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Finishing of Individual Sapphire Wafers
University of Florida
Center for Manufacturing Innovation
A.J Garcia
November 24, 2014
Sapphire (Al203) Background
• Hexagonal structure
• 9 mohs scale hardness
• Chemically and biologically
inert
• Non-thrombogenic
• 2040 °C melting point
• Low thermal expansion coeff.
• Wide transmission range
• 0.18 µm – 5.5 µm
• Stretches from IR to UV
• Birefringent
• Electrical insulator
• Anisotropic
2
(http://www.cyberphysics.co.uk/topics/light/emspec
t.htm)
Applications
• Electronics
• Epitaxial growth of semiconductors
• Gallium nitride LED manufacturing
• Silicon-on-sapphire integrated circuits
• Radiation hardened devices
• Scratch resistant screens
• Corrosion resistant components
• Nozzles, crucibles
• Optical windows and lenses in extreme
environments
Motivation
• Applications demand
precision surfaces
• Electrical industry
• Uniform semiconductor
growth
• Precision form
requirements
• Optical industry
• Image distortion
• Incomplete transmission
Effect of magnet arrangements
Guide magnet arrangement investigation
Workpiece
10 mm x 10 mm x 1 mm rectangular
sapphire
Slurry
50-70 µm diamond abrasive mixed with
lubricant
Abrasive surface P120 grit abrasive paper
Guide magnet arrangement 1, 2, 3
Set guide magnet rotation
speed
350 rpm
Finishing time 20 min
0.85 0.9
1.75
0
0.2
0.4
0.6
0.8
1
1.2
1.4
1.6
1.8
2
1 2 3
Ave.ThicknessReductionµm/min
Guide magnet arrangement
• Aim to improve tool motion
• Eliminating sticking
• Arrangement 3 enabled ideal motion
• Motion produced greater thickness reduction across
surface
Surface roughness
• 6 measurements along diagonal
• 2.02 mm spacing
• Abrasive: 0-0.5 µm diamond abrasive slurry
• Average initial roughness: 937 nm Sa
d
0
y
x
10 mm
10 mm
Measurement locations
(equally spaced)
WOT roughness reduction: Results
• Average roughness after finishing: 700 nm Sa
• Partial finishing of surface
• Smooth plateaus amid rough valleys
• 0-0.5 µm abrasive does not penetrate valleys
0
200
400
600
800
1000
1200
2.02 4.04 6.06 8.08 10.1 12.12
SurfaceRoughnessRa[nm]
Diagonal Distance From Corner [mm]
Before After
Results
Surface Roughness with Flooded
Basin
0
0.5
1
1.5
2
2.5
3
3.5
4
0 6.3 12.6 18.9 25.2 31.5
RoughnessSa[nm]
Radial distance from center [mm]
Before finishing
After finishing
Radial
Distance [mm] 0 6.3 12.6
Unpolished
surface
Polished
surface
Radial
Distance [mm] 18.9 25.2 31.5
Unpolished
surface
Polished
surface
Sa = 1.77 nm Sa = 3.24 nm Sa = 1.40 nm
Sa = 1.55 nm Sa = 1.68 nm Sa = 1.68 nm
Sa = 0.67 nm Sa = 0.77 nm Sa = 1.52 nm
Sa = 1.67 nm Sa = 1.35 nm Sa = 1.99 nm
Tool magnet sticking
• Evidence of excessive magnetic flux
• High magnetic force
• High normal reaction force
• High friction
• Exclusion of lubricant and diamond particles
N
S
N
S
Magnetic force
Guide
magnet
Tool magnet
Workpiece
Iron particle
Abrasive
particle
Normal
force
Jig
Magnetic field density
-10
10
30
50
70
90
110
130
0 5 10 15 20 25 30
Magneticfluxdensity[mT]
Radial distance from center, r [mm]
3mm
6mm
9mm
12mm
15mm
12.7 mm
r
Tool
magnet
Guide
magnet
• 3 mm jig height
