OPTICAL SYSTEMS LASER & MATERIAL PROCESSING INDUSTRIAL METROLOGY TRAFFIC SOLUTIONS DEFENCE & CIVIL SYSTEMS

HOMMEL-ETAMIC C8000 digiscan
Innovative contour measurement system for the measuring room and
the production environment
Highlights
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Digital measuring systems
Wide measuring range
Easy to replace probe arms
Automatic probe arm recognition
Automatic probe force setting
New efficient EVOVIS evaluation software
Optional top/bottom measurement

Technical data
•	 Measurement range/resolution: 60 mm/50 nm
or 90 mm/75 nm(1)
•	 Horizontal measuring range: 120 mm
•	 Measuring column trace width: 400 mm
•	 Granite plate: 780 x 500 mm
•	 Probe arm coupling: magnetic
•	 Probe arm recognition: electronic, RFID
•	 Probe force: electronic ±5 mN to ±50 mN

(1)

Options
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top/bottom measurement
Certified QS-STAT interface
Control panel wavecontrol
GTR instrument table

1.5-times probe arm length

Precision is our business.
HOMMEL-ETAMIC EVOVISTM
The innovative evaluation software for roughness and contour
measuring systems.

Many measuring tasks – one evaluation software.
EVOVIS™ offers a single user interface for all mobile and
stationary roughness and contour measuring systems from
Hommel-Etamic. The characteristic-oriented user interface offers
a comfortable and clear measuring programme design enables
the evaluation of anything from simple roughness parameters
to complex roughness and contours with several profiles in one
evaluation.
Contour evaluation




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Quick and easy user control
Characteristic-orientated measuring programme structure
Manual and CNC-controlled measurement
Efficient print log-editor
Supports all scanning systems from Hommel-Etamic
Integrated measuring station control
Option of efficient qs-STAT statistics interface

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Contour evaluation
Several profiles in one evaluation
Extensive evaluation functions
Intuitive navigation and zoom functions
Work on profile with pin-point accuracy
Roughness evaluation on contour profile
Clear object list

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

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

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Print form

Roughness evaluation
•	 Wizard for measuring conditions
•	 Extensive profile analysis functions
•	 Over 90 roughness and waviness parameters in accordance
with DIN EN ISO 4287 as well as additional ISO and
national standards (ASME, DIN, JIS, Motif)
•	 ISO/TS 16610-31 robust Gauss filter
•	 Can be extended with function-orientated dominant
waviness parameters (VDA2007)

	

JENOPTIK  I  Industrial Metrology  

	

HOMMEL-ETAMIC GmbH  I  Alte Tuttlinger Straße 20  I  78056 VS-Schwenningen
	

Germany  I  Phone +49 7720 602-0  I  Fax +49 7720 602-123

	

E-mail: info.de@hommel-etamic.com  I  www.hommel-etamic.com

DB_EVOVIS_EN 02.2011
Subject to change without notice.

Wizard for measuring conditions (roughness)

C8000 Digiscan Evovis

  • 1.
    OPTICAL SYSTEMS LASER& MATERIAL PROCESSING INDUSTRIAL METROLOGY TRAFFIC SOLUTIONS DEFENCE & CIVIL SYSTEMS HOMMEL-ETAMIC C8000 digiscan Innovative contour measurement system for the measuring room and the production environment Highlights • • • • • • • Digital measuring systems Wide measuring range Easy to replace probe arms Automatic probe arm recognition Automatic probe force setting New efficient EVOVIS evaluation software Optional top/bottom measurement Technical data • Measurement range/resolution: 60 mm/50 nm or 90 mm/75 nm(1) • Horizontal measuring range: 120 mm • Measuring column trace width: 400 mm • Granite plate: 780 x 500 mm • Probe arm coupling: magnetic • Probe arm recognition: electronic, RFID • Probe force: electronic ±5 mN to ±50 mN (1) Options • • • • top/bottom measurement Certified QS-STAT interface Control panel wavecontrol GTR instrument table 1.5-times probe arm length Precision is our business.
  • 2.
    HOMMEL-ETAMIC EVOVISTM The innovativeevaluation software for roughness and contour measuring systems. Many measuring tasks – one evaluation software. EVOVIS™ offers a single user interface for all mobile and stationary roughness and contour measuring systems from Hommel-Etamic. The characteristic-oriented user interface offers a comfortable and clear measuring programme design enables the evaluation of anything from simple roughness parameters to complex roughness and contours with several profiles in one evaluation. Contour evaluation                      Quick and easy user control Characteristic-orientated measuring programme structure Manual and CNC-controlled measurement Efficient print log-editor Supports all scanning systems from Hommel-Etamic Integrated measuring station control Option of efficient qs-STAT statistics interface  • • • • • • •      Contour evaluation Several profiles in one evaluation Extensive evaluation functions Intuitive navigation and zoom functions Work on profile with pin-point accuracy Roughness evaluation on contour profile Clear object list              • • • • • •            Print form Roughness evaluation • Wizard for measuring conditions • Extensive profile analysis functions • Over 90 roughness and waviness parameters in accordance with DIN EN ISO 4287 as well as additional ISO and national standards (ASME, DIN, JIS, Motif) • ISO/TS 16610-31 robust Gauss filter • Can be extended with function-orientated dominant waviness parameters (VDA2007) JENOPTIK I Industrial Metrology HOMMEL-ETAMIC GmbH I Alte Tuttlinger Straße 20 I 78056 VS-Schwenningen Germany I Phone +49 7720 602-0 I Fax +49 7720 602-123 E-mail: info.de@hommel-etamic.com I www.hommel-etamic.com DB_EVOVIS_EN 02.2011 Subject to change without notice. Wizard for measuring conditions (roughness)