Data Analysis tool by EBA

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Data Analysis tool by EBA

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Data Analysis tool by EBA

  1. 1. StandardTest DataYieldAnalysisTool Ertan Baykal ertan.baykal@stericsson.com April 2010
  2. 2. Contents•What is STDF•What is STDF_PRJ tool•Tool’s Main Features•Benchmark2 CONFIDENTIAL 5/5/2012
  3. 3. What is STDF The Standard Test Data Format is a comprehensive standard for the entire ATE industry, developed by Teradyne. STDF is flexible enough to meet the needs of the different testers that generate raw test data coming from ATE. Data analysis programs use STDF ( binary file ) to extract desired information.3 CONFIDENTIAL 5/5/2012
  4. 4. What is Standard Test Data Yield Analysis Standard Test Data Yield Analysis tool enables test and product engineers to perform fast Yield analysis and Start up Window process characterization on their desktops, using standard semiconductor test data files STDF. Tool is particularly useful for test engineers, close to ATE system. It dose not require a Data Base and DataPower to identify and report yield issues. ATE generates STDF file, tool opens it and analyses the results, no need to wait for data to be inserted into Data Base and later appear in DataPower. Tool was developed over a year out of office hours to enable me to do my job better and faster. Softwares used to develop it are Windows Pascal, Advance_Grid and TeeChart_Pro.4 CONFIDENTIAL 5/5/2012
  5. 5. Tool’s Main Features Distribution Plots: Contains main Stat Data Box Plots: useful for process characterization & Matrix Lots Analysis Parametric test wafer map: analyze the test gradient on wafer to investigate process or testing related problemsColor gradients on the distribution Tools can read multiple STDF filesPlot corresponds to gradient Pareto Fails Charts:On the wafer for a given parameter.. 5 CONFIDENTIAL 5/5/2012
  6. 6. Tool’s Main Features cont… 1 2 3 4 5 6 7 1 Contains Raw data. 2 Soft Ware Bin Fails • Stores a count of the parts associated with a particular logical bin after testing. 3 Hard ware Bin Fails • Stores a count of the parts “physically” placed in a particular bin after testing. 4 Test Synopsis Data : • Contains the test execution and failure counts for parametric or functional tests. 5 Detailed Global information: tester, lot, operator etc…6 CONFIDENTIAL 5/5/2012
  7. 7. Tool’s Main Features cont…Test summary:Test name, limits, Fail count, Min, Max, Range, Mean, Sigma, Cpk, etc..Copy and paste for reporting… 67 CONFIDENTIAL 5/5/2012
  8. 8. Tool’s Main Features cont… Detailed Global information: tester, lot, operator information, Copy and paste for reporting8 CONFIDENTIAL 5/5/2012
  9. 9. Tool’s Main Features cont… Raw Data view9 CONFIDENTIAL 5/5/2012
  10. 10. Tool’s Main Features cont… Yield information : good parts, failing parts, parts retested, Copy and paste for reporting A mouse click on YLD% or FAIL_CN cells sorts the data, useful to see main parameters causing a yield loss.10 CONFIDENTIAL 5/5/2012
  11. 11. Tool’s Main Features cont… Software Bin Fails, text or graphical format, Copy and paste for reporting11 CONFIDENTIAL 5/5/2012
  12. 12. Benchmark STDF TOOL Data Power NO, Data to be inserted into DATA BASE later picked up Does Data is avaiable immediatley after a Lot is completed? Yes by Datapower Does it require Data Base to access Data ? NO Yes Pareto Fails Available after extraction Time ? Yes NO * Yield Data Available after extraction Time ? Yes NO * Wafer Maps Available after extraction Time ? Yes NO * Distribution Plots Available after extraction Time ? Yes NO * * After Data extraction It requires extra steps and time to filter data12 CONFIDENTIAL 5/5/2012

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