• Steep drop in magnetic flux density
• Maximum of 121 mT
• 9 mm jig height
• 71 mT
• Consistent across tool magnet
Jig height
0
16 mm +
jig height
Surface roughness with 9 mm jig
height
• Average before: 6.0 nm Sa
• Average after: 0.9 nm Sa
0
1
2
3
4
5
6
7
8
9
10
0 6.3 12.6 18.9 25.2 31.5
SurfaceRoughnessSa[nm]
Radial Distance from Center of Polishing [mm]
Before Finishing
After finishing
Abrasive path simulation
• End goal:
• Develop method for predicting material removal
• Plan:
• Design mathematical model of ideal particle motion
• Observe correlation between surface changes and
number of particle passes
• Observe changes caused by parameter variation
• Introduce corrective terms
Simulation Plot
• Example parameters:
• R = 3, r = 1, h = 0.5, ω = 6.28, t = 1, res = 2
• xmin = -5, xmax = -4, ymin = -1, ymax = 1
Simulation inaccuracies
• Inaccuracies noticed when h = 0
𝑥 𝑡 = 𝑅 + 𝑟 cos(ω𝑡) − ℎ cos
𝑅 + 𝑟
𝑟
ω𝑡
𝑦 𝑡 = 𝑅 + 𝑟 sin(ω𝑡) − ℎ sin
𝑅 + 𝑟
𝑟
ω𝑡
𝑥 𝑡 = 𝑅 + 𝑟 cos(ω𝑡)
𝑦 𝑡 = 𝑅 + 𝑟 sin(ω𝑡)
• Becomes parametric
equations of a circle
• Simulation generates an
annulus
Simulation inaccuracies
• Generate circle using parametric circle equations
𝑥 𝑡 = 𝐴 cos(ω𝑡)
𝑦 𝑡 = 𝐴 sin(ω𝑡)
• A = 10, ω = 21 rad/s
• t = 0 s : 900 s
• Also generates an
annulus
• Thickness increases with
t
• res too low
High res circle
• Same parameters to generate circle
• res increased from 4 to 6
• Correctly represents a circle
• Lower res limit set to 6
AJ Garcia Honors Thesis sample

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AJ Garcia Honors Thesis sample

  • 1. Finishing of Individual Sapphire Wafers University of Florida Center for Manufacturing Innovation A.J Garcia November 24, 2014
  • 2. Sapphire (Al203) Background • Hexagonal structure • 9 mohs scale hardness • Chemically and biologically inert • Non-thrombogenic • 2040 °C melting point • Low thermal expansion coeff. • Wide transmission range • 0.18 µm – 5.5 µm • Stretches from IR to UV • Birefringent • Electrical insulator • Anisotropic 2 (http://www.cyberphysics.co.uk/topics/light/emspec t.htm)
  • 3. Applications • Electronics • Epitaxial growth of semiconductors • Gallium nitride LED manufacturing • Silicon-on-sapphire integrated circuits • Radiation hardened devices • Scratch resistant screens • Corrosion resistant components • Nozzles, crucibles • Optical windows and lenses in extreme environments
  • 4. Motivation • Applications demand precision surfaces • Electrical industry • Uniform semiconductor growth • Precision form requirements • Optical industry • Image distortion • Incomplete transmission
  • 5. Effect of magnet arrangements Guide magnet arrangement investigation Workpiece 10 mm x 10 mm x 1 mm rectangular sapphire Slurry 50-70 µm diamond abrasive mixed with lubricant Abrasive surface P120 grit abrasive paper Guide magnet arrangement 1, 2, 3 Set guide magnet rotation speed 350 rpm Finishing time 20 min 0.85 0.9 1.75 0 0.2 0.4 0.6 0.8 1 1.2 1.4 1.6 1.8 2 1 2 3 Ave.ThicknessReductionµm/min Guide magnet arrangement • Aim to improve tool motion • Eliminating sticking • Arrangement 3 enabled ideal motion • Motion produced greater thickness reduction across surface
