SlideShare a Scribd company logo
1 of 20
ARS, North America 2007
   San Diego, California USA
     Track 2, Session 9




  Trapped by MTBF
    Fred Schenkelberg
    Ops A La Carte, LLC
Introduction
                                                     How    does your organization talk about
                                                        Reliability?

                                                     How    do your customers talk about
                                                        Reliability?
Applied Reliability Symposium, North America 2007




                                                    Fred Schenkelberg, Ops A La Carte, LLC   Track 2   Session 9   Slide Number: 2
Outline
                                                     MTBF    – calculation
                                                     MTBF – a very poor four letter acronym
                                                     History of Use
                                                     It’s Misleading
                                                     A Better Metric
Applied Reliability Symposium, North America 2007




                                                     Actually, we’ve been talking about MTTF




                                                    Fred Schenkelberg, Ops A La Carte, LLC   Track 2   Session 9   Slide Number: 3
MTBF Calculation

                                                                                      # hours
                                                                              MTBF =
                                                                                     # failures
Applied Reliability Symposium, North America 2007




                                                                                       MTBF = 1
                                                                                                            λ
                                                    Fred Schenkelberg, Ops A La Carte, LLC   Track 2   Session 9   Slide Number: 4
Mean (M)
                                                     The            mean in MTBF

                                                     What               does it mean to you?
                                                          (no pun intended!)
Applied Reliability Symposium, North America 2007




                                                     Average?




                                                    Fred Schenkelberg, Ops A La Carte, LLC   Track 2   Session 9   Slide Number: 5
Start 1000 units, MTBF = 100 hrs


                                                              1200

                                                              1000
                                                                                     368 still alive at 101 hours
                                                               800
Applied Reliability Symposium, North America 2007




                                                               600

                                                               400

                                                               200

                                                                   0
                                                                       1    8     15 22 29 36 43 50 57 64 71 78 85 92 99




                                                    Fred Schenkelberg, Ops A La Carte, LLC   Track 2   Session 9      Slide Number: 6
Note the exponential decay

                                                        1200

                                                        1000

                                                          800
Applied Reliability Symposium, North America 2007




                                                          600

                                                          400

                                                          200

                                                              0
                                                                  1    21 41 61 81 101 121 141 161 181 201 221 241 261 281



                                                    Fred Schenkelberg, Ops A La Carte, LLC   Track 2   Session 9    Slide Number: 7
Other Issues
                                                     Time              – just because it is hours…

                                                     Between     – note the duration of the failure-
                                                        free period!
Applied Reliability Symposium, North America 2007




                                                     Failure                – use the customer definition




                                                    Fred Schenkelberg, Ops A La Carte, LLC   Track 2   Session 9   Slide Number: 8
History of Use
                                                     Remember    Slide Rule and Mechanical
                                                      Adding Machines
                                                     Victor Adding Machine
Applied Reliability Symposium, North America 2007




                                                    Fred Schenkelberg, Ops A La Carte, LLC   Track 2   Session 9   Slide Number: 9
History of Use
                                                     Early   Parts Count based on adding failure
                                                        rates of components (60’s and early 70’s)




                                                                                             − λ1t          − λ 2t                − λ nt
Applied Reliability Symposium, North America 2007




                                                           R(t ) = e                                 •e                • • e
                                                                                             − ( λ1 + λ 2 + + λ n ) t
                                                           R(t ) = e
                                                    Fred Schenkelberg, Ops A La Carte, LLC        Track 2            Session 9   Slide Number: 10
Beta = 0.63

                                                                                                                              Depth Cut Response data
                                                                                                                               Weibull Probability Plot


                                                                                               .5            Weibull Distribution ML Fit
                                                                                                             Exponential Distribution ML Fit
                                                                                               .3
                                                                                                             95% Pointwise Confidence Intervals
                                                                                               .2

                                                                                               .1
                                                                                              .05
                                                                                              .03
Applied Reliability Symposium, North America 2007




                                                                         Fraction Failing




                                                                                              .02
                                                                                              .01
                                                                                             .005
                                                                                             .003

                                                                                             .001
                                                                                            .0005
                                                                                            .0003
                                                                                            .0002
                                                                                            .0001

                                                                                                    10^-01         10^00          10^01           10^02          10^03   10^04

                                                                                                                                      DEPTH.CUT




                                                    Fred Schenkelberg, Ops A La Carte, LLC                             Track 2                       Session 9               Slide Number: 11
Beta = 1.97
                                                                                                                   test7.df data
                                                                                                               Weibull Probability Plot


                                                                                    .7       Weibull Distribution ML Fit
                                                                                    .3       Exponential Distribution ML Fit
                                                                                             95% Pointwise Confidence Intervals
                                                                                    .1
                                                                                   .03
                                                                                   .01
                                                                                  .003
Applied Reliability Symposium, North America 2007




                                                                                  .001
                                                              Fraction Failing




                                                                                 .0003
                                                                                 .0001
                                                                         .00003
                                                                         .00001
                                                                 .000003
                                                                 .000001
                                                             .0000003
                                                             .0000001
                                                            .00000003
                                                            .00000001

