AMPA, Actives Multiple Probes Array,Project Pitch to PWT and TEAK by Designer Stephen Nibblett (August 2013) - Copy
1. “AMPA” Actives Multiple Probes Array
Patch Antenna Near Field Phase Test Application
“AMPA” project pitch report to PWT & TEAK, seeking further development & implementation, with potential for licensing
ALL Concept, Design, Testing, Development and Documentation created and owned by Stephen Nibblett
(this report is dated August 3, 2013)
2. AMPA: Project Overview
ƒProject Goal:
ƒ Improvement of current antenna phase test processes for cycle time
ƒ Steps:
ƒ Test “proof of concept”, report result
ƒ Proceed to development stage, achieve project goal, receive feedback
ƒ Implement project feedback, test proto production solution (equip, process)
ƒ Submit final release implementation plan and project completion timeline
ƒ Expected Final Project Results:
ƒ Improvement on process cycle times
ƒ Improvement over current process accuracy, traceability and repeatability
ƒ Possible reduction of test station factory footprint, or assembly line integration
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4. AMPA: Offset Data Measurement 4
GS
-40dB CPL
“Flying Probe” Reference Measurement
TERM
GS
-40dB CPL
“AMPA” Offset
Measurement
TERM
10dB
pad
Note: the 10dB pad simulates using the AMPA!
5. AMPA: Offset Data Set Calculation 5
“FP” Reference Measurement
“AMPA” Offset Measurement
“AMPA” Complex Offset Values
6. AMPA: Un-Calibrated
“DUT” & “Ref” Measurements
6
DUT
-10dB CPL
“FP” REFERENCE ONLY
Measurement
TERM
DUT
-10dB CPL
“AMPA” Un-Calibrated
Measurement
TERM
10dB
pad
8. AMPA: Final Test Result Measurement Error 8
“AMPA” CALIBRATED Measurement
“FP” REFERENCE Measurement
Calibrated “AMPA” Measurement Error
Note: this “method simulation” is a closed RF circuit; no actual antenna or near-field probes used yet!
23. AMPA Proto Improvement: Step 1 Findings
ƒ (Step 1 Implemented Fixes Omitted)
ƒ Inaccuracies presumably come (omitted), such as (omitted) or
inadequate (omitted) from (omitted)
ƒ Possibility of defective DUT or Golden Standard unit!
ƒ Revaluate Antenna patch to AMPA probe positioning
ƒ (Step 2 Planned Fixes Omitted)
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34. AMPA Proto Hardware Development:
Improvements Testing Conclusion
ƒExcellent “Flying Probe” to “AMPA” measurement correlation!
ƒ Proceed to testing of full 1.8m size AMPA panel is now advised
ƒ Final hardware / jigging design and optimization should now proceed
ƒ Production Software team advised to proceed planning
IMPORTANT NOTE:
ƒ Original test data errata were due mostly to unintentional conditions:
ƒ GS1 reference unit had an older model patch design than DUT1 or GS2!!!
ƒ Result of Conditions: corrections not matched for patch designs across freq. band
ƒ Lesson Learned: DO NOT Cross-Test Different Antenna Design Versions!
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36. Vertical Test Station Mod:
Phase Testing Position
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• AMPA alignment jigging not shown
Motor / Pulley arrangement
37. 37
• AMPA alignment jigging not shown
Motor / Pulley arrangement
Vertical Test Station Mod:
RL & ISOL Testing Position
38. S-Param Testing New Layout 1:
Manual Insertion of AUT onto jig
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• AUT fitted to locating holes
39. S-Param Testing New Layout 1:
Testing Start Position
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• Barcode Camera (not scanner)
40. S-Param Testing New Layout 1:
AMPA phase testing
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• AUT lifted to AMPA for phase
41. S-Param Testing New Layout 1:
AUT re-positioning
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• AUT lowered from AMPA test
• AUT moved into isolation area
42. S-Param Testing New Layout 1:
Finish AUT Testing
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• AUT tested for RL and ISO
• Could also implement PIM tests
(I designed lo/hi power RF switchboxes)
43. ƒ Advantages (from current layout):
ƒ Different typecodes can be ran concurrently without rejigging
ƒ Disadvantages:
ƒ Usage of motors or pneumatics overly complicated, expensive
ƒ Antenna weights can be excessive for some models
New S-Param Testing Layout 1:
Observations
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44. S-Param Testing New Layout 2:
Phase Test Position
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o AUT fitted to block locating holes
o AUT heights adjusted to AMPA:
• by adapter blocks
• by spring loaded block
• …or combination of both
45. S-Param Testing New Layout 2:
Phase Test Position
45
o AUT fitted to block locating holes
o AUT heights adjusted to AMPA:
• by adapter blocks
• by spring loaded block
• …or combination of both
46. S-Param Testing New Layout 2:
Phase Test Jigging
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o AMPA height is fixed during testing
(SHOWN VIEW IS FROM USER SIDE; END VIEW SHOWN PREVIOUSLY)
47. S-Param Testing New Layout 2:
RL & ISO Test Position
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o AMPA armature counter-weighted
o RL & ISO FOAM layers extended
NOTE: drop-down foam may NOT be needed
48. ƒ Advantages (from current layout):
ƒ Different typecodes can be ran concurrently without rejigging
ƒ Disadvantages:
ƒ Current test station hardware not utilized, not enough re-investment
New S-Param Testing Layout 2:
Observations
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49. S-Param Testing New Layout 3:
RL & ISO Test Position
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o AMPA counter-weighted, light handling
o Roll Handle for AMPA positioning
50. S-Param Testing New Layout 3:
RL & ISO Test Position
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o AMPA “stored” at 90~180 degrees
o No immediate AUT proximity effects*
( * need verification test data! Updated: OK!!!)
51. S-Param Testing New Layout 3:
RL & ISO Test Position
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AMPA-AUT Common Zero Position
52. S-Param Testing New Layout 3:
Phase Test Position
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o AMPA-AUT alignment zone constant
o Each AUT model has adapter blocks
• Common AMPA zero positioning
• Custom heights adjustment
• Custom 1/2/3 row alignment
• Far end block distance not critical
o Common main mount hardware
(NOTE: AMPA rail alignment hardware not shown)
53. S-Param Testing New Layout 3:
Final Draft Hardware DWGs
Shown in:
a. RL and Isolation test position
b. Rotation
c. Phase test position
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a.
b.
c.