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- 1. www.parksystems.com Aplicaciones de la Microscopia de Fuerza Atómica Dra. Gabriela Mendoza. Científica en aplicaciones, Park Systems, Inc. Agosto 30, 2019
- 2. Park Systems es un fabricante líder mundial de Microscopios de Fuerza Atómica y Sistemas de Microscopía de Nanoescala Emergentes.
- 3. Park Systems www.parksystems.com Copyright Park Systems Corp., All rights reserved. 3 Park Systems suministra una amplia gama de AFM que son adecuados para diversas aplicaciones en el mercado
- 4. Park Systems www.parksystems.com Copyright Park Systems Corp., All rights reserved. 4 Linea de productos Park AFM AFM Investigación AFM industrial - Plataforma común: escáner desacoplado - True Non-Contact - Automatización SmartScan
- 5. Mayor precision – La más alta resolución – Fácil de usar 5 Escaner Park AFM Escáner XY y Z desacoplados Tecnologia Park AFM Modo: True Non-Contact™ Park SmartScan™
- 6. Contenido 6Confidential and Proprietary, Park Systems Aplicaciones Modos de operación Aplicación en NCM Aplicación en SICM Aplicación con modo PinPoint Aplicación en LFM
- 7. Park Systems www.parksystems.com Copyright Park Systems Corp., All rights reserved. 7 APLICACIONES
- 8. Park Systems www.parksystems.com Copyright Park Systems Corp., All rights reserved. 8 Modos basicos
- 9. Park Systems www.parksystems.com Copyright Park Systems Corp., All rights reserved. 9 NCM (video)
- 10. Park Systems www.parksystems.com Copyright Park Systems Corp., All rights reserved. 10 Topografia en NCM. Matriz polimerica 10 512 x 512 px NCM Si cantilever Adaptive scan NX10 50 x 50 um 25 x 25 um 10 x 10 um
- 11. Park Systems www.parksystems.com Copyright Park Systems Corp., All rights reserved. 1111 Topografia 5 x 5 um Fase 5 x 5 um Topografia y fase 512 x 512 px NCM Cantilever Si Adaptive scan NX10
- 12. Park Systems www.parksystems.com Copyright Park Systems Corp., All rights reserved. 12 XEI. Análisis de perfil de líneas 12 Dx=0.856 um Dx=1.341 um Dx=1.000 um Dy=320 nm Dy=369 nm Dy=496 nm Topography 5 x 5 um
- 13. Park Systems www.parksystems.com Copyright Park Systems Corp., All rights reserved. 13 XEI. Análisis de granos 13 Length =1.539 um Length = 1.242 um Topography 5um x 5um *Peak to valley roughness (Rpv), Root mean square roughness (Rq), Roughness average (Ra) Graph
- 14. Park Systems www.parksystems.com Copyright Park Systems Corp., All rights reserved. 14 Modos especiales Confidential and Proprietary, Park Systems, Inc. 14
- 15. Park Systems www.parksystems.com Copyright Park Systems Corp., All rights reserved. 15 SICM (video)
- 16. Park Systems www.parksystems.com Copyright Park Systems Corp., All rights reserved. 16 SICM Técnica de no contacto Nano pipeta con solución electrolítica La corriente iónica dependiente de la distancia se utiliza como retroalimentación. • Falta de especificidad química SECM Información electroquímica El microelectrodo escanea lateralmente a través del sustrato mapea la reactividad de la superficie Corriente Faradaica oxidación o reducción Sistema de retroalimentación • Incrementar especificidad química • Retroalimentación precisa para el control de distancia de la superficie de la sonda SICM-SECM hibrido
- 17. Park Systems www.parksystems.com Copyright Park Systems Corp., All rights reserved. 17 SICM-SECM Sonda Depósito térmico 10 nm Cr/250 nm Au Depósito químico de vapor Dichloro-p- xylylene FIB Shi, W.; Baker, L. A. RSC Adv. 2015, 5, 99284-99290. Pipeta de cuarzo