                                                                                         1           10             100              1000          10000   100000
                                                                                                                          Depth In


                                                    Fred Schenkelberg, Ops A La Carte, LLC                    Track 2                       Session 9          Slide Number: 12
Use Reliability
                                                     R(t) is the probability that a random unit
                                                      drawn from the population will still be
                                                      operating by t hours
                                                     R(t) is the fraction of all units in the
                                                      population that will survive by t hours
Applied Reliability Symposium, North America 2007




                                                                                             Applied Reliability, 2nd Ed., pg 29


                                                    Fred Schenkelberg, Ops A La Carte, LLC   Track 2       Session 9      Slide Number: 13
The four (five) elements
                                                     Function
                                                     Duration
                                                     Probability
                                                     Environment
Applied Reliability Symposium, North America 2007




                                                     They              all change over time




                                                    Fred Schenkelberg, Ops A La Carte, LLC   Track 2   Session 9   Slide Number: 14
Use better models/distributions
                                                     Weibull                                                    −( t )β
                                                                                                                     η
                                                     Type I Gumbel                          RWeibull (t ) = e
                                                     Exponential                                                                 − ( et )
                                                     Lognormal
                                                                                                         RGumbel (t ) = e
                                                                                        RExponential ( t ) = e         − λt
                                                     Etc.
Applied Reliability Symposium, North America 2007




                                                                                                                         t 
                                                                                                                       ln
                                                                                                                      T 
                                                                                                                         50 
                                                                                             Rlognormal (t ) = 1 − Φ        
                                                                                                                      σ 
                                                                                                                     
                                                                                                                            
                                                                                                                             
                                                    Fred Schenkelberg, Ops A La Carte, LLC   Track 2       Session 9          Slide Number: 15
Other metric
                                                     What               is the cost of a field failure?

                                                     Warranty  $ per unit shipped
                                                     Returns/field failure $ per unit shipped
Applied Reliability Symposium, North America 2007




                                                     What               else could you use?




                                                    Fred Schenkelberg, Ops A La Carte, LLC   Track 2   Session 9   Slide Number: 16
Actually…
                                                     MTBF  is or should be used for repairable
                                                      systems
                                                     MTTF is what I’ve been talking about
                                                     MTTF is calculated the same way as MTBF
                                                      when we assume
Applied Reliability Symposium, North America 2007




                                                           Negligible repair time
                                                           Interarrival times as from an independent sample of
                                                            non-repairable parts
                                                           Exponential distribution for lifetime of parts
                                                     See           Chap 10, Applied Reliability for more info



                                                    Fred Schenkelberg, Ops A La Carte, LLC   Track 2   Session 9   Slide Number: 17
Summary




                                                                                             MTBF
Applied Reliability Symposium, North America 2007




                                                    Fred Schenkelberg, Ops A La Carte, LLC   Track 2   Session 9   Slide Number: 18
Where to Get More Information
                                                     Tobias,   Paul A. and Trindade, David C.,
                                                        Applied Reliability, 2nd Ed. Chapman & Hall,
                                                        New York, 1995.
                                                     “The   Limitations of Using the MTTF as a
                                                        Reliability Specification” Reliability Edge, Qtr 2,
Applied Reliability Symposium, North America 2007




                                                        2000, Vol 1, Issue 1.
                                                     Ops     A La Carte, LLC provides a full range of
                                                        reliability engineering services including
                                                        assessments, FMEA facilitation, HALT and ALT
                                                        testing, data analysis and customized training.

                                                    Fred Schenkelberg, Ops A La Carte, LLC   Track 2   Session 9   Slide Number: 19
Presenter’s Biographical Sketch
                                                     Fred Schenkelberg, Consultant
                                                     Independent Reliability Engineering and
                                                      Management Consultant for past 3 years.
                                                      Previously at HP Corporate Reliability
                                                      Engineering Program for 5 years.
                                                     MS Statistics Stanford, BS Physics USMA
Applied Reliability Symposium, North America 2007




                                                     fms@opsalacarte.com
                                                     (408)              710-8248

                                                     www.opsalacarte.com

                                                    Fred Schenkelberg, Ops A La Carte, LLC   Track 2   Session 9   Slide Number: 20

More Related Content

Viewers also liked

Dfm handbook for design engineering 0402
Dfm handbook for design engineering 0402Dfm handbook for design engineering 0402
Dfm handbook for design engineering 0402Engineers Innoventures
 
Software reliability model(روش های اندازه گیری قابلیت اطمینان نرم افزار)
Software reliability model(روش های اندازه گیری قابلیت اطمینان نرم افزار)Software reliability model(روش های اندازه گیری قابلیت اطمینان نرم افزار)
Software reliability model(روش های اندازه گیری قابلیت اطمینان نرم افزار)amirbabol
 
Fundamentals of reliability engineering and applications part2of3
Fundamentals of reliability engineering and applications part2of3Fundamentals of reliability engineering and applications part2of3
Fundamentals of reliability engineering and applications part2of3ASQ Reliability Division
 
