The document describes two sample holders designed for different optical and electrical measurement setups. The first holder was designed to be compatible with an inverted optical microscope to allow for simultaneous optical and electrical measurements of nanostructured circuits. The second holder was designed for low temperature and magnetic field measurements and includes connectors to enable electrical measurements in those conditions.

1. SAMPLE HOLDERS
1.SAMPLE HOLDER FOR OPTICAL SETUP
Figure 1.1: Left: Ensemble view of the sample holder designed and fabricated compatible with inverted
optical microscope setup. Right: Separated part-view.
Figure 1.2: Holder on top of the Zeiss Axiovert inverted optical microscope, with a connected sample ready
for simultaneous opto-electrical measurements of nanostructured circuits.

2. 2.SAMPLE HOLDER FOR LOW TEMPERATURE
MEASUREMENTS
Figure 2.1 : Left: ensemble view of the sample holder designed and fabricated compatible
with low temperature and magnetic field measurements, Right: parts-separated view.
Figure 2.2: Fabricated holder, with connectors ready for measurements.