The explosion of sensors in all types of devices from “smart” consumer wearables and appliances to complex machines on manufacturing floors has given rise to a requirement to quickly analyze vast quantities of sensor metrics to provide meaningful insights. From exploratory to predictive analytics, analyzing time-series data is essential to address inefficiencies, identify risks and improve operations.
In this presentation, we will see how you can conduct exploratory analytics of time-series data rapidly to gain insights into the performance of the machines being monitored. We will talk about how to look at data from multiple metrics together in a holistic way to hone in on anomalies and identify potential problems. Finally, we will cover algorithms and techniques to predict future trends for time-series metrics. Along the way, we will discuss useful tools and technologies to perform time-series data analysis in minutes.
4. Type of Data Use Case
Financial Data Analyze stock performance
Census Data
Analyze population types and
growth
Sales Data
Analyze sales by region,
product, etc.
Industrial Data Analyze machine performance
Sample Uses Cases
5. Introduction
• Time series analytics in a variety of applications
• Classification
• Prediction
• Anomaly detection
• Pattern discovery
• And more…
5
Pattern 1 Pattern 2
Introduction Hybrid Neural Network(HNN) TreNet for Local Trend
ntroduction
Time series analytics in a variety of applications
• Classification
• Prediction
• Anomaly detection
• Pattern discovery
• And more…
5
Pattern 1 Pattern 2
ntroduction Hybrid Neural Network(HNN) TreNet for Local Trend
roduction
me series analytics in a variety of applications
Classification
Prediction
Anomaly detection
Pattern discovery
And more…
5
Pattern 1 Pattern 2
duction Hybrid Neural Network(HNN) TreNet for Local Trend
oduction
me series analytics in a variety of applications
Classification
Prediction
Anomaly detection
Pattern discovery
And more…
5
Pattern 1 Pattern 2
uction Hybrid Neural Network(HNN) TreNet for Local Trend
Time Series Applications
Classification
Prediction
Anomaly Detection Pattern Discovery