Failure Reporting, Analysis, Corrective Action System
Failure Reporting, Analysis, Corrective Action System Failure Reporting, Analysis, Corrective Action System
Failure Reporting, Analysis, Corrective Action System Ricky Smith CMRP, CMRT
 
Basics in Maintenance
Basics in MaintenanceBasics in Maintenance
Basics in Maintenanceraghuttam
 
MTBF / MTTR - Energized Work TekTalk, Mar 2012
MTBF / MTTR - Energized Work TekTalk, Mar 2012MTBF / MTTR - Energized Work TekTalk, Mar 2012
MTBF / MTTR - Energized Work TekTalk, Mar 2012Energized Work
 
DFM Design Principles
DFM Design PrinciplesDFM Design Principles
DFM Design PrinciplesNIELITA
 
Fundamentals of reliability engineering and applications part3of3
Fundamentals of reliability engineering and applications part3of3Fundamentals of reliability engineering and applications part3of3
Fundamentals of reliability engineering and applications part3of3ASQ Reliability Division
 
Fundamentals of reliability engineering and applications part1of3
Fundamentals of reliability engineering and applications part1of3Fundamentals of reliability engineering and applications part1of3
Fundamentals of reliability engineering and applications part1of3ASQ Reliability Division
 
A Proposal for an Alternative to MTBF/MTTF
A Proposal for an Alternative to MTBF/MTTFA Proposal for an Alternative to MTBF/MTTF
A Proposal for an Alternative to MTBF/MTTFASQ Reliability Division
 
basic concepts of reliability
basic concepts of reliabilitybasic concepts of reliability
basic concepts of reliabilitydennis gookyi
 
Design for Assembly (DFA)
Design for Assembly (DFA)Design for Assembly (DFA)
Design for Assembly (DFA)Richard Farr
 
Chapter 5 basic design for manufacturing
Chapter 5 basic design for manufacturingChapter 5 basic design for manufacturing
Chapter 5 basic design for manufacturingdantares
 
Design for Reliability (DfR) Seminar
Design for Reliability (DfR) SeminarDesign for Reliability (DfR) Seminar
Design for Reliability (DfR) SeminarAccendo Reliability
 

Viewers also liked (20)

Dfm handbook for design engineering 0402
Dfm handbook for design engineering 0402Dfm handbook for design engineering 0402
Dfm handbook for design engineering 0402
 
Software reliability model(روش های اندازه گیری قابلیت اطمینان نرم افزار)
Software reliability model(روش های اندازه گیری قابلیت اطمینان نرم افزار)Software reliability model(روش های اندازه گیری قابلیت اطمینان نرم افزار)
Software reliability model(روش های اندازه گیری قابلیت اطمینان نرم افزار)
 
Fundamentals of reliability engineering and applications part2of3
Fundamentals of reliability engineering and applications part2of3Fundamentals of reliability engineering and applications part2of3
Fundamentals of reliability engineering and applications part2of3
 
Failure Reporting, Analysis, Corrective Action System
Failure Reporting, Analysis, Corrective Action System Failure Reporting, Analysis, Corrective Action System
Failure Reporting, Analysis, Corrective Action System
 
Basics in Maintenance
Basics in MaintenanceBasics in Maintenance
Basics in Maintenance
 
The MTBF - Day1_v2
The MTBF - Day1_v2The MTBF - Day1_v2
The MTBF - Day1_v2
 
MTBF / MTTR - Energized Work TekTalk, Mar 2012
MTBF / MTTR - Energized Work TekTalk, Mar 2012MTBF / MTTR - Energized Work TekTalk, Mar 2012
MTBF / MTTR - Energized Work TekTalk, Mar 2012
 
DFM Design Principles
DFM Design PrinciplesDFM Design Principles
DFM Design Principles
 
Fundamentals of reliability engineering and applications part3of3
Fundamentals of reliability engineering and applications part3of3Fundamentals of reliability engineering and applications part3of3
Fundamentals of reliability engineering and applications part3of3
 
Fundamentals of reliability engineering and applications part1of3
Fundamentals of reliability engineering and applications part1of3Fundamentals of reliability engineering and applications part1of3
Fundamentals of reliability engineering and applications part1of3
 
overview of reliability engineering
overview of reliability engineeringoverview of reliability engineering
overview of reliability engineering
 
A Proposal for an Alternative to MTBF/MTTF
A Proposal for an Alternative to MTBF/MTTFA Proposal for an Alternative to MTBF/MTTF
A Proposal for an Alternative to MTBF/MTTF
 
basic concepts of reliability
basic concepts of reliabilitybasic concepts of reliability
basic concepts of reliability
 
Design for Assembly (DFA)
Design for Assembly (DFA)Design for Assembly (DFA)
Design for Assembly (DFA)
 
DFMA design for manufacturing and assembly
DFMA design for manufacturing and assembly DFMA design for manufacturing and assembly
DFMA design for manufacturing and assembly
 
