UiPath Test Automation using UiPath Test Suite series, part 4DianaGray10
Welcome to UiPath Test Automation using UiPath Test Suite series part 4. In this session, we will cover Test Manager overview along with SAP heatmap.
The UiPath Test Manager overview with SAP heatmap webinar offers a concise yet comprehensive exploration of the role of a Test Manager within SAP environments, coupled with the utilization of heatmaps for effective testing strategies.
Participants will gain insights into the responsibilities, challenges, and best practices associated with test management in SAP projects. Additionally, the webinar delves into the significance of heatmaps as a visual aid for identifying testing priorities, areas of risk, and resource allocation within SAP landscapes. Through this session, attendees can expect to enhance their understanding of test management principles while learning practical approaches to optimize testing processes in SAP environments using heatmap visualization techniques
What will you get from this session?
1. Insights into SAP testing best practices
2. Heatmap utilization for testing
3. Optimization of testing processes
4. Demo
Topics covered:
Execution from the test manager
Orchestrator execution result
Defect reporting
SAP heatmap example with demo
Speaker:
Deepak Rai, Automation Practice Lead, Boundaryless Group and UiPath MVP
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Send an interactive Slack channel message (using buttons)
Have the message received by managers and peers along with a test email for review
But there’s more:
In a second workflow supporting the same use case, you’ll see:
Your campaign sent to target colleagues for approval
If the “Approve” button is clicked, a Jira/Zendesk ticket is created for the marketing design team
But—if the “Reject” button is pushed, colleagues will be alerted via Slack message
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And...
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Charlie Greenberg, Host
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UiPath Test Automation using UiPath Test Suite series, part 3DianaGray10
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UI automation Introduction,
UI automation Sample
Desktop automation flow
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Deepak Rai, Automation Practice Lead, Boundaryless Group and UiPath MVP
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All of this illustrated with link prediction over knowledge graphs, but the argument is general.
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https://arxiv.org/abs/2306.08302
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https://www.microsoft.com/en-us/research/blog/graphrag-unlocking-llm-discovery-on-narrative-private-data/
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State of global ICS asset and network exposure
Sectoral targets and attacks as well as the cost of ransom
Global APT activity, AI usage, actor and tactic profiles, and implications
Rise in volumes of AI-powered cyberattacks
Major cyber events in 2024
Malware and malicious payload trends
Cyberattack types and targets
Vulnerability exploit attempts on CVEs
Attacks on counties – USA
Expansion of bot farms – how, where, and why
In-depth analysis of the cyber threat landscape across North America, South America, Europe, APAC, and the Middle East
Why are attacks on smart factories rising?
Cyber risk predictions
Axis of attacks – Europe
Systemic attacks in the Middle East
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Bob Boule
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Gopinath Rebala
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Learn about:
• The Future of Testing: How AI is shifting testing towards verification, analysis, and higher-level skills, while reducing repetitive tasks.
• Test Automation: How AI-powered test case generation, optimization, and self-healing tests are making testing more efficient and effective.
• Visual Testing: Explore the emerging capabilities of AI in visual testing and how it's set to revolutionize UI verification.
• Inflectra's AI Solutions: See demonstrations of Inflectra's cutting-edge AI tools like the ChatGPT plugin and Azure Open AI platform, designed to streamline your testing process.
Whether you're a developer, tester, or QA professional, this webinar will give you valuable insights into how AI is shaping the future of software delivery.
