An investment in knowledge always pays the best interest. Benjamin Franklin   APM 3DLevelScanner ™ Changing the market fro...
Moving from level to volume measurement of solids <ul><li>Level measurement, good for liquids, not relevant for solids </l...
Single-point measurement technologies  May 2011 APM Annual International Partners Conference
Replacing estimation with accurate volume measurements <ul><li>APM innovates by: </li></ul><ul><ul><li>Measuring  multiple...
How improved accuracy saves money <ul><li>Decreases extra safety stocks </li></ul><ul><li>Lowers costs by ordering materia...
APM technology building blocks Physics Mathematics Electronics Digital Signal Processing
Scanner position, acoustic waves reflection <ul><li>Positioning the 3DLevelScanner to see most of the material most of the...
Measuring distance in a 3D environment <ul><li>Distance (R) = velocity times the time an acoustic wave travels R = Velocit...
Measuring distance in a 3D environment <ul><li>Calculating distance in a 3D environment:  x - y - z   R Distance :   absol...
Measuring distance in a 3D environment Each APM scanner uses 3 antennas  <ul><li>Each antenna transmits acoustic waves and...
3 antennas – 3 different measurements of a single point <ul><li>Guarantees knowing the precise x-y-z location of each poin...
APM technology building blocks Physics Mathematics Electronics Digital Signal Processing
Calculating volume in 3D environment <ul><li>APM knows how to accurately measure distance to any point. </li></ul><ul><li>...
Prerequisites for accurate measurements <ul><li>Precise silo, bin or container dimensions </li></ul><ul><li>Precise locati...
APM technology building blocks Physics Mathematics Electronics Digital Signal Processing
Electronics - Challenges <ul><li>Generate a strong and recognizable signal </li></ul><ul><li>Generate strong SNR (signal-t...
Electronics – Challenges Acoustic wave attenuation <ul><li>Harsh, dusty and humid environments attenuate the strength of a...
Electronics – Challenges Acoustic wave attenuation <ul><li>Harsh, dusty and humid environments attenuate the strength of a...
APM technology building blocks Physics Mathematics Electronics Digital Signal Processing
Digital Signal Processing <ul><li>APM’s patented algorithms filter out false or irrelevant echoes using many specified par...
Market needs <ul><li>Accurate and continuous volume measurement (= inventory)  </li></ul><ul><li>Volume measurement of all...
Market needs Examples of self-cleaning <ul><li>Self-cleaning, practically maintenance free  </li></ul>May 2011 APM Annual ...
Competitive advantages <ul><li>The only real-time volume measurement device for silos </li></ul><ul><li>Suitable for measu...
Competitive advantages  Measures practically all kinds, sizes of containers   Large open bins    Bulk solids storage r...
Competitive advantages Accuracy tolerance 3DLevelScanner   MV  vs . single-point device <ul><li>Comparison of volume (%) a...
Competitive advantages Accuracy tolerance 3DLevelScanner   MV  vs . single-point device <ul><li>Comparison of volume (%) a...
Competitive advantages <ul><li>Self-cleaning  </li></ul><ul><li>3D mapping visualization enabling control and filling opti...
Real-life materials surface mapping <ul><li>Large brewery </li></ul><ul><li>Huge quantities of grain stored in very tall, ...
3D visualization during empty cycle # 1 <ul><li>Inset photo shows bin contents at time of measurement.  </li></ul><ul><li>...
3D visualization during empty cycle # 2 <ul><li>3D visualization reflects consistency with taped measurements. </li></ul>C...
3D visualization during empty cycle # 3 <ul><li>Photo demonstrates changes in surface area topography during the empty cyc...
3D visualization during empty cycle # 4 <ul><li>Significant topographical variations occur at this point in the empty cycl...
3D visualization during empty cycle # 6 <ul><li>A clear picture of how material can react and impact volume accuracy </li>...
Converting volume to weight <ul><li>Material density is measured in tons/m 3 </li></ul><ul><ul><li>Bulk density differs fr...