Chapter 5 basic design for manufacturing
Chapter 5 basic design for manufacturingChapter 5 basic design for manufacturing
Chapter 5 basic design for manufacturing
 
Design for Reliability (DfR) Seminar
Design for Reliability (DfR) SeminarDesign for Reliability (DfR) Seminar
Design for Reliability (DfR) Seminar
 
Reliability engineering ppt-Internship
Reliability engineering ppt-InternshipReliability engineering ppt-Internship
Reliability engineering ppt-Internship
 
The Impala Cookbook
The Impala CookbookThe Impala Cookbook
The Impala Cookbook
 
Slideshare ppt
Slideshare pptSlideshare ppt
Slideshare ppt
 

More from Accendo Reliability

Should RCM be applied to all assets.pdf
Should RCM be applied to all assets.pdfShould RCM be applied to all assets.pdf
Should RCM be applied to all assets.pdfAccendo Reliability
 
T or F Must have failure data.pdf
T or F Must have failure data.pdfT or F Must have failure data.pdf
T or F Must have failure data.pdfAccendo Reliability
 
Should RCM Templates be used.pdf
Should RCM Templates be used.pdfShould RCM Templates be used.pdf
Should RCM Templates be used.pdfAccendo Reliability
 
12-RCM NOT a Maintenance Program.pdf
12-RCM NOT a Maintenance Program.pdf12-RCM NOT a Maintenance Program.pdf
12-RCM NOT a Maintenance Program.pdfAccendo Reliability
 
09-Myth RCM only product is maintenance.pdf
09-Myth RCM only product is maintenance.pdf09-Myth RCM only product is maintenance.pdf
09-Myth RCM only product is maintenance.pdfAccendo Reliability
 
10-RCM has serious weaknesses industrial environment.pdf
10-RCM has serious weaknesses industrial environment.pdf10-RCM has serious weaknesses industrial environment.pdf
10-RCM has serious weaknesses industrial environment.pdfAccendo Reliability
 
08-Master the basics carousel.pdf
08-Master the basics carousel.pdf08-Master the basics carousel.pdf
08-Master the basics carousel.pdfAccendo Reliability
 
07-Manufacturer Recommended Maintenance.pdf
07-Manufacturer Recommended Maintenance.pdf07-Manufacturer Recommended Maintenance.pdf
07-Manufacturer Recommended Maintenance.pdfAccendo Reliability
 
06-Is a Criticality Analysis Required.pdf
06-Is a Criticality Analysis Required.pdf06-Is a Criticality Analysis Required.pdf
06-Is a Criticality Analysis Required.pdfAccendo Reliability
 
05-Failure Modes Right Detail.pdf
05-Failure Modes Right Detail.pdf05-Failure Modes Right Detail.pdf
05-Failure Modes Right Detail.pdfAccendo Reliability
 
04-Equipment Experts Couldn't believe response.pdf
04-Equipment Experts Couldn't believe response.pdf04-Equipment Experts Couldn't believe response.pdf
04-Equipment Experts Couldn't believe response.pdfAccendo Reliability
 
Reliability Engineering Management course flyer
Reliability Engineering Management course flyerReliability Engineering Management course flyer
Reliability Engineering Management course flyerAccendo Reliability
 
How to Create an Accelerated Life Test
How to Create an Accelerated Life TestHow to Create an Accelerated Life Test
How to Create an Accelerated Life TestAccendo Reliability
 

More from Accendo Reliability (20)

Should RCM be applied to all assets.pdf
Should RCM be applied to all assets.pdfShould RCM be applied to all assets.pdf
Should RCM be applied to all assets.pdf
 
T or F Must have failure data.pdf
T or F Must have failure data.pdfT or F Must have failure data.pdf
T or F Must have failure data.pdf
 
Should RCM Templates be used.pdf
Should RCM Templates be used.pdfShould RCM Templates be used.pdf
Should RCM Templates be used.pdf
 
12-RCM NOT a Maintenance Program.pdf
12-RCM NOT a Maintenance Program.pdf12-RCM NOT a Maintenance Program.pdf
12-RCM NOT a Maintenance Program.pdf
 
13-RCM Reduces Maintenance.pdf
13-RCM Reduces Maintenance.pdf13-RCM Reduces Maintenance.pdf
13-RCM Reduces Maintenance.pdf
 
11-RCM is like a diet.pdf
11-RCM is like a diet.pdf11-RCM is like a diet.pdf
11-RCM is like a diet.pdf
 
09-Myth RCM only product is maintenance.pdf
09-Myth RCM only product is maintenance.pdf09-Myth RCM only product is maintenance.pdf
09-Myth RCM only product is maintenance.pdf
 
10-RCM has serious weaknesses industrial environment.pdf
10-RCM has serious weaknesses industrial environment.pdf10-RCM has serious weaknesses industrial environment.pdf
10-RCM has serious weaknesses industrial environment.pdf
 
08-Master the basics carousel.pdf
08-Master the basics carousel.pdf08-Master the basics carousel.pdf
08-Master the basics carousel.pdf
 
