patrick M. Meathe is an executive and business process improvement consultant with over 30 years of experience in sales management, marketing, and operations across various industries. He has a proven track record of consistently increasing profits through strategic planning, new product development, and operational improvements. Meathe has extensive experience leading turnarounds of companies with revenues from $3 million to $30 million, reducing costs and increasing profits within 18 months. He has strong skills in developing sales teams, conducting due diligence for acquisitions, and holding leadership positions in both for-profit and non-profit organizations.
This document describes standalone boundary scan testing (BST) using a Xilinx FPGA board from Lorenzo Electronics. It utilizes a 100% digital methodology to interact bidirectionally with external circuits for deterministic test results without needing test fixtures or analog sensors. The document provides examples of how the BST works, including using an FPGA connected to a JTAG controller to write text to an LCD display via boundary scan cells, a test execution screen listing test patterns and lines of code, and a CSV output file detailing states of tri-control and output cells driving external pins under test.
This document describes a self-test of the Lorenzo Electronics LE1200 integrated digital in-circuit tester (ICT) and boundary scan tester (BST). The self-test checks the ability to detect faults by running test patterns on portions of the ICT system board containing four FPGA chips with boundary scan capability. Test patterns are executed with and without an inserted fault to demonstrate the fault detection capabilities. Excerpts from the test trace files highlight the detection of a fault inserted by connecting a ground wire to one of the ICT pins.
This document describes testing the integrated digital in-circuit tester and boundary scan tester of the Lorenzo Electronics LE1200 system board. The self-test was enhanced to test two boundary scan devices simultaneously using additional tester pins. Fault insertion testing was also performed by attaching a jumper wire to induce faults. Test results showed the faults were correctly detected, such as a pin detecting logic low instead of the expected logic high.
This document describes using an automatic test controller called the LE1200 to perform both boundary scan testing (BST) and in-circuit testing (ICT) on a PIC32 microcontroller-based development board. The LE1200 is connected to the board via ribbon cables and can interleave BST and ICT test patterns to thoroughly test the board and its connections. Sample test result files are shown, with faults correctly detected when a pin on the microcontroller is shorted to ground during testing.
This document describes a self-test of the Lorenzo Electronics LE1200 integrated digital in-circuit tester and boundary scan tester. The self-test checks the ability to detect faults by running test patterns between the tester pins and boundary scan pins on FPGA chips on a system board. Excerpts from the test trace files are presented to illustrate normal operation and detection of a inserted ground fault.
This document outlines 8 trends that will impact ad tech in 2015 according to Sloan Gaon, CEO. The trends are: 1) Programmatic TV will become a buzzword, 2) Private marketplaces will remain difficult to implement, 3) High impact ad formats will replace display ads, 4) The ad tech industry will experience a wave of consolidation, 5) The Lumascape model will be challenged, 6) The death of DMPs, 7) Ad quality will drive industry growth, 8) Contextual targeting will become more important. The document predicts another year of exciting changes and opportunities in the ad tech industry.
This document summarizes the results of a boundary scan test (BST) performed on a Microchip PIC32 microprocessor unit (MPU) using a Lorenzo Electronics LE1201 BST controller. The BST tested individual MPU pins for shorts by driving each pin high while pulling the others low. On a successful test, the driven pin value was correctly captured on the input cell. When a pin was shorted to ground, the test failed to detect the driven value. The document provides snippets from the BST output files detailing the passed and failed test results.
Patrick M. Meathe is an executive and business process improvement consultant with over 30 years of experience in sales management, marketing, and operations across various industries. He has a proven track record of consistently increasing profits through strategic planning, new product development, and operational improvements. Meathe has extensive experience leading turnarounds of companies with revenues from $3 million to $30 million, reducing costs and increasing profits within 18 months. He has strong skills in developing sales teams, conducting due diligence for acquisitions, and holding leadership positions in both for-profit and non-profit organizations.
This document describes standalone boundary scan testing (BST) using a Xilinx FPGA board from Lorenzo Electronics. It utilizes a 100% digital methodology to interact bidirectionally with external circuits for deterministic test results without needing test fixtures or analog sensors. The document provides examples of how the BST works, including using an FPGA connected to a JTAG controller to write text to an LCD display via boundary scan cells, a test execution screen listing test patterns and lines of code, and a CSV output file detailing states of tri-control and output cells driving external pins under test.
