Introduction to Electromigration March 2013


Published on

The effects of electro- and electrochemical (as well as stress-) migration on metal interconnects are reviewed and explained in this course. Theoretical background related to these phenomena will be described. The evaluation of measurement techniques of these migrations are also being explained in this subject. Examples related to issues for wafer and packaging levels are provided. Factors affecting electro- and electrochemical (as well as stress-) migration will be presented and statistical models predicting the reliability of these phenomena are briefly explained.

Published in: Education
  • Be the first to comment

  • Be the first to like this

No Downloads
Total views
On SlideShare
From Embeds
Number of Embeds
Embeds 0
No embeds

No notes for slide

Introduction to Electromigration March 2013

  1. 1. PUSAT PENGAJIAN KEJURUTERAAN BAHAN & SUMBER MINERALSCHOOL OF MATERIALS & MINERAL RESOURCES ENGINEERING WHO SHOULD ATTEND? Technicians, engineers, and researchers Decision makers, policy makers, and managersDates : 5 March 2013 (Wednesday)Time : 9:00 a.m. – 5:00 p.m.Venue : Kompleks ЄUREKA, Universiti Sains Malaysia, Penang. PREREQUISITE Basic technical background or working experience in a science or engineering discipline.REGISTRATION FEE collaboration in collaboration with:(Covers training materials, refreshment including lunch andCertificate of Attendance)Normal : MYR 1,100.00 per participant (wholly-owned by Universiti Sains Malaysia)Group : MYR 990.00 per participant(Minimum 3 participants from the same company / organisation) HRDF Claimable* *Subject to HRDF Approval
  2. 2. INTRODUCTION COURSE CO-ORDINATORThe effects of electro- and electrochemical (as well ASSOC. PROF. DR. IR. CHEONG KUAN YEWas stress-) migration on metal interconnects are Kuan Yew Cheong was born in Ipoh,reviewed and explained in this course. Theoretical Perak (1972) and received the B. Eng (1st Hons.) in Materials Engineeringbackground related to these phenomena will be from Universiti Sains Malaysia (USM),described. The evaluation of measurement Malaysia in 1997. After graduation, he worked for two years as a projecttechniques of these migrations are also being engineer and quality assuranceexplained in this subject. Examples related to issues engineer in a project managementfor wafer and packaging levels are provided. Factors company and a semiconductor-device manufacturing factory in Malaysia.affecting electro- and electrochemical (as well as End of 1999, he decided to pursue his postgraduate studystress-) migration will be presented and statistical (M.Sc.) after being awarded a Fellowship under the Academicmodels predicting the reliability of these Staff Training Scheme from USM. After completion his M.Sc. inphenomena are briefly explained. Materials Engineering (Thin Film Technology) in 2001, he continued his Ph.D. in the School of Microelectronic Engineering, Griffith University, Australia and the degree was awarded in 2004. This study was fully sponsored by AustralianCOURSE OUTCOMES Research Council, USM, and Griffith University Postgraduate Research Scholarship. In 2005, he was awarded a Certificate ofUpon completion of this course, participants will be Teaching and Learning from to: Now he is serving as an Associate Professor at the School ofi. Differential among electro-, electrochemical, Materials & Mineral Resources Engineering, USM. He is and stress-migration. teaching under- and post-graduate courses related to fabrication and characterization of engineering & electronic materials andii. Describe the physical mechanism of devices for more than 8 years. Dr. Cheong’s main research area electromigration. is on semiconductor device fabrication, electronic packaging, and characterization. The outcomes of his research have beeniii. List down models explaining electromigration. published in more than 100 high-impact-factor journals and 3iv. Explain electromigration-induced mechanical book chapters. Due to his expertise in wide-bandgap stress. semiconductor-based device fabrication technology, for the past six years, he has been invited three times as a Visiting Scientistv. Relate electromigration to reliability of an to Korea Electrotechnology Research Institute (KERI), Korea. interconnection. He has also being invited as an Invited Speaker and Keynotevi. Suggest characterization methods to measure Speaker in International Conference on Electronic Materials 2010 (ICEM 2010) - International Union of Materials Research electromigration. Societies (IUMRS), Korea, CIE & IEM International Seminar onvii. Cite factors affecting electro- and stress- Electrical, Electronic and Energy Saving 2010, Taiwan, and Infineon Technologies (Kulim) Sdn Bhd (IFKM) Technical migration. Symposium 2010, Malaysia, Surface Engineering 2011 at Bangkok, Thailand, and Collaborative Conference on Crystal Growth on Dec 2012 at Florida USA. Dr Cheong has served asENQUIRY a reviewer for numerous referred journals and theses examiner. He has reviewed more than 350 manuscripts and now servingTechnical Details: as an Advisory Editorial Board Member of Materials Science in Semiconductor Processing published by Elsevier Science B.VAssoc. Prof. Dr. Ir. Cheong Kuan Yew and Associate Editor of Physics Express published by SimplexSchool of Materials & Mineral Resources Academic. He is also a Professional Engineers in Material Engineering discipline under Board of Engineers, Malaysia.Engineering, USM.