07-Manufacturer Recommended Maintenance.pdf
07-Manufacturer Recommended Maintenance.pdf07-Manufacturer Recommended Maintenance.pdf
07-Manufacturer Recommended Maintenance.pdf
 
06-Is a Criticality Analysis Required.pdf
06-Is a Criticality Analysis Required.pdf06-Is a Criticality Analysis Required.pdf
06-Is a Criticality Analysis Required.pdf
 
05-Failure Modes Right Detail.pdf
05-Failure Modes Right Detail.pdf05-Failure Modes Right Detail.pdf
05-Failure Modes Right Detail.pdf
 
03-3 Ways to Do RCM.pdf
03-3 Ways to Do RCM.pdf03-3 Ways to Do RCM.pdf
03-3 Ways to Do RCM.pdf
 
04-Equipment Experts Couldn't believe response.pdf
04-Equipment Experts Couldn't believe response.pdf04-Equipment Experts Couldn't believe response.pdf
04-Equipment Experts Couldn't believe response.pdf
 
02-5 RCM Myths Carousel.pdf
02-5 RCM Myths Carousel.pdf02-5 RCM Myths Carousel.pdf
02-5 RCM Myths Carousel.pdf
 
01-5 CBM Facts.pdf
01-5 CBM Facts.pdf01-5 CBM Facts.pdf
01-5 CBM Facts.pdf
 
Lean Manufacturing
Lean ManufacturingLean Manufacturing
Lean Manufacturing
 
Reliability Engineering Management course flyer
Reliability Engineering Management course flyerReliability Engineering Management course flyer
Reliability Engineering Management course flyer
 
How to Create an Accelerated Life Test
How to Create an Accelerated Life TestHow to Create an Accelerated Life Test
How to Create an Accelerated Life Test
 
Reliability Programs
Reliability ProgramsReliability Programs
Reliability Programs
 

Recently uploaded

Dev Dives: Streamline document processing with UiPath Studio Web
Dev Dives: Streamline document processing with UiPath Studio WebDev Dives: Streamline document processing with UiPath Studio Web
Dev Dives: Streamline document processing with UiPath Studio WebUiPathCommunity
 
Transcript: New from BookNet Canada for 2024: Loan Stars - Tech Forum 2024
Transcript: New from BookNet Canada for 2024: Loan Stars - Tech Forum 2024Transcript: New from BookNet Canada for 2024: Loan Stars - Tech Forum 2024
Transcript: New from BookNet Canada for 2024: Loan Stars - Tech Forum 2024BookNet Canada
 
Unleash Your Potential - Namagunga Girls Coding Club
Unleash Your Potential - Namagunga Girls Coding ClubUnleash Your Potential - Namagunga Girls Coding Club
Unleash Your Potential - Namagunga Girls Coding ClubKalema Edgar
 
The Ultimate Guide to Choosing WordPress Pros and Cons
The Ultimate Guide to Choosing WordPress Pros and ConsThe Ultimate Guide to Choosing WordPress Pros and Cons
The Ultimate Guide to Choosing WordPress Pros and ConsPixlogix Infotech
 
Hyperautomation and AI/ML: A Strategy for Digital Transformation Success.pdf
Hyperautomation and AI/ML: A Strategy for Digital Transformation Success.pdfHyperautomation and AI/ML: A Strategy for Digital Transformation Success.pdf
Hyperautomation and AI/ML: A Strategy for Digital Transformation Success.pdfPrecisely
 
Streamlining Python Development: A Guide to a Modern Project Setup
Streamlining Python Development: A Guide to a Modern Project SetupStreamlining Python Development: A Guide to a Modern Project Setup
Streamlining Python Development: A Guide to a Modern Project SetupFlorian Wilhelm
 
Nell’iperspazio con Rocket: il Framework Web di Rust!
Nell’iperspazio con Rocket: il Framework Web di Rust!Nell’iperspazio con Rocket: il Framework Web di Rust!
Nell’iperspazio con Rocket: il Framework Web di Rust!Commit University
 
Use of FIDO in the Payments and Identity Landscape: FIDO Paris Seminar.pptx
Use of FIDO in the Payments and Identity Landscape: FIDO Paris Seminar.pptxUse of FIDO in the Payments and Identity Landscape: FIDO Paris Seminar.pptx
Use of FIDO in the Payments and Identity Landscape: FIDO Paris Seminar.pptxLoriGlavin3
 
Generative AI for Technical Writer or Information Developers
Generative AI for Technical Writer or Information DevelopersGenerative AI for Technical Writer or Information Developers
Generative AI for Technical Writer or Information DevelopersRaghuram Pandurangan
 
What is DBT - The Ultimate Data Build Tool.pdf
What is DBT - The Ultimate Data Build Tool.pdfWhat is DBT - The Ultimate Data Build Tool.pdf
What is DBT - The Ultimate Data Build Tool.pdfMounikaPolabathina
 
Take control of your SAP testing with UiPath Test Suite
Take control of your SAP testing with UiPath Test SuiteTake control of your SAP testing with UiPath Test Suite
Take control of your SAP testing with UiPath Test SuiteDianaGray10
 