Converting volume to weight <ul><li>APM scanners calculate weight based on bulk density </li></ul><ul><ul><li>Weight = bul...
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Changing the market from level to volume mordi perl

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Changing the market from level to volume mordi perl

  1. 1. An investment in knowledge always pays the best interest. Benjamin Franklin APM 3DLevelScanner ™ Changing the market from level to volume Inventory Means Money Mordi Perl, EMEA Executive Sales Director Innovating and Pioneering 3D True Volume Measurement of Solid Materials in Silos and Open Bins
  2. 2. Moving from level to volume measurement of solids <ul><li>Level measurement, good for liquids, not relevant for solids </li></ul><ul><li>Traditional level measurement devices only measure the distance between the device and one single point on the surface. </li></ul>May 2011 APM Annual International Partners Conference
  3. 3. Single-point measurement technologies May 2011 APM Annual International Partners Conference
  4. 4. Replacing estimation with accurate volume measurements <ul><li>APM innovates by: </li></ul><ul><ul><li>Measuring multiple points along the surface of solids stored in practically any kind of container </li></ul></ul><ul><ul><li>Calculating true volume of materials stored </li></ul></ul><ul><ul><li>Providing 3D visualizations of a container’s contents </li></ul></ul><ul><ul><li>Filtering out false echoes </li></ul></ul><ul><li>Improved accuracy – saves money </li></ul><ul><ul><li>Enables decision-makers to use APM measurements and integrate them into their MRP (material requirement planning) </li></ul></ul>May 2011 APM Annual International Partners Conference
  5. 5. How improved accuracy saves money <ul><li>Decreases extra safety stocks </li></ul><ul><li>Lowers costs by ordering materials only when they are needed </li></ul><ul><li>Eliminates production stoppages caused by lack of materials in process </li></ul><ul><li>Avoids overflow and its consequences: materials loss, environmental damage </li></ul><ul><li>Optimizes the right mix of materials used in the production process </li></ul><ul><li>Reduces required storage (volume) capacity </li></ul>May 2011 APM Annual International Partners Conference
  6. 6. APM technology building blocks Physics Mathematics Electronics Digital Signal Processing
  7. 7. Scanner position, acoustic waves reflection <ul><li>Positioning the 3DLevelScanner to see most of the material most of the time </li></ul><ul><li>Transmitted acoustic waves are distributed, and echoes are received, in orbits. </li></ul>May 2011 APM Annual International Partners Conference
  8. 8. Measuring distance in a 3D environment <ul><li>Distance (R) = velocity times the time an acoustic wave travels R = Velocity x (time/2) </li></ul><ul><li>A stop watch starts at beginning of transmission and stops when echo is received </li></ul><ul><li>Challenge : to find the right echo as well as the direction from which it arrives. </li></ul>z y x z 1 Speed of sound in the air = 1,236 Km/H (343 m/sec) R = radial distance May 2011 APM Annual International Partners Conference
  9. 9. Measuring distance in a 3D environment <ul><li>Calculating distance in a 3D environment: x - y - z R Distance : absolute radial (diagonal) distance measured from the top of the transducer case to any point on the surface Z Distance (x, y, z coordinates): straight down distance from a given point on the surface to the top of the transducer case at a given point x,y offset on the roof </li></ul>z y x 0.0.0 y 1 x 1 z 1 K R x i, y i x i , y i, z i May 2011 APM Annual International Partners Conference
  10. 10. Measuring distance in a 3D environment Each APM scanner uses 3 antennas <ul><li>Each antenna transmits acoustic waves and receives echoes coming from all directions. </li></ul><ul><li>Echoes coming from the walls of the silo are faulty and must be filtered out. </li></ul>Reference Point 0,0,0 R 1 R 2 R 3
