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Thin Film Measurement solution 
Software, sensors, custom development 
and integration 
ZnO (AZO) Measurement 
Al -doped ZnO is widely used as a TCO (transparent conductive oxide) layer in 
thin-film solar cells. 
Detailed analysis of the AZO optical dispersion, bandgap, etc. can be done using MProbe 
UVVisSr system that allows measurement down to 200nm. 
However, AZO can be successfully measured using our MProbe Vis system that covers 
400-1000nm wavelength range. 
AZO samples were measured using MProbe Vis system to determine thickness and 
optical dispersion in the visible range. AZO optical dispersion was represented using CP-Exciton 
approximation model. 
Fig, 1 Sample #1 AZO/Si . Model to measurement fit, T, n,k are determined 
simultaneously. Thickness: 360nm (See Fig 2 for n,k spectra ) 
83 Pine Hill Rd. Southborough, MA 01772 
Phone +1.617.388.6832 Fax. +1.508.858.5473 
email: info@semiconsoft.com http://www.semiconsoft.com
Fig. 2. Sample #1 optical dispersion determined form the measurement. 
Fig. 3. Sample #2 (AZO/SiO2/Si). Fit of the model to measurement data. Calculated 
parameters AZO and SiO2 thickness (197nm AZO/50nm SiO2/Si). AZO dispersion from 
the Sample#1 is used. Good fit to the measured data shows that the optical properties of 
the AZO in both sample are the same. 
83 Pine Hill Rd. Southborough, MA 01772 
Phone +1.617.388.6832 Fax. +1.508.858.5473 
email: info@semiconsoft.com http://www.semiconsoft.com
Fig. 4. Sample # 3(Fe3O4/SiO2/Si). Model to measured data fit. F3O4 dispersion is 
represented using CP Exciton model. 174nm Fe3O4/50nm SiO2/Si. Fe3O4 thickness and 
optical dispersion are determined from the measurement. 
Fig. 5 Sample#4 (Fe3O4/AZO/Al2O3 (substrate)). Fit of the model to measured data. 
Thicknesses of Fe3O4 and AZO are determined from the measurement. Optical 
dispersion of the materials is taken from the previous measurements. : 8 nm Fe2O4/ 22 
nm AZO/ Sapphire (substrate) 
83 Pine Hill Rd. Southborough, MA 01772 
Phone +1.617.388.6832 Fax. +1.508.858.5473 
email: info@semiconsoft.com http://www.semiconsoft.com
Fig. 6. Sample # 5. Thick AZO on glass. Model to measurement data fit. Thickness: 
1031nm, surface roughness: 42nm 
83 Pine Hill Rd. Southborough, MA 01772 
Phone +1.617.388.6832 Fax. +1.508.858.5473 
email: info@semiconsoft.com http://www.semiconsoft.com
Fig. 7. Sample# 5 Optical dispersion spectra determined from the measurement. 
Dispersion is represented using CPExciton model 
83 Pine Hill Rd. Southborough, MA 01772 
Phone +1.617.388.6832 Fax. +1.508.858.5473 
email: info@semiconsoft.com http://www.semiconsoft.com

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TCO: thickness and n&k measurement

  • 1. Thin Film Measurement solution Software, sensors, custom development and integration ZnO (AZO) Measurement Al -doped ZnO is widely used as a TCO (transparent conductive oxide) layer in thin-film solar cells. Detailed analysis of the AZO optical dispersion, bandgap, etc. can be done using MProbe UVVisSr system that allows measurement down to 200nm. However, AZO can be successfully measured using our MProbe Vis system that covers 400-1000nm wavelength range. AZO samples were measured using MProbe Vis system to determine thickness and optical dispersion in the visible range. AZO optical dispersion was represented using CP-Exciton approximation model. Fig, 1 Sample #1 AZO/Si . Model to measurement fit, T, n,k are determined simultaneously. Thickness: 360nm (See Fig 2 for n,k spectra ) 83 Pine Hill Rd. Southborough, MA 01772 Phone +1.617.388.6832 Fax. +1.508.858.5473 email: info@semiconsoft.com http://www.semiconsoft.com
  • 2. Fig. 2. Sample #1 optical dispersion determined form the measurement. Fig. 3. Sample #2 (AZO/SiO2/Si). Fit of the model to measurement data. Calculated parameters AZO and SiO2 thickness (197nm AZO/50nm SiO2/Si). AZO dispersion from the Sample#1 is used. Good fit to the measured data shows that the optical properties of the AZO in both sample are the same. 83 Pine Hill Rd. Southborough, MA 01772 Phone +1.617.388.6832 Fax. +1.508.858.5473 email: info@semiconsoft.com http://www.semiconsoft.com
  • 3. Fig. 4. Sample # 3(Fe3O4/SiO2/Si). Model to measured data fit. F3O4 dispersion is represented using CP Exciton model. 174nm Fe3O4/50nm SiO2/Si. Fe3O4 thickness and optical dispersion are determined from the measurement. Fig. 5 Sample#4 (Fe3O4/AZO/Al2O3 (substrate)). Fit of the model to measured data. Thicknesses of Fe3O4 and AZO are determined from the measurement. Optical dispersion of the materials is taken from the previous measurements. : 8 nm Fe2O4/ 22 nm AZO/ Sapphire (substrate) 83 Pine Hill Rd. Southborough, MA 01772 Phone +1.617.388.6832 Fax. +1.508.858.5473 email: info@semiconsoft.com http://www.semiconsoft.com
  • 4. Fig. 6. Sample # 5. Thick AZO on glass. Model to measurement data fit. Thickness: 1031nm, surface roughness: 42nm 83 Pine Hill Rd. Southborough, MA 01772 Phone +1.617.388.6832 Fax. +1.508.858.5473 email: info@semiconsoft.com http://www.semiconsoft.com
  • 5. Fig. 7. Sample# 5 Optical dispersion spectra determined from the measurement. Dispersion is represented using CPExciton model 83 Pine Hill Rd. Southborough, MA 01772 Phone +1.617.388.6832 Fax. +1.508.858.5473 email: info@semiconsoft.com http://www.semiconsoft.com