DevoxxFR 2024 Reproducible Builds with Apache Maven
DevoxxFR 2024 Reproducible Builds with Apache MavenDevoxxFR 2024 Reproducible Builds with Apache Maven
DevoxxFR 2024 Reproducible Builds with Apache MavenHervé Boutemy
 
The Fit for Passkeys for Employee and Consumer Sign-ins: FIDO Paris Seminar.pptx
The Fit for Passkeys for Employee and Consumer Sign-ins: FIDO Paris Seminar.pptxThe Fit for Passkeys for Employee and Consumer Sign-ins: FIDO Paris Seminar.pptx
The Fit for Passkeys for Employee and Consumer Sign-ins: FIDO Paris Seminar.pptxLoriGlavin3
 
SALESFORCE EDUCATION CLOUD | FEXLE SERVICES
SALESFORCE EDUCATION CLOUD | FEXLE SERVICESSALESFORCE EDUCATION CLOUD | FEXLE SERVICES
SALESFORCE EDUCATION CLOUD | FEXLE SERVICESmohitsingh558521
 
Are Multi-Cloud and Serverless Good or Bad?
Are Multi-Cloud and Serverless Good or Bad?Are Multi-Cloud and Serverless Good or Bad?
Are Multi-Cloud and Serverless Good or Bad?Mattias Andersson
 
Transcript: New from BookNet Canada for 2024: BNC CataList - Tech Forum 2024
Transcript: New from BookNet Canada for 2024: BNC CataList - Tech Forum 2024Transcript: New from BookNet Canada for 2024: BNC CataList - Tech Forum 2024
Transcript: New from BookNet Canada for 2024: BNC CataList - Tech Forum 2024BookNet Canada
 
"Debugging python applications inside k8s environment", Andrii Soldatenko
"Debugging python applications inside k8s environment", Andrii Soldatenko"Debugging python applications inside k8s environment", Andrii Soldatenko
"Debugging python applications inside k8s environment", Andrii SoldatenkoFwdays
 
What's New in Teams Calling, Meetings and Devices March 2024
What's New in Teams Calling, Meetings and Devices March 2024What's New in Teams Calling, Meetings and Devices March 2024
What's New in Teams Calling, Meetings and Devices March 2024Stephanie Beckett
 
Unraveling Multimodality with Large Language Models.pdf
Unraveling Multimodality with Large Language Models.pdfUnraveling Multimodality with Large Language Models.pdf
Unraveling Multimodality with Large Language Models.pdfAlex Barbosa Coqueiro
 

Recently uploaded (20)

Dev Dives: Streamline document processing with UiPath Studio Web
Dev Dives: Streamline document processing with UiPath Studio WebDev Dives: Streamline document processing with UiPath Studio Web
Dev Dives: Streamline document processing with UiPath Studio Web
 
Transcript: New from BookNet Canada for 2024: Loan Stars - Tech Forum 2024
Transcript: New from BookNet Canada for 2024: Loan Stars - Tech Forum 2024Transcript: New from BookNet Canada for 2024: Loan Stars - Tech Forum 2024
Transcript: New from BookNet Canada for 2024: Loan Stars - Tech Forum 2024
 
DMCC Future of Trade Web3 - Special Edition
DMCC Future of Trade Web3 - Special EditionDMCC Future of Trade Web3 - Special Edition
DMCC Future of Trade Web3 - Special Edition
 
Unleash Your Potential - Namagunga Girls Coding Club
Unleash Your Potential - Namagunga Girls Coding ClubUnleash Your Potential - Namagunga Girls Coding Club
Unleash Your Potential - Namagunga Girls Coding Club
 
The Ultimate Guide to Choosing WordPress Pros and Cons
The Ultimate Guide to Choosing WordPress Pros and ConsThe Ultimate Guide to Choosing WordPress Pros and Cons
The Ultimate Guide to Choosing WordPress Pros and Cons
 
Hyperautomation and AI/ML: A Strategy for Digital Transformation Success.pdf
Hyperautomation and AI/ML: A Strategy for Digital Transformation Success.pdfHyperautomation and AI/ML: A Strategy for Digital Transformation Success.pdf
Hyperautomation and AI/ML: A Strategy for Digital Transformation Success.pdf
 
Streamlining Python Development: A Guide to a Modern Project Setup
Streamlining Python Development: A Guide to a Modern Project SetupStreamlining Python Development: A Guide to a Modern Project Setup
Streamlining Python Development: A Guide to a Modern Project Setup
 
Nell’iperspazio con Rocket: il Framework Web di Rust!
Nell’iperspazio con Rocket: il Framework Web di Rust!Nell’iperspazio con Rocket: il Framework Web di Rust!
Nell’iperspazio con Rocket: il Framework Web di Rust!
 
