Personal Information
Occupation
Plano,TX
Industry
Manufacturing
Website
yieldwerx.com/
About
yieldWerx offers end-to-end semiconductor test data analytics solutions in a modular framework so that customers can purchase the capability needed to support their current business.
Tags
semiconductor manufacturing
semiconductor data
manufacturing yield
semiconductor yield management
yield management software
semiconductor industry
yield analysis software
spc semiconductor
dpat semiconductor
final test semiconductor
semiconductor yield monitoring
semiconductor yield analysis
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yield analytics
statistical yield limit
semiconductor improvement
yield enhancement systems
cluster fails semiconductor
production yield
wafer yield
spat semiconductor
yield analysis
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yield management solutions
semiconductor spc software
wafer map software
semiconductor test equipment
part average test
stdf data analysis
yield management systems
die per wafer calculator
yield software
yield in manufacturing
die yield formula
wafer mapping software
root cause analysis
outlier detection
gauge r&r
outlier
atdf data analysis
gdbn
statistical bin limit
wafer lot
yield loss in manufacturing
wat
statistical yield limits
excel wafer map
global semiconductor shortage
yield improvement
yield enhancement engineer
wafer acceptance test
wafer map analysis
wafer acceptance testing
sbl test
yield management
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yield engineering
defect data management
automated assemble map gener
part average testing
statistical process control
dynamic part average testing
wafer acceptance test (wat)
wafer map generator
yield loss
wafer map
lot control in manufacturing
high volume manufacturing
process control monitoring
statistical tests
machine learning algorithms
production yield reporting
map merge semicon
disposition software
static pat
good die bad neighborhood
advancements in tool science
emerging trends
fab integration architectures
optimal process control
catalyst for transformation
fab control application
role of control software
cluster tools
equipment integration
maximizing efficiency
machine learning
external data integration
data analysis
technological advancements
yield engineer
yield in semiconductor manufac
gage r&r
yield manufacturing
yield enhancement system
detecting process excursions
ai technology
advance process control
statistical process control se
machine vision
automated data loading
smart wafer merge
part average test (pat)
six sigma
good die/bad neighborhood (gdb
design of experiments (doe)
failure mode and effects analy
zero defects
https://yieldwerx.com/
See more
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(38)Documents
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(1)Personal Information
Occupation
Plano,TX
Industry
Manufacturing
Website
yieldwerx.com/
About
yieldWerx offers end-to-end semiconductor test data analytics solutions in a modular framework so that customers can purchase the capability needed to support their current business.
Tags
semiconductor manufacturing
semiconductor data
manufacturing yield
semiconductor yield management
yield management software
semiconductor industry
yield analysis software
spc semiconductor
dpat semiconductor
final test semiconductor
semiconductor yield monitoring
semiconductor yield analysis
semiconductor yield
yield analytics
statistical yield limit
semiconductor improvement
yield enhancement systems
cluster fails semiconductor
production yield
wafer yield
spat semiconductor
yield analysis
yield management system
yield management solutions
semiconductor spc software
wafer map software
semiconductor test equipment
part average test
stdf data analysis
yield management systems
die per wafer calculator
yield software
yield in manufacturing
die yield formula
wafer mapping software
root cause analysis
outlier detection
gauge r&r
outlier
atdf data analysis
gdbn
statistical bin limit
wafer lot
yield loss in manufacturing
wat
statistical yield limits
excel wafer map
global semiconductor shortage
yield improvement
yield enhancement engineer
wafer acceptance test
wafer map analysis
wafer acceptance testing
sbl test
yield management
dynamic pat
yield engineering
defect data management
automated assemble map gener
part average testing
statistical process control
dynamic part average testing
wafer acceptance test (wat)
wafer map generator
yield loss
wafer map
lot control in manufacturing
high volume manufacturing
process control monitoring
statistical tests
machine learning algorithms
production yield reporting
map merge semicon
disposition software
static pat
good die bad neighborhood
advancements in tool science
emerging trends
fab integration architectures
optimal process control
catalyst for transformation
fab control application
role of control software
cluster tools
equipment integration
maximizing efficiency
machine learning
external data integration
data analysis
technological advancements
yield engineer
yield in semiconductor manufac
gage r&r
yield manufacturing
yield enhancement system
detecting process excursions
ai technology
advance process control
statistical process control se
machine vision
automated data loading
smart wafer merge
part average test (pat)
six sigma
good die/bad neighborhood (gdb
design of experiments (doe)
failure mode and effects analy
zero defects
https://yieldwerx.com/
See more