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Model-based Testing of Embedded Real-Time Systems
                         in the Automotive Domain

                         Eng. Sc. D. candidate: Justyna Zander-Nowicka

                         Supervisor: Prof. Dr.–Ing. Ina Schieferdecker (TU Berlin)
                         Supervisor: Prof. Dr. rer. nat. Ingolf Krüger (UC San Diego)
                         Committee Chairman: Prof. Dr.–Ing. Clemens Gühmann (TU Berlin)


Doctoral Thesis Defense: December, 19th, 2008
Motivation

    Embedded systems in the automotive domain:
      Addressed characteristics:                                           Environment

          Hybrid: continuous signal flows and discrete events
          Real-time
          Reactive                                                Sensor                 Actuator

                   The complexity of car software
                   dramatically increases
                   The functions are distributed                      Embedded System
                   Demand to shorten time-to-market
                   Demand for quality assurance   safety             Embedded Software
                   standards IEC 61508 and ISO 26262

Testing:
          Demands 40-60% (EU, 2005) of development resources
          Systematic and automatic test approach starting at the earliest model phase of
          software development still missing
          Different companies use different technologies, methods, and tools

2     December, 19th, 2008              MBT of Embedded Systems                Justyna Zander-Nowicka
Outline




    I.     Model-based Testing (MBT)
    II.     Signal-feature Test Paradigm
             – Test Development Process
             – Signal-feature Detection for Test Evaluation
             – Signal-feature Application for Test Data Generation
    III.    The Test System
    IV.     Case Study
    V.      Summary and Outlook




3   December, 19th, 2008             MBT of Embedded Systems         Justyna Zander-Nowicka
I. Model-based Testing   II. Signal-Feature Test Paradigm   III. The Test System   IV. Case Study   V. Summary & Outlook


                                                                                            Model-Based Testing


    Model-based testing is testing in which the entire test specification is derived in
    whole or in part from both the system requirements and a model that describe
    selected functional aspects of the system under test (SUT).
    In this context, the term entire test specification covers the abstract test
    scenarios made concrete by the sets of test data and the expected SUT outputs.
    The test specification is organized in a set of test cases.
    Model-in-the-Loop for Embedded System Test (MiLEST) proposed in this thesis.



                                                        REQUIREMENTS

                                                                                                     Test Objectives



                              SYSTEM MODEL                  Interfaces and              TEST MODEL
                                                            Test Objectives




4   December, 19th, 2008                             MBT of Embedded Systems                                     Justyna Zander-Nowicka
I. Model-based Testing   II. Signal-Feature Test Paradigm   III. The Test System   IV. Case Study     V. Summary & Outlook

                                                                                                       MBT Taxonomy




                                                                                                     Acknowledgement: M. Utting et al. (2006)




                                                                                                                                 MiLEST

5   December, 19th, 2008                             MBT of Embedded Systems                                        Justyna Zander-Nowicka
I. Model-based Testing   II. Signal-Feature Test Paradigm   III. The Test System       IV. Case Study         V. Summary & Outlook

                     Related Work Challenges and Thesis Contributions

Open Issues:                                                         Solutions:

    Test data specification                                                 Automatic and systematic test data
       automatic, but only for structural                                   generation for functional test
       test or state-based models                                          Signal-feature – based generation of test
       systematic for functional test, but                                 data
       still only manual
    Automatic test evaluation, but mainly                                   Automatic and online test evaluation
    based on the reference signal flows                                     based on reference signal partition
                                                                           Signal-feature – based test assessment by
                                                                           application of validation functions


    Test process established, but not                                      Automation of MBT process
    efficient enough in terms of cost,                                     jjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjj
                                                                           Application of automated hierarchical test
    efforts, and reusability                                               patterns and transformations
                                                                           jjjjjjjjj

     Main goal              automatically created test design executable at the model level.

6   December, 19th, 2008                             MBT of Embedded Systems                                                 Justyna Zander-Nowicka
I. Model-based Testing   II. Signal-Feature Test Paradigm   III. The Test System   IV. Case Study     V. Summary & Outlook

                                                                               Signal Feature – Definition

    A signal feature, also called signal property, is a formal description of certain
    predefined attributes of a signal. It is an identifiable, descriptive property of a
    signal.
    A feature can be composed of or predicated by other features, logical
    connectives, or timing expressions.

     f(kT)                                                local max



                      decrease                                                                   step response
                                      increase                                                   characteristics


                           constant


                                                                                                                kT

                                                                                              time partitioning
                                                                                                        Acknowledgement: E. Lehmann (2003)

7   December, 19th, 2008                             MBT of Embedded Systems                                        Justyna Zander-Nowicka
I. Model-based Testing    II. Signal-Feature Test Paradigm   III. The Test System   IV. Case Study   V. Summary & Outlook

                                                       Proposed Test Development Process



                                  SUT as a Model
                                                              automatic generation – step I

                                  Test Harness Generation
                                                                 manual refinement – step II

                                  Test Specification
                                                            automatic generation – step III

                                  Test Data & Test Control Generation
                                                             automatic execution – step IV

                                  Verdicts Analysis



8   December, 19th, 2008                              MBT of Embedded Systems                                     Justyna Zander-Nowicka
I. Model-based Testing   II. Signal-Feature Test Paradigm   III. The Test System   IV. Case Study    V. Summary & Outlook

                                                                                                             Test Harness




9   December, 19th, 2008                             MBT of Embedded Systems                                      Justyna Zander-Nowicka
I. Model-based Testing   II. Signal-Feature Test Paradigm   III. The Test System   IV. Case Study   V. Summary & Outlook

                                               Signal-Feature Detection and Generation


                                                                                                           - temporal expressions
                                                                                                             (e.g., after(5ms))
                                                                                                           - logical connectives
                                                                                                             (e.g., and)

                                                                                               transformation




        Generate                                                                   Detect
     Signal Feature                                                            Signal Feature




                                           transformation



10     December, 19th, 2008                             MBT of Embedded Systems                                     Justyna Zander-Nowicka
I. Model-based Testing   II. Signal-Feature Test Paradigm   III. The Test System   IV. Case Study   V. Summary & Outlook

                                                             Increase Detection and Generation
     Detect Increase:
     The Increase feature can be detected by analyzing its derivative. This can be
     approximated (simplified version of the algorithm!) where the actual signal value
     and the past one (backward difference):
     feature(kT) = sign [signal (kT) − signal ((k − 1) * T)]
     feature(kT) is positive if the signal increases.