Use of FIDO in the Payments and Identity Landscape: FIDO Paris Seminar.pptx
Use of FIDO in the Payments and Identity Landscape: FIDO Paris Seminar.pptxUse of FIDO in the Payments and Identity Landscape: FIDO Paris Seminar.pptx
Use of FIDO in the Payments and Identity Landscape: FIDO Paris Seminar.pptx
 
Generative AI for Technical Writer or Information Developers
Generative AI for Technical Writer or Information DevelopersGenerative AI for Technical Writer or Information Developers
Generative AI for Technical Writer or Information Developers
 
What is DBT - The Ultimate Data Build Tool.pdf
What is DBT - The Ultimate Data Build Tool.pdfWhat is DBT - The Ultimate Data Build Tool.pdf
What is DBT - The Ultimate Data Build Tool.pdf
 
Take control of your SAP testing with UiPath Test Suite
Take control of your SAP testing with UiPath Test SuiteTake control of your SAP testing with UiPath Test Suite
Take control of your SAP testing with UiPath Test Suite
 
DevoxxFR 2024 Reproducible Builds with Apache Maven
DevoxxFR 2024 Reproducible Builds with Apache MavenDevoxxFR 2024 Reproducible Builds with Apache Maven
DevoxxFR 2024 Reproducible Builds with Apache Maven
 
The Fit for Passkeys for Employee and Consumer Sign-ins: FIDO Paris Seminar.pptx
The Fit for Passkeys for Employee and Consumer Sign-ins: FIDO Paris Seminar.pptxThe Fit for Passkeys for Employee and Consumer Sign-ins: FIDO Paris Seminar.pptx
The Fit for Passkeys for Employee and Consumer Sign-ins: FIDO Paris Seminar.pptx
 
SALESFORCE EDUCATION CLOUD | FEXLE SERVICES
SALESFORCE EDUCATION CLOUD | FEXLE SERVICESSALESFORCE EDUCATION CLOUD | FEXLE SERVICES
SALESFORCE EDUCATION CLOUD | FEXLE SERVICES
 
Are Multi-Cloud and Serverless Good or Bad?
Are Multi-Cloud and Serverless Good or Bad?Are Multi-Cloud and Serverless Good or Bad?
Are Multi-Cloud and Serverless Good or Bad?
 
Transcript: New from BookNet Canada for 2024: BNC CataList - Tech Forum 2024
Transcript: New from BookNet Canada for 2024: BNC CataList - Tech Forum 2024Transcript: New from BookNet Canada for 2024: BNC CataList - Tech Forum 2024
Transcript: New from BookNet Canada for 2024: BNC CataList - Tech Forum 2024
 
"Debugging python applications inside k8s environment", Andrii Soldatenko
"Debugging python applications inside k8s environment", Andrii Soldatenko"Debugging python applications inside k8s environment", Andrii Soldatenko
"Debugging python applications inside k8s environment", Andrii Soldatenko
 
What's New in Teams Calling, Meetings and Devices March 2024
What's New in Teams Calling, Meetings and Devices March 2024What's New in Teams Calling, Meetings and Devices March 2024
What's New in Teams Calling, Meetings and Devices March 2024
 
Unraveling Multimodality with Large Language Models.pdf
Unraveling Multimodality with Large Language Models.pdfUnraveling Multimodality with Large Language Models.pdf
Unraveling Multimodality with Large Language Models.pdf
 