- 18. Park Systems www.parksystems.com Copyright Park Systems Corp., All rights reserved. 18 SICM-SECM Setup con Park NX10 NX Controlador Amperimetro Corriente Faradaica a AUX IN 2 Corriente ionica como feedback SICMSECM Cabezal SICM PE RE AuE Pipeta: 100 mM KCl Bano: 100 mM KCl + 10 mM Ru(NH3)6 3+ Potencial: -0.5 V Muestra: Barras de oro sobre Pyrex Oro sobre sustrato de Pyrex • Ancho: 10 um • Paso: 20 um • Altura: 300 nm
- 19. Park Systems www.parksystems.com Copyright Park Systems Corp., All rights reserved. 19 Resultados -Feedback Hindered diffusion +Feedback Redox Cycling
- 20. Contenido 20Confidential and Proprietary, Park Systems Aplicaciones Modos de operación Aplicación en NCM Aplicación en SICM Aplicación con modo PinPoint Aplicación en LFM
- 21. Park Systems www.parksystems.com Copyright Park Systems Corp., All rights reserved. 21 Modos nanomecánicos
- 22. Park Systems www.parksystems.com Copyright Park Systems Corp., All rights reserved. 22 PinPoint (video)
- 23. Park Systems www.parksystems.com Copyright Park Systems Corp., All rights reserved. 23 Propiedades nanomecánicas Energía de adhesión Fuerza de adhesion Altura Superficie 1 Superficie 2 Superficie 3 La adhesión de bacterias se basa en la interacción física entre dos o mas superficies
- 24. Park Systems www.parksystems.com Copyright Park Systems Corp., All rights reserved. 24 Propiedades nanomecánicas Energia de adhesion Fuerza de adhesion Altura Energía de adhesión y fuerza de adhesión tuvieron un comportamiento similar Los valores mas bajos se observaron para la bacteria comparados con el sustrato. Lo anterior indica que se requiere menos fuerza sobre la bacteria La bacteria aislada en aire es menos adhesiva que el sustrato. 400 aJ 200 aJ 45 nN 20 nN Chip de silicio Bacteria Energia de adhesion Fuerza de adhesion Altura
- 25. Park Systems www.parksystems.com Copyright Park Systems Corp., All rights reserved. 25 PinPoint ~0.1 GPa~2 GPa ~1.07 GPa ~1.57 GPa ~0.196 fJ ~1.608 fJ
- 26. Park Systems www.parksystems.com Copyright Park Systems Corp., All rights reserved. 26 Lateral Force Microscopy (video)
- 27. Park Systems www.parksystems.com Copyright Park Systems Corp., All rights reserved. 27 LFM Se mide la deflexión en dirección horizontal La deflexión lateral del cantilever ocurre como resultado de la fuerza encontrada por el cantilever mientras escanea horizontalmente a lo largo de la superficie de la muestra. Los factores que determinan la magnitud de esta deflexión incluyen: – Coeficiente de fricción – Topografía de la superficie de la muestra – Dirección de escaneo – Spring constant lateral
- 28. Park Systems www.parksystems.com Copyright Park Systems Corp., All rights reserved. 28 Muestra 1 Polímero sobre vidrio 256 px x 256 px 20 um x 20 um 1 Hz LFM Forward LFM BackwardTopo
- 29. Park Systems www.parksystems.com Copyright Park Systems Corp., All rights reserved. 29 Muestra 2 Grafeno sobre silicio LFM & SThM 256 px x 256 px 15 um x 15 um 0.6 Hz LFM SThMTopo
- 30. Park Systems www.parksystems.com Copyright Park Systems Corp., All rights reserved. 30 www.parksystems.com
- 31. Park Systems www.parksystems.com Copyright Park Systems Corp., All rights reserved. 31 Eventos próximos Workshop Colombia Septiembre 11 y 12 Medellín: Universidad Nacional de Colombia Medellin: Universidad EAFIT XVIII MRS Meeting. Balneário Camboriú, Brazil. Septiembre 22-26
- 32. Gracias Gabriela Mendoza gabriela@parksystems.com 32Confidential and Proprietary, Park Systems
Editor's Notes
- Before we get started, I will give you a brief introduction about Park Systems Park Systems is a world-leading manufacture of atomic force microscopes, and emerging nanoscale microscopy systems,
- Our product line covers just about every usage case with fully manual to fully automated cases. As you can see here, from XE7 to NX-Hivac for research uses on topo And from NX-HDM to NX-3DM in our industrial systems.