     Generate Increase:




     Example:


11   December, 19th, 2008                             MBT of Embedded Systems                                     Justyna Zander-Nowicka
I. Model-based Testing   II. Signal-Feature Test Paradigm   III. The Test System   IV. Case Study    V. Summary & Outlook

     Classification of Signal-Feature Detection Mechanisms (1)

       Time-independent




                                                                                                               Acknowledgement: A. Marrero-Pérez (2007)

12   December, 19th, 2008                                         MBT of Embedded Systems                                       Justyna Zander-Nowicka
I. Model-based Testing   II. Signal-Feature Test Paradigm   III. The Test System   IV. Case Study    V. Summary & Outlook

     Classification of Signal-Feature Detection Mechanisms (2)
      Triggered




                                                                                                           Acknowledgement: A. Marrero-Pérez (2007)

13   December, 19th, 2008                                     MBT of Embedded Systems                                       Justyna Zander-Nowicka
I. Model-based Testing   II. Signal-Feature Test Paradigm     III. The Test System     IV. Case Study   V. Summary & Outlook

                                                                               Levels of Test Design in MiLEST



                          Test Specification                                                        Test Data Generation
                         designed manually                                                         obtained automatically




                                                                                                                                                  refinement
                                                                         Transformation
abstraction




                          Test Harness Level                                                            Test Harness Level
                                                                         Transformation

                       Test Requirement Level                                                      Test Requirement Level
                                                                         Transformation
                      Validation Function Level                                                          Test Case Level
                                                                         Transformation
                       Feature Detection Level                                                   Feature Generation Level




                                             IF preconditions set THEN assertions set

                                             IF preconditions set THEN generations set


14            December, 19th, 2008                             MBT of Embedded Systems                                         Justyna Zander-Nowicka
I. Model-based Testing     II. Signal-Feature Test Paradigm    III. The Test System     IV. Case Study   V. Summary & Outlook

                                                                                     Test Patterns Classification
       Test Specification Patterns
               Test Requirement Level
                       Validation Function Level
                          -    Signal-Feature Detection Level




       Test activity          Test pattern name                Context                               Problem                Solution instance

                              Detect step             Test of an electronic        Assessment of an ECU behavior in
     Test specification
                              response features       control unit (ECU)           terms of a selected signal feature


15        December, 19th, 2008                               MBT of Embedded Systems                                        Justyna Zander-Nowicka
I. Model-based Testing   II. Signal-Feature Test Paradigm   III. The Test System   IV. Case Study   V. Summary & Outlook

                                                                           Pedal Interpretation Example

Interpretation of accelerator pedal position
Normalized accelerator pedal position (phi_Acc) should be interpreted as
desired driving torque (T_des_Drive). The desired driving torque is scaled in
the non-negative range in such a way that the higher the velocity (v) is
given, the lower driving torque is obtained (Conrad, 2004).



IF v=const AND phi_Acc increases
     THEN T_des_Drive increases


IF v=const AND phi_Acc decreases
     THEN T_des_Drive decreases


IF v=const AND phi_Acc=const
     THEN T_des_Drive=const


IF v increases AND phi_Acc=const
       AND T_des_Drive>=0
 THEN T_des_Drive does not increase




16     December, 19th, 2008                             MBT of Embedded Systems                                     Justyna Zander-Nowicka
I. Model-based Testing             II. Signal-Feature Test Paradigm      III. The Test System       IV. Case Study               V. Summary & Outlook

                                                                     MiLEST Quality Metrics – an Example


                                                                    # of variants for a selected SigF applied in a test design
     Variants coverage for a SigF =
                                                                          # of all possible variants for a selected SigF

                   Pedal Interpretation –                                                         Pedal Interpretation –
                    manual generation                                                             automatic generation

            100                                                                             100
             90                                                                              90
             80                                                                              80
             70                                                                              70
             60                                                                              60
           % 50                                                                            % 50
             40                                                                              40
             30                                                                              30
             20                                                                              20
             10                                                                              10
              0                                                                               0
                        v



                                    phi_Acc



                                                     phi_Brake




                                                                                                           v



                                                                                                                    phi_Acc



                                                                                                                                phi_Brake
                                                                 Consider MiLEST Quality Metrics
                                                                 in combination (weight-based
                                                                 approach), not in isolation!


17    December, 19th, 2008                                           MBT of Embedded Systems                                                    Justyna Zander-Nowicka
I. Model-based Testing   II. Signal-Feature Test Paradigm   III. The Test System   IV. Case Study   V. Summary & Outlook

                                                                                                  MiLEST Summary

 Contributions:                                                        Achieved goals:

     Automatic and systematic test data                                      Systematic and consistent functional
     generation for functional test based                                    test specification
     on signal-feature concept                                               Automation of the test specification

     Automatic and online test evaluation                                    Novel manner of signal assessment
     based mainly on signal-feature                                          Continuous observation of the SUT
     taxonomy
                                                                             Automation of the test process

     Reusable test patterns constituting a                                   Abstract and concrete views (i.e.,
     test framework                                                          abstract libraries concretized in the
                                                                             test system)
     MBT methodology and automated                                           Requirements- & model-based testing
     test process                                                            Test execution starting at MiL level
                                                                             System model and test model in
                                                                             common execution environment

18   December, 19th, 2008                             MBT of Embedded Systems                                     Justyna Zander-Nowicka
I. Model-based Testing   II. Signal-Feature Test Paradigm   III. The Test System   IV. Case Study   V. Summary & Outlook

                                                                                                              Future Work



     Specific for current version of MiLEST:
         Test stimuli generation algorithms and their optimization
         Transposition of conditional rules (i.e., automation of the test specification)
         Further test patterns (e.g., incl. different numerical integration methods)
         Combination of the methods for verification or failure analysis purpose
     Automation for negative testing
     More case studies (i.e., test approach scalability)
     Further domains (e.g., aerospace, railway, space, earth, or military systems)
     Further execution platforms
     Mapping to TTCN-3 es
     Further test quality metrics such as:
         Cost/effort needed for constructing a test data set
         Relative number of found errors in relation to the number of test cases
         needed to find them


19   December, 19th, 2008                             MBT of Embedded Systems                                     Justyna Zander-Nowicka
Thank you so much!
justyna.zander-nowicka@fokus.fraunhofer.de
Backup slides.
Automotive Embedded System Test Dimensions




22   December, 19th, 2008            MBT of Embedded Systems   Justyna Zander-Nowicka
Related Work – Tools
                       Criteria                      Test Specification
                                                                    Test                                            Transformation
 Selected Test                      Manual         Automatic                                         Test                and
                                                                 Evaluation
 Methodologies,                   Test Case /     Test Case /                     Formal       Patterns Support       Automation
                                                                 Scenarios
 Technologies, Tools               Test Data       Test Data                    Verification                           Facilities
                                                                 as Driving
                                  Specification   Generation
                                                                   Force

 EmbeddedValidator                                                                   +         + (15 patterns)

 MTest with CTE/ES                     +
 Reactis Tester                                       +                              +
 Reactis Validator                                    +              +                         –/+ (2 patterns)
 Simulink®
 Verification and                      +                             +                         + (12 patterns)
 Validation™
 Simulink® Design
 Verifier™
                                                      +                              +         –/+ (4 patterns)
 SystemTest™                           +
 TPT                                   +                                                              +
 T-VEC                                                +                              +
 Transformations
 Approach (Dai,‘06)
                                       +                                                                                    +
 Watchdogs (Conrad,‘98)                                              +
 MiLEST                                               +              +                         + (~50 patterns)             +

