Micron Technologist Earns Multiple Achievement Awards

gSrcrcllt"
Micron Semiconduc'tor Asia Pte. Ltd. (Fab 7)
Qualiry ControlCircles
Cernfrcate Of Achia,anent
Awardedto
SATHISH KUMAR DEIVASIKAMAN I
who has successfully completed
EQCC pr oject 7- pt lesson of
Exhaust valve monitoring system
ln house Repair of Frequency Converter .
Design a box to secure the G2 alignment jig.
,":,, the RF bushing cooling sensor monitor wire connector
Awardedon March2AD
Director, MFG
.&

gficrlorr
Micron Semiconductor Asia Pte. Ltd. (Fab 7)
Certificate Of Achiarcment
Awardedto
SATH ISH KUMAR DEIVASIKAMANI
Leader
EQCC project L-pt lesson of
Design the GAS box door stopper.
Re.desin the RF Bushing encloser door.
Facilitate the clamp to hold the source shroud.
Design the holder for PFG water line connectors.
Aw ar ded in D ecewtb er 2011
Director, Services

fficron'
llicron Semlconductor Asia Pte. ttd. (Fab 7)
C ertificate Of Achia,ement
Awardedto
SATHISH KUMAR DEIVASIKAMANI
who has succestf"lly completed
EQCC project l-pt,lesson of
special tool to remove the viewing chamber glass
Design manual fork lift to lift down Q2 & Qg magnet assembly
Design a acrliyc collare to hold, pou exhaust for the MRS chamber
O"rr,n: a buffer sponge & fix on that edge of the rail to avoid hitting
Awarded onOctober 2012
Dhector,MFG

--
Micron Semiconductor Asia Pte. Ltd.
Co. Reg. No. 199802941W
No. 1 Woodlands lndustrial Park D, 5t 1
Singapore 738799
Tel: (65) 6360-1998
Mrcroll'
6h Mu 2ot2
Sathish Kumar Deivasikamani (Micron id : 1075880)
Technologist
IMPLANT/RTP2
THIN FILM/IMP
MFG
Dear Sathish,
SPOT AWARD
We would like to commend you for your display of Micron behavior Relentlessly focus on
bfficiency on spotting a tool issue which nearly went un-observed in IMLE7B5700.
Reason for Spot Award (Relentlesslv focusipg.gn, gffrcienpJ)
On Jan 31$, you spotted frttLE7B5700 Mini Environment fan tripped without alarm and tool
continued to process. You immediately alerted your respective EE and had the issue fixed. Your
alerbress prevent the tool from further processing wafers at the wrong environment conditions
which may impact the yield of the wafers. Your findings were feedback to Vendor which
resulted in a system fix solution to resolve the loop hole.
This is a commendable effort and as an appreciation for the contribution, we will be awarding
you with 5$100.00. The cash award will be credited in your pay.
Thank you and keep up the good work.
Yours sincerely,
Lim Beng
Lau Ming Su
Ivan Toh
Tang Meng Huat
Terence Toh
Director, FAB Operations
Manager, THIN FILM/IMP
Section Manager, IMPLANT/RTP2
HR Manager
cc:

Mrcrolr' Micron Semiconductor Asia Pte. Ltd.
Co. Reg. No.'199802941W
No. 1 Woodlands lndustrial Park D, St I
Singapore 738799
Tel: (65) 6365-1998
Jan26h,2013
Sathish Kumar Deivasikamani ( I 075880)
Technologist
IMPLANT/RTP2
THIN FILM/IMP
MFG
Dear Sathish,
SPOT AWARI)
We would like to commend you for your display of Micron behavior Relentlessly focus on
'efficiency
on spotting a tool issue which nearly went un-observed in IMMCT A2400.
Reason for Spot Bonus (Relentlesslv focusins on efficiencv)
On Jan 20ft, you spotted that IMMC7A2400 PFG flow sensor meter is not running but there was
no alarm and tool continued to process. You immediately alerted you respective EE and stopped
the tool. Your alertness prevent the tool from further processing without cooling and could lead
to further damage to the machine. Furthermore your findings were feedback to Vendor for a
system fix which will interlock tool whenever the mini environment conditions were
jeopardized.
This is a commendable effort and as an appreciation for the contribution, we will be awarding
you with S$100.00. The cash award will be credited in your pay.
Thank you and keep up the good work.
Yours sincerely,
Lim Beng Chea
Director, MFG
Lau Ming Su
Ivan Toh
Tang Meng Huat
Foo Kuo Yang
Director, FAB Operations
Manager, THIN FILM/IMP
Section Manager, IMPLANT/RTP2
HR Manager
cc:

r-r)
oro
o)
o
fti
EE.9o
rl E
lro h
Lr (A iX
9o;
o.=
=.=(t)
EEF9
o
3
o
o
oro
oc)
XC6
!rC)
6z=-sL
E-5
=-,'-};
==>t =
-
o.= E-r - t cr
n-'i Eo I s ,-
E
= t^, j
= +
.cl -I r E g
=:ENg i-€F> E i-iluc a =il- E
Et e E
-v
-
z
lrl
e
Ml-t
a
-(r, Fd
Eagt
=l-
M
)+l
I*r
a
-HI-.l
F
a
*i.
hjh,
a,hi
sr
af}l
-atfF
af..tt
Llt
,(:
I
r*rI
il ,
;@#r
ai-lrPr#l
:i3
Lf
ar
c
@
oul
ru<
=dnuI
--o-E
<i
E
o)
(d
o
o-
oo
O=
6i
=.(6
6e
E
.9
E-
o-
@