- And our AFM technology offers the best accuracy, the highest resolution, and, is the easiest to use on market
- Now, after the short introductory remarks about our company, let’s get started. Here is a brief outline for today’s presentation:
- As you may know, AFM has a wide variety of applications in diverse fields such as materials, electronics, manufacture, nanotechnology and last but not least life science. On the right hand side we can see AFM images from collagen fibers, topography of muscle fiber, cellular surface morphology
- Let’s recap, For SICM, a distance-dependent ion current is used as feedback, which provides a very robust probe-substrate distance control. Powerful as it is, SICM does not have any chemical specificity. For SECM, on the other hand, uses Faradaic current originated from either the oxidation or reduction of the electrochemical species in solution. With SECM, the electrochemical activity map of the surface under study can be obtained. However, the drawback in SECM lies in the fact that feedback-controlled probe positioning is complicated by the different Faradaic current behavior over conductive and insulative substrates. In conventional SECM measurements, constant-height imaging is used, in which the tip is maintained at a constant height from the surface and the faradaic current is recorded. In constant-height SECM imaging, when variations in surface topography and reactivity occurs concurrently, the data interpretation becomes problematic. So, if we can have combine SICM and SECM together, the hybrid SICM-SECM technique will have the robust probe position control from SICM, and also have the chemical specificity from SECM. Now, the question is, how to do that?
- OK, so this is the fabrication approach for the probes we employed for this SICM-SECM expt. We start with a quartz pipette, we pull it to an opening diameter of tens of nm. This is a scanning transmission electron microscopy (STEM) of a pipette, and this is the one pipette that we carried through the whole process. A Cr adhesion layer followed by a Au layer was thermally deposited on the quartz surface. So we end up with a quartz pipette with a portion of it coated with a conductive gold layer, and that’s shown here in this STEM image. We then overcoat this Au-coated pipette with a layer of parylene C. You can now see from the STEM image, here is the Au layer, here is the parylene layer that’s over coating the entire pipette. Finally we take this pipette to a focus ion beam, or FIB, what FIB will allow you to do is essentially do nanoscale sculpting. We chop off the end of the tip and expose the gold layer here and the nanopore here. So we now have a central pore that’s useful for doing SICM And this electrode that’s in a cresent shape, this gold crescent electrode can be used to record faradaic electron transfer. Here in the center we measure ion transfer, like K+, Cl- And electron transfer is measured at this gold electrode. Here is the electron micrograph of the final probe, here is the pipette in the center, and here is the gold crescent electrode, and here is the parylene coating on the outside. Now the reason why we want to use a parylene coating is we want to limit the active electrode area to this small crescent around the tip. If we did not put this coating on the outside, the active electrode area will be the entire gold layer around the pipette, we will be measuring the electrochemical response everywhere around the pipette as oppose to just the tip.
- To give you a better idea of how we realize the SICM-SECM experiment. I have here the cartoon illustration of the instrument setup and the real-life photograph of the setup side by side. In the schematic illustration, we have an ammeter connected to the Au crescent electrode, the measured Faradaic current is then fed to the auxillary ADC channel of the AFM controller, which will then enable the user to monitor and record the Faradaic current with the software. In the photo, SICM-SECM experiment performed with a Park NX10 system is shown. Here is the SICM-SECM probe. A IC clip is connected to the Au part to make electrical connection for SECM measurement. For SICM measurement, we have a pipette electrode back-inserted into the nanopipette here, and the reference electrode in the bath solution here. In the petri-dish, we have the SICM-SECM standard sample immersed in the bath solution. So what is the SICM-SECM standard sample?
- Now, after the short introductory remarks about our company, let’s get started. Here is a brief outline for today’s presentation:
- Adhesion energy and adhesion force images of a single bacteria as well as 3D topographical image were obtained at the same time on the NX-10 using PinPoint mode. The coloring of each pixel representing the elasticity and the adhesion map was determined from the calculation generated by PinPoint FD curve at each pixel. 3D topography shows exact positional match with the FD spectroscopy maps. Bacterial adhesion is based on physical interactions between two or more surfaces. If we consider the tip on the cantilever as surface 1, bacteria as surface 2, and the silicon wafer as surface 3. All three surfaces have different physicochemical properties: surface area, surface energy, surface roughness size and shape, which affect the adhesion force and energy.
- The adhesion energy and adhesion force behaved in a similar manner; smaller values were observed for the bacteria compared with the substrate where they were attached. The isolated bacteria in air is observed to be relatively less adhesive than that of the underlying Si substrate. The test results show that the probiotic bacteria under study were less adhesive to the Si cantilever tip compared to the Si substrate. This phenomenon can be correlated with the adhesion of probiotic strains to the site of action, an important prerequisite for probiotic action.
- If you want to learn more, please visit Parksystems.com for more information
- With that I want to thank you for your attention. Richard?