23     December, 19th, 2008                           MBT of Embedded Systems                                     Justyna Zander-Nowicka
MiLEST with respect to MBT Taxonomy




Test             Test Generation:                   Test Execution      Test Evaluation:
Approach         Selection Criteria                   Options           Specification
                 and Technology                                         and Technology

                 - data coverage                    - MiL               - reference signal-feature – based
                 - requirements coverage            - reactive          - requirements coverage
MiLEST           - test case specifications                             - test evaluation specifications
                 - automatic generation                                 - automatic
                 - offline generation                                   - online evaluation




24   December, 19th, 2008                     MBT of Embedded Systems                        Justyna Zander-Nowicka
Signal Features – a Descriptive Approach


u1(time) -
      step




                                                                                                          time
 q1(time)-                                                ts
      step
response                                                                max                  ess




                                                  tr

                                                                                                          time

Step response characteristics: rise time (tr), maximum overshoot (max), settling time (ts), steady state error (ess)

25     December, 19th, 2008                   MBT of Embedded Systems                              Justyna Zander-Nowicka
Signal-Features Generation




26   December, 19th, 2008   MBT of Embedded Systems              Justyna Zander-Nowicka
Signal-Feature Generation for Test Data




                                     transformation



27   December, 19th, 2008     MBT of Embedded Systems    Justyna Zander-Nowicka
Signal-Features Generation and Evaluation




28   December, 19th, 2008        MBT of Embedded Systems   Justyna Zander-Nowicka
From Signal Feature Detection to Signal Feature Generation

Signal feature Trigger-independent
detection
                  Detect signal value

 Immediately        Detect increase / decrease
 identifiable
                    …




                                                                 Signal feature Trigger-independent
                                                                 generation
                                                                                   Any curve coming through a given value
                                                                                within the permitted range of values, where
                                                                                duration time is default

                                                                 Immediately        Any increasing/decreasing function with a
                                                                 identifiable   default/given slope or other characteristics
                                                                                in the permitted range of values, where
                                                                                duration time is default

                                                                                  …




29    December, 19th, 2008                       MBT of Embedded Systems                                 Justyna Zander-Nowicka
MSOffice8

                          Classification of Signal Features based on their Detection
                                                                               Type
                                           Immediately                    Identifiable with     Identifiable with
                                            identifiable                 determinate delay    indeterminate delay
                           Detect signal value                        Detect max / min /      Detect duration of
                           Detect increase / decrease /             inflection                every single delay
      Time-independent




                           constant                                   Detect peak
                           Detect continuous signal /                 Detect impulse
                           derivative                                 Detect step
                           Detect linearity (w.r.t. 1st value)
                           Detect functional relation y = f(x)
                           Detect causal filter
                           Detect max-to-date / min-to-date


                           Detect signal value @ time1                 Detect any time        Detect step response
                           Detect time stamp                           independent features   characteristics
          Triggered




                           Detect any time independent                 over a time interval   (rise time, settling
                           features over a time interval                     e.g., value @    time, overshoot)
                                 e.g., value @ time1                         time of max      Detect response delay
                                 e.g., value @ [time1, time2]                                 Detect complete step


     30                  December, 19th, 2008               MBT of Embedded Systems                  Justyna Zander-Nowicka
Slajd 30

MSOffice8   Complete Step Detection : das was die Preconditions von Step response machen: Step detektieren und dann triggern wenn die signale 'Step' und 'Step
            response' sich stabilisiert haben.

            Step detection : detektiert nur ein Step, triggert also direkt beim Step

            max-to-date : speichert immer den maximalen Wert bislang. wenn ich z.B. die Wertefolge habe 0 1 2 3 5 6 10 9 54 6 7 3, max-to-date liefert: 0 1 2 3 4 6
            10 10 54 54 54 54
            Justyna Zander-Nowicka, 12/12/2006
Signal-Features Classification (excerpt)

                                                Evaluation View                                           Generation View
     SigF
                                                                                     Time-independent
                                   Signal value detection                    Any curve crossing the value of interest in the permitted range of values,
                                                                             where duration time = default
     Immediately identifiable




                                                                                    Generation information:
                                                                                    - value of interest
                                   Basic mathematical operations (e.g.,      Any curve described by a basic mathematical operations (e.g., crossing zero
                                   zero detection)                           value in the permitted range of values), where duration time = default
                                                                                    Generation information:
                                                                                    - time of zero crossing
                                   Increase detection                        Any ramp increasing with a default/given slope in the permitted range of
                                                                             values, where duration time = default
                                                                                    Generation information:
                                                                                    - slope
                                                                                    - initial output
                                                                                    - final output
                                   Decrease detection                        Any ramp decreasing with a default/given slope in the permitted range of
                                                                             values, where duration time = default
                                                                                    Generation information:
                                                                                    - slope
                                                                                    - initial output
                                                                                    - final output
                                   Constant detection                        Any constant in the permitted range of values, where duration time = default
                                                                                    Generation information:
                                                                                    - constant value
                                   Signal continuity detection               Any continuous curve in the permitted range of values, where duration time =
                                                                             default


31                              December, 19th, 2008                        MBT of Embedded Systems                                  Justyna Zander-Nowicka
IF – THEN Rules

Logical connectives, e.g.:

IF constrained_inputsn AND constrained_outputsm       THEN constrained_inputsn AND constrained_outputsm

IF constrained_inputsn AND constrained_outputsm       THEN constrained_outputsm

IF constrained_inputsn                                THEN constrained_inputsn AND constrained_outputsm

IF constrained_inputsn                                THEN constrained_outputsm
IF true ^ any constraints                             THEN constrained_outputsm



Alternative, i.e.:
                                                      THEN     B
IF    A                                                        OR C
                                                               OR D

Temporal expressions, e.g.:

IF    A                                               THEN during(x)B AND after(y)C



32    December, 19th, 2008               MBT of Embedded Systems                         Justyna Zander-Nowicka
Test Patterns Classification (2)


     Test Data Structure Pattern
            Test Requirement Level
                Test Case Level
                      -    Signal-Feature Generators

 Test activity            Test pattern name    Context                      Problem                        Solution instance

                                               Evaluation of a step
 Test data                Generate signal                                   Generation of appropriate
                                               response function is
 generation               feature                                           signal to stimulate an SUT
                                               intended


     Test Control Patterns (e.g., for reactive testing)
     Test activity        Test pattern name        Context                    Problem                     Solution instance
                                                                                                IF verdict=pass or verdict=fail or
                          Automatic            Test of an             Establishing of the       verdict=error of a test case
 Test control                                                                                   THEN leave this test case at that time
                          sequencing of test   electronic             starting point of the
 specification                                                                                  point & execute the next test case
                          cases                control unit           next test case
                                                                                                starting at that established time point

     Test Harness Pattern

33      December, 19th, 2008                          MBT of Embedded Systems                                      Justyna Zander-Nowicka
Combination of Variants

     Combination techniques:
        Minimal combination
        One factor at a time
        N-wise combination
        Others:
                 Complete combination
                 Random combination
                 etc...




