Paul Ahern
![Paul Ahern - Time of Flight Secondary Ion Mass Spectroscopy [ToF-SIMS] theory & practice](https://cdn.slidesharecdn.com/ss_thumbnails/paulahern-timeofflightsecondaryionmassspectroscopytof-simstheorypractice-130910131545-phpapp02-thumbnail.jpg?width=640&height=640&fit=bounds)
Personal Information
Organization / Workplace
Invention Investment IrelandLocation
Ireland IrelandOccupation
Senior Staff Engineer at Invention Investment IrelandIndustry
Venture Capital / Private Equity
About
I am a material scientist & reliability engineer with 15 years’ engagement with blue-chip global multinationals in the areas of research & development, semiconductors manufacturing, telecommunications reliability and laboratory start-up, management and analysis. Semiconductor Physics & Processing: - 200mm & 300mm VLSI/ULSI wafer processing & integration. - Strained Si, high & low K dielectrics, copper processing and barrier layer chemistry. - Fab microcontamination root cause, detection & containment. - Primavera 5/6, Fab Install & Qualification, Project management. Telecommunications Reliability: - Design for Reliability (DfR) - Telcordia/IPC/JEDEC/MIL-STD standard testing requirements.