Trapped by MTBF

  • 1. ARS, North America 2007 San Diego, California USA Track 2, Session 9 Trapped by MTBF Fred Schenkelberg Ops A La Carte, LLC
  • 2. Introduction  How does your organization talk about Reliability?  How do your customers talk about Reliability? Applied Reliability Symposium, North America 2007 Fred Schenkelberg, Ops A La Carte, LLC Track 2 Session 9 Slide Number: 2
  • 3. Outline  MTBF – calculation  MTBF – a very poor four letter acronym  History of Use  It’s Misleading  A Better Metric Applied Reliability Symposium, North America 2007  Actually, we’ve been talking about MTTF Fred Schenkelberg, Ops A La Carte, LLC Track 2 Session 9 Slide Number: 3
  • 4. MTBF Calculation # hours MTBF = # failures Applied Reliability Symposium, North America 2007 MTBF = 1 λ Fred Schenkelberg, Ops A La Carte, LLC Track 2 Session 9 Slide Number: 4
  • 5. Mean (M)  The mean in MTBF  What does it mean to you? (no pun intended!) Applied Reliability Symposium, North America 2007  Average? Fred Schenkelberg, Ops A La Carte, LLC Track 2 Session 9 Slide Number: 5
  • 6. Start 1000 units, MTBF = 100 hrs 1200 1000 368 still alive at 101 hours 800 Applied Reliability Symposium, North America 2007 600 400 200 0 1 8 15 22 29 36 43 50 57 64 71 78 85 92 99 Fred Schenkelberg, Ops A La Carte, LLC Track 2 Session 9 Slide Number: 6
  • 7. Note the exponential decay 1200 1000 800 Applied Reliability Symposium, North America 2007 600 400 200 0 1 21 41 61 81 101 121 141 161 181 201 221 241 261 281 Fred Schenkelberg, Ops A La Carte, LLC Track 2 Session 9 Slide Number: 7
  • 8. Other Issues  Time – just because it is hours…  Between – note the duration of the failure- free period! Applied Reliability Symposium, North America 2007  Failure – use the customer definition Fred Schenkelberg, Ops A La Carte, LLC Track 2 Session 9 Slide Number: 8
  • 9. History of Use  Remember Slide Rule and Mechanical Adding Machines  Victor Adding Machine Applied Reliability Symposium, North America 2007 Fred Schenkelberg, Ops A La Carte, LLC Track 2 Session 9 Slide Number: 9
  • 10. History of Use  Early Parts Count based on adding failure rates of components (60’s and early 70’s) − λ1t − λ 2t − λ nt Applied Reliability Symposium, North America 2007 R(t ) = e •e • • e − ( λ1 + λ 2 + + λ n ) t R(t ) = e Fred Schenkelberg, Ops A La Carte, LLC Track 2 Session 9 Slide Number: 10
  • 11. Beta = 0.63 Depth Cut Response data Weibull Probability Plot .5 Weibull Distribution ML Fit Exponential Distribution ML Fit .3 95% Pointwise Confidence Intervals .2 .1 .05 .03 Applied Reliability Symposium, North America 2007 Fraction Failing .02 .01 .005 .003 .001 .0005 .0003 .0002 .0001 10^-01 10^00 10^01 10^02 10^03 10^04 DEPTH.CUT Fred Schenkelberg, Ops A La Carte, LLC Track 2 Session 9 Slide Number: 11
  • 12. Beta = 1.97 test7.df data Weibull Probability Plot .7 Weibull Distribution ML Fit .3 Exponential Distribution ML Fit 95% Pointwise Confidence Intervals .1 .03 .01 .003 Applied Reliability Symposium, North America 2007 .001 Fraction Failing .0003 .0001 .00003 .00001 .000003 .000001 .0000003 .0000001 .00000003 .00000001 1 10 100 1000 10000 100000 Depth In Fred Schenkelberg, Ops A La Carte, LLC Track 2 Session 9 Slide Number: 12
  • 13. Use Reliability  R(t) is the probability that a random unit drawn from the population will still be operating by t hours  R(t) is the fraction of all units in the population that will survive by t hours Applied Reliability Symposium, North America 2007 Applied Reliability, 2nd Ed., pg 29 Fred Schenkelberg, Ops A La Carte, LLC Track 2 Session 9 Slide Number: 13
  • 14. The four (five) elements  Function  Duration  Probability  Environment Applied Reliability Symposium, North America 2007  They all change over time Fred Schenkelberg, Ops A La Carte, LLC Track 2 Session 9 Slide Number: 14
  • 15. Use better models/distributions  Weibull −( t )β η  Type I Gumbel RWeibull (t ) = e  Exponential − ( et )  Lognormal RGumbel (t ) = e RExponential ( t ) = e − λt  Etc. Applied Reliability Symposium, North America 2007  t  ln  T   50  Rlognormal (t ) = 1 − Φ    σ      Fred Schenkelberg, Ops A La Carte, LLC Track 2 Session 9 Slide Number: 15
  • 16. Other metric  What is the cost of a field failure?  Warranty $ per unit shipped  Returns/field failure $ per unit shipped Applied Reliability Symposium, North America 2007  What else could you use? Fred Schenkelberg, Ops A La Carte, LLC Track 2 Session 9 Slide Number: 16
  • 17. Actually…  MTBF is or should be used for repairable systems  MTTF is what I’ve been talking about  MTTF is calculated the same way as MTBF when we assume Applied Reliability Symposium, North America 2007  Negligible repair time  Interarrival times as from an independent sample of non-repairable parts  Exponential distribution for lifetime of parts  See Chap 10, Applied Reliability for more info Fred Schenkelberg, Ops A La Carte, LLC Track 2 Session 9 Slide Number: 17
  • 18. Summary MTBF Applied Reliability Symposium, North America 2007 Fred Schenkelberg, Ops A La Carte, LLC Track 2 Session 9 Slide Number: 18
  • 19. Where to Get More Information  Tobias, Paul A. and Trindade, David C., Applied Reliability, 2nd Ed. Chapman & Hall, New York, 1995.  “The Limitations of Using the MTTF as a Reliability Specification” Reliability Edge, Qtr 2, Applied Reliability Symposium, North America 2007 2000, Vol 1, Issue 1.  Ops A La Carte, LLC provides a full range of reliability engineering services including assessments, FMEA facilitation, HALT and ALT testing, data analysis and customized training. Fred Schenkelberg, Ops A La Carte, LLC Track 2 Session 9 Slide Number: 19
  • 20. Presenter’s Biographical Sketch  Fred Schenkelberg, Consultant  Independent Reliability Engineering and Management Consultant for past 3 years. Previously at HP Corporate Reliability Engineering Program for 5 years.  MS Statistics Stanford, BS Physics USMA Applied Reliability Symposium, North America 2007  fms@opsalacarte.com  (408) 710-8248  www.opsalacarte.com Fred Schenkelberg, Ops A La Carte, LLC Track 2 Session 9 Slide Number: 20