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BARRIERS TO THE SUCCESSFUL COMMERCIALIZATION OF MEMS:AN INDUSTRY REPORT CARD FOCUSING ON THE ISSUES OF DESIGN FOR MANUFACTURING AND TEST MEPTEC MEMS TEST AND RELIABILITY WORKSHOP San Jose, California October 21, 2009 Roger H. Grace President, Roger Grace Associates [email_address] www.rgrace.com
ROGER GRACE ASSOCIATES ,[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object]
BARRIERS TO COMMERCIALIZATION ,[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object]
MEMS/MST Commercialization Timetable Product Discovery Product  Evolution Cost Reduction Full Commer- cialization Elapsed Time years Pressure  Sensors 1954-1960 1960-1975 1975-1990 1990 36 Accelerometers 1974-1985 1985-1990 1990-1998 1998 24 Gas Sensors 1986-1994 1994-1998 1998-2005 2005 29 Valves 1980-1988 1988-1996 1996-2002 2002 22 Nozzles 1972-1984 1984-1990 1990-2002 2002 24 Photonics/Displays 1980-1986 1986-1998 1998-2005 2005 25 Bio/Chemical Sensors 1980-1994 1994-2000 2000-2010 2010 28 Radio Frequency (R.F.) 1994-1998 1998-2001 2001-2008 2008 13 Rate Sensors 1982-1990 1990-1996 1996-2006 2006 22 Micro Relays 1977-1993 1993-1998 1998-2008 2008 28 Oscillators 1965-1980  1980-1995  1995-2009  2009 44 Median 27
MARKETS & APPLICATIONS ,[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object]
APPLICATION OPPORTUNITIES ,[object Object],[object Object],[object Object],[object Object],[object Object],[object Object]
 
DESIGN FOR MANUFACTURING/TEST ,[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object]
ESTABLISHED INFRASTRUCTURE ,[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object]
MARKETING ,[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object]
MANUFACTURING /PACKAGING/TEST CHALLENGES ,[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object]
[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],WAFER LEVEL PACKAGING
“ THINK OUTSIDE THE CHIP” ,[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object]
SELECTING A PACKAGING AND TEST SUPPLIER ,[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object]
PACKAGING CAVEATS ,[object Object],[object Object],[object Object],[object Object]
CRITICAL SUCCESS FACTORS ,[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object]
MEMUNITY ,[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object]
CALL TO ACTION/RECOMMENDATION ,[object Object],[object Object],[object Object],[object Object],[object Object],[object Object]
SUMMARY ,[object Object],[object Object],[object Object],[object Object],[object Object],[object Object]
LESSONS TO BE LEARNED BY NANOTECHNOLOGY ,[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object],[object Object]
. ,[object Object]
FOR MORE INFORMATION ,[object Object],[object Object]

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Meptec 2009 Test And Reliability Rev.B

  • 1. BARRIERS TO THE SUCCESSFUL COMMERCIALIZATION OF MEMS:AN INDUSTRY REPORT CARD FOCUSING ON THE ISSUES OF DESIGN FOR MANUFACTURING AND TEST MEPTEC MEMS TEST AND RELIABILITY WORKSHOP San Jose, California October 21, 2009 Roger H. Grace President, Roger Grace Associates [email_address] www.rgrace.com
  • 2.
  • 3.
  • 4. MEMS/MST Commercialization Timetable Product Discovery Product Evolution Cost Reduction Full Commer- cialization Elapsed Time years Pressure Sensors 1954-1960 1960-1975 1975-1990 1990 36 Accelerometers 1974-1985 1985-1990 1990-1998 1998 24 Gas Sensors 1986-1994 1994-1998 1998-2005 2005 29 Valves 1980-1988 1988-1996 1996-2002 2002 22 Nozzles 1972-1984 1984-1990 1990-2002 2002 24 Photonics/Displays 1980-1986 1986-1998 1998-2005 2005 25 Bio/Chemical Sensors 1980-1994 1994-2000 2000-2010 2010 28 Radio Frequency (R.F.) 1994-1998 1998-2001 2001-2008 2008 13 Rate Sensors 1982-1990 1990-1996 1996-2006 2006 22 Micro Relays 1977-1993 1993-1998 1998-2008 2008 28 Oscillators 1965-1980 1980-1995 1995-2009 2009 44 Median 27
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