.N
la
do
[.9
Nt
N **Cbo
A, EE
'E=
-LO
t-trr(HM
i 9e
J EP
N EE
o!E
r,l
J
L
o
trI
o+,
oI
J
(J
rI
!I
oF{
frl
I
--.-
-vt
i
a
_t
-tTLJ
@o.a, c)
O -Fr
. J
5q-sld
@b
EA
co(Ua
Pro- a
cl=I_ Fr
OY'.F' u
(UO
b-sE
o
o
FI
GsFI
TE
V
-
1I
:,,,Ul
'fi
>rr
o
a
l-
G
EI
J
Y
?I
oII
?r
*,
G
o
e
.9ra-,
.*_oOo-
E
o
o
,' ()
.|lrl
$
oII.
rhl-
E(l)
O
ca
tr)
C..I
o
l< ..
R9
.= o

TECH Semiconductor Singapore Pte Ltd
Quality C ontr ol Cir cles
C er tificate Of Achiey ement
Awardedto
SATHISH KUMAR DEIVAS]KAMANI
.,,.
(Member)
who has successfully complet ed
EQCC project 7-pt lesson of
' Support Jig For Viista 810 Setup Cup Assembly
Easy lnstallation Of Viista 810 AMU Beam Dump
Fabricate Guide $haft To Facilitate HCS PFG lnstallation During PM
Wafer Platform To Prepare Wafer For Temperature Qual To Avoid Wafer Drop ln Chamber
Aw ar ded on 29 th July 2008
Yice President, Services
;

Qualrty C o ntr ol C ir cles
C er tificate Of Achiey ement
Awardedto
(Member)
EQCC project l-pt lesson of
Retrofit HCS Source Head Bushing Frcm Rubber Type to Ball Bearing
Fabrlcatlon Qf Jlg To Facilitate Safe Removal & lnstallation Of Cool TuLe
Extended Voltage Regulator Removal/lnstallation Using Holst & Liftlng Chain
Reduction ln IN.SETUP Time By Reducing Beam Tuning Retry Equipment bonfiguration
Aw ar ded on 29th August 2008
Vice President, Services

Qualrty C o ntr ol C ir cl e s
C er tific dte Of Achia, ement
Awardedto
(Member)
who has suc ces sfully c ompleted
QCC projecr title of
'High Energy RPT lmprovement
Awarded on27thFeb 2009
Ary-
Vice President, Services

Qualrty C o ntr ol C ir cles
C er tificdte Of Achiey ement
Awardedto
(Member)
who has succes sfully c ompleted
EQCC project L-ptlesson of
Modlfy The Gas Box Groundlng Rod To Remove Static Charge
Reroute-The Dl Water Llne To Dl Water Tank To lmprove Safety
To Prevent ncs PlaEma Flood Gun Fuse Blown DuE To short crrcurt
Upgrade Of 200 mm Manlpulator Suppresolon Plata To Use 300mm Tools
Aw ar ded on 28th April 2009

Wt
Qualrty C ontr ol Cir cles
C er tific ate Of A chiey ement
Awardedto
SATHISH KUMAR DEIVASIKAMAN I
(Member)
who has suc ces sfully c ompleted
EQCC project l-ptlesson of
. lmprovement of Buffer Vacuum Pressure
lnserting a T joint & manual valve between chamber
Retrofit bource RF bushing shield cover to prevent vacuum leak.
Re-locate of the pump Roughing line Exhaust Manometers Sampling point
Awarded on June2010

wTECH Semiconductor Singapore Pte Ltd
Qualrry ControlCircles
C ertific ate Of Achiev ement
Awardedto
(Member)
EQCC project L-ptlesson of
' Modify the source head insulator to avoid arcing
Upgrade the source head feed through to gold plated
Upgrade the main PD transformer to toroidal type to avoid heating
EMO switch contactor block and wiring changed to avoid power trip
Awarded on Septanber 2010
Yice President, Services

$*xsf,r"#wfe of Tee$rargea$ E*fx*sa$g"*si
Sfirgap0rne
It is hereby cefiified that
S athish Kumur D eivasikamoni
having successfully completed the programme of study
and passed.the prescribed examinations
was awarded the
ITE Skills Certificate
tn
Wafe, Fubricotion
I1,rJ^-.rr
Director & Chief Executive Officer
28 Fehruary 2007
Chairman, Board of Governors
I S C2 0060423 4 I G7 7 97 3 58W
010796

Micron Technologist Earns Multiple Achievement Awards

Recommended

Recommended

More Related Content

Similar to Micron Technologist Earns Multiple Achievement Awards

Similar to Micron Technologist Earns Multiple Achievement Awards (20)

Micron Technologist Earns Multiple Achievement Awards