  11. 11. 3 antennas – 3 different measurements of a single point <ul><li>Guarantees knowing the precise x-y-z location of each point </li></ul><ul><li>Since scanner is located in a specified position (x i , y i , z i ) on the silo roof, all measurements must be normalized for the true, central reference point, 0.0.0. </li></ul>May 2011 APM Annual International Partners Conference
  12. 12. APM technology building blocks Physics Mathematics Electronics Digital Signal Processing
  13. 13. Calculating volume in 3D environment <ul><li>APM knows how to accurately measure distance to any point. </li></ul><ul><li>APM measures multiple points. </li></ul><ul><li>Result: accurate volume measurements of the space above the material surface. </li></ul>Material volume = silo volume – space volume May 2011 APM Annual International Partners Conference
  14. 14. Prerequisites for accurate measurements <ul><li>Precise silo, bin or container dimensions </li></ul><ul><li>Precise location of the APM scanner </li></ul><ul><li>APM’s Locator software automatically normalizes system to incorporate true reference point in all calculations. </li></ul>( 0.0.0.) ∆ ◘ ( x i y i z i ) 90° APM scanner location and orientation May 2011 APM Annual International Partners Conference
  15. 15. APM technology building blocks Physics Mathematics Electronics Digital Signal Processing
  16. 16. Electronics - Challenges <ul><li>Generate a strong and recognizable signal </li></ul><ul><li>Generate strong SNR (signal-to-noise ratio) </li></ul><ul><li>Echo identification Each echo has a unique digital signature that can be matched with the transmitted signal. </li></ul><ul><li>Echo filtering </li></ul><ul><li>Match of the echo signature with that of the one transmitted stops the “timer” and records the time. </li></ul>Energy Time May 2011 APM Annual International Partners Conference
  17. 17. Electronics – Challenges Acoustic wave attenuation <ul><li>Harsh, dusty and humid environments attenuate the strength of acoustic waves. </li></ul><ul><li>APM’s low frequency signals – at 3-4 KHz – bypass this problem while losing only 2-3 dB. </li></ul>Signal attenuation due to dust/moisture concentration in the air May 2011 APM Annual International Partners Conference
  18. 18. Electronics – Challenges Acoustic wave attenuation <ul><li>Harsh, dusty and humid environments attenuate the strength of acoustic waves. </li></ul><ul><li>APM’s low frequency signals – at 3-4 KHz – bypass this problem while losing only 2-3 dB. </li></ul>Animation courtesy of Dr. Dan Russell, Kettering University Low frequency = effective dust/moisture penetration May 2011 APM Annual International Partners Conference
  19. 19. APM technology building blocks Physics Mathematics Electronics Digital Signal Processing
  20. 20. Digital Signal Processing <ul><li>APM’s patented algorithms filter out false or irrelevant echoes using many specified parameters, key among them: </li></ul><ul><ul><li>Direction of arrival </li></ul></ul><ul><ul><li>Time of arrival of the echo </li></ul></ul>May 2011 APM Annual International Partners Conference
  21. 21. Market needs <ul><li>Accurate and continuous volume measurement (= inventory) </li></ul><ul><li>Volume measurement of all kinds of solids even in harsh, dusty environments </li></ul><ul><li>3D graphic display of the material surface </li></ul><ul><li>Early warning of adhesion of materials to silo walls </li></ul><ul><li>Alerts of unexpected emptying of the silo (theft, safety, etc.) </li></ul><ul><li>Patented self-cleaning operation making APM scanners practically maintenance-free </li></ul>May 2011 APM Annual International Partners Conference
  22. 22. Market needs Examples of self-cleaning <ul><li>Self-cleaning, practically maintenance free </li></ul>May 2011 APM Annual International Partners Conference
  23. 23. Competitive advantages <ul><li>The only real-time volume measurement device for silos </li></ul><ul><li>Suitable for measuring all solid materials </li></ul><ul><li>Operates in dusty and moist conditions </li></ul><ul><li>Early warning of adhesion of materials to silo walls </li></ul><ul><li>Remote monitoring and service communications </li></ul>May 2011 APM Annual International Partners Conference
