The document provides a comprehensive overview of the Kelvin probe technique, a non-contact, non-destructive method utilized for measuring the work functions of materials, specifically in surface science. It highlights the sensitivity and resolution of the technique, particularly in characterizing semiconductor surfaces and the unique capabilities of KP Technology in producing absolute Kelvin probes. Additionally, it promotes EquipTest as a manufacturer of test solutions, including probes and fixtures, inviting inquiries for interface solutions.