(T) +604-653 3888 Ext 5259 Outside university, he is very active in professional and(E) community activities. He is a member of Materials Research Society (USA). He was the honorary treasurer for Electron Microscopy Society, Malaysia for year 2005/2006. Since 2005, he has been elected as one of the Ex-comms of the Institute ofRegistration and others: Electrical, Electronic Engineers (IEEE) – Component, Package, and Manufacturing Technology (CPMT) Society and ElectronKhairol Anuar Hazir Mohammed Device Society (EDS), Malaysia Chapter. In addition, he was theUSAINS Holding Sdn. Bhd. Chairman of the electronic engineering technical division (eETD)(T) +604-653 4372 / (M) +6012-286 9048 under The Institution of Engineers Malaysia (IEM) from 2009 to 2012 and now is the Advisor of the technical division. He has(E) / been appointed as a Council Member of IEM and a / Committee on Qualification/Admission Examination/Training. For the past years, he has involved in organizing a number of local and international conferences and being invited to chair aCOURSE METHODOLOGY few technical sessions in those conferences. Dr Cheong, who is a certified PSMB Trainer, has been delivering technical trainingThis course is conducted in a seminar room. Each courses for local and multinational electronics industries for the past 5 years and more than 400 engineers and researchersparticipant will receive a set of course materials. have benefited from those courses.
  3. 3. INTRODUCTION TO ELECTROMIGRATION COURSE OUTLINE 1. Introduction 2. Background of Electro-, Electrochemical, and Stress-migration 3. Theory of related migration 4. Tests of Electromigration 5. Factors affecting Electromigration 6. Conclusion RECOMMENDED ACCOMMODATION: Hotel Equatorial Penang Eastin Hotel Penang 1, Jalan Bukit Jambul 1, Solok Bayan Indah, Queensbay 11900 Bayan Lepas, Penang. 11900 Bayan Lepas, Penang. Tel: 04–6327000 / 04-6327900 Tel: 04–612 1111 Fax: 04–644 8000 Fax: 04–612 1199 B-Suite Hotel Vistana B Tower, Bayan Point, 213, Jalan Bukit Gambir, Bukit Jambul 11900 Bayan Lepas, Penang. 11950 Penang. Tel: 04–646 7777 Tel: 04–646 8000 Fax: 04–644 5000 Fax: 04–646 1400 The Krystal Suites USM Guest House (inside USM compound) Jalan Tun Dr. Awang Universiti Sains Malaysia 11900 Bayan Lepas, Penang. 11800 Minden, Penang. Tel: 04–613 3333 Tel: 04–653 2030 / 04-653 2050 Fax: 04–613 3338/2 Fax: 04–659 7124 SEAMEO RECSAM International House Anggerik Lodging 11700 Gelugor, Penang. 351, Hilir Pemancar (T): 04-652 2727 11700 Gelugor, Penang. (F): 04-652 2738 (T): 04–658 3760 (E): / (F): 04–659 9052 (E): (W): (W): Organizer reserves the right to reschedule or cancel any part of its published programme or venue due to unforeseen circumstances and will not accept liability forcosts incurred by participants or their organizations for the cancellation of travel arrangements and/or accommodation reservations as a result of the course beingcancelled or postponed. Advance notice will be given if there is such a change or cancellation.
  4. 4. REGISTRATION FORM INTRODUCTION TO ELECTROMIGRATION Send registration form to : Khairol Anuar, USAINS Holding Sdn. Bhd., Ground Floor, Kompleks ЄUREKA, Universiti Sains Malaysia, 11800 USM PENANG. Fax : +604-657 2210 OR Email to : / / NO. PARTICIPANT NAME POSITION & EMAIL 1. 2. 3. 4. 5.Company:Address: Postcode:Contact Person: Mobile Phone:Telephone No.: Fax No. E-mail:Mode of Payment Number Bank No. of Participants: MYRI enclose Crossed Cheque Normal: Bank Draft Group Discount: Money Order LO / PO Total: Cheque / Bank Draft / Money Order / LO / PO must be made payable to ‘USAINS HOLDING SDN. BHD.’.1. Bank Transfer [Please fax your Bank-in Slip (Print your name & details on the slip)]. Payee Name : USAINS Holding Sdn. Bhd. Details : INTRODUCTION TO ELECTROMIGRATION Name of Bank : CIMB Bank Berhad (USM Branch), Universiti Sains Malaysia, 11800 USM Penang. Account Number : 0709-0006708-05-72. A Local Order (LO) or Purchase Order (PO) must be presented before the event. The Organizer reserves the right to refrain a registered participant from taking part in the event if no proof of payment can be presented. This only applies to registered participants who have NOT paid the registration fee PRIOR to the event date.3. Cancellation / Substitution A full refund less administration fee of MYR250.00 will be given for cancellation received not later than 10 working days before the course. No refund will be made after this period. However, substitute participants are welcomed at no extra charge provided written notice of at least 5 working days before the event is given to the Organizer.