  24. 24. Competitive advantages Measures practically all kinds, sizes of containers   Large open bins   Bulk solids storage rooms   Warehouses May 2011 APM Annual International Partners Conference
  25. 25. Competitive advantages Accuracy tolerance 3DLevelScanner MV vs . single-point device <ul><li>Comparison of volume (%) accuracy: APM 3DLevelScanner MV vs. single-point device </li></ul><ul><li>Silo dimensions: width = 10m, height = 20m </li></ul><ul><li>The material is cone sloped with 45° </li></ul><ul><li>APM’s volume scanner accuracy tolerance = 1.55% </li></ul><ul><li>Laser volume accuracy tolerance = 16.0% </li></ul>20 10 May 2011 APM Annual International Partners Conference
  26. 26. Competitive advantages Accuracy tolerance 3DLevelScanner MV vs . single-point device <ul><li>Comparison of volume (%) accuracy: APM 3DLevelScanner MV vs. single-point device </li></ul><ul><li>Silo dimensions: width = 10m, height = 20m </li></ul><ul><li>The material is cone sloped with 45° </li></ul><ul><li>APM’s volume scanner accuracy tolerance = 1.55% </li></ul><ul><li>Laser volume accuracy tolerance = 16.0% </li></ul>20 10 May 2011 APM Annual International Partners Conference
  27. 27. Competitive advantages <ul><li>Self-cleaning </li></ul><ul><li>3D mapping visualization enabling control and filling optimization </li></ul><ul><li>Works with any material with density > 0.2 tons / m 3 (0.2 g / cm 3 ) – less than this is considered to be dust </li></ul><ul><li>One generic hardware for 3 different products (S/M/MV all upgradeable by software) </li></ul><ul><li>Multiple scanners can be synchronized to work in one silo without crosstalk problems </li></ul><ul><li>High reliability – 3 independent transmitters / receivers </li></ul>May 2011 APM Annual International Partners Conference
  28. 28. Real-life materials surface mapping <ul><li>Large brewery </li></ul><ul><li>Huge quantities of grain stored in very tall, very wide silos </li></ul><ul><li>Constantly challenged by significant surface irregularities of stored materials </li></ul>May 2011 APM Annual International Partners Conference
  29. 29. 3D visualization during empty cycle # 1 <ul><li>Inset photo shows bin contents at time of measurement. </li></ul><ul><li>Single-point measurement devices would not reflect such irregularity in this material surface. </li></ul>Calculated mass = actual weight May 2011 APM Annual International Partners Conference
  30. 30. 3D visualization during empty cycle # 2 <ul><li>3D visualization reflects consistency with taped measurements. </li></ul>Calculated mass = actual weight May 2011 APM Annual International Partners Conference
  31. 31. 3D visualization during empty cycle # 3 <ul><li>Photo demonstrates changes in surface area topography during the empty cycle. </li></ul><ul><li>Cliffing of products accounts for variation in single-point taped vs. multiple-point scanner measurements. </li></ul>Calculated mass = actual weight May 2011 APM Annual International Partners Conference
  32. 32. 3D visualization during empty cycle # 4 <ul><li>Significant topographical variations occur at this point in the empty cycle. </li></ul>Calculated mass = actual weight May 2011 APM Annual International Partners Conference
  33. 33. 3D visualization during empty cycle # 6 <ul><li>A clear picture of how material can react and impact volume accuracy </li></ul>Calculated mass = actual weight May 2011 APM Annual International Partners Conference
  34. 34. Converting volume to weight <ul><li>Material density is measured in tons/m 3 </li></ul><ul><ul><li>Bulk density differs from normal density </li></ul></ul><ul><ul><li>Bulk density values can be built into scanner’s memory </li></ul></ul>May 2011 APM Annual International Partners Conference
  35. 35. Converting volume to weight <ul><li>APM scanners calculate weight based on bulk density </li></ul><ul><ul><li>Weight = bulk density x volume </li></ul></ul><ul><ul><li>Weight is calculated during material filling and empting </li></ul></ul><ul><ul><li>Inventory value can be calculated at any given time </li></ul></ul>Saving extra inventory saves money May 2011 APM Annual International Partners Conference
  36. 36. Thank You!

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