34   December, 19th, 2008             MBT of Embedded Systems                Justyna Zander-Nowicka
Pedal Interpretation Component




                                                          driving torque
 velocity (v)                                             (T_des_Drive)
 acceleration                       System
 pedal (phi_Acc)                     under
                                      Test

 …                                                        …




35   December, 19th, 2008   MBT of Embedded Systems        Justyna Zander-Nowicka
Test Data Patterns Derivation

     Interpretation of accelerator pedal position
     Normalized accelerator pedal position should be interpreted as desired driving torque. The desired
     driving torque is scaled in the non-negative range in such a way that the higher the velocity is given,
     the lower driving torque is obtained.


                                                                                       v,
                                                     Generate v=const
                                                                                  phi_Acc
                                                     Generate phi_Acc increases

                                                                                      0,0                       time
                                                     Generate v=const
                                                     Generate phi_Acc decreases        v,
                                                                                  phi_Acc

                                                     Generate v=const
                                                     Generate phi_Acc=const           0,0                       time

                                                                                       v,
                                                     IF T_des_Drive>=0            phi_Acc
                                                     Generate v increases
                                                     Generate phi_Acc=const           0,0                       time

                                                                                       v,
                                                                                  phi_Acc



                                                                                      0,0                       time
36      December,   19th,   2008            MBT of Embedded Systems                         Justyna Zander-Nowicka
Concrete Test Data



                                                                                   Range
                                                      phi_Acc                    constraints



                                                            0,0     time

                                                      velocity




                                                            0,0     time

                                                  phi_Brake                       Temporal
                                                                                 constraints


                                                            0,0     time




37   December, 19th, 2008   MBT of Embedded Systems                        Justyna Zander-Nowicka
Variants for the Increase Generation – Concrete View


     Consider the velocity of a car     < -10, 70 > with the partition point of 0.
     Then, using the classification tree method (Grochtmann & Grimm, 1993), and
     the formulas:
     <pn, pn + 10% * (pn+1 – pn)> and <pn – 10% * (pn – pn-1), pn>




         Increase variants are: <-10, -9>, <-1, 0>, (0, 7>, <63, 70>.


38    December, 19th, 2008            MBT of Embedded Systems                   Justyna Zander-Nowicka
Concrete Test Data Variants
                                                                                                                                                                                          phi_Acc2
                                                                                                                              100

                                      v                                    phi_Acc                                             90

                                                                                                                               80

      v1                    v2        v3     v4       v5     phi_Acc1                phi_Acc2                                  70

                                                                                                                               60




                                                                                                                    phi_Acc
     {-10}                  {-5}     {0}     {35}     {70}        [0,10]             [90,100]                                  50

                                                                                                                               40

                                                                                                                               30
                                 One factor at a time combination                                                              20
                                                                                                                                                             phi_Acc1
                                             SUT inputs                                                                        10

                                                                                                                               0


                                   phi_Acc                         v                                                                0         2          4           6          8          10          12

                                                                                                                                                             time [s]
                             phi_Acc1 phi_Acc2   v1     v2   v3        v4       v5
                                                                                                                                    iteration1 iteration 2 iteration3 iteration 4 iteration 5 iteration6

                       1                                                               t0
     iterations[n]




                                                                                                time [units]
                                                                                                                               90
                                                                                                                               80
                       2                                                               t1                                                                                            v5
                                                                                                                               70

                                                                                                                               60
                       3                                                               t2                                      50

                                                                                                                                                                         v4




                                                                                                                    v
                                                                                                                               40

                       4                                                               t3                                      30

                                                                                                                               20


                        5                                                              t4                                      10
                                                                                                                                                              v3
                                                                                                                               0                   v2
                                                                                                                                        v1                                                       v1
                                                                                                                              -10
                        6                                                              t5
                                                                                                                                    0         2          4           6          8          10          12

                                                                                                                                                               time [s]
39                   December, 19th, 2008                                  MBT of Embedded Systems                                                                       Justyna Zander-Nowicka
Set of Test Cases Sequenced in Test Suites




40   December, 19th, 2008        MBT of Embedded Systems    Justyna Zander-Nowicka
Test Cases Sequenced in Test Suite




41   December, 19th, 2008   MBT of Embedded Systems   Justyna Zander-Nowicka
MiLEST Test Quality Metrics
                 Test data related:                                  Test control related:
Signal range consistency                                Test cases coverage
Constraint correctness                                                      Others:
Variants coverage for a SigF                            Service activation coverage
Variants coverage during test execution                 System model coverage
Variants related preconditions coverage                 Cost/effort needed for constructing a test data
Variants related assertions coverage                    set

SUT output variants coverage                            Relative number of found errors in relation to
                                                        the number of test cases needed to find them
Minimal combination coverage
                                                        Coverage of signal variants combinations –
           Test specification related:                  CTCmax, CTCmin
Test requirements coverage
VFs activation coverage
VF specification quality
Preconditions coverage
Effective assertions coverage


42   December, 19th, 2008                MBT of Embedded Systems                        Justyna Zander-Nowicka
Summary and Future Work




                                                                                 Test l e, Arbi
                                                                                   Orac
                                                   p p a tu l-




                                                                                     Eval
                                            on




                                                                   Sp
                                                      F e ig n a




                                                                    Te ica
                                                       ro re



                                                                     ec
                                   ra c t i




                                                            h




                                                                      st tio
                                                                       if
                                                         ac




                                                                                          uat i o at i on
                                                          S
                             A bst




                                                                            n




                                                                                                 n, Te
                                                                                                 tr
                                                 A




                                                                                                        st
                                                 Te




                                                                             n
                                                   st




                                                                            io
                                                                         at
                                                     Q
                                                       ua




                                                                        om
                                                         lit




                                                                     ut
                                                             y



                                                                   A
     Three types of case studies:
        component level test
        component in the loop level test
        integration level test

43   December, 19th, 2008                        MBT of Embedded Systems                                     Justyna Zander-Nowicka
Example: Ariane 5

                                                                         ADA Code of 2nd channel
                                                       ...
                                                       declare
 Ariane 5 Flight 501 on 4 June 1996 failed               vertical_veloc_sensor: float;
 Weight: 740 t, Payload: cluster satellites              horizontal_veloc_sensor: float;
                                                         vertical_veloc_bias: integer;
 Rocket self-destructing 37 seconds after launch         horizontal_veloc_bias: integer;
 because of a malfunction in the control software        ...
                                                       begin
 Most expensive computer bug in history:                 declare
 370 Mio $                                                 pragma suppress(numeric_error, horizontal_veloc_bias);
                                                         begin
                                                           sensor_get(vertical_veloc_sensor);
                                                           sensor_get(horizontal_veloc_sensor);
 Causes:                                                   vertical_veloc_bias := integer(vertical_veloc_sensor);
   Reused software from Ariane 4                           horizontal_veloc_bias :=
                                                       integer(horizontal_veloc_sensor);           Horizontal velocity
   Data conversion from 64-bit float to 16-bit             ...                                    > 32786.0 internal unit
   signed integer    overflow / not caught               exception
                                                           when numeric_error => calculate_vertical_veloc();
   ADA software with 2 channels (redundancy), but          when others => use_irs1();
   identical implementation!                             end;
                                                       end irs2;
   1st channel had same problem 72ms before            .
   Software handler got exceptions from both
   channels, no Plan B for such situations                                                       Unclassified Exception caught
                                                                                                  Control transfer to 1st channel
   Main computer interpreted horizontal velocity
   and sent strange control command
   Self-destruction due to safety issues

