Mike Ryland presented the design of a dense memory module connector. Some key points:
- The connector uses a tapered beam contact design to uniformly distribute stress along the contact length and minimize local stress concentrations. Simulation found the design can withstand the target 5.3 gram normal force per contact.
- Prototypes of the tapered beam contacts were manufactured and tested, showing the design had minimal permanent deformation after a 0.015mm deflection.
- The complete DMM module design houses the pin-socket-BGA interconnect array and includes features for thermal management within a 1U chassis.
- Tolerance analysis and simulations were performed to validate the design could meet requirements with the expected variances