This document describes a self-test of the Lorenzo Electronics LE1200 integrated digital in-circuit tester (ICT) and boundary scan tester (BST). The self-test checks the ability to detect faults by running test patterns on portions of the ICT system board containing four FPGA chips with boundary scan capability. Test patterns are executed with and without an inserted fault to demonstrate the fault detection capabilities. Excerpts from the test trace files highlight the detection of a fault inserted by connecting a ground wire to one of the ICT pins.
This document describes testing the integrated digital in-circuit tester and boundary scan tester of the Lorenzo Electronics LE1200 system board. The self-test was enhanced to test two boundary scan devices simultaneously using additional tester pins. Fault insertion testing was also performed by attaching a jumper wire to induce faults. Test results showed the faults were correctly detected, such as a pin detecting logic low instead of the expected logic high.
This document describes using an automatic test controller called the LE1200 to perform both boundary scan testing (BST) and in-circuit testing (ICT) on a PIC32 microcontroller-based development board. The LE1200 is connected to the board via ribbon cables and can interleave BST and ICT test patterns to thoroughly test the board and its connections. Sample test result files are shown, with faults correctly detected when a pin on the microcontroller is shorted to ground during testing.
This document describes a self-test of the Lorenzo Electronics LE1200 integrated digital in-circuit tester and boundary scan tester. The self-test checks the ability to detect faults by running test patterns between the tester pins and boundary scan pins on FPGA chips on a system board. Excerpts from the test trace files are presented to illustrate normal operation and detection of a inserted ground fault.
The global data in PulsePoint's Intelligence Report examines trends and changes in inventory, ad spend, and contextual categories on mobile and desktop in 2014. The report projects how programmatic will move to mobile, contextual targeting will move RTB beyond the cookie, and the North American market share will shift to Europe and Asia.
The document describes testing of an analog subtractor circuit using an LE1200 integrated digital, analog, and boundary scan tester. The tester is used to sweep voltage levels on the circuit inputs and verify the outputs fall within expected ranges. A test interface circuit handles out of range outputs. Fault insertion testing is also demonstrated by grounding an op-amp pin, causing some output measurements to fail as expected.
The document discusses enhancing an LE1201 automatic test equipment system to support an XJTAG XJLink2 JTAG controller. It presents results from standalone boundary scan tests of an FPGA using the XJLink2 controller to drive LCD pins and from testing a Microchip MPU development board, showing existing tests can be run without changes.
Brand Safety/ Impression Quality Index (US) PulsePoint
Our Impression Quality Index™ (IQ Index™) is the first of its kind to capture, analyze and filter content, audience and environmental data to determine both Audience Quality and Inventory Quality. This holistic approach ensures that campaigns are delivered within relevant, brand safe contextual environments to the right audience.
The global data in PulsePoint's Intelligence Report examines trends and changes in inventory, ad spend, and contextual categories on mobile and desktop in 2014. The report projects how programmatic will move to mobile, contextual targeting will move RTB beyond the cookie, and the North American market share will shift to Europe and Asia.
The document describes testing of an analog subtractor circuit using an LE1200 integrated digital, analog, and boundary scan tester. The tester is used to sweep voltage levels on the circuit inputs and verify the outputs fall within expected ranges. A test interface circuit handles out of range outputs. Fault insertion testing is also demonstrated by grounding an op-amp pin, causing some output measurements to fail as expected.
The document discusses enhancing an LE1201 automatic test equipment system to support an XJTAG XJLink2 JTAG controller. It presents results from standalone boundary scan tests of an FPGA using the XJLink2 controller to drive LCD pins and from testing a Microchip MPU development board, showing existing tests can be run without changes.
Brand Safety/ Impression Quality Index (US) PulsePoint
Our Impression Quality Index™ (IQ Index™) is the first of its kind to capture, analyze and filter content, audience and environmental data to determine both Audience Quality and Inventory Quality. This holistic approach ensures that campaigns are delivered within relevant, brand safe contextual environments to the right audience.