                                                                   * source: http://www-aix.gsi.de/~giese/swr/ariane5.html (retrieved 2008)

44   December, 19th, 2008                MBT of Embedded Systems                                              Justyna Zander-Nowicka
MiLEST Realization


     MiLEST – Model-in-the-Loop for Embedded System Testing
     It is a Simulink® add-on built on top of the MATLAB® engine.




45    December, 19th, 2008         MBT of Embedded Systems            Justyna Zander-Nowicka
Integration of MiLEST in the Automotive-specific V-Modell®




                                                      Acknowledgement: J. Großmann et al. (2008)

46   December, 19th, 2008   MBT of Embedded Systems                     Justyna Zander-Nowicka
Model- and Requirement-based Testing


                                                       REQUIREMENTS

                                                                                       Test Objectives


                                What is the role of a system model?
                                What is the role of a test model?
                              SYSTEM MODEL use a common language forMODEL
                                Is it possible to                           TEST both
                                                     Interfaces and
                                system and test specifications?
                                                    Test Objectives
                        Transformation                             How can discrete and
                                                                    Transformation

                                                                   continuous signals be
                                    SYSTEM
                                                                   handled atTESTsame time?
                                                                                   the
                            IMPLEMENTATION                         How should a test
                                                                          IMPLEMENTATION
                                                                   framework be realized?

                            Execution Environment
                                                                               How to automate the test
                                                                               process?
                                                                               How to assure the quality of
                                                                               tests?

47   December, 19th, 2008                            MBT of Embedded Systems                      Justyna Zander-Nowicka
MiLEST Marketing
     Features:                                      Benefits:
      Systematic functional test specification         Testing in early design stages
      Signal-feature – oriented paradigm               Test of hybrid systems including temporal
      Graphical test design                            and logical dependencies
      Test process automation                          Traceability of test cases to the
        systematic and automatic test data             requirements
        generation                                     Traceability of verdicts to the root faults
        online automatic test evaluation               Increased test coverage and test
      Model-in-the-Loop test execution                 completeness
      Reusable test patterns                           Assured quality of the tests
      Abstract and concrete views




48    December, 19th, 2008          MBT of Embedded Systems                         Justyna Zander-Nowicka
Discrete and Continuous Signal Interpretation in Simulink

     Consider a second order Runge-Kutta numerical integration

                               a1 = hk f ( x(tk ), tk )
                                                 hk      a1
                               a2 = hk f (tk + , x(tk ) + )
                                                  2      2
                               x(tk +1 ) = x(tk ) + a2