  • 6. Surface roughness • 6 measurements along diagonal • 2.02 mm spacing • Abrasive: 0-0.5 µm diamond abrasive slurry • Average initial roughness: 937 nm Sa d 0 y x 10 mm 10 mm Measurement locations (equally spaced)
  • 7. WOT roughness reduction: Results • Average roughness after finishing: 700 nm Sa • Partial finishing of surface • Smooth plateaus amid rough valleys • 0-0.5 µm abrasive does not penetrate valleys 0 200 400 600 800 1000 1200 2.02 4.04 6.06 8.08 10.1 12.12 SurfaceRoughnessRa[nm] Diagonal Distance From Corner [mm] Before After
  • 9. Surface Roughness with Flooded Basin 0 0.5 1 1.5 2 2.5 3 3.5 4 0 6.3 12.6 18.9 25.2 31.5 RoughnessSa[nm] Radial distance from center [mm] Before finishing After finishing
  • 10. Radial Distance [mm] 0 6.3 12.6 Unpolished surface Polished surface Radial Distance [mm] 18.9 25.2 31.5 Unpolished surface Polished surface Sa = 1.77 nm Sa = 3.24 nm Sa = 1.40 nm Sa = 1.55 nm Sa = 1.68 nm Sa = 1.68 nm Sa = 0.67 nm Sa = 0.77 nm Sa = 1.52 nm Sa = 1.67 nm Sa = 1.35 nm Sa = 1.99 nm
  • 11. Tool magnet sticking • Evidence of excessive magnetic flux • High magnetic force • High normal reaction force • High friction • Exclusion of lubricant and diamond particles N S N S Magnetic force Guide magnet Tool magnet Workpiece Iron particle Abrasive particle Normal force Jig
  • 12. Magnetic field density -10 10 30 50 70 90 110 130 0 5 10 15 20 25 30 Magneticfluxdensity[mT] Radial distance from center, r [mm] 3mm 6mm 9mm 12mm 15mm 12.7 mm r Tool magnet Guide magnet • 3 mm jig height • Steep drop in magnetic flux density • Maximum of 121 mT • 9 mm jig height • 71 mT • Consistent across tool magnet Jig height 0 16 mm + jig height
  • 13. Surface roughness with 9 mm jig height • Average before: 6.0 nm Sa • Average after: 0.9 nm Sa 0 1 2 3 4 5 6 7 8 9 10 0 6.3 12.6 18.9 25.2 31.5 SurfaceRoughnessSa[nm] Radial Distance from Center of Polishing [mm] Before Finishing After finishing
  • 14. Abrasive path simulation • End goal: • Develop method for predicting material removal • Plan: • Design mathematical model of ideal particle motion • Observe correlation between surface changes and number of particle passes • Observe changes caused by parameter variation • Introduce corrective terms
  • 15. Simulation Plot • Example parameters: • R = 3, r = 1, h = 0.5, ω = 6.28, t = 1, res = 2 • xmin = -5, xmax = -4, ymin = -1, ymax = 1
  • 16. Simulation inaccuracies • Inaccuracies noticed when h = 0 𝑥 𝑡 = 𝑅 + 𝑟 cos(ω𝑡) − ℎ cos 𝑅 + 𝑟 𝑟 ω𝑡 𝑦 𝑡 = 𝑅 + 𝑟 sin(ω𝑡) − ℎ sin 𝑅 + 𝑟 𝑟 ω𝑡 𝑥 𝑡 = 𝑅 + 𝑟 cos(ω𝑡) 𝑦 𝑡 = 𝑅 + 𝑟 sin(ω𝑡) • Becomes parametric equations of a circle • Simulation generates an annulus
  • 17. Simulation inaccuracies • Generate circle using parametric circle equations 𝑥 𝑡 = 𝐴 cos(ω𝑡) 𝑦 𝑡 = 𝐴 sin(ω𝑡) • A = 10, ω = 21 rad/s • t = 0 s : 900 s • Also generates an annulus • Thickness increases with t • res too low
  • 18. High res circle • Same parameters to generate circle • res increased from 4 to 6 • Correctly represents a circle • Lower res limit set to 6

Editor's Notes

  1. Structural and functional component High dielectric constant 90 % of blue LEDs