The document provides information on electron microscopy. It discusses the basic components and operating principles of transmission electron microscopes and scanning electron microscopes. Key points include: TEMs use electromagnetic lenses to focus electrons into an image, while SEMs scan specimen surfaces with a focused electron beam to produce topographical images. Both require specimens to be prepared through fixation, dehydration, embedding and sectioning to withstand the vacuum conditions. Contrast in electron micrographs is obtained through interactions between electrons and the specimen.