49      December, 19th, 2008            MBT of Embedded Systems   Justyna Zander-Nowicka

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  • 1. Model-based Testing of Embedded Real-Time Systems in the Automotive Domain Eng. Sc. D. candidate: Justyna Zander-Nowicka Supervisor: Prof. Dr.–Ing. Ina Schieferdecker (TU Berlin) Supervisor: Prof. Dr. rer. nat. Ingolf Krüger (UC San Diego) Committee Chairman: Prof. Dr.–Ing. Clemens Gühmann (TU Berlin) Doctoral Thesis Defense: December, 19th, 2008
  • 2. Motivation Embedded systems in the automotive domain: Addressed characteristics: Environment Hybrid: continuous signal flows and discrete events Real-time Reactive Sensor Actuator The complexity of car software dramatically increases The functions are distributed Embedded System Demand to shorten time-to-market Demand for quality assurance safety Embedded Software standards IEC 61508 and ISO 26262 Testing: Demands 40-60% (EU, 2005) of development resources Systematic and automatic test approach starting at the earliest model phase of software development still missing Different companies use different technologies, methods, and tools 2 December, 19th, 2008 MBT of Embedded Systems Justyna Zander-Nowicka
  • 3. Outline I. Model-based Testing (MBT) II. Signal-feature Test Paradigm – Test Development Process – Signal-feature Detection for Test Evaluation – Signal-feature Application for Test Data Generation III. The Test System IV. Case Study V. Summary and Outlook 3 December, 19th, 2008 MBT of Embedded Systems Justyna Zander-Nowicka
  • 4. I. Model-based Testing II. Signal-Feature Test Paradigm III. The Test System IV. Case Study V. Summary & Outlook Model-Based Testing Model-based testing is testing in which the entire test specification is derived in whole or in part from both the system requirements and a model that describe selected functional aspects of the system under test (SUT). In this context, the term entire test specification covers the abstract test scenarios made concrete by the sets of test data and the expected SUT outputs. The test specification is organized in a set of test cases. Model-in-the-Loop for Embedded System Test (MiLEST) proposed in this thesis. REQUIREMENTS Test Objectives SYSTEM MODEL Interfaces and TEST MODEL Test Objectives 4 December, 19th, 2008 MBT of Embedded Systems Justyna Zander-Nowicka
  • 5. I. Model-based Testing II. Signal-Feature Test Paradigm III. The Test System IV. Case Study V. Summary & Outlook MBT Taxonomy Acknowledgement: M. Utting et al. (2006) MiLEST 5 December, 19th, 2008 MBT of Embedded Systems Justyna Zander-Nowicka
  • 6. I. Model-based Testing II. Signal-Feature Test Paradigm III. The Test System IV. Case Study V. Summary & Outlook Related Work Challenges and Thesis Contributions Open Issues: Solutions: Test data specification Automatic and systematic test data automatic, but only for structural generation for functional test test or state-based models Signal-feature – based generation of test systematic for functional test, but data still only manual Automatic test evaluation, but mainly Automatic and online test evaluation based on the reference signal flows based on reference signal partition Signal-feature – based test assessment by application of validation functions Test process established, but not Automation of MBT process efficient enough in terms of cost, jjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjjj Application of automated hierarchical test efforts, and reusability patterns and transformations jjjjjjjjj Main goal automatically created test design executable at the model level. 6 December, 19th, 2008 MBT of Embedded Systems Justyna Zander-Nowicka
  • 7. I. Model-based Testing II. Signal-Feature Test Paradigm III. The Test System IV. Case Study V. Summary & Outlook Signal Feature – Definition A signal feature, also called signal property, is a formal description of certain predefined attributes of a signal. It is an identifiable, descriptive property of a signal. A feature can be composed of or predicated by other features, logical connectives, or timing expressions. f(kT) local max decrease step response increase characteristics constant kT time partitioning Acknowledgement: E. Lehmann (2003) 7 December, 19th, 2008 MBT of Embedded Systems Justyna Zander-Nowicka
  • 8. I. Model-based Testing II. Signal-Feature Test Paradigm III. The Test System IV. Case Study V. Summary & Outlook Proposed Test Development Process SUT as a Model automatic generation – step I Test Harness Generation manual refinement – step II Test Specification automatic generation – step III Test Data & Test Control Generation automatic execution – step IV Verdicts Analysis 8 December, 19th, 2008 MBT of Embedded Systems Justyna Zander-Nowicka
  • 9. I. Model-based Testing II. Signal-Feature Test Paradigm III. The Test System IV. Case Study V. Summary & Outlook Test Harness 9 December, 19th, 2008 MBT of Embedded Systems Justyna Zander-Nowicka
  • 10. I. Model-based Testing II. Signal-Feature Test Paradigm III. The Test System IV. Case Study V. Summary & Outlook Signal-Feature Detection and Generation - temporal expressions (e.g., after(5ms)) - logical connectives (e.g., and) transformation Generate Detect Signal Feature Signal Feature transformation 10 December, 19th, 2008 MBT of Embedded Systems Justyna Zander-Nowicka
  • 11. I. Model-based Testing II. Signal-Feature Test Paradigm III. The Test System IV. Case Study V. Summary & Outlook Increase Detection and Generation Detect Increase: The Increase feature can be detected by analyzing its derivative. This can be approximated (simplified version of the algorithm!) where the actual signal value and the past one (backward difference): feature(kT) = sign [signal (kT) − signal ((k − 1) * T)] feature(kT) is positive if the signal increases. Generate Increase: Example: 11 December, 19th, 2008 MBT of Embedded Systems Justyna Zander-Nowicka
  • 12. I. Model-based Testing II. Signal-Feature Test Paradigm III. The Test System IV. Case Study V. Summary & Outlook Classification of Signal-Feature Detection Mechanisms (1) Time-independent Acknowledgement: A. Marrero-Pérez (2007) 12 December, 19th, 2008 MBT of Embedded Systems Justyna Zander-Nowicka
  • 13. I. Model-based Testing II. Signal-Feature Test Paradigm III. The Test System IV. Case Study V. Summary & Outlook Classification of Signal-Feature Detection Mechanisms (2) Triggered Acknowledgement: A. Marrero-Pérez (2007) 13 December, 19th, 2008 MBT of Embedded Systems Justyna Zander-Nowicka
  • 14. I. Model-based Testing II. Signal-Feature Test Paradigm III. The Test System IV. Case Study V. Summary & Outlook Levels of Test Design in MiLEST Test Specification Test Data Generation designed manually obtained automatically refinement Transformation abstraction Test Harness Level Test Harness Level Transformation Test Requirement Level Test Requirement Level Transformation Validation Function Level Test Case Level Transformation Feature Detection Level Feature Generation Level IF preconditions set THEN assertions set IF preconditions set THEN generations set 14 December, 19th, 2008 MBT of Embedded Systems Justyna Zander-Nowicka
  • 15. I. Model-based Testing II. Signal-Feature Test Paradigm III. The Test System IV. Case Study V. Summary & Outlook Test Patterns Classification Test Specification Patterns Test Requirement Level Validation Function Level - Signal-Feature Detection Level Test activity Test pattern name Context Problem Solution instance Detect step Test of an electronic Assessment of an ECU behavior in Test specification response features control unit (ECU) terms of a selected signal feature 15 December, 19th, 2008 MBT of Embedded Systems Justyna Zander-Nowicka
  • 16. I. Model-based Testing II. Signal-Feature Test Paradigm III. The Test System IV. Case Study V. Summary & Outlook Pedal Interpretation Example Interpretation of accelerator pedal position Normalized accelerator pedal position (phi_Acc) should be interpreted as desired driving torque (T_des_Drive). The desired driving torque is scaled in the non-negative range in such a way that the higher the velocity (v) is given, the lower driving torque is obtained (Conrad, 2004). IF v=const AND phi_Acc increases THEN T_des_Drive increases IF v=const AND phi_Acc decreases THEN T_des_Drive decreases IF v=const AND phi_Acc=const THEN T_des_Drive=const IF v increases AND phi_Acc=const AND T_des_Drive>=0 THEN T_des_Drive does not increase 16 December, 19th, 2008 MBT of Embedded Systems Justyna Zander-Nowicka