3. BO56HXX680D
SFP+ CWDM 8.5G 1470 – 1610nm 80KM
RoHS Compliant Optical Transceiver
- 3 -
1. Absolute Maximum Ratings
Parameter Symbol Min. Typ. Max. Unit
Storage Temperature Ts -40 85 ºC
Storage Ambient Humidity HA 5 95 %
2. Recommended Operating Conditions
Parameter Symbol Min. Typ. Max. Unit Note
Case Operating Temperature Tcase
0 70 BO56HXX680D
-10 80 ºC BO56HXX680DEX
-40 85 BO56HXX680DIN
Ambient Humidity HA 5 70 %
Transmission Distance 80 KM
Coupled Fiber Single mode fiber 9/125µm SMF
3. Electrical Interface Characteristics
Parameter Symbol Min. Typ. Max. Unit Note
Power Supply Voltage Vcc 3.14 3.3 3.46 V
Signal Input Voltage Icc 450 mA
Transmitter
Input differential impedance Rin 100 Ω 1
Single ended data input swing Vin,pp 180 1200 mV
Transmit Disable Voltage VD Vcc-1.3 Vcc V
Transmit Enable Voltage VEN Vee Vee+0.8 V 2
Transmit Disable Assert Time 10 µs
Receiver
Differential data output swing Vout,pp 300 850 mV 3
Data output rise time tr 38 Ps 4
Data output fall time tf 38 Ps 4
LOS Fault VLOS
fault
Vcc-1.3 VccHOST V 5
LOS Normal VLOS
norm
Vee Vee+0.8 V
5
Power Supply Rejection PSR 100 mVpp 6
Notes:
1. Internally AC coupled.
2. Or open circuit.
3. Into 100Ω differential termination.
4. 20-80%
5. LOS is an open collector output. Should be pulled up with 4.7KΩ on the host board.
6. All transceiver specifications are compliant with a power supply sinusoidal modulation of 20 Hz to 1.5 MHz
up to specified value through the power supply filtering network shown on page 23 of the Small Form -
factor Pluggable (SFP) Transceiver Multi Source Agreement (MSA), September 14, 2000.
4. BO56HXX680D
SFP+ CWDM 8.5G 1470 – 1610nm 80KM
RoHS Compliant Optical Transceiver
- 4 -
4. Transmitter Specifications - Optical
Parameter Symbol Min. Typ. Max. Unit Note
Average Output Power POUT 0 5 dBm
Extinction Ratio ER 6 dB
Center Wavelength λC λ-6.5 λ λ+6.5 nm 1
SMSR 30
Transmitter and Dispersion Peanlty TDP 3 dB
RIN RIN -128 dB/Hz
Output Eye Mask FC-PI-4 rev 7.0 requirements
Notes:
1. λ is 1470,1490,1510,1530,1550,1570,1590 or 1610
5. Receiver Specifications - Optical
Parameter Symbol Min. Typ. Max. Unit Note
Input Optical Wavelength λIN 1270 1620 nm
Receiver Sensitivity PIN -24 dBM 1
Input Saturation Power (Overload) PSAT -7 dBm
LOS Assert PA -32 dBm
LOS De-assert PD -26 dBm
LOS Hysteresis PA-PD 0.5 dB
Notes:
1. Measured with 8.5Gb/s; BER =<10
-12
@PRBS=2
31
-1 non-return-to-zero.
6. SFP+ to Host Connector Pin Out
Pin Symbol Name / Description Note
1 VEET Transmitter Ground (Common with Receiver Ground) 1
2 TFAULT Transmitter Fault indication 2
3 TDIS Transmitter Disable 3
4 SDA 2-wire Serial Interface Data Line 4
5 SCL 2-wire Serial Interface Clock Line 4
6 MOD-ABS Module Absent. Grounded within the module 4
7 RS0 Rate Select 0 5
8 LOS Loss of Signal indication 6
9 RS1 No connection required 1
10 VEER Receiver Ground (Common with Transmitter Ground) 1
11 VEER Receiver Ground (Common with Transmitter Ground) 1
12 RD- Inv. Received Data Out
13 RD+ Received Data Out
14 VEER Receiver Ground (Common with Transmitter Ground) 1
15 VCCR Receiver Power Supply
16 VCCT Transmitter Power
17 VEET Transmitter Ground (Common with Receiver Ground) 1
18 TD+ Transmit Data In
19 TD- Inv. Transmit Data In
20 VEET Transmitter Ground (Common with Receiver Ground) 1
5. BO56HXX680D
SFP+ CWDM 8.5G 1470 – 1610nm 80KM
RoHS Compliant Optical Transceiver
- 5 -
Notes:
1. Circuit ground is isolated from chassis ground.
2. Needs to be pulled up with 4.7k – 10kΩ on host board to a voltage from 2.0V to Vcc + 0.3V.
3. Tx_Disable is an input contact with a 4.7 kΩ to 10 kΩ pullup to VccT inside the module.
4. Mod_ABS is connected to VeeT or VeeR in the SFP+ module. The host may pull this contact up to
Vcc_Host with a resistor from 4.7 kΩ up to 10 kΩ.
5. RS1 are module inputs and are pulled low to VeeT with > 30 kΩ resistors in the module.
6. This is an open collector output, which should only be pulled with a resistor of 4.7k - 10kΩ. Pull up
voltage between 2.0V and 3.6V. Logic 1 indicates loss of signal; logic 0 indicates normal operation. The
output will be pulled to less than 0.8V.
Pinout of Connector Block on Host Board
7. EEPROM Information
The SFP MSA defines a 256-byte memory map in EEPROM describing the transceivers capabilities, standard
interfaces, manufacturer, and other information, which is accessible over a 2 wire serial interface at the 8-bit
address 1010000X (A0h).
Data
Address
Field Size
(Bytes)
Name of Field Contents (Hex) Description
0 1 Identifier XX Formfactor
1 1 Ext. Identifier XX
2 1 Connector XX
3-10 8 Transceiver XX XX XX XX XX XX XX XX Transmittter Code
11 1 Encoding XX
12 1 BR, Nominal XX Transceiver Speed
13 1 Reserved 00
14 1 Length (9μm) km XX Max. link length in KM
15 1 Length (9μm) 100m XX Max. link length in M
16 1 Length (50μm) 10m XX Max. link length in M
17 1 Length(62.5μm)10m XX Max. link length in M
18 1 Length (Copper) XX Max. link length in M
29 1 Reserved 00
30-35
16
Vendor name
XX XX XX XX XX XX XX XX
XX XX XX XX XX XX XX XX
Vendor name - OEM
36 1 Reserved 00
37-39 3 Vendor OUI XX XX XX
6. BO56HXX680D
SFP+ CWDM 8.5G 1470 – 1610nm 80KM
RoHS Compliant Optical Transceiver
- 6 -
40-55
16
Vendor PN
XX XX XX XX XX XX XX XX
XX XX XX XX XX XX XX XX
Product Number -
depending on Part
56-59 4 Vendor rev XX XX XX XX Vendor revision
60-61 2 Wavelength XX XX Transceiver
Wavelength
62 1 Reserved 00
63 1
CC BASE
XX Checksum of bytes 0-
62
64-65 2 Options XX XX
66 1 BR, max XX
67 1 BR, min XX
68-83 16
Vendor SN
XX XX XX XX XX XX XX XX
XX XX XX XX XX XX XX XX
Part serial number
84-91 8 Vendor date code XX XX XX XX XX XX 20 20 Year, Month, Day
92 1 Diagnostic type XX Diagnostics
93 1 Enhanced option XX Diagnostics
94 1 SFF-8472 XX Diagnostics
95 1
CC_EXT
XX Checksum of bytes 64-
94
96-255 160 Vendor Specific
8. Digital Diagnostics / Digital Optical Monitoring
The transceiver provides serial ID memory contents and diagnostic information about the present
operating conditions by the 2-wire serial interface (SCL, SDA).
The diagnostic information with internal calibration or external calibration are all implemented,
including received power monitoring, transmitted power monitoring, bias current monitoring, supply
voltage monitoring and temperature monitoring.
9. Recommended Interface Circuit