1. Internship Report
Application Overview
PARAMETRIC
SHIFT
ANALYSES
USING ANOVA,
DELTA SIGMA,
CPK
DEVICE
DRIFT
ANALYSIS
Automotive Test qualification methods
Group A
Accelerated
Environment
Stress test
Group B
Accelerated
Life time
Simulation
test
Group E
Package
Assembly
Integrity
Tests
Group X
Customer
Specific
tests
Biased HAST
Temperature
Humidity Bias
High Temperature
Operating Life
Human Body Model
(Electro Static
Discharge)
Charged Device Model
(Electro Static Discharge)
Charged Device Model
(Electro Static Discharge)
Low Temperature
Operating Life
High
score in
FMEA
Wafer Fab Transfer
New material
Qualification
Process Change
qualification
TP release
Qualification of changes in
manufacturing Process