  • 17. I. Model-based Testing II. Signal-Feature Test Paradigm III. The Test System IV. Case Study V. Summary & Outlook MiLEST Quality Metrics – an Example # of variants for a selected SigF applied in a test design Variants coverage for a SigF = # of all possible variants for a selected SigF Pedal Interpretation – Pedal Interpretation – manual generation automatic generation 100 100 90 90 80 80 70 70 60 60 % 50 % 50 40 40 30 30 20 20 10 10 0 0 v phi_Acc phi_Brake v phi_Acc phi_Brake Consider MiLEST Quality Metrics in combination (weight-based approach), not in isolation! 17 December, 19th, 2008 MBT of Embedded Systems Justyna Zander-Nowicka
  • 18. I. Model-based Testing II. Signal-Feature Test Paradigm III. The Test System IV. Case Study V. Summary & Outlook MiLEST Summary Contributions: Achieved goals: Automatic and systematic test data Systematic and consistent functional generation for functional test based test specification on signal-feature concept Automation of the test specification Automatic and online test evaluation Novel manner of signal assessment based mainly on signal-feature Continuous observation of the SUT taxonomy Automation of the test process Reusable test patterns constituting a Abstract and concrete views (i.e., test framework abstract libraries concretized in the test system) MBT methodology and automated Requirements- & model-based testing test process Test execution starting at MiL level System model and test model in common execution environment 18 December, 19th, 2008 MBT of Embedded Systems Justyna Zander-Nowicka
  • 19. I. Model-based Testing II. Signal-Feature Test Paradigm III. The Test System IV. Case Study V. Summary & Outlook Future Work Specific for current version of MiLEST: Test stimuli generation algorithms and their optimization Transposition of conditional rules (i.e., automation of the test specification) Further test patterns (e.g., incl. different numerical integration methods) Combination of the methods for verification or failure analysis purpose Automation for negative testing More case studies (i.e., test approach scalability) Further domains (e.g., aerospace, railway, space, earth, or military systems) Further execution platforms Mapping to TTCN-3 es Further test quality metrics such as: Cost/effort needed for constructing a test data set Relative number of found errors in relation to the number of test cases needed to find them 19 December, 19th, 2008 MBT of Embedded Systems Justyna Zander-Nowicka
  • 20. Thank you so much! justyna.zander-nowicka@fokus.fraunhofer.de
  • 22. Automotive Embedded System Test Dimensions 22 December, 19th, 2008 MBT of Embedded Systems Justyna Zander-Nowicka
  • 23. Related Work – Tools Criteria Test Specification Test Transformation Selected Test Manual Automatic Test and Evaluation Methodologies, Test Case / Test Case / Formal Patterns Support Automation Scenarios Technologies, Tools Test Data Test Data Verification Facilities as Driving Specification Generation Force EmbeddedValidator + + (15 patterns) MTest with CTE/ES + Reactis Tester + + Reactis Validator + + –/+ (2 patterns) Simulink® Verification and + + + (12 patterns) Validation™ Simulink® Design Verifier™ + + –/+ (4 patterns) SystemTest™ + TPT + + T-VEC + + Transformations Approach (Dai,‘06) + + Watchdogs (Conrad,‘98) + MiLEST + + + (~50 patterns) + 23 December, 19th, 2008 MBT of Embedded Systems Justyna Zander-Nowicka
  • 24. MiLEST with respect to MBT Taxonomy Test Test Generation: Test Execution Test Evaluation: Approach Selection Criteria Options Specification and Technology and Technology - data coverage - MiL - reference signal-feature – based - requirements coverage - reactive - requirements coverage MiLEST - test case specifications - test evaluation specifications - automatic generation - automatic - offline generation - online evaluation 24 December, 19th, 2008 MBT of Embedded Systems Justyna Zander-Nowicka
  • 25. Signal Features – a Descriptive Approach u1(time) - step time q1(time)- ts step response max ess tr time Step response characteristics: rise time (tr), maximum overshoot (max), settling time (ts), steady state error (ess) 25 December, 19th, 2008 MBT of Embedded Systems Justyna Zander-Nowicka
  • 26. Signal-Features Generation 26 December, 19th, 2008 MBT of Embedded Systems Justyna Zander-Nowicka
  • 27. Signal-Feature Generation for Test Data transformation 27 December, 19th, 2008 MBT of Embedded Systems Justyna Zander-Nowicka
  • 28. Signal-Features Generation and Evaluation 28 December, 19th, 2008 MBT of Embedded Systems Justyna Zander-Nowicka
  • 29. From Signal Feature Detection to Signal Feature Generation Signal feature Trigger-independent detection Detect signal value Immediately Detect increase / decrease identifiable … Signal feature Trigger-independent generation Any curve coming through a given value within the permitted range of values, where duration time is default Immediately Any increasing/decreasing function with a identifiable default/given slope or other characteristics in the permitted range of values, where duration time is default … 29 December, 19th, 2008 MBT of Embedded Systems Justyna Zander-Nowicka
  • 30. MSOffice8 Classification of Signal Features based on their Detection Type Immediately Identifiable with Identifiable with identifiable determinate delay indeterminate delay Detect signal value Detect max / min / Detect duration of Detect increase / decrease / inflection every single delay Time-independent constant Detect peak Detect continuous signal / Detect impulse derivative Detect step Detect linearity (w.r.t. 1st value) Detect functional relation y = f(x) Detect causal filter Detect max-to-date / min-to-date Detect signal value @ time1 Detect any time Detect step response Detect time stamp independent features characteristics Triggered Detect any time independent over a time interval (rise time, settling features over a time interval e.g., value @ time, overshoot) e.g., value @ time1 time of max Detect response delay e.g., value @ [time1, time2] Detect complete step 30 December, 19th, 2008 MBT of Embedded Systems Justyna Zander-Nowicka
  • 31. Slajd 30 MSOffice8 Complete Step Detection : das was die Preconditions von Step response machen: Step detektieren und dann triggern wenn die signale 'Step' und 'Step response' sich stabilisiert haben. Step detection : detektiert nur ein Step, triggert also direkt beim Step max-to-date : speichert immer den maximalen Wert bislang. wenn ich z.B. die Wertefolge habe 0 1 2 3 5 6 10 9 54 6 7 3, max-to-date liefert: 0 1 2 3 4 6 10 10 54 54 54 54 Justyna Zander-Nowicka, 12/12/2006
  • 32. Signal-Features Classification (excerpt) Evaluation View Generation View SigF Time-independent Signal value detection Any curve crossing the value of interest in the permitted range of values, where duration time = default Immediately identifiable Generation information: - value of interest Basic mathematical operations (e.g., Any curve described by a basic mathematical operations (e.g., crossing zero zero detection) value in the permitted range of values), where duration time = default Generation information: - time of zero crossing Increase detection Any ramp increasing with a default/given slope in the permitted range of values, where duration time = default Generation information: - slope - initial output - final output Decrease detection Any ramp decreasing with a default/given slope in the permitted range of values, where duration time = default Generation information: - slope - initial output - final output Constant detection Any constant in the permitted range of values, where duration time = default Generation information: - constant value Signal continuity detection Any continuous curve in the permitted range of values, where duration time = default 31 December, 19th, 2008 MBT of Embedded Systems Justyna Zander-Nowicka
  • 33. IF – THEN Rules Logical connectives, e.g.: IF constrained_inputsn AND constrained_outputsm THEN constrained_inputsn AND constrained_outputsm IF constrained_inputsn AND constrained_outputsm THEN constrained_outputsm IF constrained_inputsn THEN constrained_inputsn AND constrained_outputsm IF constrained_inputsn THEN constrained_outputsm IF true ^ any constraints THEN constrained_outputsm Alternative, i.e.: THEN B IF A OR C OR D Temporal expressions, e.g.: IF A THEN during(x)B AND after(y)C 32 December, 19th, 2008 MBT of Embedded Systems Justyna Zander-Nowicka
  • 34. Test Patterns Classification (2) Test Data Structure Pattern Test Requirement Level Test Case Level - Signal-Feature Generators Test activity Test pattern name Context Problem Solution instance Evaluation of a step Test data Generate signal Generation of appropriate response function is generation feature signal to stimulate an SUT intended Test Control Patterns (e.g., for reactive testing) Test activity Test pattern name Context Problem Solution instance IF verdict=pass or verdict=fail or Automatic Test of an Establishing of the verdict=error of a test case Test control THEN leave this test case at that time sequencing of test electronic starting point of the specification point & execute the next test case cases control unit next test case starting at that established time point Test Harness Pattern 33 December, 19th, 2008 MBT of Embedded Systems Justyna Zander-Nowicka
  • 35. Combination of Variants Combination techniques: Minimal combination One factor at a time N-wise combination Others: Complete combination Random combination etc... 34 December, 19th, 2008 MBT of Embedded Systems Justyna Zander-Nowicka
  • 36. Pedal Interpretation Component driving torque velocity (v) (T_des_Drive) acceleration System pedal (phi_Acc) under Test … … 35 December, 19th, 2008 MBT of Embedded Systems Justyna Zander-Nowicka
  • 37. Test Data Patterns Derivation Interpretation of accelerator pedal position Normalized accelerator pedal position should be interpreted as desired driving torque. The desired driving torque is scaled in the non-negative range in such a way that the higher the velocity is given, the lower driving torque is obtained. v, Generate v=const phi_Acc Generate phi_Acc increases 0,0 time Generate v=const Generate phi_Acc decreases v, phi_Acc Generate v=const Generate phi_Acc=const 0,0 time v, IF T_des_Drive>=0 phi_Acc Generate v increases Generate phi_Acc=const 0,0 time v, phi_Acc 0,0 time 36 December, 19th, 2008 MBT of Embedded Systems Justyna Zander-Nowicka
  • 38. Concrete Test Data Range phi_Acc constraints 0,0 time velocity 0,0 time phi_Brake Temporal constraints 0,0 time 37 December, 19th, 2008 MBT of Embedded Systems Justyna Zander-Nowicka
  • 39. Variants for the Increase Generation – Concrete View Consider the velocity of a car < -10, 70 > with the partition point of 0. Then, using the classification tree method (Grochtmann & Grimm, 1993), and the formulas: <pn, pn + 10% * (pn+1 – pn)> and <pn – 10% * (pn – pn-1), pn> Increase variants are: <-10, -9>, <-1, 0>, (0, 7>, <63, 70>. 38 December, 19th, 2008 MBT of Embedded Systems Justyna Zander-Nowicka
  • 40. Concrete Test Data Variants phi_Acc2 100 v phi_Acc 90 80 v1 v2 v3 v4 v5 phi_Acc1 phi_Acc2 70 60 phi_Acc {-10} {-5} {0} {35} {70} [0,10] [90,100] 50 40 30 One factor at a time combination 20 phi_Acc1 SUT inputs 10 0 phi_Acc v 0 2 4 6 8 10 12 time [s] phi_Acc1 phi_Acc2 v1 v2 v3 v4 v5 iteration1 iteration 2 iteration3 iteration 4 iteration 5 iteration6 1 t0 iterations[n] time [units] 90 80 2 t1 v5 70 60 3 t2 50 v4 v 40 4 t3 30 20 5 t4 10 v3 0 v2 v1 v1 -10 6 t5 0 2 4 6 8 10 12 time [s] 39 December, 19th, 2008 MBT of Embedded Systems Justyna Zander-Nowicka
  • 41. Set of Test Cases Sequenced in Test Suites 40 December, 19th, 2008 MBT of Embedded Systems Justyna Zander-Nowicka
  • 42. Test Cases Sequenced in Test Suite 41 December, 19th, 2008 MBT of Embedded Systems Justyna Zander-Nowicka
  • 43. MiLEST Test Quality Metrics Test data related: Test control related: Signal range consistency Test cases coverage Constraint correctness Others: Variants coverage for a SigF Service activation coverage Variants coverage during test execution System model coverage Variants related preconditions coverage Cost/effort needed for constructing a test data Variants related assertions coverage set SUT output variants coverage Relative number of found errors in relation to the number of test cases needed to find them Minimal combination coverage Coverage of signal variants combinations – Test specification related: CTCmax, CTCmin Test requirements coverage VFs activation coverage VF specification quality Preconditions coverage Effective assertions coverage 42 December, 19th, 2008 MBT of Embedded Systems Justyna Zander-Nowicka
  • 44. Summary and Future Work Test l e, Arbi Orac p p a tu l- Eval on Sp F e ig n a Te ica ro re ec ra c t i h st tio if ac uat i o at i on S A bst n n, Te tr A st Te n st io at Q ua om lit ut y A Three types of case studies: component level test component in the loop level test integration level test 43 December, 19th, 2008 MBT of Embedded Systems Justyna Zander-Nowicka
  • 45. Example: Ariane 5 ADA Code of 2nd channel ... declare Ariane 5 Flight 501 on 4 June 1996 failed vertical_veloc_sensor: float; Weight: 740 t, Payload: cluster satellites horizontal_veloc_sensor: float; vertical_veloc_bias: integer; Rocket self-destructing 37 seconds after launch horizontal_veloc_bias: integer; because of a malfunction in the control software ... begin Most expensive computer bug in history: declare 370 Mio $ pragma suppress(numeric_error, horizontal_veloc_bias); begin sensor_get(vertical_veloc_sensor); sensor_get(horizontal_veloc_sensor); Causes: vertical_veloc_bias := integer(vertical_veloc_sensor); Reused software from Ariane 4 horizontal_veloc_bias := integer(horizontal_veloc_sensor); Horizontal velocity Data conversion from 64-bit float to 16-bit ... > 32786.0 internal unit signed integer overflow / not caught exception when numeric_error => calculate_vertical_veloc(); ADA software with 2 channels (redundancy), but when others => use_irs1(); identical implementation! end; end irs2; 1st channel had same problem 72ms before . Software handler got exceptions from both channels, no Plan B for such situations Unclassified Exception caught Control transfer to 1st channel Main computer interpreted horizontal velocity and sent strange control command Self-destruction due to safety issues * source: http://www-aix.gsi.de/~giese/swr/ariane5.html (retrieved 2008) 44 December, 19th, 2008 MBT of Embedded Systems Justyna Zander-Nowicka
  • 46. MiLEST Realization MiLEST – Model-in-the-Loop for Embedded System Testing It is a Simulink® add-on built on top of the MATLAB® engine. 45 December, 19th, 2008 MBT of Embedded Systems Justyna Zander-Nowicka
  • 47. Integration of MiLEST in the Automotive-specific V-Modell® Acknowledgement: J. Großmann et al. (2008) 46 December, 19th, 2008 MBT of Embedded Systems Justyna Zander-Nowicka
  • 48. Model- and Requirement-based Testing REQUIREMENTS Test Objectives What is the role of a system model? What is the role of a test model? SYSTEM MODEL use a common language forMODEL Is it possible to TEST both Interfaces and system and test specifications? Test Objectives Transformation How can discrete and Transformation continuous signals be SYSTEM handled atTESTsame time? the IMPLEMENTATION How should a test IMPLEMENTATION framework be realized? Execution Environment How to automate the test process? How to assure the quality of tests? 47 December, 19th, 2008 MBT of Embedded Systems Justyna Zander-Nowicka
  • 49. MiLEST Marketing Features: Benefits: Systematic functional test specification Testing in early design stages Signal-feature – oriented paradigm Test of hybrid systems including temporal Graphical test design and logical dependencies Test process automation Traceability of test cases to the systematic and automatic test data requirements generation Traceability of verdicts to the root faults online automatic test evaluation Increased test coverage and test Model-in-the-Loop test execution completeness Reusable test patterns Assured quality of the tests Abstract and concrete views 48 December, 19th, 2008 MBT of Embedded Systems Justyna Zander-Nowicka
  • 50. Discrete and Continuous Signal Interpretation in Simulink Consider a second order Runge-Kutta numerical integration a1 = hk f ( x(tk ), tk ) hk a1 a2 = hk f (tk + , x(tk ) + ) 2 2 x(tk +1 ) = x(tk ) + a2 49 December, 19th, 2008 MBT of Embedded Systems Justyna Zander-Nowicka